| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Accuracy of conventional inversion charge modeling in scaled down MOS devices
|
Bose, S.C.
|
|
1988
|
28 |
1 |
p. 15-17
3 p.
|
artikel
|
| 2 |
A hybrid simulation/analytic approach for computer communication systems via exponential limit theorems
|
Sumita, Ushio
|
|
1988
|
28 |
1 |
p. 1-5
5 p.
|
artikel
|
| 3 |
Analytical approximation to the queuing model: (HE3/HE3/1):(GD/∞/∞) for maintainability
|
Kuo, Way
|
|
1988
|
28 |
1 |
p. 59-73
15 p.
|
artikel
|
| 4 |
4677375 Apparatus for testing integrated circuit
|
Nakaie, Toshiyuki
|
|
1988
|
28 |
1 |
p. 164-165
2 p.
|
artikel
|
| 5 |
A study of a time dependent queueing system with two parallel channels
|
(Miss) Sharda,
|
|
1988
|
28 |
1 |
p. 7-9
3 p.
|
artikel
|
| 6 |
A two duplex unit standby system with two types of repair
|
Singh, H.R.
|
|
1988
|
28 |
1 |
p. 11-14
4 p.
|
artikel
|
| 7 |
Editorial Board
|
|
|
1988
|
28 |
1 |
p. IFC-
1 p.
|
artikel
|
| 8 |
4677250 Fault tolerant thin-film photovoltaic cell
|
Barnett, AllenM
|
|
1988
|
28 |
1 |
p. 164-
1 p.
|
artikel
|
| 9 |
GERT analysis of sampling plan for system reliability
|
Shankar, Gauri
|
|
1988
|
28 |
1 |
p. 23-25
3 p.
|
artikel
|
| 10 |
Improving the lower bound for the reliability when the strength distribution is gamma and the stress distribution is chi-square
|
Jaisingh, Lloyd R.
|
|
1988
|
28 |
1 |
p. 27-41
15 p.
|
artikel
|
| 11 |
8704008 Lead finishing for a surface mount package
|
Lin, PaulT
|
|
1988
|
28 |
1 |
p. 166-
1 p.
|
artikel
|
| 12 |
4676840 Method of capless annealing for group III£14 V compound semiconductor substrate
|
Matsumura, Takao
|
|
1988
|
28 |
1 |
p. 164-
1 p.
|
artikel
|
| 13 |
4677370 Method of testing wire bonds for defects using a magnetic field
|
Tustaniwskyj, Jerry
|
|
1988
|
28 |
1 |
p. 164-
1 p.
|
artikel
|
| 14 |
4677586 Microcomputer device having test mode substituting external ram for internal RAM
|
Magar, SurendarS
|
|
1988
|
28 |
1 |
p. 165-
1 p.
|
artikel
|
| 15 |
Modified shrinkage technique for estimation of the exponential scale parameter
|
Shah, M.C.
|
|
1988
|
28 |
1 |
p. 19-21
3 p.
|
artikel
|
| 16 |
Non-metal hermetic encapsulation of a hybrid circuit
|
Schneider, Gernot
|
|
1988
|
28 |
1 |
p. 75-92
18 p.
|
artikel
|
| 17 |
On the design of a new arbitration network
|
Kaur, Devinder
|
|
1988
|
28 |
1 |
p. 93-100
8 p.
|
artikel
|
| 18 |
4675800 Power converter with a failure detector of a self-turn-off semiconductor element
|
Seki, Nagataka
|
|
1988
|
28 |
1 |
p. 163-164
2 p.
|
artikel
|
| 19 |
4676761 Process for producing a matrix of electronic components
|
Poujois, Robert
|
|
1988
|
28 |
1 |
p. 164-
1 p.
|
artikel
|
| 20 |
Recursive enumeration of state graphs for the reliability evaluation of logic circuits
|
Dokouzgiannis, S.P.
|
|
1988
|
28 |
1 |
p. 101-117
17 p.
|
artikel
|
| 21 |
4680761 Self diagnostic cyclic analysis testing system (CATS) for LSI/VLSI
|
Burkness, Donald
|
|
1988
|
28 |
1 |
p. 166-
1 p.
|
artikel
|
| 22 |
4680610 Semiconductor component comprising bump-like, metallic lead contacts and multilayer wiring
|
Pammer, Erich
|
|
1988
|
28 |
1 |
p. 165-166
2 p.
|
artikel
|
| 23 |
System reliability design with deteriorative components
|
Jan, Rong-Hong
|
|
1988
|
28 |
1 |
p. 43-58
16 p.
|
artikel
|
| 24 |
Techniques for latch-up analysis in CMOS IC's based on scanning electron microscopy
|
Canali, C.
|
|
1988
|
28 |
1 |
p. 119-161
43 p.
|
artikel
|
| 25 |
4675599 Testsite system
|
Jensen, Dennis
|
|
1988
|
28 |
1 |
p. 163-
1 p.
|
artikel
|
| 26 |
4674625 Transport mechanism for an automated integrated circuit handler
|
Swapp, MavinC
|
|
1988
|
28 |
1 |
p. 163-
1 p.
|
artikel
|
| 27 |
4678762 Very smooth and flat polycrystalline alumina substrates from direct firing
|
Agarwal, Anil
|
|
1988
|
28 |
1 |
p. 165-
1 p.
|
artikel
|
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