| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Analysis of 1-server n-unit parallel system subject to different service strategies
|
Gopalan, M.N.
|
|
1986
|
26 |
1 |
p. 191-196
6 p.
|
artikel
|
| 2 |
Announcement
|
|
|
1986
|
26 |
1 |
p. 199-
1 p.
|
artikel
|
| 3 |
A note on “A finite range distribution of failure times”
|
Lai, C.D.
|
|
1986
|
26 |
1 |
p. 183-189
7 p.
|
artikel
|
| 4 |
4523145 Apparatus for the automated handling and testing of electronic modules
|
Gray, GeorgeG
|
|
1986
|
26 |
1 |
p. 202-203
2 p.
|
artikel
|
| 5 |
Application of the surrogate constraints algorithm to optimal reliability design of systems
|
Hikita, Mitsunori
|
|
1986
|
26 |
1 |
p. 35-38
4 p.
|
artikel
|
| 6 |
Availability and MTTF analysis of a three-state parallel redundant multi-component system under critical human failures
|
Gupta, P.P.
|
|
1986
|
26 |
1 |
p. 63-68
6 p.
|
artikel
|
| 7 |
Availability and MTTF analysis of a three state repairable redundant electronic equipment under critical human errors
|
Gupta, P.P.
|
|
1986
|
26 |
1 |
p. 57-62
6 p.
|
artikel
|
| 8 |
Bibliography of literature on computer hardware reliability
|
Dhillon, Balbir S
|
|
1986
|
26 |
1 |
p. 131-153
23 p.
|
artikel
|
| 9 |
Bibliography of literature on reliability in civil engineering
|
Dhillon, Balbir S.
|
|
1986
|
26 |
1 |
p. 99-121
23 p.
|
artikel
|
| 10 |
Calendar of International Conferences, Symposia, Lectures and Meetings of Interest
|
|
|
1986
|
26 |
1 |
p. 1-3
3 p.
|
artikel
|
| 11 |
4523144 Complex probe card for testing a semiconductor wafer
|
Okubo, Masao
|
|
1986
|
26 |
1 |
p. 202-
1 p.
|
artikel
|
| 12 |
Cost analysis of a three-state repairable redundant complex system under various modes of failures
|
Gupta, P.P.
|
|
1986
|
26 |
1 |
p. 69-73
5 p.
|
artikel
|
| 13 |
Cost-benefit analysis of a one-server two-unit standby system subject to imperfect switching device, random inspection and k-failure modes
|
Gupta, Rakesh
|
|
1986
|
26 |
1 |
p. 7-11
5 p.
|
artikel
|
| 14 |
Editorial Board
|
|
|
1986
|
26 |
1 |
p. IFC-
1 p.
|
artikel
|
| 15 |
Handbook of microelectronics packaging and inter connection technologies
|
G.W.A.D.,
|
|
1986
|
26 |
1 |
p. 198-
1 p.
|
artikel
|
| 16 |
Hot carriers' effects in short channel devices
|
Petrova, R.
|
|
1986
|
26 |
1 |
p. 155-162
8 p.
|
artikel
|
| 17 |
4523312 IC tester
|
Takeuchi, Kunio
|
|
1986
|
26 |
1 |
p. 203-
1 p.
|
artikel
|
| 18 |
4523975 Integrated circuit planarizing process
|
Groves, ChristopherK
|
|
1986
|
26 |
1 |
p. 203-
1 p.
|
artikel
|
| 19 |
Introduction to microcomputer engineering
|
G.W.A.D.,
|
|
1986
|
26 |
1 |
p. 197-
1 p.
|
artikel
|
| 20 |
4520448 Method of characterizing reliability in bipolar semiconductor devices
|
Tremintin, Bernard
|
|
1986
|
26 |
1 |
p. 201-202
2 p.
|
artikel
|
| 21 |
MTTF and availability evaluation of a two-unit, two-state, parallel redundant complex system with constant human failure
|
Gupta, P.P.
|
|
1986
|
26 |
1 |
p. 53-56
4 p.
|
artikel
|
| 22 |
N-unit parallel redundant system with multiple correlated failures
|
Nikolov, Angel Vasilev
|
|
1986
|
26 |
1 |
p. 31-34
4 p.
|
artikel
|
| 23 |
4521086 Objective for an IC mask testing device
|
Kurita, Hiroyuki
|
|
1986
|
26 |
1 |
p. 202-
1 p.
|
artikel
|
| 24 |
On the expected net revenue of a one-server two-unit system with arbitrary installation time
|
Gopalan, M.N.
|
|
1986
|
26 |
1 |
p. 45-48
4 p.
|
artikel
|
| 25 |
On the expected revenue of a two-unit system supported by independent service facilities for installation and repair
|
Gopalan, M.N.
|
|
1986
|
26 |
1 |
p. 49-52
4 p.
|
artikel
|
| 26 |
Optimum ordering policies for an equipment with a sensing device
|
Sung, C.S.
|
|
1986
|
26 |
1 |
p. 87-98
12 p.
|
artikel
|
| 27 |
Probabilistic analysis of a two-unit cold standby system with two-phase repair and preventive maintenance
|
Gupta, Rakesh
|
|
1986
|
26 |
1 |
p. 13-18
6 p.
|
artikel
|
| 28 |
4525789 Programmable network tester with data formatter
|
Kemper, KyranB
|
|
1986
|
26 |
1 |
p. 203-204
2 p.
|
artikel
|
| 29 |
4528504 Pulsed linear integrated circuit tester
|
Thornton, MaxC
|
|
1986
|
26 |
1 |
p. 204-
1 p.
|
artikel
|
| 30 |
Reliability and maintainability of a multicomponent series-parallel system with simultaneous failure under preemptive repeat repair discipline
|
Kodama, Masanori
|
|
1986
|
26 |
1 |
p. 163-181
19 p.
|
artikel
|
| 31 |
Reliability — An update
|
Reiche, Hans
|
|
1986
|
26 |
1 |
p. 5-6
2 p.
|
artikel
|
| 32 |
4520313 Semiconductor testing and apparatus therefor
|
Allred, LaurenceL
|
|
1986
|
26 |
1 |
p. 201-
1 p.
|
artikel
|
| 33 |
Stochastic analysis of a two-unit warm standby system with slow switching device
|
Sharma, G.C.
|
|
1986
|
26 |
1 |
p. 25-29
5 p.
|
artikel
|
| 34 |
Stochastic analysis of standby system with duplex units
|
Goel, L.R.
|
|
1986
|
26 |
1 |
p. 19-24
6 p.
|
artikel
|
| 35 |
Stochastic behaviour of man-machine systems operating under different weather conditions
|
Dhillon, Balbir S.
|
|
1986
|
26 |
1 |
p. 123-129
7 p.
|
artikel
|
| 36 |
4520309 System for testing the malfunctioning or correct operation of a circuit with logic components
|
Berard, Andre
|
|
1986
|
26 |
1 |
p. 201-
1 p.
|
artikel
|
| 37 |
Testing whether F is “more NBU” than is G
|
Hollander, Myles
|
|
1986
|
26 |
1 |
p. 39-43
5 p.
|
artikel
|
| 38 |
The search for quality: The case of planned obsolescence
|
Sherif, Yosef S.
|
|
1986
|
26 |
1 |
p. 75-85
11 p.
|
artikel
|
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