| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A Bayesian scheme for sequentially testing a multi-component system
|
|
|
1977
|
16 |
1 |
p. 16-
1 p.
|
artikel
|
| 2 |
Accelearted life testing of flexible printed circuits. Part I—Test program and typical results
|
|
|
1977
|
16 |
1 |
p. 14-15
2 p.
|
artikel
|
| 3 |
Accelerated life testing of flexible printed circuits Part II—Failure modes in flexible printed circuits coated with UV-cured resins
|
|
|
1977
|
16 |
1 |
p. 15-
1 p.
|
artikel
|
| 4 |
A CMOS/SOS Reliability Study
|
|
|
1977
|
16 |
1 |
p. 15-
1 p.
|
artikel
|
| 5 |
A good QA can help you survive
|
|
|
1977
|
16 |
1 |
p. 11-
1 p.
|
artikel
|
| 6 |
ALE—a carrier aircraft availability model
|
|
|
1977
|
16 |
1 |
p. 17-
1 p.
|
artikel
|
| 7 |
A method for investigation of fluctuations in doping concentration and minority-carrier diffusion length in semiconductors by scanning electron microscope
|
|
|
1977
|
16 |
1 |
p. 22-23
2 p.
|
artikel
|
| 8 |
A model for burn-in programs for components with eliminateable defects
|
|
|
1977
|
16 |
1 |
p. 14-
1 p.
|
artikel
|
| 9 |
Amplification of acoustic waves in semiconductors with dominants ionized impurity scattering
|
|
|
1977
|
16 |
1 |
p. 25-
1 p.
|
artikel
|
| 10 |
A multi-state system model
|
Dhillon, Balbir S.
|
|
1977
|
16 |
1 |
p. 55-56
2 p.
|
artikel
|
| 11 |
Analyses of two difference 1-server systems
|
|
|
1977
|
16 |
1 |
p. 16-
1 p.
|
artikel
|
| 12 |
Analysis of 7 models for the 2-dissimilar-unit, warm standby, redundant system
|
|
|
1977
|
16 |
1 |
p. 16-
1 p.
|
artikel
|
| 13 |
Analysis of pesudo-reliability of a combat tank system and its optimal design
|
|
|
1977
|
16 |
1 |
p. 17-
1 p.
|
artikel
|
| 14 |
Analytical methods for calculating the characteristic impedance of finite-thickness microstrip lines
|
|
|
1977
|
16 |
1 |
p. 20-
1 p.
|
artikel
|
| 15 |
An automated gaging and sorting machine
|
|
|
1977
|
16 |
1 |
p. 20-
1 p.
|
artikel
|
| 16 |
An efficient algorithm for deducing the minimal cuts and reliability indices of a general network configuration
|
|
|
1977
|
16 |
1 |
p. 17-
1 p.
|
artikel
|
| 17 |
An evaluation of silicon damage resulting from ultrasonic wire bonding
|
|
|
1977
|
16 |
1 |
p. 15-
1 p.
|
artikel
|
| 18 |
A new approach to memory testing
|
|
|
1977
|
16 |
1 |
p. 16-
1 p.
|
artikel
|
| 19 |
A new family of monolithic A/D converter circuits and their applications
|
|
|
1977
|
16 |
1 |
p. 22-
1 p.
|
artikel
|
| 20 |
An investigation of surface effect on glass-passivated p-n junctions
|
|
|
1977
|
16 |
1 |
p. 24-
1 p.
|
artikel
|
| 21 |
An ion implanted bipolar silicon integrated circuit process
|
Sanders, I.R.
|
|
1977
|
16 |
1 |
p. 75-80
6 p.
|
artikel
|
| 22 |
Anomalous frequency dependence of conductivity of amorphous semiconductor films
|
|
|
1977
|
16 |
1 |
p. 25-
1 p.
|
artikel
|
| 23 |
Anomalous temperature dependence of resistivity in heavily doped germanium
|
|
|
1977
|
16 |
1 |
p. 24-
1 p.
|
artikel
|
| 24 |
Approximate confidence intervals for reliability of a series system
|
|
|
1977
|
16 |
1 |
p. 16-
1 p.
|
artikel
|
| 25 |
A review of CCD imaging technology
|
|
|
1977
|
16 |
1 |
p. 18-
1 p.
