| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Accelerated life testing of small-geometry printed circuit boards
|
|
|
1985
|
25 |
6 |
p. 1161-
1 p.
|
artikel
|
| 2 |
A classification system for reliability models
|
|
|
1985
|
25 |
6 |
p. 1163-
1 p.
|
artikel
|
| 3 |
A CMOS LSSD test generation system
|
|
|
1985
|
25 |
6 |
p. 1159-1160
2 p.
|
artikel
|
| 4 |
A complex three-unit system
|
|
|
1985
|
25 |
6 |
p. 1162-
1 p.
|
artikel
|
| 5 |
Acoustic microscopy improves internal reliability of IC packaging
|
|
|
1985
|
25 |
6 |
p. 1159-
1 p.
|
artikel
|
| 6 |
Adaptive probability distribution estimation based upon maximum entropy
|
|
|
1985
|
25 |
6 |
p. 1164-
1 p.
|
artikel
|
| 7 |
Addressing, packaging and assembly weaknesses
|
|
|
1985
|
25 |
6 |
p. 1168-
1 p.
|
artikel
|
| 8 |
A design method for field service centres
|
|
|
1985
|
25 |
6 |
p. 1163-
1 p.
|
artikel
|
| 9 |
A field study of connector reliability
|
|
|
1985
|
25 |
6 |
p. 1160-
1 p.
|
artikel
|
| 10 |
AFTP fault tree analysis program
|
|
|
1985
|
25 |
6 |
p. 1163-
1 p.
|
artikel
|
| 11 |
A further study on the microstructure of glass-bonded Ag thick-film conductors
|
|
|
1985
|
25 |
6 |
p. 1173-
1 p.
|
artikel
|
| 12 |
A-k-out-of-N:G redundant system with cold standby units and common-cause failures
|
|
|
1985
|
25 |
6 |
p. 1165-
1 p.
|
artikel
|
| 13 |
A melting model for pulsed laser heating of silicon
|
|
|
1985
|
25 |
6 |
p. 1171-
1 p.
|
artikel
|
| 14 |
A method of predicting availability characteristics of series-parallel systems
|
|
|
1985
|
25 |
6 |
p. 1164-
1 p.
|
artikel
|
| 15 |
An alternative approach towards the design of control units
|
|
|
1985
|
25 |
6 |
p. 1169-
1 p.
|
artikel
|
| 16 |
Analysis of a k-out-of-n unit system with two types of failure and preventive maintenance
|
|
|
1985
|
25 |
6 |
p. 1166-
1 p.
|
artikel
|
| 17 |
Analysis of a two unit standby system with partial failure and two types of repairs
|
|
|
1985
|
25 |
6 |
p. 1166-
1 p.
|
artikel
|
| 18 |
Analysis of distribution of boron and phosphorus concentration in poly Si-SiO2-Si
|
|
|
1985
|
25 |
6 |
p. 1172-
1 p.
|
artikel
|
| 19 |
Analysis of systems subject to inspection and repair: a state-of-the-art survey
|
|
|
1985
|
25 |
6 |
p. 1167-
1 p.
|
artikel
|
| 20 |
An analytic and accurate model for the threshold voltage of short channel MOSFETs in VLSI
|
|
|
1985
|
25 |
6 |
p. 1171-
1 p.
|
artikel
|
| 21 |
Anatomy of a clean room robot
|
|
|
1985
|
25 |
6 |
p. 1169-1170
2 p.
|
artikel
|
| 22 |
An empirically developed Fourier series model for describing software failures
|
|
|
1985
|
25 |
6 |
p. 1164-1165
2 p.
|
artikel
|
| 23 |
A new heuristic approach for redundancy optimization problem
|
|
|
1985
|
25 |
6 |
p. 1167-
1 p.
|
artikel
|
| 24 |
An expert system for fault tree construction
|
|
|
1985
|
25 |
6 |
p. 1165-1166
2 p.
|
artikel
|
| 25 |
An interactive two-dimensional finite element process modelling package for a single user mini-computer
|
|
|
1985
|
25 |
6 |
p. 1170-
1 p.
