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                             157 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A Bayesian scheme for sequentially testing a multi-component system 1977
16 1 p. 16-
1 p.
artikel
2 Accelearted life testing of flexible printed circuits. Part I—Test program and typical results 1977
16 1 p. 14-15
2 p.
artikel
3 Accelerated life testing of flexible printed circuits Part II—Failure modes in flexible printed circuits coated with UV-cured resins 1977
16 1 p. 15-
1 p.
artikel
4 A CMOS/SOS Reliability Study 1977
16 1 p. 15-
1 p.
artikel
5 A good QA can help you survive 1977
16 1 p. 11-
1 p.
artikel
6 ALE—a carrier aircraft availability model 1977
16 1 p. 17-
1 p.
artikel
7 A method for investigation of fluctuations in doping concentration and minority-carrier diffusion length in semiconductors by scanning electron microscope 1977
16 1 p. 22-23
2 p.
artikel
8 A model for burn-in programs for components with eliminateable defects 1977
16 1 p. 14-
1 p.
artikel
9 Amplification of acoustic waves in semiconductors with dominants ionized impurity scattering 1977
16 1 p. 25-
1 p.
artikel
10 A multi-state system model Dhillon, Balbir S.
1977
16 1 p. 55-56
2 p.
artikel
11 Analyses of two difference 1-server systems 1977
16 1 p. 16-
1 p.
artikel
12 Analysis of 7 models for the 2-dissimilar-unit, warm standby, redundant system 1977
16 1 p. 16-
1 p.
artikel
13 Analysis of pesudo-reliability of a combat tank system and its optimal design 1977
16 1 p. 17-
1 p.
artikel
14 Analytical methods for calculating the characteristic impedance of finite-thickness microstrip lines 1977
16 1 p. 20-
1 p.
artikel
15 An automated gaging and sorting machine 1977
16 1 p. 20-
1 p.
artikel
16 An efficient algorithm for deducing the minimal cuts and reliability indices of a general network configuration 1977
16 1 p. 17-
1 p.
artikel
17 An evaluation of silicon damage resulting from ultrasonic wire bonding 1977
16 1 p. 15-
1 p.
artikel
18 A new approach to memory testing 1977
16 1 p. 16-
1 p.
artikel
19 A new family of monolithic A/D converter circuits and their applications 1977
16 1 p. 22-
1 p.
artikel
20 An investigation of surface effect on glass-passivated p-n junctions 1977
16 1 p. 24-
1 p.
artikel
21 An ion implanted bipolar silicon integrated circuit process Sanders, I.R.
1977
16 1 p. 75-80
6 p.
artikel
22 Anomalous frequency dependence of conductivity of amorphous semiconductor films 1977
16 1 p. 25-
1 p.
artikel
23 Anomalous temperature dependence of resistivity in heavily doped germanium 1977
16 1 p. 24-
1 p.
artikel
24 Approximate confidence intervals for reliability of a series system 1977
16 1 p. 16-
1 p.
artikel
25 A review of CCD imaging technology 1977
16 1 p. 18-
1 p.
artikel
26 A simple model for the thermo-mechaincal deformations of plated-through-holes in multilayer printed wiring boards 1977
16 1 p. 15-
1 p.
artikel
27 A study of surface charge induced inversion failure of junction isolated monolithic silicon integrated circuits 1977
16 1 p. 13-
1 p.
artikel
28 A technique for measuring the impurity concentration of silicon-on-sapphire films using C-V plots 1977
16 1 p. 25-26
2 p.
artikel
29 A test approach for commercial communication satellites Beisel, F.
1977
16 1 p. 91-97
7 p.
artikel
30 Automatic fault diagnosis on analogue boards 1977
16 1 p. 17-
1 p.
artikel
31 Avalanche breakdown in complementary diodes 1977
16 1 p. 13-
1 p.
artikel
32 A versatile boron diffusion process 1977
16 1 p. 20-21
2 p.
artikel
33 Batch bonded crossovers for thin film circuits 1977
16 1 p. 28-
1 p.
artikel
34 Beryllium—a high reliability metallization 1977
16 1 p. 14-
1 p.
artikel
35 Bias-humidity performance of encapsulated and unencapsulated Ti-Pd-Au thin-film conductors in an environment contaminated with Cl2 1977
16 1 p. 26-27
2 p.
artikel
36 Bibliography for reliability and availability of stochastic systems 1977
16 1 p. 13-
1 p.
artikel
37 Bubble domain memories. Present achievements and future applications 1977
16 1 p. 18-
1 p.
artikel
38 Bubbles rise from the lab 1977
16 1 p. 18-
1 p.
artikel
39 Bulk and interface imperfections in semiconductors 1977
16 1 p. 14-
1 p.
