| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A comparison of four Monte Carlo methods for estimating the probability of s-t connectedness
|
|
|
1987
|
27 |
5 |
p. 935-936
2 p.
|
artikel
|
| 2 |
A 6800 coprocessor for error detection in microcomputers: the PAD
|
|
|
1987
|
27 |
5 |
p. 938-
1 p.
|
artikel
|
| 3 |
A cubical logic circuit modelling for reliability studies
|
Dokouzgiannis, S.P.
|
|
1987
|
27 |
5 |
p. 823-831
9 p.
|
artikel
|
| 4 |
Advanced lithographies: finding a niche
|
|
|
1987
|
27 |
5 |
p. 942-
1 p.
|
artikel
|
| 5 |
Analysis of series-parallel production networks without buffers
|
|
|
1987
|
27 |
5 |
p. 938-
1 p.
|
artikel
|
| 6 |
A new high power semiconductor laser array of phase-locking free structure
|
|
|
1987
|
27 |
5 |
p. 943-
1 p.
|
artikel
|
| 7 |
An optimal annealing technique for OHMIC contacts to ion-implanted n-layers in semi-insulating indium phosphide
|
|
|
1987
|
27 |
5 |
p. 942-
1 p.
|
artikel
|
| 8 |
A perspective on CMOS technology trends
|
|
|
1987
|
27 |
5 |
p. 934-
1 p.
|
artikel
|
| 9 |
Approximate expressions for steady-state reliability indexes of Markov systems
|
|
|
1987
|
27 |
5 |
p. 939-
1 p.
|
artikel
|
| 10 |
A semi-parametric approach to testing for reliability growth, with application to software systems
|
|
|
1987
|
27 |
5 |
p. 936-
1 p.
|
artikel
|
| 11 |
A simple method for optimal redundancy allocation for complex networks
|
Bala, Renu
|
|
1987
|
27 |
5 |
p. 835-837
3 p.
|
artikel
|
| 12 |
A simple procedure for reliability growth modeling
|
|
|
1987
|
27 |
5 |
p. 935-
1 p.
|
artikel
|
| 13 |
A travelling-wave rate equation analysis for semiconductor lasers
|
|
|
1987
|
27 |
5 |
p. 942-943
2 p.
|
artikel
|
| 14 |
A variational model for transistors
|
|
|
1987
|
27 |
5 |
p. 941-
1 p.
|
artikel
|
| 15 |
Bayes interval estimation for the shape parameter of the power distribution
|
|
|
1987
|
27 |
5 |
p. 939-
1 p.
|
artikel
|
| 16 |
Bayes weighted availability for a digital radio transmission system
|
|
|
1987
|
27 |
5 |
p. 938-
1 p.
|
artikel
|
| 17 |
Best linear unbiased estimators for normal distribution quantiles for sample sizes up to to 20
|
|
|
1987
|
27 |
5 |
p. 936-
1 p.
|
artikel
|
| 18 |
Bipolar trends
|
|
|
1987
|
27 |
5 |
p. 939-940
2 p.
|
artikel
|
| 19 |
Bounds for reliability of large consecutive-k-out-of-n:F systems with unequal component reliability
|
|
|
1987
|
27 |
5 |
p. 936-
1 p.
|
artikel
|
| 20 |
Bounds on the reliability of networks
|
|
|
1987
|
27 |
5 |
p. 936-
1 p.
|
artikel
|
| 21 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1987
|
27 |
5 |
p. 797-802
6 p.
|
artikel
|
| 22 |
Chips for graphics—making the pixels fly
|
|
|
1987
|
27 |
5 |
p. 941-
1 p.
|
artikel
|
| 23 |
Computational complexity of network reliability analysis: an overview
|
|
|
1987
|
27 |
5 |
p. 938-
1 p.
|
artikel
|
| 24 |
Conditional availability of intermittently-used systems in non-Markov environment
|
|
|
1987
|
27 |
5 |
p. 936-
1 p.
|
artikel
|
| 25 |
Derivation of an exact expression for mean time to repair
|
|
|
1987
|
27 |
5 |
p. 937-
1 p.
|
artikel
|
| 26 |
Digital signal processing in the U.K.
|
|
|
1987
|
27 |
5 |
p. 941-
1 p.
