| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Accelerated life testing for LSI failure mechanisms
|
|
|
1978
|
18 |
6 |
p. 476-
1 p.
|
artikel
|
| 2 |
Accelerated reliability evaluation of trimetal integrated circuit chips in plastic packages
|
|
|
1978
|
18 |
6 |
p. 476-
1 p.
|
artikel
|
| 3 |
Accelerated testing in FAMOS Devices—8K EPROM
|
|
|
1978
|
18 |
6 |
p. 478-
1 p.
|
artikel
|
| 4 |
A delta-star transformation approach for reliability evaluation
|
|
|
1978
|
18 |
6 |
p. 480-
1 p.
|
artikel
|
| 5 |
Advances in ceramic chip carriers and multilayer substrate technologies
|
|
|
1978
|
18 |
6 |
p. 482-
1 p.
|
artikel
|
| 6 |
Aging of highly N-doped α-Ta thin-film capacitors
|
|
|
1978
|
18 |
6 |
p. 484-
1 p.
|
artikel
|
| 7 |
A go-not-go reliability assessment procedure—“HI-FMECA”
|
|
|
1978
|
18 |
6 |
p. 479-
1 p.
|
artikel
|
| 8 |
A moment approach to evaluation and optimization of complex system reliability
|
|
|
1978
|
18 |
6 |
p. 478-
1 p.
|
artikel
|
| 9 |
Analysis of the interaction of an electron beam with a solar cell—I
|
|
|
1978
|
18 |
6 |
p. 485-
1 p.
|
artikel
|
| 10 |
Analysis of the interaction of an electron beam with solar cell—II
|
|
|
1978
|
18 |
6 |
p. 485-
1 p.
|
artikel
|
| 11 |
Analytical techniques for electronic materials—A comparative evaluation
|
|
|
1978
|
18 |
6 |
p. 476-
1 p.
|
artikel
|
| 12 |
An efficient method for reliability evaluation of a general network
|
|
|
1978
|
18 |
6 |
p. 479-
1 p.
|
artikel
|
| 13 |
An efficient simple algorithm for fault tree automatic synthesis from the reliability graph
|
|
|
1978
|
18 |
6 |
p. 479-
1 p.
|
artikel
|
| 14 |
A new electrostatic discharge failure mode
|
|
|
1978
|
18 |
6 |
p. 483-
1 p.
|
artikel
|
| 15 |
A new physical mechanism for soft errors in dynamic memories
|
|
|
1978
|
18 |
6 |
p. 480-
1 p.
|
artikel
|
| 16 |
An operating system for a microprocessor-based interactive graphic terminal
|
|
|
1978
|
18 |
6 |
p. 483-
1 p.
|
artikel
|
| 17 |
A reliable dry ceramic dual in-line package (CERDIP)
|
|
|
1978
|
18 |
6 |
p. 476-
1 p.
|
artikel
|
| 18 |
Assessing product liability through material failure analysis
|
|
|
1978
|
18 |
6 |
p. 479-
1 p.
|
artikel
|
| 19 |
A study of accelerated storage test conditions applicable to semiconductor devices and microcircuits
|
|
|
1978
|
18 |
6 |
p. 474-
1 p.
|
artikel
|
| 20 |
A study of Al/PtSi/Si thin film reaction kinetics by X-ray diffraction
|
|
|
1978
|
18 |
6 |
p. 483-484
2 p.
|
artikel
|
| 21 |
A two-gun ion beam system for dynamic recoil implantation
|
|
|
1978
|
18 |
6 |
p. 485-
1 p.
|
artikel
|
| 22 |
Auditing—A product liability prevention tool
|
|
|
1978
|
18 |
6 |
p. 479-
1 p.
|
artikel
|
| 23 |
Automatic registration in an electron-beam lithographic system
|
|
|
1978
|
18 |
6 |
p. 485-
1 p.