artikel
40 Calendar of international conferences, symposia, lectures and meetings of interest 1977
16 1 p. 3-5
3 p.
artikel
41 Call for papers press release 1977
16 1 p. 7-9
3 p.
artikel
42 Characterization of plasma etching for semiconductor applications 1977
16 1 p. 20-
1 p.
artikel
43 Charge transfer in charge-coupled devices in the presence of interface states 1977
16 1 p. 25-
1 p.
artikel
44 Component quality assurance: which plan is better? 1977
16 1 p. 14-
1 p.
artikel
45 Computer-aided coarse grid layout technique for photomasks 1977
16 1 p. 19-
1 p.
artikel
46 Current liquid crystal display technology 1977
16 1 p. 17-18
2 p.
artikel
47 Designing the maximum performance into bit-slice minicomputers 1977
16 1 p. 22-
1 p.
artikel
48 Dry film photoresists in microelectronics 1977
16 1 p. 20-
1 p.
artikel
49 D− state in silicon 1977
16 1 p. 22-
1 p.
artikel
50 Editorial Board 1977
16 1 p. IFC-
1 p.
artikel
51 Effective threshold energy for pair production in nonpolar semiconductors 1977
16 1 p. 24-
1 p.
artikel
52 Electrical conduction by percolation in thick film resistors 1977
16 1 p. 26-
1 p.
artikel
53 Electron-beam-induced currents in simple device structures 1977
16 1 p. 28-
1 p.
artikel
54 Electronic density of states of group-IV semiconductors: A cluster-bethe lattice approach for realistic Hamiltonians 1977
16 1 p. 24-
1 p.
artikel
55 Electronic structure of semiconducting crystals under high stress 1977
16 1 p. 23-
1 p.
artikel
56 Encapsulation of integrated circuits containing beam leaded devices with a silicone RTV dispersion 1977
16 1 p. 19-
1 p.
artikel
57 ESR in iron doped silicon crystals under stress 1977
16 1 p. 24-
1 p.
artikel
58 Evidence for mobility domains in (100) silicon inversion layers 1977
16 1 p. 25-
1 p.
artikel
59 First-in-first-out unit is fast, dense 1977
16 1 p. 28-
1 p.
artikel
60 Gold aluminum interconnect stability on thin film hybrid microcircuit substrates 1977
16 1 p. 28-
1 p.
artikel
61 Hall effects in thin films of gold-silver alloys 1977
16 1 p. 28-
1 p.
artikel
62 High transmission X-ray masks for lithographic applications 1977
16 1 p. 19-
1 p.
artikel
63 Hot electron induced degradation of N-channel IGFETs 1977
16 1 p. 15-
1 p.
artikel
64 Hybrid protective device for MOS-LSI chips 1977
16 1 p. 20-
1 p.
artikel
65 IC simulates matched transistor pairs 1977
16 1 p. 22-
1 p.
artikel
66 Implanted high value resistors 1977
16 1 p. 28-
1 p.
artikel
67 Influence of crystallographic and electrophysical imperfections in monocrystalline silicon on the formation of microplasmas in p-n junctions 1977
16 1 p. 24-
1 p.
artikel
68 Introduction to charge-coupled devices 1977
16 1 p. 17-
1 p.
artikel
69 Investigation into failures of AI wires bonded to Au metallization in microsubstrates 1977
16 1 p. 19-20
2 p.
artikel
70 Ion etching of platinum and palladium layers in beam lead technology 1977
16 1 p. 28-
1 p.
artikel
71 Large scale integration 1977
16 1 p. 18-
1 p.
artikel
72 12L chip provides phase-locked loop for citizens' radio 1977
16 1 p. 22-
1 p.
artikel
73 Low TCR thick film resistors for potentiometers 1977
16 1 p. 26-
1 p.
artikel
74 Magnetic bubble memory—a pilot model 1977
16 1 p. 21-
1 p.
artikel
75 Majority and similarity voting in analogue redundant systems Klaassen, K.B.
1977
16 1 p. 47-54
8 p.
artikel
76 Mask alignment for the fabrication of integrated circuits using X-ray lithography 1977
16 1 p. 18-19
2 p.
artikel
77 Masks for printing thick-film circuits Dubey, G.C.
1977
16 1 p. 69-73
5 p.
artikel
78 Measurement of concentration profile of conduction electrons in semiconductor epitaxial layers 1977
16 1 p. 22-
1 p.
artikel
79 Measurement of land to plated-through-hole interface resistance in multilayer boards 1977
16 1 p. 14-
1 p.
artikel
80 Measurement of thermo-mechanical strains in plated-through-holes 1977
16 1 p. 15-
1 p.
artikel
81 Memory architecture and the influence of the microprocessor 1977
16 1 p. 22-
1 p.
artikel
82 Metallurgical aspects of aluminium wire bonds to gold metallization 1977
16 1 p. 20-
1 p.
artikel
83 Methods for evaluating plated-through-hole reliability 1977
16 1 p. 15-
1 p.
artikel
84 “Microelectronics and Reliability” Abstracts Dummer, G.W.A.