|
artikel
|
| 26 |
Annealing of damage in Se+-implanted indium phosphide
|
|
|
1985
|
25 |
6 |
p. 1172-
1 p.
|
artikel
|
| 27 |
A novel boron spin-on dopant
|
|
|
1985
|
25 |
6 |
p. 1168-
1 p.
|
artikel
|
| 28 |
4481628 Apparatus for testing dynamic noise immunity of digital integrated circuits
|
Pasquinelli, Rossan
|
|
1985
|
25 |
6 |
p. 1175-1176
2 p.
|
artikel
|
| 29 |
Approximate tolerance limits and confidence limits on reliability for the Gamma distribution
|
|
|
1985
|
25 |
6 |
p. 1164-
1 p.
|
artikel
|
| 30 |
A simple method of photomask yield optimization by defect inspection
|
|
|
1985
|
25 |
6 |
p. 1169-
1 p.
|
artikel
|
| 31 |
A Truncation methodology for evaluating large fault trees
|
|
|
1985
|
25 |
6 |
p. 1167-
1 p.
|
artikel
|
| 32 |
A two level metal CMOS process for VLSI circuits
|
|
|
1985
|
25 |
6 |
p. 1170-
1 p.
|
artikel
|
| 33 |
Availability analysis of transit systems
|
|
|
1985
|
25 |
6 |
p. 1162-
1 p.
|
artikel
|
| 34 |
Bayes reliability assessment of a two-unit hot-standby redundant system
|
|
|
1985
|
25 |
6 |
p. 1167-
1 p.
|
artikel
|
| 35 |
B-Si masks for storage ring X-ray lithography
|
|
|
1985
|
25 |
6 |
p. 1169-
1 p.
|
artikel
|
| 36 |
Calculation of the extended-state electron mobility in hydrogenated amorphous silicon
|
|
|
1985
|
25 |
6 |
p. 1172-
1 p.
|
artikel
|
| 37 |
Calculations of systems unreliability by algebraic manipulation of failure event
|
|
|
1985
|
25 |
6 |
p. 1163-1164
2 p.
|
artikel
|
| 38 |
Cast leads for surface attachment
|
|
|
1985
|
25 |
6 |
p. 1169-
1 p.
|
artikel
|
| 39 |
Catastrophic failure modes limit redundancy effectiveness
|
|
|
1985
|
25 |
6 |
p. 1164-
1 p.
|
artikel
|
| 40 |
Characteristics of thin chromium films obtained by different methods of deposition
|
|
|
1985
|
25 |
6 |
p. 1168-
1 p.
|
artikel
|
| 41 |
Characterization of semiconductor materials and devices by surface analysis techniques
|
|
|
1985
|
25 |
6 |
p. 1171-
1 p.
|
artikel
|
| 42 |
Computer-aided design of an eight bit binary counter N-MOS chip for large scale integration (LSI)
|
|
|
1985
|
25 |
6 |
p. 1170-
1 p.
|
artikel
|
| 43 |
Computer contracts: negotiating user protection
|
|
|
1985
|
25 |
6 |
p. 1159-
1 p.
|
artikel
|
| 44 |
Computer software quality measurements and metrics
|
Sherif, Y.S.
|
|
1985
|
25 |
6 |
p. 1105-1150
46 p.
|
artikel
|
| 45 |
4482953 Computer with console addressable PLA storing control microcode and microinstructions for self-test of internal registers and ALU
|
Burke, GaryR
|
|
1985
|
25 |
6 |
p. 1176-
1 p.
|
artikel
|
| 46 |
Computing k-out-of-n system reliability
|
|
|
1985
|
25 |
6 |
p. 1167-
1 p.
|
artikel
|
| 47 |
Confidence intervals for reliability from stress - strength relationships
|
|
|
1985
|
25 |
6 |
p. 1162-
1 p.
|
artikel
|
| 48 |
Contact hole etching in a load-locked hexagonal reactive ion etching system
|
|
|
1985
|
25 |
6 |
p. 1174-
1 p.
|
artikel
|
| 49 |
Controlling the quality of soldering of PTH solder joints
|
|
|
1985
|
25 |
6 |
p. 1161-1162
2 p.