|
artikel
|
| 24 |
Availability of a reduadant system
|
|
|
1978
|
18 |
6 |
p. 478-
1 p.
|
artikel
|
| 25 |
Bayesian approach to the prediction problem in the exponential population
|
|
|
1978
|
18 |
6 |
p. 480-
1 p.
|
artikel
|
| 26 |
Behaviour of a two correlated units redundant system with many types of failure
|
|
|
1978
|
18 |
6 |
p. 479-480
2 p.
|
artikel
|
| 27 |
Bibliography of literature on fault trees
|
|
|
1978
|
18 |
6 |
p. 473-
1 p.
|
artikel
|
| 28 |
Calendar of International Conferences, Symposia, Lectures and Meetings of Interest
|
|
|
1978
|
18 |
6 |
p. 451-454
4 p.
|
artikel
|
| 29 |
Calls for papers, etc.
|
|
|
1978
|
18 |
6 |
p. 455-461
7 p.
|
artikel
|
| 30 |
Capacitors of thin insulating films of photoresist materials
|
|
|
1978
|
18 |
6 |
p. 484-
1 p.
|
artikel
|
| 31 |
Ceramic capacitor insulation resistance failures accelerated by low voltage
|
|
|
1978
|
18 |
6 |
p. 475-
1 p.
|
artikel
|
| 32 |
Chip carriers as a means for high-density packaging
|
|
|
1978
|
18 |
6 |
p. 482-
1 p.
|
artikel
|
| 33 |
Conference report
|
Mittal, K.L.
|
|
1978
|
18 |
6 |
p. 471-472
2 p.
|
artikel
|
| 34 |
Corrosion of in-base solders
|
|
|
1978
|
18 |
6 |
p. 476-
1 p.
|
artikel
|
| 35 |
Cross-modulation and intermodulation performance of MOS-FET's in tuned high-frequency amplifiers
|
|
|
1978
|
18 |
6 |
p. 482-
1 p.
|
artikel
|
| 36 |
Decision tools for use by management
|
|
|
1978
|
18 |
6 |
p. 473-
1 p.
|
artikel
|
| 37 |
Degradation of PVF2 capacitors during accelerated test
|
|
|
1978
|
18 |
6 |
p. 478-
1 p.
|
artikel
|
| 38 |
Dependence of the operating point on h.f. characteristics of bipolar integrated transistors
|
|
|
1978
|
18 |
6 |
p. 481-482
2 p.
|
artikel
|
| 39 |
Determination of strain in 10 μm spots using a microdiffractometer
|
|
|
1978
|
18 |
6 |
p. 482-
1 p.
|
artikel
|
| 40 |
Developing an approach to semiconductor failure analysis and curve tracer interpretation
|
|
|
1978
|
18 |
6 |
p. 483-
1 p.
|
artikel
|
| 41 |
Double level metallurgy defect study
|
|
|
1978
|
18 |
6 |
p. 483-
1 p.
|
artikel
|
| 42 |
Double-sided photolithography
|
|
|
1978
|
18 |
6 |
p. 481-
1 p.
|
artikel
|
| 43 |
Electrical overstress failure analysis in microcircuits
|
|
|
1978
|
18 |
6 |
p. 476-
1 p.
|
artikel
|
| 44 |
Electrical properties of (SN) x films
|
|
|
1978
|
18 |
6 |
p. 484-
1 p.
|
artikel
|
| 45 |
Electromigration failure under pulse test conditions
|
|
|
1978
|
18 |
6 |
p. 474-475
2 p.
|
artikel
|
| 46 |
Electromigration of Al-Si alloy films
|
|
|
1978
|
18 |
6 |
p. 484-
1 p.
|
artikel
|
| 47 |
Electron transport in very thin multilayers of Al-Al2O3
|
|
|
1978
|
18 |
6 |
p. 484-
1 p.
|
artikel
|
| 48 |
Electrostatic damage susceptibility of semiconductor devices
|
|
|
1978
|
18 |
6 |
p. 483-
1 p.
