| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A Bayesian reliability assessment of complex systems for binomial sampling
|
|
|
1975
|
14 |
5-6 |
p. 408-
1 p.
|
artikel
|
| 2 |
Acceleration factors for plastic encapsulated semiconductor devices and their relationship to field performance
|
|
|
1975
|
14 |
5-6 |
p. 405-
1 p.
|
artikel
|
| 3 |
A comparative reliability evaluation of CMOS. A maturing technology
|
|
|
1975
|
14 |
5-6 |
p. 406-
1 p.
|
artikel
|
| 4 |
A metallization system for microwave and UHF power transistors
|
|
|
1975
|
14 |
5-6 |
p. 410-
1 p.
|
artikel
|
| 5 |
A modified reliability expression for the electromigration time-to-failure
|
Bobbio, A.
|
|
1975
|
14 |
5-6 |
p. 431-433
3 p.
|
artikel
|
| 6 |
An academic profile. Education in reliability engineering
|
|
|
1975
|
14 |
5-6 |
p. 403-
1 p.
|
artikel
|
| 7 |
Analysis of deposited glass layer defects
|
|
|
1975
|
14 |
5-6 |
p. 404-
1 p.
|
artikel
|
| 8 |
Analysis of semiconductor surfaces by spark source mass spectrometry
|
|
|
1975
|
14 |
5-6 |
p. 412-
1 p.
|
artikel
|
| 9 |
An evaluation of design-sensitive maintainability-prediction technique
|
|
|
1975
|
14 |
5-6 |
p. 408-
1 p.
|
artikel
|
| 10 |
A profile of activities in reliability studies at the University of Windsor
|
|
|
1975
|
14 |
5-6 |
p. 403-
1 p.
|
artikel
|
| 11 |
A report on a survey of the specification and attainment of reliability in communications equipment
|
|
|
1975
|
14 |
5-6 |
p. 408-
1 p.
|
artikel
|
| 12 |
A three-state system Markov model
|
Proctor, C.L.
|
|
1975
|
14 |
5-6 |
p. 463-464
2 p.
|
artikel
|
| 13 |
A universal MOS-LSI testing system
|
|
|
1975
|
14 |
5-6 |
p. 411-
1 p.
|
artikel
|
| 14 |
Automated circuit testers lead the way out of continuity maze
|
|
|
1975
|
14 |
5-6 |
p. 411-
1 p.
|
artikel
|
| 15 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1975
|
14 |
5-6 |
p. 399-
1 p.
|
artikel
|
| 16 |
Characteristics of enhancement/depletion (E/D) gate MOSFET fabricated using ion implantation
|
|
|
1975
|
14 |
5-6 |
p. 414-
1 p.
|
artikel
|
| 17 |
Circuit-analysis program can model many digital ICs automatically
|
|
|
1975
|
14 |
5-6 |
p. 410-
1 p.
|
artikel
|
| 18 |
Circuits employing small-size field effect transistors
|
|
|
1975
|
14 |
5-6 |
p. 410-
1 p.
|
artikel
|
| 19 |
Combined ferrite-dielectric substrates for integrated circuits in microwave technique
|
|
|
1975
|
14 |
5-6 |
p. 410-
1 p.
|
artikel
|
| 20 |
Computational time and absolute error comparison for reliability expression derived by various methods
|
Aggarwal, K.K.
|
|
1975
|
14 |
5-6 |
p. 465-467
3 p.
|
artikel
|
| 21 |
“Condensation” of impurities in semiconductors (Si+Li)
|
|
|
1975
|
14 |
5-6 |
p. 412-
1 p.
|
artikel
|
| 22 |
Consider 1024-bit C-MOS RAMs for small static-memory systems
|
|
|
1975
|
14 |
5-6 |
p. 411-
1 p.
|
artikel
|
| 23 |
Cost of ownership—an overview. Life cycle costs: evaluation of avionic system reliability improvements
|
|
|
1975
|
14 |
5-6 |
p. 408-
1 p.
|
artikel
|
| 24 |
Decision theoretic approach to the design of reliability systems
|
|
|
1975
|
14 |
5-6 |
p. 407-
1 p.