|
artikel
|
| 27 |
Distribution of failures in an array of cells
|
|
|
1987
|
27 |
5 |
p. 936-
1 p.
|
artikel
|
| 28 |
Efficient algorithms for reliability analysis of planar networks—a survey
|
|
|
1987
|
27 |
5 |
p. 937-
1 p.
|
artikel
|
| 29 |
Evaluating MTBF approximations for simple maintained systems
|
|
|
1987
|
27 |
5 |
p. 936-
1 p.
|
artikel
|
| 30 |
Evaluation of an opportunistic replacement policy for a 2-unit system
|
|
|
1987
|
27 |
5 |
p. 936-
1 p.
|
artikel
|
| 31 |
Factoring algorithms for computing K-terminal network reliability
|
|
|
1987
|
27 |
5 |
p. 936-
1 p.
|
artikel
|
| 32 |
Factors affecting call setup time
|
Sultan, Torky I.
|
|
1987
|
27 |
5 |
p. 811-814
4 p.
|
artikel
|
| 33 |
Fault detection in programmable logic arrays
|
|
|
1987
|
27 |
5 |
p. 938-
1 p.
|
artikel
|
| 34 |
4653050 Fault-tolerant memory system
|
Vaillancourt, Steven
|
|
1987
|
27 |
5 |
p. 946-
1 p.
|
artikel
|
| 35 |
Forecast '87. Assembly
|
|
|
1987
|
27 |
5 |
p. 941-
1 p.
|
artikel
|
| 36 |
Forecast '87. CIM trends
|
|
|
1987
|
27 |
5 |
p. 940-
1 p.
|
artikel
|
| 37 |
Forecast '87. Final test
|
|
|
1987
|
27 |
5 |
p. 940-
1 p.
|
artikel
|
| 38 |
Forecast '87. Wafer fabrication trends
|
|
|
1987
|
27 |
5 |
p. 940-
1 p.
|
artikel
|
| 39 |
Further studies of the interactions between thick film resistors and dielectrics
|
|
|
1987
|
27 |
5 |
p. 942-
1 p.
|
artikel
|
| 40 |
Future trends in wafer scale integration
|
|
|
1987
|
27 |
5 |
p. 939-
1 p.
|
artikel
|
| 41 |
Gaseous impurity effects in silicon epitaxy
|
|
|
1987
|
27 |
5 |
p. 942-
1 p.
|
artikel
|
| 42 |
4654849 High speed concurrent testing of dynamic read/write memory array
|
White, LionelS
|
|
1987
|
27 |
5 |
p. 947-
1 p.
|
artikel
|
| 43 |
High speed semiconductor laser design and performance
|
|
|
1987
|
27 |
5 |
p. 943-
1 p.
|
artikel
|
| 44 |
4654827 High speed testing of semiconductor memory devices
|
Childers, Jimmie
|
|
1987
|
27 |
5 |
p. 946-
1 p.
|
artikel
|
| 45 |
Human engineering and software maintainability effects on software reliability
|
|
|
1987
|
27 |
5 |
p. 933-
1 p.
|
artikel
|
| 46 |
IC handlers for thermal testing
|
|
|
1987
|
27 |
5 |
p. 941-
1 p.
|
artikel
|
| 47 |
Implantation gettering in silicon
|
|
|
1987
|
27 |
5 |
p. 943-
1 p.
|
artikel
|
| 48 |
Innovations in water purification
|
|
|
1987
|
27 |
5 |
p. 941-
1 p.
|
artikel
|
| 49 |
4649339 Integrated circuit interface
|
Grangroth, RobertH
|
|
1987
|
27 |
5 |
p. 945-946
2 p.
|
artikel
|
| 50 |
Lifetime distribution identities
|
|
|
1987
|
27 |
5 |
p. 937-938
2 p.
|
artikel
|
| 51 |
Maintainability for a manufacturing process
|
|
|
1987
|
27 |
5 |
p. 935-
1 p.
|
artikel
|
| 52 |
Measurement tools for overlay registration
|
|
|
1987
|
27 |
5 |
p. 941-
1 p.
|
artikel
|
| 53 |
4648547 Method and apparatus for achieving reduced component failure during soldering
|
Mahler, James
|
|
1987
|
27 |
5 |
p. 945-
1 p.