|
artikel
|
| 26 |
A simple model for the thermo-mechaincal deformations of plated-through-holes in multilayer printed wiring boards
|
|
|
1977
|
16 |
1 |
p. 15-
1 p.
|
artikel
|
| 27 |
A study of surface charge induced inversion failure of junction isolated monolithic silicon integrated circuits
|
|
|
1977
|
16 |
1 |
p. 13-
1 p.
|
artikel
|
| 28 |
A technique for measuring the impurity concentration of silicon-on-sapphire films using C-V plots
|
|
|
1977
|
16 |
1 |
p. 25-26
2 p.
|
artikel
|
| 29 |
A test approach for commercial communication satellites
|
Beisel, F.
|
|
1977
|
16 |
1 |
p. 91-97
7 p.
|
artikel
|
| 30 |
Automatic fault diagnosis on analogue boards
|
|
|
1977
|
16 |
1 |
p. 17-
1 p.
|
artikel
|
| 31 |
Avalanche breakdown in complementary diodes
|
|
|
1977
|
16 |
1 |
p. 13-
1 p.
|
artikel
|
| 32 |
A versatile boron diffusion process
|
|
|
1977
|
16 |
1 |
p. 20-21
2 p.
|
artikel
|
| 33 |
Batch bonded crossovers for thin film circuits
|
|
|
1977
|
16 |
1 |
p. 28-
1 p.
|
artikel
|
| 34 |
Beryllium—a high reliability metallization
|
|
|
1977
|
16 |
1 |
p. 14-
1 p.
|
artikel
|
| 35 |
Bias-humidity performance of encapsulated and unencapsulated Ti-Pd-Au thin-film conductors in an environment contaminated with Cl2
|
|
|
1977
|
16 |
1 |
p. 26-27
2 p.
|
artikel
|
| 36 |
Bibliography for reliability and availability of stochastic systems
|
|
|
1977
|
16 |
1 |
p. 13-
1 p.
|
artikel
|
| 37 |
Bubble domain memories. Present achievements and future applications
|
|
|
1977
|
16 |
1 |
p. 18-
1 p.
|
artikel
|
| 38 |
Bubbles rise from the lab
|
|
|
1977
|
16 |
1 |
p. 18-
1 p.
|
artikel
|
| 39 |
Bulk and interface imperfections in semiconductors
|
|
|
1977
|
16 |
1 |
p. 14-
1 p.
|
artikel
|
| 40 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1977
|
16 |
1 |
p. 3-5
3 p.
|
artikel
|
| 41 |
Call for papers press release
|
|
|
1977
|
16 |
1 |
p. 7-9
3 p.
|
artikel
|
| 42 |
Characterization of plasma etching for semiconductor applications
|
|
|
1977
|
16 |
1 |
p. 20-
1 p.
|
artikel
|
| 43 |
Charge transfer in charge-coupled devices in the presence of interface states
|
|
|
1977
|
16 |
1 |
p. 25-
1 p.
|
artikel
|
| 44 |
Component quality assurance: which plan is better?
|
|
|
1977
|
16 |
1 |
p. 14-
1 p.
|
artikel
|
| 45 |
Computer-aided coarse grid layout technique for photomasks
|
|
|
1977
|
16 |
1 |
p. 19-
1 p.
|
artikel
|
| 46 |
Current liquid crystal display technology
|
|
|
1977
|
16 |
1 |
p. 17-18
2 p.
|
artikel
|
| 47 |
Designing the maximum performance into bit-slice minicomputers
|
|
|
1977
|
16 |
1 |
p. 22-
1 p.
|
artikel
|
| 48 |
Dry film photoresists in microelectronics
|
|
|
1977
|
16 |
1 |
p. 20-
1 p.
|
artikel
|
| 49 |
D− state in silicon
|
|
|
1977
|
16 |
1 |
p. 22-
1 p.
|
artikel
|
| 50 |
Editorial Board
|
|
|
1977
|
16 |
1 |
p. IFC-
1 p.
|
artikel
|
| 51 |
Effective threshold energy for pair production in nonpolar semiconductors
|
|
|
1977
|
16 |
1 |
p. 24-
1 p.
|
artikel
|
| 52 |
Electrical conduction by percolation in thick film resistors
|
|
|
1977
|
16 |
1 |
p. 26-
1 p.
|
artikel
|
| 53 |
Electron-beam-induced currents in simple device structures
|
|
|
1977
|
16 |
1 |
p. 28-
1 p.
