nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Admissibility of a conditionally specified test procedure for life data
|
Saxena, S.K. |
|
1985 |
25 |
1 |
p. 59-60 2 p. |
artikel |
2 |
A new algorithm for network system reliability
|
Chen, Hua Cheng |
|
1985 |
25 |
1 |
p. 35-40 6 p. |
artikel |
3 |
A new CMOS IC structure and its characterization
|
Živić, Z. |
|
1985 |
25 |
1 |
p. 123-146 24 p. |
artikel |
4 |
An improved method for a redundancy optimization problem
|
Dakshina Murty, V. |
|
1985 |
25 |
1 |
p. 93-95 3 p. |
artikel |
5 |
4454413 Apparatus for tracking integrated circuit devices
|
Morton, WilliamD |
|
1985 |
25 |
1 |
p. 203- 1 p. |
artikel |
6 |
A reliability physics model for dissimilar two-unit standby system with single repair facility
|
Gopalan, M.N. |
|
1985 |
25 |
1 |
p. 17-23 7 p. |
artikel |
7 |
Availability analysis of a two-unit (dissimilar) parallel system with inspection and bivariate exponential life times
|
Goel, L.R. |
|
1985 |
25 |
1 |
p. 77-80 4 p. |
artikel |
8 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1985 |
25 |
1 |
p. 1-4 4 p. |
artikel |
9 |
4444309 Carrier for a leadless integrated circuit chip
|
Morton, WilliamD |
|
1985 |
25 |
1 |
p. 201- 1 p. |
artikel |
10 |
Conductibilité thermique des éléments dans les circuits hybrides
|
Berlicki, T.M. |
|
1985 |
25 |
1 |
p. 101-103 3 p. |
artikel |
11 |
Cost analysis of a two-unit cold standby system with two types of operation and repair
|
Goel, L.R. |
|
1985 |
25 |
1 |
p. 71-75 5 p. |
artikel |
12 |
Cost analysis of a two unit priority standby system with imperfect switch and arbitrary distributions
|
Goel, L.R. |
|
1985 |
25 |
1 |
p. 65-69 5 p. |
artikel |
13 |
Cost analysis of a two-unit standby system with delayed replacement and better utilization of units
|
Goel, L.R. |
|
1985 |
25 |
1 |
p. 81-86 6 p. |
artikel |
14 |
Cost-benefit analysis of an n-unit repairable adaptive system
|
Vijayakumar, A. |
|
1985 |
25 |
1 |
p. 31-34 4 p. |
artikel |
15 |
Cost-benefit analysis of a two-unit adaptive system with slow switch
|
Gopalan, M.N. |
|
1985 |
25 |
1 |
p. 25-30 6 p. |
artikel |
16 |
Cost-benefit analysis of one-server two-unit system subject to slow switch and random service
|
Gopalan, M.N. |
|
1985 |
25 |
1 |
p. 183-194 12 p. |
artikel |
17 |
Direct computation of expected numbers of failures and repairs via integral equation approach
|
Inagaki, Toshiyuki |
|
1985 |
25 |
1 |
p. 105-109 5 p. |
artikel |
18 |
Editorial Board
|
|
|
1985 |
25 |
1 |
p. IFC- 1 p. |
artikel |
19 |
4456978 Electrically alterable read only memory semiconductor device made by low pressure chemical vapor deposition process
|
Morley, RichardM |
|
1985 |
25 |
1 |
p. 204- 1 p. |
artikel |
20 |
Erratum
|
|
|
1985 |
25 |
1 |
p. 197-199 3 p. |
artikel |
21 |
4453248 Fault alignment exclusion method to prevent realignment of previously paired memory defects
|
Ryan, PhilipM |
|
1985 |
25 |
1 |
p. 203- 1 p. |
artikel |
22 |
4445085 Fault location methods and apparatus using current pulse injection
|
Metcalf, Eric |
|
1985 |
25 |
1 |
p. 201- 1 p. |
artikel |
23 |
