| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Acceptor-like gold level in n-type silicon
|
|
|
1987
|
27 |
1 |
p. 189-
1 p.
|
artikel
|
| 2 |
A degradation model for metallized polyester capacitors
|
Specchiulli, G.
|
|
1987
|
27 |
1 |
p. 145-163
19 p.
|
artikel
|
| 3 |
A flexible bathtub hazard model for non-repairable systems with uncensored data
|
Jaisingh, Lloyd R.
|
|
1987
|
27 |
1 |
p. 87-103
17 p.
|
artikel
|
| 4 |
Algorithms for generating minimal cutsets by inversion
|
|
|
1987
|
27 |
1 |
p. 186-
1 p.
|
artikel
|
| 5 |
A mixed CMOS-DMOS-JFET technology for switching circuits with high voltage output stages
|
Podmiotko, W.J.
|
|
1987
|
27 |
1 |
p. 33-37
5 p.
|
artikel
|
| 6 |
A Monte Carlo method for determining confidence bounds on reliability and availability of maintained systems
|
|
|
1987
|
27 |
1 |
p. 185-
1 p.
|
artikel
|
| 7 |
An algebraic method for reliability calculations
|
Gupta, P.P.
|
|
1987
|
27 |
1 |
p. 19-23
5 p.
|
artikel
|
| 8 |
Analysis of a communication system with imperfect repair
|
Pignal, Pierre I.
|
|
1987
|
27 |
1 |
p. 165-169
5 p.
|
artikel
|
| 9 |
Analysis of failures during qualification approval testing of diodes and thyristors
|
|
|
1987
|
27 |
1 |
p. 182-
1 p.
|
artikel
|
| 10 |
Analysis of fault tolerant computer systems
|
Sumita, U.
|
|
1987
|
27 |
1 |
p. 65-78
14 p.
|
artikel
|
| 11 |
Analysis of 1-out-of-2:G warm-standby repairable system
|
|
|
1987
|
27 |
1 |
p. 185-
1 p.
|
artikel
|
| 12 |
An approach in the life cycle cost of integrated logistic support
|
Roca, J.L.
|
|
1987
|
27 |
1 |
p. 25-27
3 p.
|
artikel
|
| 13 |
An evaluation of 32 bit microprocessors for a fault-tolerant application
|
|
|
1987
|
27 |
1 |
p. 183-
1 p.
|
artikel
|
| 14 |
An inexpensive electron beam lithographic system and its application to monolithic circuit fabrication
|
|
|
1987
|
27 |
1 |
p. 190-
1 p.
|
artikel
|
| 15 |
An overview of pattern delineation technology in the semiconductor industry
|
|
|
1987
|
27 |
1 |
p. 188-
1 p.
|
artikel
|
| 16 |
Application of signature analysis technique for microprocessor based systems
|
|
|
1987
|
27 |
1 |
p. 185-
1 p.
|
artikel
|
| 17 |
A priority multi-component system with spares
|
Kalpakam, S.
|
|
1987
|
27 |
1 |
p. 79-85
7 p.
|
artikel
|
| 18 |
A probabilistic cost-based method for evaluation of operational improvements of nuclear reactors
|
|
|
1987
|
27 |
1 |
p. 183-184
2 p.
|
artikel
|
| 19 |
As2-ambient activation and alloyed-ohmic-contact studies of Si+-ion-implanted Al0.3Ga0.7 As/GaAs modulation-doped structures
|
|
|
1987
|
27 |
1 |
p. 191-
1 p.
|
artikel
|
| 20 |
ASEE concentrates on manufacturing science for VLSI
|
|
|
1987
|
27 |
1 |
p. 186-
1 p.
|
artikel
|
| 21 |
Assembly catching up with productivity needs
|
|
|
1987
|
27 |
1 |
p. 187-
1 p.
|
artikel
|
| 22 |
A switching-algebraic analysis of consecutive-k-out-of-n:F systems
|
Rushdi, Ali M.
|
|
1987
|
27 |
1 |
p. 171-174
4 p.
|
artikel
|
| 23 |
Asymptotic distribution of Bayes estimators in censored type-1 samples from a mixed exponential population
|
|
|
1987
|
27 |
1 |
p. 185-
1 p.