|
artikel
|
| 49 |
Evaluating system reliability
|
|
|
1978
|
18 |
6 |
p. 480-
1 p.
|
artikel
|
| 50 |
Evaluation of epitaxial planar transistors based on their double diffused impurity profile distribution
|
Srivastava, A.
|
|
1978
|
18 |
6 |
p. 505-510
6 p.
|
artikel
|
| 51 |
Experimental determination of a more powerful burn-in
|
|
|
1978
|
18 |
6 |
p. 479-
1 p.
|
artikel
|
| 52 |
Failure analysis of passive devices
|
|
|
1978
|
18 |
6 |
p. 476-
1 p.
|
artikel
|
| 53 |
Failure of small thin film conductors due to high current-density pulses
|
|
|
1978
|
18 |
6 |
p. 475-
1 p.
|
artikel
|
| 54 |
Graded band-gap pAl x Ga 1−x As−GaAs heterojunction solar cells prepared by molecular beam epitaxy
|
|
|
1978
|
18 |
6 |
p. 485-
1 p.
|
artikel
|
| 55 |
H-MOS reliability
|
|
|
1978
|
18 |
6 |
p. 475-
1 p.
|
artikel
|
| 56 |
Human reliability engineering
|
|
|
1978
|
18 |
6 |
p. 473-474
2 p.
|
artikel
|
| 57 |
Improved reliability and yield in thin thermal SiO2
|
|
|
1978
|
18 |
6 |
p. 484-
1 p.
|
artikel
|
| 58 |
Influence of electrical bias level on 85/85 test results of plastic encapsulated 4K RAMS
|
|
|
1978
|
18 |
6 |
p. 477-478
2 p.
|
artikel
|
| 59 |
Introduction to microelectronics, 2nd edition
|
G.W.A.D.,
|
|
1978
|
18 |
6 |
p. 488-
1 p.
|
artikel
|
| 60 |
Laboratory accreditation and its relation to product liability
|
|
|
1978
|
18 |
6 |
p. 473-
1 p.
|
artikel
|
| 61 |
Life characteristics of plastic encapsulated semiconductor devices
|
|
|
1978
|
18 |
6 |
p. 474-
1 p.
|
artikel
|
| 62 |
Measurement of series resistance of a pn junction diode and its applications in the analysis of integrated curcuits
|
|
|
1978
|
18 |
6 |
p. 481-
1 p.
|
artikel
|
| 63 |
Microcircuit analysis techniques using field effect liquid crystals
|
|
|
1978
|
18 |
6 |
p. 477-
1 p.
|
artikel
|
| 64 |
Microcomputers invade the linear world
|
|
|
1978
|
18 |
6 |
p. 480-
1 p.
|
artikel
|
| 65 |
Miner's rule in mechanical tests of electronic parts
|
|
|
1978
|
18 |
6 |
p. 474-
1 p.
|
artikel
|
| 66 |
Model for MOS field-time-dependent breakdown
|
|
|
1978
|
18 |
6 |
p. 483-
1 p.
|
artikel
|
| 67 |
Multi-level self-diagnosis and fault tolerance in a multimicroprocessor system
|
|
|
1978
|
18 |
6 |
p. 478-
1 p.
|
artikel
|
| 68 |
Near IR absorption in films of silicon containing oxygen
|
|
|
1978
|
18 |
6 |
p. 483-
1 p.
|
artikel
|
| 69 |
New acceleration factors for temperature, humidity, bias testing
|
|
|
1978
|
18 |
6 |
p. 483-
1 p.
|
artikel
|
| 70 |
New concerns about integrated circuit reliability
|
|
|
1978
|
18 |
6 |
p. 475-476
2 p.
|
artikel
|
| 71 |
New hazard rate functions
|
Dhillon, Balbir S.
|
|
1978
|
18 |
6 |
p. 531-532
2 p.