4459694 Field programmable device with circuitry for detecting poor insulation between adjacent word lines
|
Ueno, Kouji |
|
1985 |
25 |
1 |
p. 205- 1 p. |
artikel |
24 |
Human reliability with probabilistic learning in discrete and continuous tasks: Conceptualization and modeling
|
Park, Kyung S. |
|
1985 |
25 |
1 |
p. 157-166 10 p. |
artikel |
25 |
4450402 Integrated circuit testing apparatus
|
Owen, WilliamH |
|
1985 |
25 |
1 |
p. 202- 1 p. |
artikel |
26 |
4446341 Mechanized testing of subscriber facilities
|
Rubin, Harvey |
|
1985 |
25 |
1 |
p. 201-202 2 p. |
artikel |
27 |
4458349 Method for storing data words in fault tolerant memory to recover uncorrectable errors
|
Aichelmann, FrederickJ |
|
1985 |
25 |
1 |
p. 205- 1 p. |
artikel |
28 |
4459693 Method of and apparatus for the automatic diagnosis of the failure of electrical devices connected to common bus nodes and the like
|
Prang, Joseph |
|
1985 |
25 |
1 |
p. 205- 1 p. |
artikel |
29 |
Modelling the firing tables of field artillery (cannon 105 mm howitzer)
|
Sherif, Y.S |
|
1985 |
25 |
1 |
p. 41-53 13 p. |
artikel |
30 |
On a compound redundant system without repair
|
Fukuta, Jiro |
|
1985 |
25 |
1 |
p. 167-182 16 p. |
artikel |
31 |
Optimal stocking for replacement with minimal repair
|
Park, Y.T. |
|
1985 |
25 |
1 |
p. 147-155 9 p. |
artikel |
32 |
4451742 Power supply control for integrated circuit
|
Aswell, CecilJ |
|
1985 |
25 |
1 |
p. 202- 1 p. |
artikel |
33 |
4455737 Process for and structure of high density VLSI circuits, having selfaligned gates and contacts for FET devices and conducting lines
|
Godejahn, GordonC |
|
1985 |
25 |
1 |
p. 204- 1 p. |
artikel |
34 |
4455739 Process protection for individual device gates on large area MIS devices
|
Hynecek, Jaroslav |
|
1985 |
25 |
1 |
p. 204- 1 p. |
artikel |
35 |
Program solves N-job, M-machine sequencing problem
|
Sherif, Yosef S. |
|
1985 |
25 |
1 |
p. 55-57 3 p. |
artikel |
36 |
Publications, notices, calls for papers, etc.
|
|
|
1985 |
25 |
1 |
p. 5-9 5 p. |
artikel |
37 |
4459685 Redundancy system for high speed, wide-word semiconductor memories
|
Sud, Rahul |
|
1985 |
25 |
1 |
p. 205- 1 p. |
artikel |
38 |
Reliability analysis of non-maintained parallel systems subject to hardware failure and human error
|
Dhillon, Balbir S. |
|
1985 |
25 |
1 |
p. 111-122 12 p. |
artikel |
39 |
Reliability of analogue electron systems
|
G.W.A.D., |
|
1985 |
25 |
1 |
p. 195- 1 p. |
artikel |
40 |
Reverse photolithographic technique for thick film circuits
|
Singh, Awatar |
|
1985 |
25 |
1 |
p. 61-63 3 p. |
artikel |
41 |
Sensitivity analysis of a coherent system
|
Lu, Pei-En |
|
1985 |
25 |
1 |
p. 97-99 3 p. |
artikel |
42 |
Stochastic behaviour of man-machine systems operating under different weather conditions
|
Goel, L.R. |
|
1985 |
25 |
1 |
p. 87-91 5 p. |
artikel |
43 |
4455654 Test apparatus for electronic assemblies employing a microprocessor
|
Bhaskar, KasiS |
|
1985 |
25 |
1 |
p. 203-204 2 p. |
artikel |
44 |
The microelectronics applications of differential scanning calorimetry for packaging and materials—Including solder pastes
|
Anjard Sr., Ronald P. |
|
1985 |
25 |
1 |
p. 9-16 8 p. |
artikel |