| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A Bayesian note on reliability growth during a development testing program
|
|
|
1978
|
17 |
5 |
p. 486-
1 p.
|
artikel
|
| 2 |
A direct method to calculate the frequency and duration of failures for large networks
|
|
|
1978
|
17 |
5 |
p. 486-
1 p.
|
artikel
|
| 3 |
A high speed ECL multiplexer in beam lead, hybrid technology
|
|
|
1978
|
17 |
5 |
p. 487-488
2 p.
|
artikel
|
| 4 |
Alloy element additions to gold thick film conductors: Effects on indium/lead soldering and ultrasonic aluminum wire bonding
|
|
|
1978
|
17 |
5 |
p. 493-
1 p.
|
artikel
|
| 5 |
Alloy scattering and high field transport in ternary and quaternary III–V semiconductors
|
|
|
1978
|
17 |
5 |
p. 491-
1 p.
|
artikel
|
| 6 |
A method for estimating the reliability of ICs
|
|
|
1978
|
17 |
5 |
p. 483-
1 p.
|
artikel
|
| 7 |
A method of automatic centering of chips, masks and semiconductor wafers
|
|
|
1978
|
17 |
5 |
p. 487-
1 p.
|
artikel
|
| 8 |
Amorphous semiconducting silicon-hydrogen alloys
|
|
|
1978
|
17 |
5 |
p. 488-
1 p.
|
artikel
|
| 9 |
A new concept in calculation of thick film resistors
|
|
|
1978
|
17 |
5 |
p. 493-
1 p.
|
artikel
|
| 10 |
An experimental application of microprocessors to railway signalling
|
|
|
1978
|
17 |
5 |
p. 489-
1 p.
|
artikel
|
| 11 |
An optimum procedure for component testing in the demonstration of series system reliability
|
|
|
1978
|
17 |
5 |
p. 483-
1 p.
|
artikel
|
| 12 |
A recursive algorithm for bounding network reliability
|
|
|
1978
|
17 |
5 |
p. 486-
1 p.
|
artikel
|
| 13 |
A survey of published information on universal logic arrays
|
|
|
1978
|
17 |
5 |
p. 489-
1 p.
|
artikel
|
| 14 |
A unified availability analysis method for sysstems containing design errors
|
|
|
1978
|
17 |
5 |
p. 486-
1 p.
|
artikel
|
| 15 |
A 4-unit redundant system with common-cause failures
|
|
|
1978
|
17 |
5 |
p. 484-
1 p.
|
artikel
|
| 16 |
Behaviour of a two correlated units redundant system with many types of failure
|
Itoi, Takashi
|
|
1978
|
17 |
5 |
p. 517-522
6 p.
|
artikel
|
| 17 |
Bibliography of literature on fault trees
|
Dhillon, Balbir S.
|
|
1978
|
17 |
5 |
p. 501-503
3 p.
|
artikel
|
| 18 |
Biomedical applications of microprocessors
|
|
|
1978
|
17 |
5 |
p. 488-
1 p.
|
artikel
|
| 19 |
16-bit wave gathering speed
|
|
|
1978
|
17 |
5 |
p. 489-
1 p.
|
artikel
|
| 20 |
Calculation of hot electron phenomena
|
|
|
1978
|
17 |
5 |
p. 492-
1 p.
|
artikel
|
| 21 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1978
|
17 |
5 |
p. 469-472
4 p.
|
artikel
|
| 22 |
Carrier distributions function in semiconductors
|
|
|
1978
|
17 |
5 |
p. 492-
1 p.
|
artikel
|
| 23 |
CCD memory circuits of highest packing density—technological and electrical improvements
|
|
|
1978
|
17 |
5 |
p. 487-
1 p.
|
artikel
|
| 24 |
Characterization of thick film capicitors
|
|
|
1978
|
17 |
5 |
p. 493-
1 p.
|
artikel
|
| 25 |
Comments on “Experimental evidence against the shell model of bound multiexciton complexes in silicon”
|
|
|
1978
|
17 |
5 |
p. 490-
1 p.
|
artikel
|
| 26 |
Communications chip interfaces with most microprocessors
|
|
|
1978
|
17 |
5 |
p. 489-
1 p.
|
artikel
|
| 27 |
Complete ranking of reliability-related distributions
|
|
|
1978
|
17 |
5 |
p. 484-
1 p.
