| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A bibliography on silicon dioxide films
|
|
|
1977
|
16 |
2 |
p. 116-
1 p.
|
artikel
|
| 2 |
Age replacement with leadtime
|
|
|
1977
|
16 |
2 |
p. 114-
1 p.
|
artikel
|
| 3 |
Algorithm for reliability evaluation of a reducible network
|
|
|
1977
|
16 |
2 |
p. 114-
1 p.
|
artikel
|
| 4 |
A model for doped-oxide-source diffusion with a chemical reaction at the silicon-silicon dioxide interface
|
|
|
1977
|
16 |
2 |
p. 119-
1 p.
|
artikel
|
| 5 |
Analysis of superposition errors in wafer fabrication
|
Matsuzawa, Toshiharu
|
|
1977
|
16 |
2 |
p. 173-176
4 p.
|
artikel
|
| 6 |
An electrically alterable ROM—and it doesn't use nitride
|
|
|
1977
|
16 |
2 |
p. 116-
1 p.
|
artikel
|
| 7 |
A new generation of MOS/bipolar operational amplifiers
|
|
|
1977
|
16 |
2 |
p. 117-
1 p.
|
artikel
|
| 8 |
Application of RAM to communication systems
|
|
|
1977
|
16 |
2 |
p. 114-
1 p.
|
artikel
|
| 9 |
Applications of ion implantation in semiconductor processing
|
|
|
1977
|
16 |
2 |
p. 123-
1 p.
|
artikel
|
| 10 |
A practical approach to printed wiring repair techniques
|
|
|
1977
|
16 |
2 |
p. 112-
1 p.
|
artikel
|
| 11 |
A ratio-type goodness-of-fit test for 2-parameter Weibull distributions
|
|
|
1977
|
16 |
2 |
p. 114-
1 p.
|
artikel
|
| 12 |
A reliability assessment of bipolar proms
|
|
|
1977
|
16 |
2 |
p. 115-
1 p.
|
artikel
|
| 13 |
A review of some charge transport properties of silicon
|
|
|
1977
|
16 |
2 |
p. 119-
1 p.
|
artikel
|
| 14 |
A review of thick film conductors
|
|
|
1977
|
16 |
2 |
p. 121-
1 p.
|
artikel
|
| 15 |
A survey of accelerated ageing techniques for solderable substrates
|
|
|
1977
|
16 |
2 |
p. 113-
1 p.
|
artikel
|
| 16 |
A survey of design methods for failure detection in dynamic systems
|
|
|
1977
|
16 |
2 |
p. 114-
1 p.
|
artikel
|
| 17 |
A technology of thin-film hybrid microwave circuits
|
|
|
1977
|
16 |
2 |
p. 122-
1 p.
|
artikel
|
| 18 |
Availability of a certain item within a system
|
Wollner, E.
|
|
1977
|
16 |
2 |
p. 143-148
6 p.
|
artikel
|
| 19 |
Availability prediction by using a method of simulation
|
Basker, B.A.
|
|
1977
|
16 |
2 |
p. 135-141
7 p.
|
artikel
|
| 20 |
Basic integrated circuit failure analysis techniques
|
|
|
1977
|
16 |
2 |
p. 111-
1 p.
|
artikel
|
| 21 |
Beryllia Ceramics in microelectronic applications
|
|
|
1977
|
16 |
2 |
p. 116-
1 p.
|
artikel
|
| 22 |
Book review amendment
|
G.W.A.D.,
|
|
1977
|
16 |
2 |
p. 125-
1 p.
|
artikel
|
| 23 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1977
|
16 |
2 |
p. 99-100
2 p.
|
artikel
|
| 24 |
Carbon Interstitial in electron-irradiated silicon
|
|
|
1977
|
16 |
2 |
p. 123-
1 p.
|
artikel
|
| 25 |
Component reliability exposed to thermal neutron environment—I
|
Yadav, R.P.S.
|
|
1977
|
16 |
2 |
p. 149-153
5 p.