|
artikel
|
| 50 |
Cost analysis of a three-state parallel redundant complex system
|
Gupta, P.P.
|
|
1985
|
25 |
6 |
p. 1021-1027
7 p.
|
artikel
|
| 51 |
Cost analysis of a three-state standby redundant electronic equipment
|
Gupta, P.P.
|
|
1985
|
25 |
6 |
p. 1029-1033
5 p.
|
artikel
|
| 52 |
Cost analysis of a two-unit standby system with two types of repairmen
|
|
|
1985
|
25 |
6 |
p. 1166-1167
2 p.
|
artikel
|
| 53 |
Cost effectiveness analysis of utilizing flow improvers for crude oil
|
Abdel Halim, M.M.
|
|
1985
|
25 |
6 |
p. 1151-1156
6 p.
|
artikel
|
| 54 |
Cost-effective reliable software engineering and development
|
|
|
1985
|
25 |
6 |
p. 1164-
1 p.
|
artikel
|
| 55 |
Design of a comprehensive process evaluation vehicle for development of small geometry CMOS process
|
|
|
1985
|
25 |
6 |
p. 1169-
1 p.
|
artikel
|
| 56 |
Determination of reliability from ramped voltage breakdown experiments: application to dual dielectric MIM capacitors
|
|
|
1985
|
25 |
6 |
p. 1161-
1 p.
|
artikel
|
| 57 |
Development of a novel resistor system for nitrogen firing applications
|
|
|
1985
|
25 |
6 |
p. 1173-
1 p.
|
artikel
|
| 58 |
Die attach in hi-rel P-dips: polyimides or low chloride epoxies?
|
|
|
1985
|
25 |
6 |
p. 1168-
1 p.
|
artikel
|
| 59 |
Digital computer systems reliability
|
|
|
1985
|
25 |
6 |
p. 1167-1168
2 p.
|
artikel
|
| 60 |
Economic benefits of part quality knowledge
|
|
|
1985
|
25 |
6 |
p. 1165-
1 p.
|
artikel
|
| 61 |
Effect of ion beam etching on metal-Si and metal-GaAs barriers
|
|
|
1985
|
25 |
6 |
p. 1174-
1 p.
|
artikel
|
| 62 |
Effects of ambient atmosphere on aluminum-copper wirebond reliability
|
|
|
1985
|
25 |
6 |
p. 1160-
1 p.
|
artikel
|
| 63 |
Effects of oxygen and internal gettering on donor formation
|
|
|
1985
|
25 |
6 |
p. 1171-
1 p.
|
artikel
|
| 64 |
Empirical Bayes approach to reliability estimation for the exponential distribution
|
|
|
1985
|
25 |
6 |
p. 1162-1163
2 p.
|
artikel
|
| 65 |
Endurance tests on noble-metal sliding-contact materials for small horsepower d.c. motors
|
|
|
1985
|
25 |
6 |
p. 1161-
1 p.
|
artikel
|
| 66 |
Enhanced magnetron sputtering of planarized silica coatings
|
|
|
1985
|
25 |
6 |
p. 1169-
1 p.
|
artikel
|
| 67 |
Equivalent matrix parameter functions for two-port sub-networks of non-uniform thin-film Y-Z-KY structure
|
|
|
1985
|
25 |
6 |
p. 1173-1174
2 p.
|
artikel
|
| 68 |
Evaluation of commercial E-beam resists in Japan
|
|
|
1985
|
25 |
6 |
p. 1174-
1 p.
|
artikel
|
| 69 |
Fractional duration before first failure—a useful index and an analytical tool
|
|
|
1985
|
25 |
6 |
p. 1167-
1 p.
|
artikel
|
| 70 |
Furnace loading systems review
|
|
|
1985
|
25 |
6 |
p. 1170-
1 p.
|
artikel
|
| 71 |
GaAs waits in the wings
|
|
|
1985
|
25 |
6 |
p. 1168-
1 p.
|
artikel
|
| 72 |
Gas cooling enhancement technology for integrated circuit chips
|
|
|
1985
|
25 |
6 |
p. 1169-
1 p.