|
artikel
|
| 72 |
Noise analysis study of semiconductor devices for reliability improvement
|
Khobare, S.K.
|
|
1978
|
18 |
6 |
p. 489-493
5 p.
|
artikel
|
| 73 |
On common-cause failures—Bibliography
|
Dhillon, Balbir S.
|
|
1978
|
18 |
6 |
p. 533-534
2 p.
|
artikel
|
| 74 |
Optimum preventive maintenance policy for two-unit priority standby redundant system with minimal repair
|
Ohashi, Mamoru
|
|
1978
|
18 |
6 |
p. 535-538
4 p.
|
artikel
|
| 75 |
Photoresist technology and processing techniques for fine dimensional control
|
|
|
1978
|
18 |
6 |
p. 481-
1 p.
|
artikel
|
| 76 |
Probability of displacement damage in a component exposed to nuclear radiation stress from the viewpoint of reliability
|
|
|
1978
|
18 |
6 |
p. 474-
1 p.
|
artikel
|
| 77 |
Process testing for reliability control
|
|
|
1978
|
18 |
6 |
p. 476-477
2 p.
|
artikel
|
| 78 |
Product liability in Europe
|
|
|
1978
|
18 |
6 |
p. 473-
1 p.
|
artikel
|
| 79 |
Products liability—Current state of the law
|
|
|
1978
|
18 |
6 |
p. 473-
1 p.
|
artikel
|
| 80 |
Quantitative H2O determination in components using a plasma chromatograph—mass spectrometer
|
|
|
1978
|
18 |
6 |
p. 480-
1 p.
|
artikel
|
| 81 |
Recent patents on microelectronics
|
|
|
1978
|
18 |
6 |
p. 463-469
7 p.
|
artikel
|
| 82 |
Reduction of waste resulting from mask defects
|
|
|
1978
|
18 |
6 |
p. 481-
1 p.
|
artikel
|
| 83 |
Reed switch reliability
|
|
|
1978
|
18 |
6 |
p. 474-
1 p.
|
artikel
|
| 84 |
Reliability analysis of multistate device networks
|
|
|
1978
|
18 |
6 |
p. 478-
1 p.
|
artikel
|
| 85 |
Reliability analysis of standby repairable systems when an emergency occurs
|
|
|
1978
|
18 |
6 |
p. 479-
1 p.
|
artikel
|
| 86 |
Reliability engineering in microelectronics
|
|
|
1978
|
18 |
6 |
p. 480-
1 p.
|
artikel
|
| 87 |
Reliability evaluation program and results for a 4K dynamic RAM
|
|
|
1978
|
18 |
6 |
p. 475-
1 p.
|
artikel
|
| 88 |
Reliability of dynamic fatigue data for plastic coated fused silica optical waveguide fibers
|
|
|
1978
|
18 |
6 |
p. 475-
1 p.
|
artikel
|
| 89 |
Reliability of epoxy and silicone molded tape-carrier silicon integrated circuits with various chip-protective coatings
|
|
|
1978
|
18 |
6 |
p. 477-
1 p.
|
artikel
|
| 90 |
Reliability study of high efficiency gallium arsenide avalanche diodes
|
|
|
1978
|
18 |
6 |
p. 477-
1 p.
|
artikel
|
| 91 |
Reliability study of microwave GaAs field-effect transistors
|
|
|
1978
|
18 |
6 |
p. 477-
1 p.
|
artikel
|
| 92 |
Reliability testing of fluorinated polymeric materials (FNP) for hybrid encapsulation
|
|
|
1978
|
18 |
6 |
p. 484-
1 p.
|
artikel
|
| 93 |
Scanning eletron microscopy for complex microcircuit analysis
|
|
|
1978
|
18 |
6 |
p. 485-
1 p.
|
artikel
|
| 94 |
Semiconductor component reliability in an equipment operating in electromechanical telephone exchanges
|
|
|
1978
|
18 |
6 |
p. 480-
1 p.