1977
16 1 p. 1-
1 p.
artikel
85 Microsurgery as a tool in the analysis of L.S.I. 1977
16 1 p. 15-
1 p.
artikel
86 Mixed-process devices gain ground 1977
16 1 p. 22-
1 p.
artikel
87 Modelling of channel enhancement effects on the write characteristics of FAMOS devices 1977
16 1 p. 23-
1 p.
artikel
88 Moisture, myths and microcircuits 1977
16 1 p. 20-
1 p.
artikel
89 MOS and the static problem 1977
16 1 p. 21-
1 p.
artikel
90 MOTT transition of the electron-hole liquid in Ge 1977
16 1 p. 26-
1 p.
artikel
91 Network recognition of a MOS integrated circuit from its masks 1977
16 1 p. 20-
1 p.
artikel
92 Neutron activation analysis and autoradiographic purity examination of semiconductor grade silicon wafers 1977
16 1 p. 19-
1 p.
artikel
93 New analogue component concepts for digital processing systems Haynes, G.
1977
16 1 p. 57-67
11 p.
artikel
94 New method of influencing semiconductor surface properties 1977
16 1 p. 22-
1 p.
artikel
95 OHMIC contact to p-type GaP 1977
16 1 p. 23-
1 p.
artikel
96 On reliability prediction of repairable redundant digital structures 1977
16 1 p. 16-
1 p.
artikel
97 On the absorption of infrared radiation by electrons in semiconductor inversion layers 1977
16 1 p. 23-
1 p.
artikel
98 On the behaviour of some quantities used in Bayesian reliability demonstration tests 1977
16 1 p. 16-17
2 p.
artikel
99 Oxidation of silicon: new electron spectroscopy results 1977
16 1 p. 24-
1 p.
artikel
100 Parallel gap welding to thick-film metallization 1977
16 1 p. 26-
1 p.
artikel
101 Photoconductivity of a semiconductor with large-scale fluctuations of electrostatic potential: a case of an impurity recombination 1977
16 1 p. 23-
1 p.
artikel
102 Photoluminescence spectra of germanium at high excitation intensities 1977
16 1 p. 26-
1 p.
artikel
103 Photon assisted tunneling from aluminum into silicon dioxide 1977
16 1 p. 24-
1 p.
artikel
104 Plasma reactor design for the selective etching of SiO2 on Si 1977
16 1 p. 18-
1 p.
artikel
105 Properties of inlay clad wrought gold alloys 1977
16 1 p. 20-
1 p.
artikel
106 Pulsed overload tolerance of Si/Cr, Ni/Cr and Mo/Si thin film resistors on integrated circuits 1977
16 1 p. 28-
1 p.
artikel
107 Pumping characteristics of a vacuum system using a rotary pump and sublimation pump 1977
16 1 p. 27-
1 p.
artikel
108 Quality assurance in the nuclear industry. Moving on to a new stage of maturity 1977
16 1 p. 16-
1 p.
artikel
109 Quality control in PC manufacturing 1977
16 1 p. 14-
1 p.
artikel
110 Rapid formation kinetics of a long-lived electron-hole drop in Ge under pulsed excitation 1977
16 1 p. 24-
1 p.
artikel
111 Recent developments in the design and application of a bipolar control store sequencer and other MPU associated LSI components 1977
16 1 p. 21-
1 p.
artikel
112 Regular periodic “explosions” of electron-hole drops under steady-state illumination and microwave heating 1977
16 1 p. 23-
1 p.
artikel
113 Relaxation of (111) silicon surface atoms from studies of Si4H9 clusters 1977
16 1 p. 26-
1 p.
artikel
114 Reliability analysis of logic circuits DesMarais, P.
1977
16 1 p. 29-33
5 p.
artikel
115 Reliability implications of hot electron generation and parasitic bipolar action in an IGFET device 1977
16 1 p. 15-
1 p.
artikel
116 Reliability model and analysis of a system with non-exponential down-time distributions including a derated state Schenk, K.F.