|
artikel
|
| 26 |
Computer model and charge transport studies in short gate charge-coupled devices
|
|
|
1977
|
16 |
2 |
p. 118-119
2 p.
|
artikel
|
| 27 |
Conductor crossovers provided by a combined thin-film and thick-film technology
|
|
|
1977
|
16 |
2 |
p. 120-
1 p.
|
artikel
|
| 28 |
Contribution a l'étude de la ségrégation de surface
|
|
|
1977
|
16 |
2 |
p. 120-
1 p.
|
artikel
|
| 29 |
Design and use of a laser interferometer for ultrasonic bonding studies
|
|
|
1977
|
16 |
2 |
p. 123-
1 p.
|
artikel
|
| 30 |
Designing a burn-in facility
|
|
|
1977
|
16 |
2 |
p. 115-
1 p.
|
artikel
|
| 31 |
Developments in hybrid technology relating to high performance applications
|
|
|
1977
|
16 |
2 |
p. 120-
1 p.
|
artikel
|
| 32 |
Economic considerations in inspection for lot acceptance
|
|
|
1977
|
16 |
2 |
p. 115-
1 p.
|
artikel
|
| 33 |
Electron-beam system makes masks for integrated circuits
|
|
|
1977
|
16 |
2 |
p. 122-
1 p.
|
artikel
|
| 34 |
Electron-sensitive film-forming materials and their uses in semiconductor technology
|
|
|
1977
|
16 |
2 |
p. 117-
1 p.
|
artikel
|
| 35 |
English-Russian dictionary of reliability and quality control
|
G.W.A.D.,
|
|
1977
|
16 |
2 |
p. 125-
1 p.
|
artikel
|
| 36 |
Epoxy bonding in hybrid microelectronic circuits
|
|
|
1977
|
16 |
2 |
p. 121-122
2 p.
|
artikel
|
| 37 |
Estimators for parameters of a series system under an attribute life test situation
|
|
|
1977
|
16 |
2 |
p. 114-
1 p.
|
artikel
|
| 38 |
Evaluation of component quality for military and space applications
|
|
|
1977
|
16 |
2 |
p. 113-
1 p.
|
artikel
|
| 39 |
Factors governing aluminium interconnection corrosion in plastic encapsulated microelectronic devices
|
Neighbour, F.
|
|
1977
|
16 |
2 |
p. 161-164
4 p.
|
artikel
|
| 40 |
Failure-rate as a function of time due to log-normal life distribution(s) of weak parts
|
Hallberg, Ö.
|
|
1977
|
16 |
2 |
p. 155-158
4 p.
|
artikel
|
| 41 |
FAMOS from reliability studies
|
|
|
1977
|
16 |
2 |
p. 115-
1 p.
|
artikel
|
| 42 |
Function adjustment of thick film hybrid microelectronic filters
|
|
|
1977
|
16 |
2 |
p. 120-121
2 p.
|
artikel
|
| 43 |
General method for incipient failure detection
|
|
|
1977
|
16 |
2 |
p. 111-
1 p.
|
artikel
|
| 44 |
High purity chemicals and resists
|
|
|
1977
|
16 |
2 |
p. 117-
1 p.
|
artikel
|
| 45 |
High rate magnetron sputtering for metallizing semiconductor devices
|
|
|
1977
|
16 |
2 |
p. 117-
1 p.
|
artikel
|
| 46 |
High-reliability semiconductors: paying more doesn't always pay off
|
|
|
1977
|
16 |
2 |
p. 112-
1 p.
|
artikel
|
| 47 |
High voltage integrated circuit technology
|
|
|
1977
|
16 |
2 |
p. 118-
1 p.
|
artikel
|
| 48 |
ICs streamline plasma-display units
|
|
|
1977
|
16 |
2 |
p. 118-
1 p.
|
artikel
|
| 49 |
Implanted silicon layers as strain sensors
|
|
|
1977
|
16 |
2 |
p. 122-
1 p.
|
artikel
|
| 50 |
Improving quality through behaviour modification
|
|
|
1977
|
16 |
2 |
p. 113-114
2 p.