|
artikel
|
| 25 |
Degradation mechanisms in rewritable n-channel FAMOS devices
|
|
|
1975
|
14 |
5-6 |
p. 405-
1 p.
|
artikel
|
| 26 |
Design for quality: A designer's notebook for electronic systems
|
|
|
1975
|
14 |
5-6 |
p. 407-
1 p.
|
artikel
|
| 27 |
Determination of useful life of two-layer metallization systems via accelerated stressing
|
|
|
1975
|
14 |
5-6 |
p. 410-
1 p.
|
artikel
|
| 28 |
Developpement d'un modele theorique d'evolution de surfaces soumises au bombardement ionique pour applications a la gravure
|
Cantagrel, M
|
|
1975
|
14 |
5-6 |
p. 419-424
6 p.
|
artikel
|
| 29 |
Dosing the phosphorus in silicon and doped oxides by X-fluorescence
|
|
|
1975
|
14 |
5-6 |
p. 412-
1 p.
|
artikel
|
| 30 |
Dynamic environment factors in determining electronic assembly reliability
|
|
|
1975
|
14 |
5-6 |
p. 408-
1 p.
|
artikel
|
| 31 |
Educational needs for reliability and maintainability
|
|
|
1975
|
14 |
5-6 |
p. 403-
1 p.
|
artikel
|
| 32 |
Effect of substrate resistance on MOS distributed RC notch network
|
Bozic, S.M.
|
|
1975
|
14 |
5-6 |
p. 435-437
3 p.
|
artikel
|
| 33 |
Effects of band non-parabolicity on electron drift velocity in silicon above room temperature
|
|
|
1975
|
14 |
5-6 |
p. 412-413
2 p.
|
artikel
|
| 34 |
Effects of fast temperature cycling on alumium and gold metal systems
|
|
|
1975
|
14 |
5-6 |
p. 405-
1 p.
|
artikel
|
| 35 |
Electromigration failure in Au thin-film conductors
|
|
|
1975
|
14 |
5-6 |
p. 404-405
2 p.
|
artikel
|
| 36 |
Electron-beam trimming of thin and thick film resistor networks
|
|
|
1975
|
14 |
5-6 |
p. 415-
1 p.
|
artikel
|
| 37 |
Empirical reliability models of complex structures
|
|
|
1975
|
14 |
5-6 |
p. 407-
1 p.
|
artikel
|
| 38 |
Enhanced solubility and ion pairing of Cu and Au in heavily doped silicon at high temperatures
|
|
|
1975
|
14 |
5-6 |
p. 412-
1 p.
|
artikel
|
| 39 |
Epoxy bonding for integrated circuits
|
|
|
1975
|
14 |
5-6 |
p. 409-
1 p.
|
artikel
|
| 40 |
Evaluation testing of integrated circuits
|
|
|
1975
|
14 |
5-6 |
p. 406-
1 p.
|
artikel
|
| 41 |
Failure mechanisms in pulsed RF power transistors
|
|
|
1975
|
14 |
5-6 |
p. 404-
1 p.
|
artikel
|
| 42 |
Flatness measurements in semiconductor technology
|
|
|
1975
|
14 |
5-6 |
p. 409-
1 p.
|
artikel
|
| 43 |
4 GHz band low-noise preamplifier
|
|
|
1975
|
14 |
5-6 |
p. 410-411
2 p.
|
artikel
|
| 44 |
High reliability photodiodes for space applications
|
|
|
1975
|
14 |
5-6 |
p. 406-
1 p.
|
artikel
|
| 45 |
Hybrid packages by the direct bonded copper process
|
|
|
1975
|
14 |
5-6 |
p. 413-
1 p.
|
artikel
|
| 46 |
Hybrid technology loose particles and coating materials
|
|
|
1975
|
14 |
5-6 |
p. 413-
1 p.
|
artikel
|
| 47 |
IC fabrication improvements combat hostile environments
|
|
|
1975
|
14 |
5-6 |
p. 409-
1 p.
|
artikel
|
| 48 |
IC runs complex radio
|
|
|
1975
|
14 |
5-6 |
p. 411-
1 p.
|
artikel
|
| 49 |
Impulse-bonded wiring is economical alternative to multilayer boards
|
|
|
1975
|
14 |
5-6 |
p. 410-
1 p.