|
artikel
|
| 54 |
Electronic density of states of group-IV semiconductors: A cluster-bethe lattice approach for realistic Hamiltonians
|
|
|
1977
|
16 |
1 |
p. 24-
1 p.
|
artikel
|
| 55 |
Electronic structure of semiconducting crystals under high stress
|
|
|
1977
|
16 |
1 |
p. 23-
1 p.
|
artikel
|
| 56 |
Encapsulation of integrated circuits containing beam leaded devices with a silicone RTV dispersion
|
|
|
1977
|
16 |
1 |
p. 19-
1 p.
|
artikel
|
| 57 |
ESR in iron doped silicon crystals under stress
|
|
|
1977
|
16 |
1 |
p. 24-
1 p.
|
artikel
|
| 58 |
Evidence for mobility domains in (100) silicon inversion layers
|
|
|
1977
|
16 |
1 |
p. 25-
1 p.
|
artikel
|
| 59 |
First-in-first-out unit is fast, dense
|
|
|
1977
|
16 |
1 |
p. 28-
1 p.
|
artikel
|
| 60 |
Gold aluminum interconnect stability on thin film hybrid microcircuit substrates
|
|
|
1977
|
16 |
1 |
p. 28-
1 p.
|
artikel
|
| 61 |
Hall effects in thin films of gold-silver alloys
|
|
|
1977
|
16 |
1 |
p. 28-
1 p.
|
artikel
|
| 62 |
High transmission X-ray masks for lithographic applications
|
|
|
1977
|
16 |
1 |
p. 19-
1 p.
|
artikel
|
| 63 |
Hot electron induced degradation of N-channel IGFETs
|
|
|
1977
|
16 |
1 |
p. 15-
1 p.
|
artikel
|
| 64 |
Hybrid protective device for MOS-LSI chips
|
|
|
1977
|
16 |
1 |
p. 20-
1 p.
|
artikel
|
| 65 |
IC simulates matched transistor pairs
|
|
|
1977
|
16 |
1 |
p. 22-
1 p.
|
artikel
|
| 66 |
Implanted high value resistors
|
|
|
1977
|
16 |
1 |
p. 28-
1 p.
|
artikel
|
| 67 |
Influence of crystallographic and electrophysical imperfections in monocrystalline silicon on the formation of microplasmas in p-n junctions
|
|
|
1977
|
16 |
1 |
p. 24-
1 p.
|
artikel
|
| 68 |
Introduction to charge-coupled devices
|
|
|
1977
|
16 |
1 |
p. 17-
1 p.
|
artikel
|
| 69 |
Investigation into failures of AI wires bonded to Au metallization in microsubstrates
|
|
|
1977
|
16 |
1 |
p. 19-20
2 p.
|
artikel
|
| 70 |
Ion etching of platinum and palladium layers in beam lead technology
|
|
|
1977
|
16 |
1 |
p. 28-
1 p.
|
artikel
|
| 71 |
Large scale integration
|
|
|
1977
|
16 |
1 |
p. 18-
1 p.
|
artikel
|
| 72 |
12L chip provides phase-locked loop for citizens' radio
|
|
|
1977
|
16 |
1 |
p. 22-
1 p.
|
artikel
|
| 73 |
Low TCR thick film resistors for potentiometers
|
|
|
1977
|
16 |
1 |
p. 26-
1 p.
|
artikel
|
| 74 |
Magnetic bubble memory—a pilot model
|
|
|
1977
|
16 |
1 |
p. 21-
1 p.
|
artikel
|
| 75 |
Majority and similarity voting in analogue redundant systems
|
Klaassen, K.B.
|
|
1977
|
16 |
1 |
p. 47-54
8 p.
|
artikel
|
| 76 |
Mask alignment for the fabrication of integrated circuits using X-ray lithography
|
|
|
1977
|
16 |
1 |
p. 18-19
2 p.
|
artikel
|
| 77 |
Masks for printing thick-film circuits
|
Dubey, G.C.
|
|
1977
|
16 |
1 |
p. 69-73
5 p.
|
artikel
|
| 78 |
Measurement of concentration profile of conduction electrons in semiconductor epitaxial layers
|
|
|
1977
|
16 |
1 |
p. 22-
1 p.
|
artikel
|
| 79 |
Measurement of land to plated-through-hole interface resistance in multilayer boards
|
|
|
1977
|
16 |
1 |
p. 14-
1 p.