|
artikel
|
| 51 |
Influence of mechanical stresses on effective diffusion length of carriers in the base region of germanium diode
|
|
|
1977
|
16 |
2 |
p. 118-
1 p.
|
artikel
|
| 52 |
Influence of thermal treatment on electrical and mechanical properties of large diameter Si single crystals with high oxygen concentration
|
|
|
1977
|
16 |
2 |
p. 118-
1 p.
|
artikel
|
| 53 |
Integrated injection logic (I2L)
|
|
|
1977
|
16 |
2 |
p. 117-
1 p.
|
artikel
|
| 54 |
Investigations on the damage caused by ion etching of SiO2 layers at low energy and high dose
|
|
|
1977
|
16 |
2 |
p. 122-
1 p.
|
artikel
|
| 55 |
Ion beam sputtering for thin film deposition and high-precision micromachining
|
|
|
1977
|
16 |
2 |
p. 122-
1 p.
|
artikel
|
| 56 |
Manufacturing process for hybrid microcircuits containing vias
|
|
|
1977
|
16 |
2 |
p. 122-
1 p.
|
artikel
|
| 57 |
Materials selection in hybrid product design
|
|
|
1977
|
16 |
2 |
p. 120-
1 p.
|
artikel
|
| 58 |
Measurement of minority carrier lifetime profiles in silicon
|
|
|
1977
|
16 |
2 |
p. 119-
1 p.
|
artikel
|
| 59 |
Microcircuit reliability bibliography
|
|
|
1977
|
16 |
2 |
p. 105-
1 p.
|
artikel
|
| 60 |
Microwave hybrid integrated circuit technology
|
|
|
1977
|
16 |
2 |
p. 121-
1 p.
|
artikel
|
| 61 |
MIS capacitor with traps in semiconductor
|
|
|
1977
|
16 |
2 |
p. 119-
1 p.
|
artikel
|
| 62 |
Modified control chart for defectives where inspection error is operative
|
|
|
1977
|
16 |
2 |
p. 115-
1 p.
|
artikel
|
| 63 |
New analogue multiplier opens way to powerful function-synthesis
|
|
|
1977
|
16 |
2 |
p. 116-
1 p.
|
artikel
|
| 64 |
New failure analysis techniques for beam lead and multilevel metal integrated circuits
|
|
|
1977
|
16 |
2 |
p. 111-
1 p.
|
artikel
|
| 65 |
Noise in silicon and FET's at high electric fields
|
|
|
1977
|
16 |
2 |
p. 119-
1 p.
|
artikel
|
| 66 |
Nondestructive, X-ray inspection of ceramic-chip capacitors for delaminations
|
|
|
1977
|
16 |
2 |
p. 112-
1 p.
|
artikel
|
| 67 |
On the alloying of aluminium to silicon in the fabrication of integrated circuits
|
Berthoud, L.A.
|
|
1977
|
16 |
2 |
p. 165-171
7 p.
|
artikel
|
| 68 |
On the mean duration of hidden faults in periodically checked systems
|
|
|
1977
|
16 |
2 |
p. 114-
1 p.
|
artikel
|
| 69 |
On the reliability of a two-unit redundant system with random switchover time and two types of repair
|
Khalil, Z.S.
|
|
1977
|
16 |
2 |
p. 159-160
2 p.
|
artikel
|
| 70 |
On the theory of double injection in solids with traps non-uniformly distributed in energy and in space
|
|
|
1977
|
16 |
2 |
p. 118-
1 p.
|
artikel
|
| 71 |
Photoelastic techniques reveal endangered component terminals on printed circuit boards of epoxy resin
|
|
|
1977
|
16 |
2 |
p. 111-
1 p.
|
artikel
|
| 72 |
Physical analysis of electronic components destined for satellite use
|
|
|
1977
|
16 |
2 |
p. 112-
1 p.
|
artikel
|
| 73 |
Polyimide passivation reliability study
|
|
|
1977
|
16 |
2 |
p. 112-
1 p.
|
artikel
|
| 74 |
Printed wiring of assessed quality
|
|
|
1977
|
16 |
2 |
p. 113-
1 p.