|
artikel
|
| 73 |
Gaseous cleaning beneath surface mounted components: evaluation using a beam lead test chip
|
|
|
1985
|
25 |
6 |
p. 1160-
1 p.
|
artikel
|
| 74 |
Glow discharge polymeric films: preparation, structure, properties and applications
|
|
|
1985
|
25 |
6 |
p. 1173-
1 p.
|
artikel
|
| 75 |
Gold contacts to semiconductor devices
|
|
|
1985
|
25 |
6 |
p. 1170-
1 p.
|
artikel
|
| 76 |
Goodness-of-fit test-statistics on Gaussian and exponential reliability data
|
|
|
1985
|
25 |
6 |
p. 1163-
1 p.
|
artikel
|
| 77 |
Humidity control in accelerated life tests
|
|
|
1985
|
25 |
6 |
p. 1165-
1 p.
|
artikel
|
| 78 |
Hybrid market in Europe
|
|
|
1985
|
25 |
6 |
p. 1168-
1 p.
|
artikel
|
| 79 |
4480199 Identification of repaired integrated circuits
|
Varshney, RameshC
|
|
1985
|
25 |
6 |
p. 1175-
1 p.
|
artikel
|
| 80 |
Impurity distributions and p-n junctions in semiconductors
|
|
|
1985
|
25 |
6 |
p. 1171-1172
2 p.
|
artikel
|
| 81 |
Incoming inspection and delivery quality of integrated circuits
|
|
|
1985
|
25 |
6 |
p. 1160-1161
2 p.
|
artikel
|
| 82 |
Independence bounds and approximations for system availability computations
|
|
|
1985
|
25 |
6 |
p. 1166-
1 p.
|
artikel
|
| 83 |
Influence of temperature on the potential and field distributions in microresistors and Halltrons for MOS integrated circuits
|
|
|
1985
|
25 |
6 |
p. 1170-
1 p.
|
artikel
|
| 84 |
Information technology in the U.K.
|
|
|
1985
|
25 |
6 |
p. 1168-
1 p.
|
artikel
|
| 85 |
Inspection frequency and availability of emergency equipment
|
|
|
1985
|
25 |
6 |
p. 1162-
1 p.
|
artikel
|
| 86 |
Integrated non-uniform thin-film micro-systems of circular geometry
|
|
|
1985
|
25 |
6 |
p. 1173-
1 p.
|
artikel
|
| 87 |
Integrated T/R modules employ GaAs ICs
|
|
|
1985
|
25 |
6 |
p. 1170-
1 p.
|
artikel
|
| 88 |
Interband recombination in doped GaAs
|
|
|
1985
|
25 |
6 |
p. 1172-
1 p.
|
artikel
|
| 89 |
Ion cluster beam deposition technology
|
|
|
1985
|
25 |
6 |
p. 1174-
1 p.
|
artikel
|
| 90 |
Keys and keyboards—application-oriented survey and computer-controlled reliability tests
|
|
|
1985
|
25 |
6 |
p. 1162-
1 p.
|
artikel
|
| 91 |
Leak detection in IC packages
|
|
|
1985
|
25 |
6 |
p. 1168-
1 p.
|
artikel
|
| 92 |
Lifetime of bonded contacts on thin film metallizations
|
|
|
1985
|
25 |
6 |
p. 1170-
1 p.
|
artikel
|
| 93 |
Magnetic field enhanced reactive ion etching
|
|
|
1985
|
25 |
6 |
p. 1174-
1 p.
|
artikel
|
| 94 |
Map derivation of the minimal sum of a switching function from that of its complement
|
Rushdi, Ali M.
|
|
1985
|
25 |
6 |
p. 1055-1065
11 p.
|
artikel
|
| 95 |
Matrix parameters on non-uniform distributed parameter thin film C-R-KC micro-systems of circular geometry
|
|
|
1985
|
25 |
6 |
p. 1173-
1 p.
|
artikel
|
| 96 |
Maturity factors in predicting failure rate for linear integrated circuits
|
|
|
1985
|
25 |
6 |
p. 1159-
1 p.
|
artikel
|
| 97 |
Metallic glass formation by ion implantation into nickel
|
|
|
1985
|
25 |
6 |
p. 1174-
1 p.