|
artikel
|
| 50 |
Inspection and supervision of cable quality, during fabrication, using an auto-test unit TM02
|
|
|
1975
|
14 |
5-6 |
p. 406-
1 p.
|
artikel
|
| 51 |
Instrumentation for electron beam lithography
|
|
|
1975
|
14 |
5-6 |
p. 415-
1 p.
|
artikel
|
| 52 |
Interface charge characteristics of MOS structures with different metals on steam grown oxides
|
|
|
1975
|
14 |
5-6 |
p. 412-
1 p.
|
artikel
|
| 53 |
Local-exchange renewal strategy: Maintenance man-hour requirements
|
|
|
1975
|
14 |
5-6 |
p. 407-
1 p.
|
artikel
|
| 54 |
Low frequency conductance and capacitance measurements on MOS capacitors in weak inversion
|
|
|
1975
|
14 |
5-6 |
p. 413-
1 p.
|
artikel
|
| 55 |
Masking and duplication in the realm of 1 μm wide lines. State of the art and prospects in optics and electronics
|
|
|
1975
|
14 |
5-6 |
p. 409-
1 p.
|
artikel
|
| 56 |
Materials control for the manufacture of thin-film hybrid circuits
|
|
|
1975
|
14 |
5-6 |
p. 413-414
2 p.
|
artikel
|
| 57 |
Mathematics of diffusion controlled precipitates with time-dependent boundary conditions
|
|
|
1975
|
14 |
5-6 |
p. 412-
1 p.
|
artikel
|
| 58 |
Migrated-gold resistive shorts in microcircuits
|
|
|
1975
|
14 |
5-6 |
p. 405-
1 p.
|
artikel
|
| 59 |
Migratory gold resistive shorts: chemical aspects of a failure mechanism
|
|
|
1975
|
14 |
5-6 |
p. 405-
1 p.
|
artikel
|
| 60 |
Military IC standardization, acquisition and technology
|
|
|
1975
|
14 |
5-6 |
p. 409-
1 p.
|
artikel
|
| 61 |
MIL-STD-781B: Effect of a “Continue Test” decision
|
|
|
1975
|
14 |
5-6 |
p. 407-
1 p.
|
artikel
|
| 62 |
Model band structure of reconstructed (111) 2×1 surface of silicon
|
|
|
1975
|
14 |
5-6 |
p. 413-
1 p.
|
artikel
|
| 63 |
Modelling transient faults in TMR computer systems
|
|
|
1975
|
14 |
5-6 |
p. 407-
1 p.
|
artikel
|
| 64 |
Multichip integrated circuit memory with photoformed plated conductors
|
|
|
1975
|
14 |
5-6 |
p. 411-
1 p.
|
artikel
|
| 65 |
On chemical cleaning for thermocompression bonding
|
|
|
1975
|
14 |
5-6 |
p. 409-410
2 p.
|
artikel
|
| 66 |
On computer-oriented design of microstrip amplifiers with component tolerance assignment
|
|
|
1975
|
14 |
5-6 |
p. 406-
1 p.
|
artikel
|
| 67 |
On the propagation of impulses in thin film distributed parameter networks
|
|
|
1975
|
14 |
5-6 |
p. 414-
1 p.
|
artikel
|
| 68 |
Operation and Characterization of Micronic and Submicronic MESFETs
|
|
|
1975
|
14 |
5-6 |
p. 409-
1 p.
|
artikel
|
| 69 |
Packages and film resistors for hybrid microcircuits
|
|
|
1975
|
14 |
5-6 |
p. 413-
1 p.
|
artikel
|
| 70 |
Physical limits in digital electronics
|
|
|
1975
|
14 |
5-6 |
p. 409-
1 p.
|
artikel
|
| 71 |
Planar InSb photodiodes fabricated by Be and Mg ion implantation
|
|
|
1975
|
14 |
5-6 |
p. 414-415
2 p.
|
artikel
|
| 72 |
Power supplies for C-MOS
|
|
|
1975
|
14 |
5-6 |
p. 411-
1 p.
|
artikel
|
| 73 |
Practical uses of accelerated testing at Motorola
|
|
|
1975
|
14 |
5-6 |
p. 404-
1 p.