|
artikel
|
| 75 |
Publications, notices, calls for papers, etc.
|
|
|
1977
|
16 |
2 |
p. 101-
1 p.
|
artikel
|
| 76 |
Quality assurance in the communications industry
|
|
|
1977
|
16 |
2 |
p. 114-
1 p.
|
artikel
|
| 77 |
Recent developments in microwave integrated circuits
|
|
|
1977
|
16 |
2 |
p. 118-
1 p.
|
artikel
|
| 78 |
Recent patents on microelectronics
|
|
|
1977
|
16 |
2 |
p. 107-109
3 p.
|
artikel
|
| 79 |
Reliability allocation for electronic systems
|
|
|
1977
|
16 |
2 |
p. 114-115
2 p.
|
artikel
|
| 80 |
Reliability case history of an airborne air turbine starter
|
|
|
1977
|
16 |
2 |
p. 114-
1 p.
|
artikel
|
| 81 |
Reliability in repairable and non-repairable systems
|
|
|
1977
|
16 |
2 |
p. 115-
1 p.
|
artikel
|
| 82 |
Reliability of multiprocessor configurations
|
|
|
1977
|
16 |
2 |
p. 115-
1 p.
|
artikel
|
| 83 |
Reliability studies of polysilicon fusible link prom's
|
|
|
1977
|
16 |
2 |
p. 115-
1 p.
|
artikel
|
| 84 |
Reliability study of GaAs MESFETs
|
|
|
1977
|
16 |
2 |
p. 112-
1 p.
|
artikel
|
| 85 |
Reproducible methods for the fabrication of microwave strip lines of high precision and reliability
|
|
|
1977
|
16 |
2 |
p. 113-
1 p.
|
artikel
|
| 86 |
RIGFET arrays simplify analog-to-digital conversion
|
|
|
1977
|
16 |
2 |
p. 181-182
2 p.
|
artikel
|
| 87 |
Rolling bigger dice
|
|
|
1977
|
16 |
2 |
p. 116-
1 p.
|
artikel
|
| 88 |
Sequential testing of components for system reliability
|
|
|
1977
|
16 |
2 |
p. 113-
1 p.
|
artikel
|
| 89 |
Simulation of thermal stress stimuli in the testing of printed wiring products
|
|
|
1977
|
16 |
2 |
p. 112-
1 p.
|
artikel
|
| 90 |
Solid-state oscillator using a VO2 polyconductor film as a circuit element
|
|
|
1977
|
16 |
2 |
p. 118-
1 p.
|
artikel
|
| 91 |
Study of the growth of epitaxial layers and its application to (Ga,In)As composites
|
|
|
1977
|
16 |
2 |
p. 120-
1 p.
|
artikel
|
| 92 |
System performance and its dependence upon sub-system failure modes
|
|
|
1977
|
16 |
2 |
p. 115-
1 p.
|
artikel
|
| 93 |
Testers are getting better at finding microprocessor flaws
|
|
|
1977
|
16 |
2 |
p. 113-
1 p.
|
artikel
|
| 94 |
Testing large dynamic memories
|
|
|
1977
|
16 |
2 |
p. 118-
1 p.
|
artikel
|
| 95 |
The application of hybrid integration techniques to microwave transistor amplifier design
|
|
|
1977
|
16 |
2 |
p. 121-
1 p.
|
artikel
|
| 96 |
The application of thick film techniques to microwave components in the range 10–20 GHz
|
|
|
1977
|
16 |
2 |
p. 121-
1 p.
|
artikel
|
| 97 |
The dielectric constant associated with direct interband transitions in germanium
|
|
|
1977
|
16 |
2 |
p. 119-
1 p.
|
artikel
|
| 98 |
The effect of quality control procedures on component reliability
|
|
|
1977
|
16 |
2 |
p. 112-
1 p.
|
artikel
|
| 99 |
The effect of surface recombination on distribution of excess charge carriers at semiconductor plate edge and on the base current
|
|
|
1977
|
16 |
2 |
p. 118-
1 p.