|
artikel
|
| 24 |
A test of the equality of survival distributions based on paired observations from conditionally independent exponential distributions
|
|
|
1987
|
27 |
1 |
p. 183-
1 p.
|
artikel
|
| 25 |
8602166 Automated circuit tester
|
Littlebury, Hugh
|
|
1987
|
27 |
1 |
p. 197-
1 p.
|
artikel
|
| 26 |
A VME bus compatible ADC interface chip
|
Shekhar, Chandra
|
|
1987
|
27 |
1 |
p. 61-63
3 p.
|
artikel
|
| 27 |
Ball formation processes in aluminum bonding wire
|
|
|
1987
|
27 |
1 |
p. 187-
1 p.
|
artikel
|
| 28 |
Bayes shrinkage estimators of Weibull parameters
|
|
|
1987
|
27 |
1 |
p. 182-
1 p.
|
artikel
|
| 29 |
Borophosphosilicate glass for VLSI device fabrication
|
|
|
1987
|
27 |
1 |
p. 187-
1 p.
|
artikel
|
| 30 |
CAD tools for custom IC layout
|
|
|
1987
|
27 |
1 |
p. 188-
1 p.
|
artikel
|
| 31 |
Carbon and composite carbon-metal films deposited in an rf glow discharge operated in organic gases
|
|
|
1987
|
27 |
1 |
p. 189-
1 p.
|
artikel
|
| 32 |
Chemical vapour deposition of metal silicides from organometallic compounds with silicon-metal bonds
|
|
|
1987
|
27 |
1 |
p. 188-
1 p.
|
artikel
|
| 33 |
Cleaning and contamination of electronics components and assemblies
|
G.W.A.D.,
|
|
1987
|
27 |
1 |
p. 180-
1 p.
|
artikel
|
| 34 |
Clean room technology: the concept of total environmental control for advanced industries
|
|
|
1987
|
27 |
1 |
p. 186-
1 p.
|
artikel
|
| 35 |
Comment on the dependence of Rq and current noise on grain size in thick film resistors (RFR's)
|
|
|
1987
|
27 |
1 |
p. 190-
1 p.
|
artikel
|
| 36 |
4578637 Continuity/leakage tester for electronic circuits
|
Allen, RichardJ
|
|
1987
|
27 |
1 |
p. 195-
1 p.
|
artikel
|
| 37 |
Control and documentation in burn-in
|
|
|
1987
|
27 |
1 |
p. 181-
1 p.
|
artikel
|
| 38 |
Cost analysis of a one server two unit system subject to two types of repair and arbitrary distributions
|
Singh, S.K.
|
|
1987
|
27 |
1 |
p. 49-53
5 p.
|
artikel
|
| 39 |
Cost—reliability optimal release policies for software systems
|
|
|
1987
|
27 |
1 |
p. 185-186
2 p.
|
artikel
|
| 40 |
4575746 Crossunders for high density SOS integrated circuits
|
Dingwall, AndrewGF
|
|
1987
|
27 |
1 |
p. 194-
1 p.
|
artikel
|
| 41 |
Cutset analysis of networks using basic minimal paths and network decomposition
|
|
|
1987
|
27 |
1 |
p. 182-183
2 p.
|
artikel
|
| 42 |
4587480 Delay testing method for CMOS LSI and VLSI integrated circuits
|
Zasio, John
|
|
1987
|
27 |
1 |
p. 197-
1 p.
|
artikel
|
| 43 |
4577149 Detection of catastrophic failure of dielectric, improper connection, and temperature of a printed circuit assembly via one wire
|
Zbinden, Terry
|
|
1987
|
27 |
1 |
p. 194-
1 p.
|
artikel
|
| 44 |
Determination of threshold power for semiconductor melting during laser annealing
|
|
|
1987
|
27 |
1 |
p. 191-
1 p.
|
artikel
|
| 45 |
4575747 Device for protecting film-mounted integrated circuits against destruction due to electrostatic charges
|
Fritz, Otmar
|
|
1987
|
27 |
1 |
p. 194-
1 p.
|
artikel
|
| 46 |
Digraph matrix analysis
|
|
|
1987
|
27 |
1 |
p. 185-
1 p.
|
artikel
|
| 47 |
Distribution-free confidence bound for Pr(Y < X) of an r-out-of-k system
|
|
|
1987
|
27 |
1 |
p. 185-
1 p.