|
artikel
|
| 74 |
Predicting the Reliability of Systems Using Complex MOS/LSI Devices in Automotive Application
|
|
|
1975
|
14 |
5-6 |
p. 408-
1 p.
|
artikel
|
| 75 |
Prediction of software reliability during debugging
|
|
|
1975
|
14 |
5-6 |
p. 407-
1 p.
|
artikel
|
| 76 |
Printed Circuit Troubleshooting
|
G.W.A.D.,
|
|
1975
|
14 |
5-6 |
p. 417-
1 p.
|
artikel
|
| 77 |
Process control by means of accelerated testing
|
|
|
1975
|
14 |
5-6 |
p. 410-
1 p.
|
artikel
|
| 78 |
Properties of zirconium nitride film resistors deposited by reactive RF sputtering
|
|
|
1975
|
14 |
5-6 |
p. 414-
1 p.
|
artikel
|
| 79 |
Publications, notices, calls for papers, etc.
|
|
|
1975
|
14 |
5-6 |
p. 401-402
2 p.
|
artikel
|
| 80 |
Reliability and flow graphs
|
Råde, L.
|
|
1975
|
14 |
5-6 |
p. 447-450
4 p.
|
artikel
|
| 81 |
Reliability case history of an airborne air data computer
|
|
|
1975
|
14 |
5-6 |
p. 406-407
2 p.
|
artikel
|
| 82 |
Reliability demonstration: purposes, practices and value
|
|
|
1975
|
14 |
5-6 |
p. 407-
1 p.
|
artikel
|
| 83 |
Reliability evaluation. A comparative study of different techniques
|
|
|
1975
|
14 |
5-6 |
p. 403-
1 p.
|
artikel
|
| 84 |
Reliability evaluation of hermetic integrated circuit chips in plastic packages
|
|
|
1975
|
14 |
5-6 |
p. 405-
1 p.
|
artikel
|
| 85 |
Reliability growth of electronic equipment
|
Mead, P.H.
|
|
1975
|
14 |
5-6 |
p. 439-443
5 p.
|
artikel
|
| 86 |
Reliability Improvements
|
|
|
1975
|
14 |
5-6 |
p. 408-
1 p.
|
artikel
|
| 87 |
Reliability of a 2-Unit standby redundant system with repair, maintenance and standby failure
|
|
|
1975
|
14 |
5-6 |
p. 408-
1 p.
|
artikel
|
| 88 |
Reliability of interconnections on microcircuits
|
|
|
1975
|
14 |
5-6 |
p. 406-
1 p.
|
artikel
|
| 89 |
Reliability of microwave gallium arsenide field effect transistors
|
|
|
1975
|
14 |
5-6 |
p. 404-
1 p.
|
artikel
|
| 90 |
Reliability studies at Carleton University
|
|
|
1975
|
14 |
5-6 |
p. 403-
1 p.
|
artikel
|
| 91 |
Reliability study of microwave transistors
|
|
|
1975
|
14 |
5-6 |
p. 404-
1 p.
|
artikel
|
| 92 |
Repairs to complex hybrid circuits—their effect on reliability
|
|
|
1975
|
14 |
5-6 |
p. 414-
1 p.
|
artikel
|
| 93 |
Results of a 160 × 106 device-hour reliability assessment and failure analysis of TTL SSI integrated circuits, part 2 survey of dominant IC failure mechanisms and analysis of failure causes
|
kemény, A.P.
|
|
1975
|
14 |
5-6 |
p. 499-500
2 p.
|
artikel
|
| 94 |
Results of A 160 × 106 device-hour reliability assessment and failure analysis of TTL SSI integrated circuits, part 1 test results and electrical failure analysis
|
Kemény, A.P.
|
|
1975
|
14 |
5-6 |
p. 469-470
2 p.
|
artikel
|
| 95 |
Reverse bias stresses on emitter-base junctions
|
|
|
1975
|
14 |
5-6 |
p. 406-
1 p.
|
artikel
|
| 96 |
Scanned surface photovoltage detection of defects in silicon wafers
|
|
|
1975
|
14 |
5-6 |
p. 404-
1 p.