|
artikel
|
| 100 |
The failure tracers
|
|
|
1977
|
16 |
2 |
p. 111-
1 p.
|
artikel
|
| 101 |
The manufacture and use of chrome working masks
|
|
|
1977
|
16 |
2 |
p. 116-117
2 p.
|
artikel
|
| 102 |
The measurement and prediction of the reliability of computer systems
|
|
|
1977
|
16 |
2 |
p. 115-
1 p.
|
artikel
|
| 103 |
Theoretical study of X-ray photoelecton spectrum of germanium valence electrons
|
|
|
1977
|
16 |
2 |
p. 119-120
2 p.
|
artikel
|
| 104 |
Theory and experiment for silicon Schottky barrier diodes at high current density
|
|
|
1977
|
16 |
2 |
p. 119-
1 p.
|
artikel
|
| 105 |
The quality of photomasks
|
|
|
1977
|
16 |
2 |
p. 117-
1 p.
|
artikel
|
| 106 |
Thermal characterization of multilayer interconnection boards
|
|
|
1977
|
16 |
2 |
p. 111-
1 p.
|
artikel
|
| 107 |
The TDA 1071 radio IC in communications receivers
|
|
|
1977
|
16 |
2 |
p. 118-
1 p.
|
artikel
|
| 108 |
The technical “back up” for your Q.A. organisation in the electronics industry
|
|
|
1977
|
16 |
2 |
p. 115-116
2 p.
|
artikel
|
| 109 |
The techniques and applications of high rate sputtering
|
|
|
1977
|
16 |
2 |
p. 121-
1 p.
|
artikel
|
| 110 |
The thermal design of an LSI single-chip package
|
|
|
1977
|
16 |
2 |
p. 116-
1 p.
|
artikel
|
| 111 |
The use of high energy ion beams for surface and thin film analysis
|
|
|
1977
|
16 |
2 |
p. 122-123
2 p.
|
artikel
|
| 112 |
The use of liquid crystals in planar technology
|
|
|
1977
|
16 |
2 |
p. 118-
1 p.
|
artikel
|
| 113 |
The user's need for quality assurance
|
|
|
1977
|
16 |
2 |
p. 116-
1 p.
|
artikel
|
| 114 |
Tiny packaged ICs replace chips
|
|
|
1977
|
16 |
2 |
p. 116-
1 p.
|
artikel
|
| 115 |
Travelling-wave dividers: A new concept for frequency division
|
Kasperkovitz, D.
|
|
1977
|
16 |
2 |
p. 127-134
8 p.
|
artikel
|
| 116 |
Troubleshooting in the electroless copper process
|
|
|
1977
|
16 |
2 |
p. 113-
1 p.
|
artikel
|
| 117 |
Tunneling of electrons from Si into thermally grown SiO2
|
|
|
1977
|
16 |
2 |
p. 119-
1 p.
|
artikel
|
| 118 |
Ultrasonic wire welding
|
|
|
1977
|
16 |
2 |
p. 117-
1 p.
|
artikel
|
| 119 |
Universal logic gate and its applications
|
|
|
1977
|
16 |
2 |
p. 118-
1 p.
|
artikel
|
| 120 |
Use of hybrid thick film circuits in medical electronics
|
|
|
1977
|
16 |
2 |
p. 120-
1 p.
|
artikel
|
| 121 |
Validity of the mathematical formula for calculating the inductance of square etched spirals, in the frequency range 25 MHz to 52 MHz
|
Sharma, G.N.
|
|
1977
|
16 |
2 |
p. 177-180
4 p.
|
artikel
|
| 122 |
Volume production of hybrid circuits
|
|
|
1977
|
16 |
2 |
p. 121-
1 p.
|
artikel
|
| 123 |
20-watt audio amplifier IC offers high fidelity
|
|
|
1977
|
16 |
2 |
p. 117-
1 p.
|
artikel
|
| 124 |
Wiggly phase shifters and directional couplers for radio-frequency hybrid microcircuit applications
|
|
|
1977
|
16 |
2 |
p. 122-
1 p.
|
artikel
|
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