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                             101 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A compilation technique for exact system reliability 1982
 22 5 p. 1040-
1 p.
 artikel
2 A generalized block-replacement policy 1982
 22 5 p. 1041-
1 p.
 artikel
3 Analysis of coherent multistate systems 1982
 22 5 p. 1040-
1 p.
 artikel
4 Analysis of performance-degradation data from accelerated tests 1982
 22 5 p. 1042-
1 p.
 artikel
5 4334880 Analytical device having semiconductive polyacetylene element associated with analyte-binding substance Malmros, M.K.
 1982
 22 5 p. 1049-
1 p.
 artikel
6 An efficient computational technique for evaluating the cut/tie sets and common-cause failures of complex systems 1982
 22 5 p. 1042-1043
2 p.
 artikel
7 An experimental comparison of the heuristic methods for solving reliability optimization problems 1982
 22 5 p. 1041-
1 p.
 artikel
8 An extension of the block preventive maintenance policy for stochastically failing items Alley, Lebert R.
 1982
 22 5 p. 1027-1032
6 p.
 artikel
9 An integrated LSI design aids system 1982
 22 5 p. 1043-
1 p.
 artikel
10 Anomalous thermoelastic effect in silicon 1982
 22 5 p. 1044-
1 p.
 artikel
11 4336438 Apparatus for automatic semi-batch sheet treatment of semiconductor wafers by plasma reaction Uehara, A
 1982
 22 5 p. 1053-1054
2 p.
 artikel
12 4335350 Apparatus for probing semiconductor wafers 1982
 22 5 p. 1050-
1 p.
 artikel
13 A summary of optimal ordering policies 1982
 22 5 p. 1041-
1 p.
 artikel
14 Availability of a 2-component dependent system 1982
 22 5 p. 1041-
1 p.
 artikel
15 4337524 Backup power circuit for biasing bit lines of a static semiconductor memory Parkinson, W.D.
 1982
 22 5 p. 1051-
1 p.
 artikel
16 Bivariate survival model derived from a Weibull distribution 1982
 22 5 p. 1042-
1 p.
 artikel
17 Calculating the failure frequency of a repairable system Zhi, Huang Xi
 1982
 22 5 p. 945-947
3 p.
 artikel
18 Calculation of age-replacement with Weibull failure times 1982
 22 5 p. 1042-
1 p.
 artikel
19 Carrier mobilities in silicon semi-empirically related to temperature, doping and injection level 1982
 22 5 p. 1044-
1 p.
 artikel
20 Chip carriers mounted on large thick film multilayer boards 1982
 22 5 p. 1045-
1 p.
 artikel
21 C-MOS inspires the best chips yet for computer, consumer, and communication applications 1982
 22 5 p. 1043-
1 p.
 artikel
22 Computer-assisted development of hybrid integrated hyperfrequency circuits 1982
 22 5 p. 1046-
1 p.
 artikel
23 Conductance of small semiconductor devices 1982
 22 5 p. 1044-
1 p.
 artikel
24 Confidence estimates of reliability for complex systems 1982
 22 5 p. 1041-
1 p.
 artikel
25 Current developments in product liability affecting international commerce 1982
 22 5 p. 1039-
1 p.
 artikel
26 D—a converter has versatile on-chip up-down counter 1982
 22 5 p. 1043-
1 p.
 artikel
27 Decomposition method for computing the reliability of complex networks 1982
 22 5 p. 1040-
1 p.
 artikel
28 Dependability modeling of safety systems Laprie, J.C.
 1982
 22 5 p. 997-1026
30 p.
 artikel
29 Design and evaluation of RC active filters for hybrid thick film implementation 1982
 22 5 p. 1045-
1 p.
 artikel
30 Devices and circuits for bipolar (V) LSI 1982
 22 5 p. 1043-
1 p.
 artikel
31 Do flame retardants affect the reliability of molded plastic packages 1982
 22 5 p. 1039-
1 p.
 artikel
32 Electrical characteristics of polymer thick film resistors, Part I: experimental results 1982
 22 5 p. 1045-
1 p.
 artikel
33 Enumeration of success paths in a graph Hura, G.S.
 1982
 22 5 p. 1033-1034
2 p.
 artikel
34 Environmental effects on copper thick film microcircuits 1982
 22 5 p. 1044-1045
2 p.
 artikel
35 EPROM testing — Part II: Application to 16K N-channel devices Alliney, S.
 1982
 22 5 p. 987-996
10 p.