|
artikel
|
| 48 |
Dry etching systems: gearing up for larger wafers
|
|
|
1987
|
27 |
1 |
p. 187-
1 p.
|
artikel
|
| 49 |
Dynamic and steady-state solutions for a general availability model
|
|
|
1987
|
27 |
1 |
p. 184-
1 p.
|
artikel
|
| 50 |
Early applications of laser direct patterning: direct writing and excimer projection
|
|
|
1987
|
27 |
1 |
p. 191-
1 p.
|
artikel
|
| 51 |
Editorial Board
|
|
|
1987
|
27 |
1 |
p. IFC-
1 p.
|
artikel
|
| 52 |
Effect of burn-in on mean residual life
|
|
|
1987
|
27 |
1 |
p. 181-
1 p.
|
artikel
|
| 53 |
Efficient computer-aided failure analysis of integrated circuits using scanning electron microscopy
|
|
|
1987
|
27 |
1 |
p. 182-
1 p.
|
artikel
|
| 54 |
Electron beam probing of integrated circuits
|
|
|
1987
|
27 |
1 |
p. 191-
1 p.
|
artikel
|
| 55 |
4575630 Electron-beam testing of semiconductor wafers
|
Lukianoff, George
|
|
1987
|
27 |
1 |
p. 193-
1 p.
|
artikel
|
| 56 |
4581739 Electronically selectable redundant array (ESRA)
|
McMahon, MauriceT
|
|
1987
|
27 |
1 |
p. 195-
1 p.
|
artikel
|
| 57 |
Element importance and system failure frequency of a 2-state system
|
|
|
1987
|
27 |
1 |
p. 186-
1 p.
|
artikel
|
| 58 |
Equipment interface communications for the automated fab
|
|
|
1987
|
27 |
1 |
p. 187-
1 p.
|
artikel
|
| 59 |
Erratum
|
|
|
1987
|
27 |
1 |
p. 199-
1 p.
|
artikel
|
| 60 |
4578587 Error-corrected corpuscular beam lithography
|
Behringer, Uwe
|
|
1987
|
27 |
1 |
p. 194-195
2 p.
|
artikel
|
| 61 |
Evolution of the microstructure and performance of Pd/Ag-based thick conductors
|
|
|
1987
|
27 |
1 |
p. 189-
1 p.
|
artikel
|
| 62 |
Failure distributions of consecutive-k-out-of-n:F systems
|
|
|
1987
|
27 |
1 |
p. 183-
1 p.
|
artikel
|
| 63 |
Fastener failure vs. products liability
|
|
|
1987
|
27 |
1 |
p. 182-
1 p.
|
artikel
|
| 64 |
Fault-tree analysis using a binary decision tree
|
|
|
1987
|
27 |
1 |
p. 183-
1 p.
|
artikel
|
| 65 |
4585727 Fixed point method and apparatus for probing semiconductor devices
|
Reams, DonaldJ
|
|
1987
|
27 |
1 |
p. 196-
1 p.
|
artikel
|
| 66 |
Formation of buried insulating layers by high dose oxygen implantation under controlled temperature conditions
|
|
|
1987
|
27 |
1 |
p. 191-
1 p.
|
artikel
|
| 67 |
Graph theory concepts in frequency and availability analysis
|
|
|
1987
|
27 |
1 |
p. 183-
1 p.
|
artikel
|
| 68 |
Guidelines for selecting an automatic test equipment for electronic modules
|
|
|
1987
|
27 |
1 |
p. 185-
1 p.
|
artikel
|
| 69 |
Heat transfer and thermal stress analysis of plastic-encapsulated ICs
|
|
|
1987
|
27 |
1 |
p. 181-182
2 p.
|
artikel
|
| 70 |
High quality thick epitaxial films for power semiconductor devices
|
|
|
1987
|
27 |
1 |
p. 189-190
2 p.
|
artikel
|
| 71 |
High-resolution photoluminescence studies of GaAs/GaAlAs multi-quantum-well structures grown by molecular beam epitaxy
|
|
|
1987
|
27 |
1 |
p. 189-
1 p.
|
artikel
|
| 72 |
High vacuum systems for sputtering applications
|
|
|
1987
|
27 |
1 |
p. 187-188
2 p.