|
artikel
|
| 54 |
4653174 Method of making packaged IC chip
|
Gilder, Thomas
|
|
1987
|
27 |
5 |
p. 946-
1 p.
|
artikel
|
| 55 |
Microprocessor technology trends
|
|
|
1987
|
27 |
5 |
p. 940-
1 p.
|
artikel
|
| 56 |
Minimum expected loss estimators of the shape and scale parameters of the Weibull distribution
|
|
|
1987
|
27 |
5 |
p. 939-
1 p.
|
artikel
|
| 57 |
Modeling, metamodeling, and taxonomy of system failures
|
|
|
1987
|
27 |
5 |
p. 937-
1 p.
|
artikel
|
| 58 |
Modeling the penalty costs of software failure
|
|
|
1987
|
27 |
5 |
p. 933-
1 p.
|
artikel
|
| 59 |
Modelling DC characteristics of lambda transistors for CAD
|
|
|
1987
|
27 |
5 |
p. 941-
1 p.
|
artikel
|
| 60 |
Models for reliability and fail-safety evaluation of microcomputer control systems
|
Zhou, Zhibang
|
|
1987
|
27 |
5 |
p. 839-846
8 p.
|
artikel
|
| 61 |
MOS VLSI reliability and yield trends
|
|
|
1987
|
27 |
5 |
p. 934-
1 p.
|
artikel
|
| 62 |
MTTF and MTFF of a k out of n system
|
Kiu, Sun-Wah
|
|
1987
|
27 |
5 |
p. 913-922
10 p.
|
artikel
|
| 63 |
Multistate Markov models and structural properties of the transition-rate matrix
|
|
|
1987
|
27 |
5 |
p. 938-
1 p.
|
artikel
|
| 64 |
Network reliability evaluation using probability expressions
|
|
|
1987
|
27 |
5 |
p. 937-
1 p.
|
artikel
|
| 65 |
Non-destructive lifetime measurement in silicon wafers by microwave reflection
|
|
|
1987
|
27 |
5 |
p. 935-
1 p.
|
artikel
|
| 66 |
On a two dissimilar unit cold standby system with switchover time and proper initialization of connect switching
|
Mokaddis, G.S.
|
|
1987
|
27 |
5 |
p. 819-822
4 p.
|
artikel
|
| 67 |
On MOS transistor model accuracy
|
|
|
1987
|
27 |
5 |
p. 941-
1 p.
|
artikel
|
| 68 |
On the relationship between two fatigue-life models
|
|
|
1987
|
27 |
5 |
p. 937-
1 p.
|
artikel
|
| 69 |
Optical inspection of printed circuits: requirements placed on AOI in the manufacturing process
|
|
|
1987
|
27 |
5 |
p. 935-
1 p.
|
artikel
|
| 70 |
Optimal computation of k-to-l-out-of-n system reliability
|
Rushdi, Ali M.
|
|
1987
|
27 |
5 |
p. 875-896
22 p.
|
artikel
|
| 71 |
Packages for high-density surface-mount applications
|
|
|
1987
|
27 |
5 |
p. 941-
1 p.
|
artikel
|
| 72 |
Particle-beam fabrication and ‘in situ’ processing of integrated circuits
|
|
|
1987
|
27 |
5 |
p. 942-
1 p.
|
artikel
|
| 73 |
Prediction intervals for future observations from the inverse Gaussian distribution
|
|
|
1987
|
27 |
5 |
p. 939-
1 p.
|
artikel
|
| 74 |
Process modeling and simulation
|
|
|
1987
|
27 |
5 |
p. 941-
1 p.
|
artikel
|
| 75 |
4648179 Process of making interconnection structure for semiconductor device
|
Bhattacharyya, Aru
|
|
1987
|
27 |
5 |
p. 945-
1 p.
|
artikel
|
| 76 |
4650696 Process using tungsten for multilevel metallization
|
Raby, Joseph
|
|
1987
|
27 |
5 |
p. 946-
1 p.
|
artikel
|
| 77 |
Progress in quality and design
|
|
|
1987
|
27 |
5 |
p. 933-
1 p.