 artikel
36 EPROM testing — part I: Theoretical considerations Alliney, S.
 1982
 22 5 p. 965-986
22 p.
 artikel
37 Erratum 1982
 22 5 p. 986-
1 p.
 artikel
38 Exact statistical tolerance limits for sample variances from non-normal populations 1982
 22 5 p. 1041-
1 p.
 artikel
39 Fault diagnosis with imperfect tests 1982
 22 5 p. 1041-1042
2 p.
 artikel
40 Input keys for electronic measuring devices with high reliability requirements, tests and characteristics 1982
 22 5 p. 1039-1040
2 p.
 artikel
41 4334235 Insulated gate type semiconductor device Nishizawa, J
 1982
 22 5 p. 1048-1049
2 p.
 artikel
42 Large scale integration and packaging technologies for telecommunication equipment 1982
 22 5 p. 1043-
1 p.
 artikel
43 Large scale integration techniques for telecommunication 1982
 22 5 p. 1043-
1 p.
 artikel
44 Les problemes de brasabilite dans l'industrie electronique spatiale Billot, Marc
 1982
 22 5 p. 919-927
9 p.
 artikel
45 Life cycle cost: a survey 1982
 22 5 p. 1039-
1 p.
 artikel
46 Likelihood function of a debugging model for computer software reliability 1982
 22 5 p. 1042-
1 p.
 artikel
47 Main tendencies of the development to digital telecommunication 1982
 22 5 p. 1044-
1 p.
 artikel
48 Measurement procedure for evaluating the equivalent circuit elements of bond wires in microwave integrated circuits 1982
 22 5 p. 1043-
1 p.
 artikel
49 4335457 Method for semiconductor memory testing Early, J.M.
 1982
 22 5 p. 1050-
1 p.
 artikel
50 4337115 Method of forming electrodes on the surface of a semiconductor substrate Ikeda, M
 1982
 22 5 p. 1054-
1 p.
 artikel
51 4335505 Method of manufacturing semiconductor memory device having memory cell elements composed of a transistor and a capacitor Shibata, H
 1982
 22 5 p. 1053-
1 p.
 artikel
52 4334349 Method of producing semiconductor device Aoyama, M
 1982
 22 5 p. 1052-
1 p.
 artikel
53 Methods for calculating point-to-point congestion in switched communication networks Rai, Suresh
 1982
 22 5 p. 941-943
3 p.
 artikel
54 Mini fire extinguishers spark off row 1982
 22 5 p. 917-918
2 p.
 artikel
55 Minimal-cut reliability lower-bound for systems containing standby modules 1982
 22 5 p. 1040-
1 p.
 artikel
56 Modified periodic replacement with minimal repair at failure 1982
 22 5 p. 1042-
1 p.
 artikel
57 4337526 Monolithically integrable semiconductor memory Rosler, H
 1982
 22 5 p. 1052-
1 p.
 artikel
58 New mounting technologies in the manufacture of hybrid circuits 1982
 22 5 p. 1046-
1 p.
 artikel
59 Nondestructive infrared inspection of hybrid microcircuit substrate-to-package thermal adhesive bonds 1982
 22 5 p. 1045-
1 p.
 artikel
60 4335391 Non-volatile semiconductor memory elements and methods of making Morris, H.B.
 1982
 22 5 p. 1052-1053
2 p.
 artikel
61 [No title] G.W.A.D.,
 1982
 22 5 p. 1038-
1 p.
 artikel
62 [No title] G.W.A.D.,
 1982
 22 5 p. 1037-
1 p.
 artikel
63 Optimal inspection policy for multistage production process with alternate inspection plans 1982
 22 5 p. 1040-
1 p.
 artikel
64 Optimal reliability design for complex systems 1982
 22 5 p. 1040-1041
2 p.
 artikel
65 Optimal replication for a specific system objective 1982
 22 5 p. 1042-
1 p.
 artikel
66 Optimization of assembly code generation in a compiler Hura, G.S.
 1982
 22 5 p. 1035-1036
2 p.
 artikel
67 Optimum repair limit policies with a cost constraint 1982
 22 5 p. 1039-
1 p.
 artikel
68 Optimum replacement policies for a system composed of components 1982
 22 5 p. 1041-
1 p.
 artikel
69 Parametric analysis of 2-unit redundant computer systems with corrective and preventive maintenance 1982
 22 5 p. 1041-
1 p.