|
artikel
|
| 73 |
III–V semiconductors on Si substrates: new directions for heterojunction electronics
|
|
|
1987
|
27 |
1 |
p. 188-
1 p.
|
artikel
|
| 74 |
Improving the accuracy of the Littlewood—Verally model
|
|
|
1987
|
27 |
1 |
p. 184-
1 p.
|
artikel
|
| 75 |
Incorporation of oxygen into nonocrystalline silicon
|
|
|
1987
|
27 |
1 |
p. 189-
1 p.
|
artikel
|
| 76 |
8602167 Integrated circuit tester and remote pin electronics therefor
|
Peterson, JohnL
|
|
1987
|
27 |
1 |
p. 197-198
2 p.
|
artikel
|
| 77 |
Ion implant monitoring with thermal wave technology
|
|
|
1987
|
27 |
1 |
p. 190-
1 p.
|
artikel
|
| 78 |
JBW redundancy-allocation algorithm
|
|
|
1987
|
27 |
1 |
p. 184-
1 p.
|
artikel
|
| 79 |
Lifetime distribution of consecutive-k-out-of-n:F systems with exchangeable lifetimes
|
|
|
1987
|
27 |
1 |
p. 183-
1 p.
|
artikel
|
| 80 |
Low temperature co-fired tape dielectric material systems for multilayer interconnections
|
|
|
1987
|
27 |
1 |
p. 190-
1 p.
|
artikel
|
| 81 |
Mass flow controllers: assuring precise process gas flows
|
|
|
1987
|
27 |
1 |
p. 188-
1 p.
|
artikel
|
| 82 |
Mechanism of misalignment failure of liquid-crystal display cells
|
|
|
1987
|
27 |
1 |
p. 181-
1 p.
|
artikel
|
| 83 |
4575676 Method and apparatus for radiation testing of electron devices
|
Palkuti, Leslie
|
|
1987
|
27 |
1 |
p. 193-
1 p.
|
artikel
|
| 84 |
Microfabrication with ion beams
|
|
|
1987
|
27 |
1 |
p. 191-
1 p.
|
artikel
|
| 85 |
4586180 Microprocessor fault-monitoring circuit
|
Anders, Horst-Gunther
|
|
1987
|
27 |
1 |
p. 197-
1 p.
|
artikel
|
| 86 |
Minimizing bias in sampling contaminant particles
|
|
|
1987
|
27 |
1 |
p. 186-187
2 p.
|
artikel
|
| 87 |
Minimum-distance estimation of the parameters of the 3-parameter Weibull distribution
|
|
|
1987
|
27 |
1 |
p. 183-
1 p.
|
artikel
|
| 88 |
Modeling simultaneous outages for bulk-power system reliability-analysis
|
|
|
1987
|
27 |
1 |
p. 185-
1 p.
|
artikel
|
| 89 |
Modularizing and minimizing fault trees
|
|
|
1987
|
27 |
1 |
p. 182-
1 p.
|
artikel
|
| 90 |
New reliability indices for topological design
|
Cǎtuneanu, V.M.
|
|
1987
|
27 |
1 |
p. 39-43
5 p.
|
artikel
|
| 91 |
On characterizations of a mixture of exponential distributions
|
|
|
1987
|
27 |
1 |
p. 185-
1 p.
|
artikel
|
| 92 |
On possibilities of synthesis of a useful model of thick film components
|
|
|
1987
|
27 |
1 |
p. 190-
1 p.
|
artikel
|
| 93 |
On robot reliability and safety - bibliography
|
Dhillon, Balbir S.
|
|
1987
|
27 |
1 |
p. 105-118
14 p.
|
artikel
|
| 94 |
On the band offsets of AlGaAs/GaAs and beyond
|
|
|
1987
|
27 |
1 |
p. 189-
1 p.
|
artikel
|
| 95 |
On the utility of insulation resistance tests to assess the life performance of printed wiring boards
|
|
|
1987
|
27 |
1 |
p. 182-
1 p.
|
artikel
|
| 96 |
Optical ICs: the new alternative
|
|
|
1987
|
27 |
1 |
p. 186-
1 p.
|
artikel
|
| 97 |
Optimal use of product warranties
|
|
|
1987
|
27 |
1 |
p. 184-
1 p.