|
artikel
|
| 78 |
Properties of amorphous CdS-crystalline Si junctions
|
|
|
1987
|
27 |
5 |
p. 942-
1 p.
|
artikel
|
| 79 |
Publications, notices, calls for papers, etc.
|
|
|
1987
|
27 |
5 |
p. 803-810
8 p.
|
artikel
|
| 80 |
Quality control of surfaces for high-reliability electronics
|
|
|
1987
|
27 |
5 |
p. 933-
1 p.
|
artikel
|
| 81 |
Randomized quality control of a 2-station machining process with blocking
|
|
|
1987
|
27 |
5 |
p. 939-
1 p.
|
artikel
|
| 82 |
Reactive ion etching of AlSiCu alloy films
|
|
|
1987
|
27 |
5 |
p. 942-
1 p.
|
artikel
|
| 83 |
Reactive ion etching of direct-write metallisation patterns
|
|
|
1987
|
27 |
5 |
p. 942-
1 p.
|
artikel
|
| 84 |
Recipe for reliability: shake and bake
|
|
|
1987
|
27 |
5 |
p. 933-
1 p.
|
artikel
|
| 85 |
Rectifying inspection for defects
|
|
|
1987
|
27 |
5 |
p. 937-
1 p.
|
artikel
|
| 86 |
Reliability and availability of duplex systems: some simple models
|
|
|
1987
|
27 |
5 |
p. 936-
1 p.
|
artikel
|
| 87 |
Reliability and MTTF evaluation of a repairable complex system under waiting
|
Gupta, P.P.
|
|
1987
|
27 |
5 |
p. 815-818
4 p.
|
artikel
|
| 88 |
Reliability and safety analysis of a fault-tolerant controller
|
|
|
1987
|
27 |
5 |
p. 939-
1 p.
|
artikel
|
| 89 |
Reliability-based life cycle costing
|
Ntuen, Celestine A.
|
|
1987
|
27 |
5 |
p. 833-834
2 p.
|
artikel
|
| 90 |
Reliability enhancements—million cycle EEPROMs
|
|
|
1987
|
27 |
5 |
p. 935-
1 p.
|
artikel
|
| 91 |
Reliability improvement for simplex communication systems with multiple channels
|
|
|
1987
|
27 |
5 |
p. 938-939
2 p.
|
artikel
|
| 92 |
Reliability modeling and analysis of computer networks
|
|
|
1987
|
27 |
5 |
p. 938-
1 p.
|
artikel
|
| 93 |
Reliability of implantable electronic devices: two case studies
|
|
|
1987
|
27 |
5 |
p. 934-
1 p.
|
artikel
|
| 94 |
Ring network reliability and a fault-tolerant Cambridge ring architecture
|
|
|
1987
|
27 |
5 |
p. 938-
1 p.
|
artikel
|
| 95 |
R. & M attributes of VHSIC/VLSI technology
|
|
|
1987
|
27 |
5 |
p. 933-
1 p.
|
artikel
|
| 96 |
SDC and combat resilience
|
|
|
1987
|
27 |
5 |
p. 935-
1 p.
|
artikel
|
| 97 |
Selecting the accept/reject criteria for an automated solder process inspection machine
|
|
|
1987
|
27 |
5 |
p. 934-
1 p.
|
artikel
|
| 98 |
Self-consistent analysis of gain-guided triple stripe lasers
|
|
|
1987
|
27 |
5 |
p. 942-
1 p.
|
artikel
|
| 99 |
4656610 Semiconductor memory device having redundancy means
|
Yoshida, Masahir
|
|
1987
|
27 |
5 |
p. 947-948
2 p.
|
artikel
|
| 100 |
Semiconductor memory trends
|
|
|
1987
|
27 |
5 |
p. 940-941
2 p.
|
artikel
|
| 101 |
Semicustom and custom LSI technology
|
|
|
1987
|
27 |
5 |
p. 941-
1 p.
|
artikel
|
| 102 |
4656419 Simplified solar cell material tester
|
Garlick, GeorgeFJ
|
|
1987
|
27 |
5 |
p. 947-
1 p.
|
artikel
|
| 103 |
Software for reliability testing of computer peripherals: a case history
|
|
|
1987
|
27 |
5 |
p. 937-
1 p.