1977
16 1 p. 35-40
6 p.
artikel
117 Repair limit suspension policies for a two-unit standby redundant system with two phase repairs Osaki, S.
1977
16 1 p. 41-45
5 p.
artikel
118 Resistivity recovery of thin sputtered aluminium films 1977
16 1 p. 27-
1 p.
artikel
119 SCF-Xα studies of the electronic structures of C, Si and Ge oxides 1977
16 1 p. 25-
1 p.
artikel
120 Schottky solar cells on thin epitaxial silicon 1977
16 1 p. 25-
1 p.
artikel
121 Search for reliability 1977
16 1 p. 16-
1 p.
artikel
122 Semiconductor materials for future display devices 1977
16 1 p. 18-
1 p.
artikel
123 Short communication. An inexpensive thick film furnace 1977
16 1 p. 27-
1 p.
artikel
124 Silicon wafer reclamation—a processing service 1977
16 1 p. 21-
1 p.
artikel
125 Solid state displays, engineering considerations for the third generation 1977
16 1 p. 21-
1 p.
artikel
126 Some comparisons between redundant structures for telephone exchange central control 1977
16 1 p. 17-
1 p.
artikel
127 Some studies on the instability in MOS devices due to water vapour contamination 1977
16 1 p. 13-
1 p.
artikel
128 Space shuttle component reuse study 1977
16 1 p. 17-
1 p.
artikel
129 Spin-dependent recombination in a silicon p-n junction 1977
16 1 p. 24-
1 p.
artikel
130 Stable and unstable surface state charge in thermally oxidised silicon 1977
16 1 p. 22-
1 p.
artikel
131 Stereo Radiography of complex multilayered microcircuits 1977
16 1 p. 20-
1 p.
artikel
132 Strahlungsbelastungs-untersuchungen an elektronischen bauelementen des symphonie-satelliten Spencker, A.
1977
16 1 p. 81-89
9 p.
artikel
133 Structure and applications of field programmable logic arrays 1977
16 1 p. 21-
1 p.
artikel
134 Surface states and metal overlayers on the (110) surface of GaAs 1977
16 1 p. 25-
1 p.
artikel
135 Survey of hybrid microelectronics in the U.K. 1977
16 1 p. 26-
1 p.
artikel
136 Temperature dependence of resistivity and hole conductivity mobility in p-type silicon 1977
16 1 p. 23-
1 p.
artikel
137 The current-voltage characteristics of MOS structures as measured with the triangular voltage sweep method 1977
16 1 p. 24-25
2 p.
artikel
138 The detection of barrel cracks in plated through holes using four point resistance measurements 1977
16 1 p. 14-
1 p.
artikel
139 The development and future of television horizontal processors 1977
16 1 p. 22-
1 p.
artikel
140 The effect of impurities on the corrosion of aluminum metallization 1977
16 1 p. 15-
1 p.
artikel
141 The effects of radiation damage on the properties of Ni-nGaAs Schottky diodes—III Annealing Studies 1977
16 1 p. 14-
1 p.
artikel
142 The effects of stacking faults on the electrical properties of a high voltage power transistor 1977
16 1 p. 13-
1 p.
artikel
143 The importance of considering test needs in circuit design 1977
16 1 p. 16-
1 p.
artikel
144 The mechanics of gold beam leads during thermocompression bonding 1977
16 1 p. 19-
1 p.
artikel
145 The mechanisms of degradation in an optically coupled isolator 1977
16 1 p. 13-
1 p.
artikel
146 The numerical solution of Poisson's equation for two-dimensional semiconductor devices 1977
16 1 p. 26-
1 p.
artikel
147 The properties of gate-controlled diffused microresistors 1977
16 1 p. 23-
1 p.
artikel
148 Thermocycling fails solder chips 1977
16 1 p. 14-
1 p.
artikel
149 The statistics of nearest neighbour impurity pair formation in semiconductors 1977
16 1 p. 25-
1 p.
artikel
150 The use of acoustic emission in a test for beam lead bond integrity 1977
16 1 p. 19-
1 p.
artikel
151 The versatile technique of RF plasma etching 1977
16 1 p. 20-
1 p.
artikel
152 Thick film hybrid microcircuits—general applications 1977
16 1 p. 27-
1 p.
artikel
153 Trends in thick film materials 1977
16 1 p. 27-
1 p.
artikel
154 Tunnelling current versus voltage characteristics in metalinsulator-metal films 1977
16 1 p. 25-
1 p.
artikel
155 Valley degeneracy and mobility anisotropy under mechanical stress on (111) silicon inversion layers 1977
16 1 p. 23-24
2 p.
artikel
156 Vapor Phase solder reflow for hybrid circuit manufacturing 1977
16 1 p. 27-
1 p.
artikel
157 “Worked Examples of Engineering Field Theory” by A. J. Baden Fuller G.W.A.D.,
1977
16 1 p. 10-
1 p.
artikel
                             157 gevonden resultaten
 
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