| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A Kolmogorov - Smirnov goodness-of-fit test for the two-parameter weibull distribution when the parameters are estimated from the data
|
Parsons, F.G
|
|
1982
|
22 |
2 |
p. 163-167
5 p.
|
artikel
|
| 2 |
An introduction to mini and micro computers
|
G.W.A.D,
|
|
1982
|
22 |
2 |
p. 314-315
2 p.
|
artikel
|
| 3 |
An introduction to thick film component technology
|
G.W.A.D,
|
|
1982
|
22 |
2 |
p. 315-316
2 p.
|
artikel
|
| 4 |
Availability modelling of ring microcomputer systems
|
Lombardi, F
|
|
1982
|
22 |
2 |
p. 295-308
14 p.
|
artikel
|
| 5 |
Editorial
|
Ryerson, Clifford M
|
|
1982
|
22 |
2 |
p. 145-
1 p.
|
artikel
|
| 6 |
Engineering reliability: New techniques and applications
|
G.W.A.D,
|
|
1982
|
22 |
2 |
p. 316-317
2 p.
|
artikel
|
| 7 |
Estimation of total errors in software
|
Islam, M
|
|
1982
|
22 |
2 |
p. 281-285
5 p.
|
artikel
|
| 8 |
Handbook of printed circuit design, manufacture, components and assembly
|
G.W.A.D,
|
|
1982
|
22 |
2 |
p. 318-319
2 p.
|
artikel
|
| 9 |
Improved cost effectiveness for new satellite systems
|
Behmann, François F
|
|
1982
|
22 |
2 |
p. 169-176
8 p.
|
artikel
|
| 10 |
Modeling systems with high early failure occurrence patterns
|
Sherif, Y.S
|
|
1982
|
22 |
2 |
p. 147-149
3 p.
|
artikel
|
| 11 |
On a model for software reliability performance
|
Strandberg, Kjell
|
|
1982
|
22 |
2 |
p. 227-240
14 p.
|
artikel
|
| 12 |
Practical reliability engineering
|
G.W.A.D,
|
|
1982
|
22 |
2 |
p. 313-314
2 p.
|
artikel
|
| 13 |
Preventive maintenance of a 1-unit system with two types of repair
|
Kowada, Masasi
|
|
1982
|
22 |
2 |
p. 287-293
7 p.
|
artikel
|
| 14 |
Punch-through gate protection of M.O.S. devices
|
Miller, C.A
|
|
1982
|
22 |
2 |
p. 187-193
7 p.
|
artikel
|
| 15 |
Quality improvement program addressed to M.O.S. microprocessors
|
Hutchins, Charles L
|
|
1982
|
22 |
2 |
p. 207-216
10 p.
|
artikel
|
| 16 |
Reliability and maintainability of electronic systems
|
G.W.A.D,
|
|
1982
|
22 |
2 |
p. 312-
1 p.
|
artikel
|
| 17 |
Reliability evaluation of some fault-tolerant computer architectures
|
G.W.A.D,
|
|
1982
|
22 |
2 |
p. 311-
1 p.
|
artikel
|
| 18 |
Sequential evaluation of terminal pair reliability in a reliability network
|
Kumar, Santosh
|
|
1982
|
22 |
2 |
p. 151-162
12 p.
|
artikel
|
| 19 |
Some stress-strength reliability models
|
Chung, Who Kee
|
|
1982
|
22 |
2 |
p. 277-280
4 p.
|
artikel
|
| 20 |
Step-repeat pattern generation technique
|
Singh, Awatar
|
|
1982
|
22 |
2 |
p. 309-310
2 p.
|
artikel
|
| 21 |
Stochastic and deterministic averaging processors
|
G.W.A.D,
|
|
1982
|
22 |
2 |
p. 313-
1 p.
|
artikel
|
| 22 |
Systems safety: A survey
|
Dhillon, Balbir S
|
|
1982
|
22 |
2 |
p. 265-275
11 p.
|
artikel
|
| 23 |
Test device structures for integrated circuit design, process technology development and evaluation
|
Srivastava, A
|
|
1982
|
22 |
2 |
p. 195-206
12 p.
|
artikel
|
| 24 |
The application of marginal voltage measurements to detect and locate defects in digital microcircuits
|
Ager, D.J
|
|
1982
|
22 |
2 |
p. 241-264
24 p.
|
artikel
|
| 25 |
The common thread for operational reliability and failure physics
|
Wong, Kam L
|
|
1982
|
22 |
2 |
p. 177-186
10 p.
|
artikel
|
| 26 |
The first passage time distribution of brownian motion and its applications
|
Sherif, Y.S
|
|
1982
|
22 |
2 |
p. 217-226
10 p.
|
artikel
|
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