|
artikel
|
| 28 |
Courses International Society for Hybrid Microelectronics
|
|
|
1978
|
17 |
5 |
p. 477-
1 p.
|
artikel
|
| 29 |
dc voltage effects on saw device interdigital electrodes
|
|
|
1978
|
17 |
5 |
p. 484-
1 p.
|
artikel
|
| 30 |
Decision tools for use by management
|
Ryerson, C.M.
|
|
1978
|
17 |
5 |
p. 527-542
16 p.
|
artikel
|
| 31 |
Dedicated LSI chips aim at communications
|
|
|
1978
|
17 |
5 |
p. 489-
1 p.
|
artikel
|
| 32 |
Density variation in the strain-confined electron-hole liquid in Ge
|
|
|
1978
|
17 |
5 |
p. 492-493
2 p.
|
artikel
|
| 33 |
Derivation of fault-detection tests using Boolean matrices
|
|
|
1978
|
17 |
5 |
p. 485-
1 p.
|
artikel
|
| 34 |
Design of a pattern on a photomask-like physical standard for evaluation and calibration of linewidth-measuring systems
|
|
|
1978
|
17 |
5 |
p. 487-
1 p.
|
artikel
|
| 35 |
Digital testing oscilloscope cushions against mounting costs of troubleshooting
|
|
|
1978
|
17 |
5 |
p. 483-
1 p.
|
artikel
|
| 36 |
Duration of hidden faults in randomly checked systems
|
|
|
1978
|
17 |
5 |
p. 486-
1 p.
|
artikel
|
| 37 |
Dynamic decision elements for 3-unit systems
|
|
|
1978
|
17 |
5 |
p. 486-
1 p.
|
artikel
|
| 38 |
Economics of thick and thin film hybrid production in Europe
|
|
|
1978
|
17 |
5 |
p. 493-
1 p.
|
artikel
|
| 39 |
Efficient evaluation of system reliability by Monte Carlo method
|
|
|
1978
|
17 |
5 |
p. 486-
1 p.
|
artikel
|
| 40 |
Electrical characteristics of sputtering-induced defects in n-type silicon
|
|
|
1978
|
17 |
5 |
p. 490-
1 p.
|
artikel
|
| 41 |
Electronic system thermal design for reliability
|
|
|
1978
|
17 |
5 |
p. 483-
1 p.
|
artikel
|
| 42 |
Electron transport and ionization in silicon at high fields
|
|
|
1978
|
17 |
5 |
p. 490-491
2 p.
|
artikel
|
| 43 |
Estimation of reliability after corrective action
|
|
|
1978
|
17 |
5 |
p. 484-
1 p.
|
artikel
|
| 44 |
Evolving microprocessors which better meet the needs of automotive electronics
|
|
|
1978
|
17 |
5 |
p. 488-
1 p.
|
artikel
|
| 45 |
Experimental and theoretical determination of hot electron distribution in GaAs and related mixed crystals
|
|
|
1978
|
17 |
5 |
p. 492-
1 p.
|
artikel
|
| 46 |
Experimental aspects of hot electron distribution functions
|
|
|
1978
|
17 |
5 |
p. 491-492
2 p.
|
artikel
|
| 47 |
Far-infrared absorption by excitons in silicon
|
|
|
1978
|
17 |
5 |
p. 492-
1 p.
|
artikel
|
| 48 |
Far infrared emission from hot electrons in Si-inversion layers
|
|
|
1978
|
17 |
5 |
p. 491-
1 p.
|
artikel
|
| 49 |
FETs move up in power and frequency
|
|
|
1978
|
17 |
5 |
p. 489-
1 p.
|
artikel
|
| 50 |
Grade-of-service and service quality concepts in public telephone exchanges
|
|
|
1978
|
17 |
5 |
p. 485-
1 p.
|
artikel
|
| 51 |
High field electronic properties of SiO2
|
|
|
1978
|
17 |
5 |
p. 491-
1 p.
|
artikel
|
| 52 |
Hot electron and magneto-transport properties of In 1−x Ga x P 1−y As y liquid phase epitaxial films
|
|
|
1978
|
17 |
5 |
p. 491-
1 p.
|
artikel
|
| 53 |
Hot-electron relaxation effects in devices
|
|
|
1978
|
17 |
5 |
p. 492-
1 p.