|
artikel
|
| 104 |
Solder sealing semiconductor packages
|
|
|
1987
|
27 |
5 |
p. 941-
1 p.
|
artikel
|
| 105 |
Standby redundancy in reliability—a review
|
|
|
1987
|
27 |
5 |
p. 937-
1 p.
|
artikel
|
| 106 |
Study of extrinsic gettering of epitaxial substrates
|
|
|
1987
|
27 |
5 |
p. 941-
1 p.
|
artikel
|
| 107 |
Surface mount technology in Japan—from consumer electronics to supercomputer
|
|
|
1987
|
27 |
5 |
p. 941-
1 p.
|
artikel
|
| 108 |
Synthesis of reliable networks; a survey
|
|
|
1987
|
27 |
5 |
p. 936-
1 p.
|
artikel
|
| 109 |
Temperature behaviour and annealing of insulated gate transistors subjected to localized lifetime control by proton implantation
|
|
|
1987
|
27 |
5 |
p. 934-935
2 p.
|
artikel
|
| 110 |
Test fixture for MESFET reliability life tests
|
Canali, C.
|
|
1987
|
27 |
5 |
p. 897-911
15 p.
|
artikel
|
| 111 |
Tests for equality of location and scale parameters of exponential distributions with type-II censoring
|
|
|
1987
|
27 |
5 |
p. 935-
1 p.
|
artikel
|
| 112 |
The application of radioanalytical methods in semiconductor technology
|
|
|
1987
|
27 |
5 |
p. 942-
1 p.
|
artikel
|
| 113 |
The characteristics of emitter-collector surface leakage channels in bipolar transistors
|
Jones, B.K.
|
|
1987
|
27 |
5 |
p. 923-931
9 p.
|
artikel
|
| 114 |
The development of a fully implanted 3 micron poly-gate NMOS technology—(Part 1)
|
|
|
1987
|
27 |
5 |
p. 943-
1 p.
|
artikel
|
| 115 |
The failure frequency of systems with dependent components
|
|
|
1987
|
27 |
5 |
p. 934-
1 p.
|
artikel
|
| 116 |
The future of automation for high-volume wafer fabrication and ASIC manufacturing
|
|
|
1987
|
27 |
5 |
p. 940-
1 p.
|
artikel
|
| 117 |
The independence assumption for a series or parallel system when component lifetimes are exponential
|
|
|
1987
|
27 |
5 |
p. 937-
1 p.
|
artikel
|
| 118 |
The reliability and validity of correlating human health hazards and nicotine content in cigarettes
|
Sherif, Yosef S.
|
|
1987
|
27 |
5 |
p. 859-865
7 p.
|
artikel
|
| 119 |
The search for quality: The case of competitiveness
|
Sherif, Yosef S.
|
|
1987
|
27 |
5 |
p. 867-873
7 p.
|
artikel
|
| 120 |
The use of computer aids in IC technology evolution
|
|
|
1987
|
27 |
5 |
p. 933-934
2 p.
|
artikel
|
| 121 |
Three-dimensional IC trends
|
|
|
1987
|
27 |
5 |
p. 940-
1 p.
|
artikel
|
| 122 |
Tools for software design: Program design languages (pdl's)
|
Sherif, Yosef S.
|
|
1987
|
27 |
5 |
p. 847-857
11 p.
|
artikel
|
| 123 |
Trends in advanced process technology—submicrometer CMOS device design and process requirements
|
|
|
1987
|
27 |
5 |
p. 940-
1 p.
|
artikel
|
| 124 |
US Air Force aircraft battle damage repair (ABDR) program
|
|
|
1987
|
27 |
5 |
p. 935-
1 p.
|
artikel
|
| 125 |
Verifying IC layouts through design rule checking
|
|
|
1987
|
27 |
5 |
p. 941-
1 p.
|
artikel
|
| 126 |
4656592 Very large scale integrated circuit subdivided into isochronous regions, method for the machine-aided design of such a circuit, and method for the machine-aided testing of such a circuit
|
Spaanenburg, Lambertus
|
|
1987
|
27 |
5 |
p. 947-
1 p.
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artikel
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| 127 |
Yield and performance enhancement through redundancy in VLSI and WSI multi-processor systems
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1987
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27 |
5 |
p. 937-
1 p.
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artikel
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