|
artikel
|
| 80 |
Measurement of thermo-mechanical strains in plated-through-holes
|
|
|
1977
|
16 |
1 |
p. 15-
1 p.
|
artikel
|
| 81 |
Memory architecture and the influence of the microprocessor
|
|
|
1977
|
16 |
1 |
p. 22-
1 p.
|
artikel
|
| 82 |
Metallurgical aspects of aluminium wire bonds to gold metallization
|
|
|
1977
|
16 |
1 |
p. 20-
1 p.
|
artikel
|
| 83 |
Methods for evaluating plated-through-hole reliability
|
|
|
1977
|
16 |
1 |
p. 15-
1 p.
|
artikel
|
| 84 |
“Microelectronics and Reliability” Abstracts
|
Dummer, G.W.A.
|
|
1977
|
16 |
1 |
p. 1-
1 p.
|
artikel
|
| 85 |
Microsurgery as a tool in the analysis of L.S.I.
|
|
|
1977
|
16 |
1 |
p. 15-
1 p.
|
artikel
|
| 86 |
Mixed-process devices gain ground
|
|
|
1977
|
16 |
1 |
p. 22-
1 p.
|
artikel
|
| 87 |
Modelling of channel enhancement effects on the write characteristics of FAMOS devices
|
|
|
1977
|
16 |
1 |
p. 23-
1 p.
|
artikel
|
| 88 |
Moisture, myths and microcircuits
|
|
|
1977
|
16 |
1 |
p. 20-
1 p.
|
artikel
|
| 89 |
MOS and the static problem
|
|
|
1977
|
16 |
1 |
p. 21-
1 p.
|
artikel
|
| 90 |
MOTT transition of the electron-hole liquid in Ge
|
|
|
1977
|
16 |
1 |
p. 26-
1 p.
|
artikel
|
| 91 |
Network recognition of a MOS integrated circuit from its masks
|
|
|
1977
|
16 |
1 |
p. 20-
1 p.
|
artikel
|
| 92 |
Neutron activation analysis and autoradiographic purity examination of semiconductor grade silicon wafers
|
|
|
1977
|
16 |
1 |
p. 19-
1 p.
|
artikel
|
| 93 |
New analogue component concepts for digital processing systems
|
Haynes, G.
|
|
1977
|
16 |
1 |
p. 57-67
11 p.
|
artikel
|
| 94 |
New method of influencing semiconductor surface properties
|
|
|
1977
|
16 |
1 |
p. 22-
1 p.
|
artikel
|
| 95 |
OHMIC contact to p-type GaP
|
|
|
1977
|
16 |
1 |
p. 23-
1 p.
|
artikel
|
| 96 |
On reliability prediction of repairable redundant digital structures
|
|
|
1977
|
16 |
1 |
p. 16-
1 p.
|
artikel
|
| 97 |
On the absorption of infrared radiation by electrons in semiconductor inversion layers
|
|
|
1977
|
16 |
1 |
p. 23-
1 p.
|
artikel
|
| 98 |
On the behaviour of some quantities used in Bayesian reliability demonstration tests
|
|
|
1977
|
16 |
1 |
p. 16-17
2 p.
|
artikel
|
| 99 |
Oxidation of silicon: new electron spectroscopy results
|
|
|
1977
|
16 |
1 |
p. 24-
1 p.
|
artikel
|
| 100 |
Parallel gap welding to thick-film metallization
|
|
|
1977
|
16 |
1 |
p. 26-
1 p.
|
artikel
|
| 101 |
Photoconductivity of a semiconductor with large-scale fluctuations of electrostatic potential: a case of an impurity recombination
|
|
|
1977
|
16 |
1 |
p. 23-
1 p.
|
artikel
|
| 102 |
Photoluminescence spectra of germanium at high excitation intensities
|
|
|
1977
|
16 |
1 |
p. 26-
1 p.
|
artikel
|
| 103 |
Photon assisted tunneling from aluminum into silicon dioxide
|
|
|
1977
|
16 |
1 |
p. 24-
1 p.
|
artikel
|
| 104 |
Plasma reactor design for the selective etching of SiO2 on Si
|
|
|
1977
|
16 |
1 |
p. 18-
1 p.
|
artikel
|
| 105 |
Properties of inlay clad wrought gold alloys
|
|
|
1977
|
16 |
1 |
p. 20-
1 p.