|
artikel
|
| 54 |
Hot electron transport effects in field effect transistors
|
|
|
1978
|
17 |
5 |
p. 492-
1 p.
|
artikel
|
| 55 |
IEEE Standard 488 and microprocessor synergism
|
|
|
1978
|
17 |
5 |
p. 488-
1 p.
|
artikel
|
| 56 |
Increasing the functional speed of positive photoresist
|
|
|
1978
|
17 |
5 |
p. 488-
1 p.
|
artikel
|
| 57 |
Integrated circuit process and design rule evaluation techniques
|
|
|
1978
|
17 |
5 |
p. 487-
1 p.
|
artikel
|
| 58 |
Investigation of metalization failures of glass sealed ceramic dual in line integrated circuits
|
|
|
1978
|
17 |
5 |
p. 484-
1 p.
|
artikel
|
| 59 |
Japan Fact Book 1978 (Guide to Japan's Electronics Manufacturers and Industry)
|
G.W.A.D.,
|
|
1978
|
17 |
5 |
p. 495-
1 p.
|
artikel
|
| 60 |
Life characteristics of plastic encapsulated semiconductor devices
|
Reich, Bernard
|
|
1978
|
17 |
5 |
p. 513-515
3 p.
|
artikel
|
| 61 |
L.S.I. CMOS applications
|
|
|
1978
|
17 |
5 |
p. 487-
1 p.
|
artikel
|
| 62 |
Maintenance strategies for PCM circuit switching
|
|
|
1978
|
17 |
5 |
p. 485-
1 p.
|
artikel
|
| 63 |
Majority and similarity voting in analogue redundant systems
|
|
|
1978
|
17 |
5 |
p. 484-
1 p.
|
artikel
|
| 64 |
Microcomputer applications in telephony
|
|
|
1978
|
17 |
5 |
p. 490-
1 p.
|
artikel
|
| 65 |
Microcomputers, miracle or myth?
|
|
|
1978
|
17 |
5 |
p. 486-487
2 p.
|
artikel
|
| 66 |
Microprocessors heed the call to supervise I/O
|
|
|
1978
|
17 |
5 |
p. 489-
1 p.
|
artikel
|
| 67 |
Microprocessors in consumer products
|
|
|
1978
|
17 |
5 |
p. 488-
1 p.
|
artikel
|
| 68 |
Microprocessors in instrumentation
|
|
|
1978
|
17 |
5 |
p. 488-
1 p.
|
artikel
|
| 69 |
Microprocessors in telecommunication systems
|
|
|
1978
|
17 |
5 |
p. 490-
1 p.
|
artikel
|
| 70 |
Microprogramming a minicomputer for fast signal processing
|
|
|
1978
|
17 |
5 |
p. 489-
1 p.
|
artikel
|
| 71 |
Molybdenum-gate RAM is designed for high speed
|
|
|
1978
|
17 |
5 |
p. 489-
1 p.
|
artikel
|
| 72 |
Monte Carlo comparisons of parameter estimators of the 2-parameter Weibull distribution
|
|
|
1978
|
17 |
5 |
p. 484-
1 p.
|
artikel
|
| 73 |
Multiprocessor systems
|
|
|
1978
|
17 |
5 |
p. 489-
1 p.
|
artikel
|
| 74 |
Noise and diffusion of hot holes in Si
|
|
|
1978
|
17 |
5 |
p. 491-
1 p.
|
artikel
|
| 75 |
Noise of hot carriers in the channel of n silicon junction gate field effect transistors
|
|
|
1978
|
17 |
5 |
p. 491-
1 p.
|
artikel
|
| 76 |
Optimal ordering and replacement for a 1-unit system
|
|
|
1978
|
17 |
5 |
p. 485-
1 p.
|
artikel
|
| 77 |
Optimization of system reliability by sequential weight increasing factor technique
|
|
|
1978
|
17 |
5 |
p. 486-
1 p.
|
artikel
|
| 78 |
Phosphorus concentration in low temperature vapor deposited oxide
|
|
|
1978
|
17 |
5 |
p. 487-
1 p.
|
artikel
|
| 79 |
Physical and thermodynamic properties of silane
|
|
|
1978
|
17 |
5 |
p. 487-
1 p.
|
artikel
|
| 80 |
Physical phenomena in an ideal MOS structure
|
|
|
1978
|
17 |
5 |
p. 488-
1 p.