|
artikel
|
| 98 |
4479297 Method of fabricating three-dimensional semiconductor devices utilizing CeO2 and ion-implantation
|
Mizutani, Yoshihisa
|
|
1985
|
25 |
6 |
p. 1175-
1 p.
|
artikel
|
| 99 |
Minimizing the cost of automated board testing
|
|
|
1985
|
25 |
6 |
p. 1166-
1 p.
|
artikel
|
| 100 |
Modified goodness-of-fit tests for Gamma distributions with unknown location and scale parameters
|
|
|
1985
|
25 |
6 |
p. 1165-
1 p.
|
artikel
|
| 101 |
New thick film capacitor dielectrics
|
|
|
1985
|
25 |
6 |
p. 1160-
1 p.
|
artikel
|
| 102 |
Numerical simulation of hot-electron effects on source-drain burnout characteristics of GaAs power FETs
|
|
|
1985
|
25 |
6 |
p. 1172-
1 p.
|
artikel
|
| 103 |
Observation of discrete donor-accept pair spectra in MBE grown GaAs
|
|
|
1985
|
25 |
6 |
p. 1171-
1 p.
|
artikel
|
| 104 |
On multistate coherent systems
|
|
|
1985
|
25 |
6 |
p. 1166-
1 p.
|
artikel
|
| 105 |
On power line carrier communication (PLC)
|
|
|
1985
|
25 |
6 |
p. 1166-
1 p.
|
artikel
|
| 106 |
On the fabrication of thin film MICs from substrate cleaning to pattern delineation
|
|
|
1985
|
25 |
6 |
p. 1174-
1 p.
|
artikel
|
| 107 |
On the semi-insulating polycrystalline silicon resistor
|
|
|
1985
|
25 |
6 |
p. 1172-
1 p.
|
artikel
|
| 108 |
Optimal allocation of cost to detectors in a two-unit series system
|
|
|
1985
|
25 |
6 |
p. 1162-
1 p.
|
artikel
|
| 109 |
Optimal policies in a two-unit standby system with two types of repairmen
|
|
|
1985
|
25 |
6 |
p. 1165-
1 p.
|
artikel
|
| 110 |
Optimum preventive maintenance policies for a computer-system with restart
|
|
|
1985
|
25 |
6 |
p. 1166-
1 p.
|
artikel
|
| 111 |
Particle energy loss spectroscopy and SEM studies of topography development in thin aluminium films inplanted with high doses of helium
|
|
|
1985
|
25 |
6 |
p. 1174-
1 p.
|
artikel
|
| 112 |
Performance-related dependability evaluation of supercomputer systems
|
|
|
1985
|
25 |
6 |
p. 1166-
1 p.
|
artikel
|
| 113 |
Photomask defects: causes and solutions
|
|
|
1985
|
25 |
6 |
p. 1169-
1 p.
|
artikel
|
| 114 |
Polyimide for high resolution ion implantation masking
|
|
|
1985
|
25 |
6 |
p. 1174-
1 p.
|
artikel
|
| 115 |
Polymers in electronics, Part I
|
|
|
1985
|
25 |
6 |
p. 1168-
1 p.
|
artikel
|
| 116 |
Power GaAs MESFET: reliability aspects and failure mechanisms
|
|
|
1985
|
25 |
6 |
p. 1161-
1 p.
|
artikel
|
| 117 |
Practical comparison of LEC production methods for SI-GaAs
|
|
|
1985
|
25 |
6 |
p. 1169-
1 p.
|
artikel
|
| 118 |
Prediction intervals for the two-parameter exponential distribution using incomplete data
|
|
|
1985
|
25 |
6 |
p. 1162-
1 p.
|
artikel
|
| 119 |
Preflow solder ceramic lids for hermetic packages
|
|
|
1985
|
25 |
6 |
p. 1168-1169
2 p.
|
artikel
|
| 120 |
Process modeling of phosphorus diffusion in silicon—a new model
|
|
|
1985
|
25 |
6 |
p. 1172-
1 p.
|
artikel
|
| 121 |
Properties of moment estimators for the three-parameter Weibull distribution
|
|
|
1985
|
25 |
6 |
p. 1165-
1 p.