|
artikel
|
| 106 |
Pulsed overload tolerance of Si/Cr, Ni/Cr and Mo/Si thin film resistors on integrated circuits
|
|
|
1977
|
16 |
1 |
p. 28-
1 p.
|
artikel
|
| 107 |
Pumping characteristics of a vacuum system using a rotary pump and sublimation pump
|
|
|
1977
|
16 |
1 |
p. 27-
1 p.
|
artikel
|
| 108 |
Quality assurance in the nuclear industry. Moving on to a new stage of maturity
|
|
|
1977
|
16 |
1 |
p. 16-
1 p.
|
artikel
|
| 109 |
Quality control in PC manufacturing
|
|
|
1977
|
16 |
1 |
p. 14-
1 p.
|
artikel
|
| 110 |
Rapid formation kinetics of a long-lived electron-hole drop in Ge under pulsed excitation
|
|
|
1977
|
16 |
1 |
p. 24-
1 p.
|
artikel
|
| 111 |
Recent developments in the design and application of a bipolar control store sequencer and other MPU associated LSI components
|
|
|
1977
|
16 |
1 |
p. 21-
1 p.
|
artikel
|
| 112 |
Regular periodic “explosions” of electron-hole drops under steady-state illumination and microwave heating
|
|
|
1977
|
16 |
1 |
p. 23-
1 p.
|
artikel
|
| 113 |
Relaxation of (111) silicon surface atoms from studies of Si4H9 clusters
|
|
|
1977
|
16 |
1 |
p. 26-
1 p.
|
artikel
|
| 114 |
Reliability analysis of logic circuits
|
DesMarais, P.
|
|
1977
|
16 |
1 |
p. 29-33
5 p.
|
artikel
|
| 115 |
Reliability implications of hot electron generation and parasitic bipolar action in an IGFET device
|
|
|
1977
|
16 |
1 |
p. 15-
1 p.
|
artikel
|
| 116 |
Reliability model and analysis of a system with non-exponential down-time distributions including a derated state
|
Schenk, K.F.
|
|
1977
|
16 |
1 |
p. 35-40
6 p.
|
artikel
|
| 117 |
Repair limit suspension policies for a two-unit standby redundant system with two phase repairs
|
Osaki, S.
|
|
1977
|
16 |
1 |
p. 41-45
5 p.
|
artikel
|
| 118 |
Resistivity recovery of thin sputtered aluminium films
|
|
|
1977
|
16 |
1 |
p. 27-
1 p.
|
artikel
|
| 119 |
SCF-Xα studies of the electronic structures of C, Si and Ge oxides
|
|
|
1977
|
16 |
1 |
p. 25-
1 p.
|
artikel
|
| 120 |
Schottky solar cells on thin epitaxial silicon
|
|
|
1977
|
16 |
1 |
p. 25-
1 p.
|
artikel
|
| 121 |
Search for reliability
|
|
|
1977
|
16 |
1 |
p. 16-
1 p.
|
artikel
|
| 122 |
Semiconductor materials for future display devices
|
|
|
1977
|
16 |
1 |
p. 18-
1 p.
|
artikel
|
| 123 |
Short communication. An inexpensive thick film furnace
|
|
|
1977
|
16 |
1 |
p. 27-
1 p.
|
artikel
|
| 124 |
Silicon wafer reclamation—a processing service
|
|
|
1977
|
16 |
1 |
p. 21-
1 p.
|
artikel
|
| 125 |
Solid state displays, engineering considerations for the third generation
|
|
|
1977
|
16 |
1 |
p. 21-
1 p.
|
artikel
|
| 126 |
Some comparisons between redundant structures for telephone exchange central control
|
|
|
1977
|
16 |
1 |
p. 17-
1 p.
|
artikel
|
| 127 |
Some studies on the instability in MOS devices due to water vapour contamination
|
|
|
1977
|
16 |
1 |
p. 13-
1 p.
|
artikel
|
| 128 |
Space shuttle component reuse study
|
|
|
1977
|
16 |
1 |
p. 17-
1 p.
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artikel
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| 129 |
Spin-dependent recombination in a silicon p-n junction
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1977
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16 |
1 |
p. 24-
1 p.
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artikel
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| 130 |
Stable and unstable surface state charge in thermally oxidised silicon
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1977
|
16 |
1 |
p. 22-
1 p.