|
artikel
|
| 95 |
Simulation model of mission effectiveness for military systems
|
|
|
1978
|
18 |
6 |
p. 478-479
2 p.
|
artikel
|
| 96 |
Solid-state devices and the age of indelence
|
|
|
1978
|
18 |
6 |
p. 480-481
2 p.
|
artikel
|
| 97 |
Solid-state serial memories—The role of bubbles and c.c.d.s.
|
|
|
1978
|
18 |
6 |
p. 481-
1 p.
|
artikel
|
| 98 |
Solutions for the process engineering and circuit technique of LSI circuits
|
|
|
1978
|
18 |
6 |
p. 481-
1 p.
|
artikel
|
| 99 |
Some aspects of cost minimization of a thick film hybrid high-power device
|
Kramek, Jan P.
|
|
1978
|
18 |
6 |
p. 523-530
8 p.
|
artikel
|
| 100 |
Some package reliability implications of current trends in large scale silicon integrated circuits
|
|
|
1978
|
18 |
6 |
p. 480-
1 p.
|
artikel
|
| 101 |
Staggered testing of electronic systems revisited
|
|
|
1978
|
18 |
6 |
p. 479-
1 p.
|
artikel
|
| 102 |
Standards development for technical aspects of products liability litigation
|
|
|
1978
|
18 |
6 |
p. 473-
1 p.
|
artikel
|
| 103 |
Symbolic reliability evaluation using logical signal relations
|
|
|
1978
|
18 |
6 |
p. 478-
1 p.
|
artikel
|
| 104 |
Tape assembled components. A packaging option
|
|
|
1978
|
18 |
6 |
p. 482-
1 p.
|
artikel
|
| 105 |
Test chips in LSI reliability assurance
|
|
|
1978
|
18 |
6 |
p. 475-
1 p.
|
artikel
|
| 106 |
Testing for reliability qualification of semiconductor memory devices
|
|
|
1978
|
18 |
6 |
p. 477-
1 p.
|
artikel
|
| 107 |
The application of electrical overstress models to gate protective networks
|
|
|
1978
|
18 |
6 |
p. 483-
1 p.
|
artikel
|
| 108 |
The construction and reliability of Schottky diodes
|
|
|
1978
|
18 |
6 |
p. 474-
1 p.
|
artikel
|
| 109 |
The development of heavy current electricity in the United Kingdom
|
G.W.A.D.,
|
|
1978
|
18 |
6 |
p. 487-
1 p.
|
artikel
|
| 110 |
The distributed RC variable-frequency phase-shift oscillator
|
|
|
1978
|
18 |
6 |
p. 481-
1 p.
|
artikel
|
| 111 |
The Federal Government and product liability
|
|
|
1978
|
18 |
6 |
p. 474-
1 p.
|
artikel
|
| 112 |
The reduction of Au-Al intermetallic formation and electromigration in hydrogen environments
|
|
|
1978
|
18 |
6 |
p. 482-
1 p.
|
artikel
|
| 113 |
The reliability of a system subject to revealed and unrevealed faults
|
Phillips, M.J.
|
|
1978
|
18 |
6 |
p. 495-503
9 p.
|
artikel
|
| 114 |
The use of laser and infrared scanning techniques in reliability assurance
|
Edwards, W.D.
|
|
1978
|
18 |
6 |
p. 511-522
12 p.
|
artikel
|
| 115 |
Ultra-high density VLSI modules
|
|
|
1978
|
18 |
6 |
p. 482-
1 p.
|
artikel
|
| 116 |
VMOS electrostatic protection
|
|
|
1978
|
18 |
6 |
p. 476-
1 p.
|
artikel
|
| 117 |
Water vaper penetration rate into enclosures with known air leak rates
|
|
|
1978
|
18 |
6 |
p. 482-
1 p.
|
artikel
|
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