|
artikel
|
| 122 |
Publications, notices, calls for papers, etc.
|
|
|
1985
|
25 |
6 |
p. 1015-1017
3 p.
|
artikel
|
| 123 |
Qualifying reduction reticles
|
|
|
1985
|
25 |
6 |
p. 1170-
1 p.
|
artikel
|
| 124 |
Rationale for a modified Duane model
|
|
|
1985
|
25 |
6 |
p. 1163-
1 p.
|
artikel
|
| 125 |
Reliability and availability analysis of on surface transit systems
|
|
|
1985
|
25 |
6 |
p. 1164-
1 p.
|
artikel
|
| 126 |
Reliability and availability analysis of transit systems
|
Dhillon, Balbir S.
|
|
1985
|
25 |
6 |
p. 1073-1085
13 p.
|
artikel
|
| 127 |
Reliability characterization of high speed CMOS logic ICs
|
|
|
1985
|
25 |
6 |
p. 1161-
1 p.
|
artikel
|
| 128 |
Reliability compliance testing of electronic components for consumer electronics
|
|
|
1985
|
25 |
6 |
p. 1161-
1 p.
|
artikel
|
| 129 |
Reliability enhancement through optimal burn-in
|
|
|
1985
|
25 |
6 |
p. 1163-
1 p.
|
artikel
|
| 130 |
Reliability evaluation of protective system with scheduled and unscheduled maintenance
|
|
|
1985
|
25 |
6 |
p. 1162-
1 p.
|
artikel
|
| 131 |
Reliability modeling of on-surface transit systems with human errors
|
Dhillon, Balbir S.
|
|
1985
|
25 |
6 |
p. 1087-1098
12 p.
|
artikel
|
| 132 |
Reliability of CMOS/SOS integrated circuits
|
|
|
1985
|
25 |
6 |
p. 1162-
1 p.
|
artikel
|
| 133 |
Reliability of liquid crystal display
|
|
|
1985
|
25 |
6 |
p. 1159-
1 p.
|
artikel
|
| 134 |
Reliability prediction using large MOS capacitors
|
|
|
1985
|
25 |
6 |
p. 1161-
1 p.
|
artikel
|
| 135 |
Reliability specifications in engineering design: A survey
|
Dhillon, Balbir S.
|
|
1985
|
25 |
6 |
p. 1099-1104
6 p.
|
artikel
|
| 136 |
Reliability with imperfect diagnostics
|
|
|
1985
|
25 |
6 |
p. 1167-
1 p.
|
artikel
|
| 137 |
Schottky barrier height of sputtered TiN contacts on silicon
|
|
|
1985
|
25 |
6 |
p. 1171-
1 p.
|
artikel
|
| 138 |
Sensor on silicon gate NMOS multi-project chips
|
|
|
1985
|
25 |
6 |
p. 1168-
1 p.
|
artikel
|
| 139 |
s-Expected number of inspections and repairs of a one-server two-unit system subject to arbitrary failure
|
|
|
1985
|
25 |
6 |
p. 1164-
1 p.
|
artikel
|
| 140 |
Si crystal growth trends
|
|
|
1985
|
25 |
6 |
p. 1168-
1 p.
|
artikel
|
| 141 |
Silicon processing with silicon carbide furnace components
|
|
|
1985
|
25 |
6 |
p. 1172-
1 p.
|
artikel
|
| 142 |
Some applications of semi-regenerative processes to two-unit warm standby system
|
|
|
1985
|
25 |
6 |
p. 1162-
1 p.
|
artikel
|
| 143 |
Some problems and prospects in high erosion yield sputtering
|
|
|
1985
|
25 |
6 |
p. 1173-
1 p.
|
artikel
|
| 144 |
Something needs to be done
|
Gianelle, W.H.
|
|
1985
|
25 |
6 |
p. 1019-
1 p.
|
artikel
|
| 145 |
Space station reliability
|
|
|
1985
|
25 |
6 |
p. 1167-
1 p.
|
artikel
|
| 146 |
Sputtering and interconnect trends
|
|
|
1985
|
25 |
6 |
p. 1168-
1 p.