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artikel
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| 131 |
Stereo Radiography of complex multilayered microcircuits
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1977
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16 |
1 |
p. 20-
1 p.
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artikel
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| 132 |
Strahlungsbelastungs-untersuchungen an elektronischen bauelementen des symphonie-satelliten
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Spencker, A.
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1977
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16 |
1 |
p. 81-89
9 p.
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artikel
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| 133 |
Structure and applications of field programmable logic arrays
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1977
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16 |
1 |
p. 21-
1 p.
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artikel
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| 134 |
Surface states and metal overlayers on the (110) surface of GaAs
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1977
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16 |
1 |
p. 25-
1 p.
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artikel
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| 135 |
Survey of hybrid microelectronics in the U.K.
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1977
|
16 |
1 |
p. 26-
1 p.
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artikel
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| 136 |
Temperature dependence of resistivity and hole conductivity mobility in p-type silicon
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1977
|
16 |
1 |
p. 23-
1 p.
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artikel
|
| 137 |
The current-voltage characteristics of MOS structures as measured with the triangular voltage sweep method
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1977
|
16 |
1 |
p. 24-25
2 p.
|
artikel
|
| 138 |
The detection of barrel cracks in plated through holes using four point resistance measurements
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1977
|
16 |
1 |
p. 14-
1 p.
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artikel
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| 139 |
The development and future of television horizontal processors
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1977
|
16 |
1 |
p. 22-
1 p.
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artikel
|
| 140 |
The effect of impurities on the corrosion of aluminum metallization
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1977
|
16 |
1 |
p. 15-
1 p.
|
artikel
|
| 141 |
The effects of radiation damage on the properties of Ni-nGaAs Schottky diodes—III Annealing Studies
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|
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1977
|
16 |
1 |
p. 14-
1 p.
|
artikel
|
| 142 |
The effects of stacking faults on the electrical properties of a high voltage power transistor
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|
1977
|
16 |
1 |
p. 13-
1 p.
|
artikel
|
| 143 |
The importance of considering test needs in circuit design
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|
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1977
|
16 |
1 |
p. 16-
1 p.
|
artikel
|
| 144 |
The mechanics of gold beam leads during thermocompression bonding
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1977
|
16 |
1 |
p. 19-
1 p.
|
artikel
|
| 145 |
The mechanisms of degradation in an optically coupled isolator
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1977
|
16 |
1 |
p. 13-
1 p.
|
artikel
|
| 146 |
The numerical solution of Poisson's equation for two-dimensional semiconductor devices
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1977
|
16 |
1 |
p. 26-
1 p.
|
artikel
|
| 147 |
The properties of gate-controlled diffused microresistors
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|
|
1977
|
16 |
1 |
p. 23-
1 p.
|
artikel
|
| 148 |
Thermocycling fails solder chips
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|
|
1977
|
16 |
1 |
p. 14-
1 p.
|
artikel
|
| 149 |
The statistics of nearest neighbour impurity pair formation in semiconductors
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1977
|
16 |
1 |
p. 25-
1 p.
|
artikel
|
| 150 |
The use of acoustic emission in a test for beam lead bond integrity
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1977
|
16 |
1 |
p. 19-
1 p.
|
artikel
|
| 151 |
The versatile technique of RF plasma etching
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|
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1977
|
16 |
1 |
p. 20-
1 p.
|
artikel
|
| 152 |
Thick film hybrid microcircuits—general applications
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|
|
1977
|
16 |
1 |
p. 27-
1 p.
|
artikel
|
| 153 |
Trends in thick film materials
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1977
|
16 |
1 |
p. 27-
1 p.
|
artikel
|
| 154 |
Tunnelling current versus voltage characteristics in metalinsulator-metal films
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|
|
1977
|
16 |
1 |
p. 25-
1 p.
|
artikel
|
| 155 |
Valley degeneracy and mobility anisotropy under mechanical stress on (111) silicon inversion layers
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|
|
1977
|
16 |
1 |
p. 23-24
2 p.
|
artikel
|
| 156 |
Vapor Phase solder reflow for hybrid circuit manufacturing
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|
|
1977
|
16 |
1 |
p. 27-
1 p.
|
artikel
|
| 157 |
“Worked Examples of Engineering Field Theory” by A. J. Baden Fuller
|
G.W.A.D.,
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|
1977
|
16 |
1 |
p. 10-
1 p.
|
artikel
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