|
artikel
|
| 98 |
Optimum piggyback preventive maintenance policies
|
|
|
1987
|
27 |
1 |
p. 184-
1 p.
|
artikel
|
| 99 |
Optimum spare allocation policy for preventive maintenance
|
Cǎtuneanu, V.M.
|
|
1987
|
27 |
1 |
p. 45-48
4 p.
|
artikel
|
| 100 |
Overall reliability determination of computer networks with hierarchical routing strategies
|
Mandaltsis, D.
|
|
1987
|
27 |
1 |
p. 129-143
15 p.
|
artikel
|
| 101 |
Parametric testing: design to production
|
|
|
1987
|
27 |
1 |
p. 187-
1 p.
|
artikel
|
| 102 |
Polymer thick films: what are they, how are they used and where?
|
|
|
1987
|
27 |
1 |
p. 190-
1 p.
|
artikel
|
| 103 |
4582563 Process for forming multi-layer interconnections
|
Hazuki, Yoshikaz
|
|
1987
|
27 |
1 |
p. 196-
1 p.
|
artikel
|
| 104 |
Publications, Notices, Calls for Papers, Etc.
|
|
|
1987
|
27 |
1 |
p. 1-7
7 p.
|
artikel
|
| 105 |
4573255 Purging: A reliability assurance technique for semiconductor lasers utilizing a purging process
|
Gordon, EugeneI
|
|
1987
|
27 |
1 |
p. 193-
1 p.
|
artikel
|
| 106 |
Quality assurance in the PCB industry—incoming goods inspection
|
|
|
1987
|
27 |
1 |
p. 182-
1 p.
|
artikel
|
| 107 |
Raman spectra of silicon monoxide
|
|
|
1987
|
27 |
1 |
p. 188-
1 p.
|
artikel
|
| 108 |
Recent developments in computing of system-reliability
|
|
|
1987
|
27 |
1 |
p. 181-
1 p.
|
artikel
|
| 109 |
Recursive estimation of phased-mission reliability
|
|
|
1987
|
27 |
1 |
p. 184-
1 p.
|
artikel
|
| 110 |
Redistribution of aluminum in MODFET OHMIC contacts
|
|
|
1987
|
27 |
1 |
p. 187-
1 p.
|
artikel
|
| 111 |
Reliability and fail-softness analysis of multistage interconnection networks
|
|
|
1987
|
27 |
1 |
p. 183-
1 p.
|
artikel
|
| 112 |
Reliability-equivalent-replacement of a subnetwork
|
|
|
1987
|
27 |
1 |
p. 186-
1 p.
|
artikel
|
| 113 |
Reliability evaluation of a first order standby system with module redundancy
|
Dyer, Danny
|
|
1987
|
27 |
1 |
p. 119-128
10 p.
|
artikel
|
| 114 |
Reliability evaluation of multistate systems with multistate components
|
|
|
1987
|
27 |
1 |
p. 185-
1 p.
|
artikel
|
| 115 |
Reliability modelling of electronic components
|
Verma, A.K.
|
|
1987
|
27 |
1 |
p. 29-32
4 p.
|
artikel
|
| 116 |
Reliability of networks of three-state devices
|
Page, Lavon B.
|
|
1987
|
27 |
1 |
p. 175-178
4 p.
|
artikel
|
| 117 |
Reliability prediction from assessment tests on plastic encapsulated semiconductor devices
|
|
|
1987
|
27 |
1 |
p. 182-
1 p.
|
artikel
|
| 118 |
Repair of clear photomask defects by laser-pyrolytic deposition
|
|
|
1987
|
27 |
1 |
p. 191-
1 p.
|
artikel
|
| 119 |
Resists used in plasma processing
|
|
|
1987
|
27 |
1 |
p. 188-
1 p.
|
artikel
|
| 120 |
Robust estimators of the 3-parameter Weibull distribution
|
|
|
1987
|
27 |
1 |
p. 186-
1 p.
|
artikel
|
| 121 |
4579621 Selective epitaxial growth method
|
Hine, Shiro
|
|
1987
|
27 |
1 |
p. 195-
1 p.
|
artikel
|
| 122 |
Selective tungsten processing by low pressure CVD
|
|
|
1987
|
27 |
1 |
p. 187-
1 p.
|
artikel
|
| 123 |
Semiconductor applications of focused ion beam micromachining
|
|
|
1987
|
27 |
1 |
p. 190-191
2 p.
|
artikel
|
| 124 |
Semiconductor factory automation: current theories
|
|
|
1987
|
27 |
1 |
p. 189-
1 p.
|
artikel
|
| 125 |
Semiconductor heterojunction topics: introduction and overview
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1987
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27 |
1 |
p. 188-189
2 p.