|
artikel
|
| 147 |
s-Shaped software reliability growth models and their applications
|
|
|
1985
|
25 |
6 |
p. 1165-
1 p.
|
artikel
|
| 148 |
4482781 Stabilization of semiconductor device package leads
|
Burns, CarmenD
|
|
1985
|
25 |
6 |
p. 1176-
1 p.
|
artikel
|
| 149 |
State space representation of Petri nets
|
|
|
1985
|
25 |
6 |
p. 1164-
1 p.
|
artikel
|
| 150 |
Stochastic analysis of a parallel system with common cause failure, preventive maintenance and two types of repair
|
Sharma, G.C.
|
|
1985
|
25 |
6 |
p. 1035-1039
5 p.
|
artikel
|
| 151 |
Stochastic analysis of a two-unit parallel system with partial and catastrophic failures and preventive maintenance
|
|
|
1985
|
25 |
6 |
p. 1165-
1 p.
|
artikel
|
| 152 |
Stochastic behaviour of a maintained system with protection system
|
|
|
1985
|
25 |
6 |
p. 1166-
1 p.
|
artikel
|
| 153 |
Stochastic behaviour of a single server n-unit pulverizer system with common-cause failures and general maintenance
|
|
|
1985
|
25 |
6 |
p. 1163-
1 p.
|
artikel
|
| 154 |
Symbolic reliability analysis via Shannon's expansion and statistical independence
|
Rushdi, Ali M.
|
|
1985
|
25 |
6 |
p. 1041-1053
13 p.
|
artikel
|
| 155 |
The anatomy of burn-in—an analysis
|
|
|
1985
|
25 |
6 |
p. 1167-
1 p.
|
artikel
|
| 156 |
The generic method of the multistate fault tree analysis
|
|
|
1985
|
25 |
6 |
p. 1164-
1 p.
|
artikel
|
| 157 |
The impact of robots on product reliability
|
|
|
1985
|
25 |
6 |
p. 1167-
1 p.
|
artikel
|
| 158 |
The measurement of flux residues from chip carrier attachment and their effect on other thick film hybrid components
|
|
|
1985
|
25 |
6 |
p. 1173-
1 p.
|
artikel
|
| 159 |
The multilayer printed circuit board handbook
|
G.W.A.D.,
|
|
1985
|
25 |
6 |
p. 1157-
1 p.
|
artikel
|
| 160 |
The Pioneer 10/11 program: from 1969 to 1994
|
|
|
1985
|
25 |
6 |
p. 1163-
1 p.
|
artikel
|
| 161 |
The redundancy of two three-state devices
|
Pulli, Tapio
|
|
1985
|
25 |
6 |
p. 1067-1071
5 p.
|
artikel
|
| 162 |
Thermal stress-free package for flip-chip devices
|
|
|
1985
|
25 |
6 |
p. 1170-1171
2 p.
|
artikel
|
| 163 |
The role of surface treatment on the anodic oxidation of n-GaAs
|
|
|
1985
|
25 |
6 |
p. 1172-
1 p.
|
artikel
|
| 164 |
Title section, volume contents and author index for volume 25, 1985
|
|
|
1985
|
25 |
6 |
p. i-x
nvt p.
|
artikel
|
| 165 |
Topological optimization of distributed computer networks subject to reliability constraints
|
|
|
1985
|
25 |
6 |
p. 1166-
1 p.
|
artikel
|
| 166 |
Training in the semiconductor industry
|
|
|
1985
|
25 |
6 |
p. 1168-
1 p.
|
artikel
|
| 167 |
Use of radiant infrared in soldering surface mounted devices to printed circuit boards
|
|
|
1985
|
25 |
6 |
p. 1170-
1 p.
|
artikel
|
| 168 |
VLSI multilevel metallization
|
|
|
1985
|
25 |
6 |
p. 1169-
1 p.
|
artikel
|
| 169 |
Voltage-testing of thin-film capacitors
|
|
|
1985
|
25 |
6 |
p. 1160-
1 p.
|
artikel
|
| 170 |
Yield model for fault clusters within integrated circuits
|
|
|
1985
|
25 |
6 |
p. 1160-
1 p.
|
artikel
|
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