 artikel
70 Preparation and some magnetic properties of amorphous rare earth—transition metal films with perpendicular anisotropy for bubble memories 1982
 22 5 p. 1045-
1 p.
 artikel
71 Prime implicants of noncoherent fault trees 1982
 22 5 p. 1043-
1 p.
 artikel
72 Publications, notices, calls for papers, etc. 1982
 22 5 p. 913-916
4 p.
 artikel
73 Punch-through currents in P + NP + and N + PN + sandwich structures—II. General low-injection theory and measurements 1982
 22 5 p. 1044-
1 p.
 artikel
74 Punch-through currents in P + NP + and N + PN + sandwich structures—I. Introduction and basic calculations 1982
 22 5 p. 1044-
1 p.
 artikel
75 Quality deficiency: diagnosis and remedy—a case study 1982
 22 5 p. 1041-
1 p.
 artikel
76 Recombination properties of a diffused PN junction determined by spectral response measurements 1982
 22 5 p. 1044-
1 p.
 artikel
77 Reliability analysis and optimal redundancy for majority-voted logic circuits 1982
 22 5 p. 1042-
1 p.
 artikel
78 Reliability of electronic components. Part 1: reliability parameters and failure mechanisms 1982
 22 5 p. 1039-
1 p.
 artikel
79 4334294 Restore circuit for a semiconductor storage Heuber, K
 1982
 22 5 p. 1047-
1 p.
 artikel
80 Reverse photo-lithographic technique for S.A.W. devices Singh, Awatar
 1982
 22 5 p. 949-950
2 p.
 artikel
81 Review of ion-implanted bubble devices 1982
 22 5 p. 1046-
1 p.
 artikel
82 4337474 Semiconductor device Yukimoto, Y
 1982
 22 5 p. 1051-
1 p.
 artikel
83 4335362 Semiconductor device and a method of contacting a partial region of a semiconductor surface Salathe, R.P.
 1982
 22 5 p. 1050-
1 p.
 artikel
84 4335392 Semiconductor device with at least two semiconductor elements Reiter, K
 1982
 22 5 p. 1047-1048
2 p.
 artikel
85 4337443 Semiconductor laser device with facet passivation film Umeda, J
 1982
 22 5 p. 1051-
1 p.
 artikel
86 4334293 Semiconductor memory cell with clocked voltage supply from data lines Ponder, J.E.
 1982
 22 5 p. 1049-
1 p.
 artikel
87 4336528 Semiconductor resistive network Kane, J
 1982
 22 5 p. 1048-
1 p.
 artikel
88 Signal-flow-based graphs for failure-mode analysis of systems with control loops 1982
 22 5 p. 1040-
1 p.
 artikel
89 Silver migration in thick film conductors and chip attachment resins 1982
 22 5 p. 1046-
1 p.
 artikel
90 Steady-state availability of a system with two subsystems working alternately Maruthachalam, C.
 1982
 22 5 p. 935-940
6 p.
 artikel
91 Surrogate constraints algorithm for reliability optimization problems with two constraints 1982
 22 5 p. 1041-
1 p.
 artikel
92 Systems in reduced efficiency and alternating periods Maruthachalam, C.
 1982
 22 5 p. 929-934
6 p.
 artikel
93 Testing and reliability of throughplatings in thin-film hybrid-circuits 1982
 22 5 p. 1046-
1 p.
 artikel
94 The contiguous disk technology for high density bubble memories 1982
 22 5 p. 1046-
1 p.
 artikel
95 Theoretical analysis of Hall factor and Hall mobility in p-type silicon 1982
 22 5 p. 1044-
1 p.
 artikel
96 4334311 Transverse junction stripe semiconductor laser device Oomura, E
 1982
 22 5 p. 1049-
1 p.
 artikel
97 Two repairable multistate devices with general repair-time distributions 1982
 22 5 p. 1042-
1 p.
 artikel
98 VLSI circuit development for future applications 1982
 22 5 p. 1043-
1 p.
 artikel
99 Weapons systems analysis, Part III: Warfare gaming, tactics and techniques Sherif, Yosef S.
 1982
 22 5 p. 951-964
14 p.
 artikel
100 What to do when the bits go out 1982
 22 5 p. 1040-
1 p.
 artikel
101 X-ray and microscopic investigations of resistors containing CdO and RuO2 1982
 22 5 p. 1046-
1 p.
 artikel
                             101 gevonden resultaten
 
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