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artikel
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| 126 |
4586170 Semiconductor memory redundant element identification circuit
|
O'Toole, JamesE
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1987
|
27 |
1 |
p. 196-
1 p.
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artikel
|
| 127 |
Sequential tests of hypotheses for system reliability modeled by a 2-parameter Weibull distribution
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1987
|
27 |
1 |
p. 186-
1 p.
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artikel
|
| 128 |
Silicides for VLSI interconnects
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1987
|
27 |
1 |
p. 187-
1 p.
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artikel
|
| 129 |
Software aid for mask shop
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1987
|
27 |
1 |
p. 187-
1 p.
|
artikel
|
| 130 |
4585991 Solid state multiprobe testing apparatus
|
Reid, LeeR
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1987
|
27 |
1 |
p. 196-
1 p.
|
artikel
|
| 131 |
Some computer applications for reliability and maintainabillity
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1987
|
27 |
1 |
p. 184-
1 p.
|
artikel
|
| 132 |
4587639 Static semiconductor memory device incorporating redundancy memory cells
|
Aoyama, Keizo
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|
1987
|
27 |
1 |
p. 197-
1 p.
|
artikel
|
| 133 |
Stochastic analysis of a two unit cold standby system with preparation time for repair
|
Singh, S.K.
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|
1987
|
27 |
1 |
p. 55-60
6 p.
|
artikel
|
| 134 |
Stochastic behaviour of a two-unit cold standby redundant electronic equipment under human failure
|
Gupta, P.P.
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|
1987
|
27 |
1 |
p. 15-18
4 p.
|
artikel
|
| 135 |
Strict liability and negligence: the distinguishable twins of products liability
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|
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1987
|
27 |
1 |
p. 181-
1 p.
|
artikel
|
| 136 |
Technology advances in hybrids
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|
|
1987
|
27 |
1 |
p. 190-
1 p.
|
artikel
|
| 137 |
The architecture of micro-processors
|
G.W.A.D.,
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1987
|
27 |
1 |
p. 179-
1 p.
|
artikel
|
| 138 |
The availability of a k-out-of-n:G network
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|
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1987
|
27 |
1 |
p. 185-
1 p.
|
artikel
|
| 139 |
The bi-annual quality conference
|
Jacobs, Richard M.
|
|
1987
|
27 |
1 |
p. 9-13
5 p.
|
artikel
|
| 140 |
The effects of a sacrificial oxide process on metal-oxide-semiconductor field effect transistors fabricated with ion-beam-nitridation technology
|
|
|
1987
|
27 |
1 |
p. 191-
1 p.
|
artikel
|
| 141 |
The gaseous anodization of silicon and its applications
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|
|
1987
|
27 |
1 |
p. 189-
1 p.
|
artikel
|
| 142 |
The impact of photoresist linewidth control and measurement
|
|
|
1987
|
27 |
1 |
p. 187-
1 p.
|
artikel
|
| 143 |
The influence of pulse shape on the dynamics of pulsed laser annealing of GaAs
|
|
|
1987
|
27 |
1 |
p. 191-
1 p.
|
artikel
|
| 144 |
The role of design and development in quality and reliability assurance
|
|
|
1987
|
27 |
1 |
p. 186-
1 p.
|
artikel
|
| 145 |
The test trend is “integration”
|
|
|
1987
|
27 |
1 |
p. 188-
1 p.
|
artikel
|
| 146 |
4581740 Transfer circuit for defect inspection of an integrated circuit
|
Kinoshita, Tsune
|
|
1987
|
27 |
1 |
p. 195-196
2 p.
|
artikel
|
| 147 |
Uncertainty analysis of fault-tree outputs
|
|
|
1987
|
27 |
1 |
p. 184-
1 p.
|
artikel
|
| 148 |
Vacuum systems for microelectronics
|
|
|
1987
|
27 |
1 |
p. 187-
1 p.
|
artikel
|
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