|
artikel
|
| 81 |
Product liability: A mechanical design for liability prevention
|
|
|
1978
|
17 |
5 |
p. 485-486
2 p.
|
artikel
|
| 82 |
Publications, notices, calls for papers, etc.
|
|
|
1978
|
17 |
5 |
p. 473-476
4 p.
|
artikel
|
| 83 |
Recent patents on microelectronics
|
|
|
1978
|
17 |
5 |
p. 479-482
4 p.
|
artikel
|
| 84 |
Reliability analysis of an m n system with inspections
|
|
|
1978
|
17 |
5 |
p. 485-
1 p.
|
artikel
|
| 85 |
Reliability analysis of logic circuits
|
|
|
1978
|
17 |
5 |
p. 485-
1 p.
|
artikel
|
| 86 |
Reliability engineering in microelectronics
|
Jowett, C.E.
|
|
1978
|
17 |
5 |
p. 505-512
8 p.
|
artikel
|
| 87 |
Reliability model and analysis of a system with non-exponential down-time distrubitions including a derated state
|
|
|
1978
|
17 |
5 |
p. 485-
1 p.
|
artikel
|
| 88 |
Reliability of power supplies
|
|
|
1978
|
17 |
5 |
p. 484-
1 p.
|
artikel
|
| 89 |
Reliability of several standby-priority-redundant systems
|
|
|
1978
|
17 |
5 |
p. 484-485
2 p.
|
artikel
|
| 90 |
Repair limit suspension policies for a two-unit standby redundant system with two phase repairs
|
|
|
1978
|
17 |
5 |
p. 485-
1 p.
|
artikel
|
| 91 |
Review of some microwave integrated circuit components utilizing microstrip techniques
|
|
|
1978
|
17 |
5 |
p. 488-489
2 p.
|
artikel
|
| 92 |
Screening results of JAN transitors and diodes used in military and aerospace programmes
|
|
|
1978
|
17 |
5 |
p. 484-
1 p.
|
artikel
|
| 93 |
Significance of GaAs solubility in GaAl Alloys in multilayer LPE of Al x Ga 1−x As
|
|
|
1978
|
17 |
5 |
p. 490-
1 p.
|
artikel
|
| 94 |
Staggered testing of electronic systems revisited
|
Schneeweiss, Winfrid G.
|
|
1978
|
17 |
5 |
p. 523-526
4 p.
|
artikel
|
| 95 |
Stationary model of the chemical vapour deposition of homoepitaxial silicon layers
|
|
|
1978
|
17 |
5 |
p. 490-
1 p.
|
artikel
|
| 96 |
Surface and bulk charge transport in a buried-layer MOS structure
|
|
|
1978
|
17 |
5 |
p. 492-
1 p.
|
artikel
|
| 97 |
Take the guesswork out of thick microstrip
|
|
|
1978
|
17 |
5 |
p. 489-
1 p.
|
artikel
|
| 98 |
The band structure dependence of impact ionization by hot carriers in semiconductors: GaAs
|
|
|
1978
|
17 |
5 |
p. 490-
1 p.
|
artikel
|
| 99 |
The 1977 Canadian SRE reliability symposium: Keynote address
|
Hall, C.D.
|
|
1978
|
17 |
5 |
p. 497-500
4 p.
|
artikel
|
| 100 |
The effect of integration steps and manufacturing improvements on the mean life of semiconductor circuits
|
|
|
1978
|
17 |
5 |
p. 483-484
2 p.
|
artikel
|
| 101 |
Theory of the mobility of electrons limited by charged impurities in two dimensions
|
|
|
1978
|
17 |
5 |
p. 490-
1 p.
|
artikel
|
| 102 |
The reliability, testing and evaluation of hybrid microcircuits
|
|
|
1978
|
17 |
5 |
p. 493-
1 p.
|
artikel
|
| 103 |
The study of microcircuits by transmission electron microscopy
|
|
|
1978
|
17 |
5 |
p. 489-
1 p.
|
artikel
|
| 104 |
Variational wave functions for the biexciton in polar semiconductors
|
|
|
1978
|
17 |
5 |
p. 491-
1 p.
|
artikel
|
| 105 |
What happens to semiconductors in a nuclear environment
|
|
|
1978
|
17 |
5 |
p. 483-
1 p.
|
artikel
|
Tijdschrift beschrijving