|
artikel
|
| 97 |
Slow states in InSb/SiOx thin film transistors
|
|
|
1975
|
14 |
5-6 |
p. 414-
1 p.
|
artikel
|
| 98 |
Small field effect transistors. Research on the normally-off channel type
|
|
|
1975
|
14 |
5-6 |
p. 410-
1 p.
|
artikel
|
| 99 |
Solubility of gold in p-type silicon
|
|
|
1975
|
14 |
5-6 |
p. 412-
1 p.
|
artikel
|
| 100 |
Some approaches to Bayesian reliability demonstration
|
|
|
1975
|
14 |
5-6 |
p. 407-
1 p.
|
artikel
|
| 101 |
Some reliability aspects of carbon film resistors
|
|
|
1975
|
14 |
5-6 |
p. 405-406
2 p.
|
artikel
|
| 102 |
SOS island edge profiles following oxidation
|
|
|
1975
|
14 |
5-6 |
p. 413-
1 p.
|
artikel
|
| 103 |
Special report: C-MOS enlarges its territory
|
|
|
1975
|
14 |
5-6 |
p. 409-
1 p.
|
artikel
|
| 104 |
Specifications and reliability
|
Thompson, P.M.
|
|
1975
|
14 |
5-6 |
p. 527-528
2 p.
|
artikel
|
| 105 |
Stochastic behavior of two-unit paralleled redundant systems with repair maintenance
|
Nakagawa, Toshio
|
|
1975
|
14 |
5-6 |
p. 457-461
5 p.
|
artikel
|
| 106 |
Stochastic behaviour of a two-unit priority standby redundant system with repair
|
|
|
1975
|
14 |
5-6 |
p. 407-
1 p.
|
artikel
|
| 107 |
Surface quantum oscillations in (110) and (111) n-type silicon inversion layers
|
|
|
1975
|
14 |
5-6 |
p. 413-
1 p.
|
artikel
|
| 108 |
Susceptibility of microwelds in hybrid microcircuits to corrosion degradation
|
|
|
1975
|
14 |
5-6 |
p. 405-
1 p.
|
artikel
|
| 109 |
Testing of the layout of integrated solid-state circuits, in particular of bipolar ones
|
|
|
1975
|
14 |
5-6 |
p. 411-
1 p.
|
artikel
|
| 110 |
The Canadian Nuclear Association. R. & M. Standard
|
|
|
1975
|
14 |
5-6 |
p. 403-404
2 p.
|
artikel
|
| 111 |
The corrosive activity of fluxes
|
|
|
1975
|
14 |
5-6 |
p. 406-
1 p.
|
artikel
|
| 112 |
The effects of SO2 and H2S atmospheres on thick film resistors
|
Coleman, M.V.
|
|
1975
|
14 |
5-6 |
p. 445-446
2 p.
|
artikel
|
| 113 |
The graphical reliability evaluation of three-state device networks
|
|
|
1975
|
14 |
5-6 |
p. 404-
1 p.
|
artikel
|
| 114 |
The microcircuit pacemaker. Space age spin-off to achieve reliability and long life
|
|
|
1975
|
14 |
5-6 |
p. 411-
1 p.
|
artikel
|
| 115 |
Theoretical influence of surface states and bulk traps on thin film transistor characteristics
|
|
|
1975
|
14 |
5-6 |
p. 414-
1 p.
|
artikel
|
| 116 |
The set approach to determine the frequency of system failure
|
|
|
1975
|
14 |
5-6 |
p. 407-
1 p.
|
artikel
|
| 117 |
The squeegee in printing of electronic circuits
|
Dubey, G.C.
|
|
1975
|
14 |
5-6 |
p. 427-429
3 p.
|
artikel
|
| 118 |
Transistor structure relation to secondary breakdown and its effects
|
Aharoni, H.
|
|
1975
|
14 |
5-6 |
p. 451-452
2 p.
|
artikel
|
| 119 |
“Troubleshooting” color TV. More smoke than fire may emanate from widely publicized consumer surveys and hazard data
|
|
|
1975
|
14 |
5-6 |
p. 408-409
2 p.
|
artikel
|
| 120 |
Tunnel injection into gate oxide traps
|
|
|
1975
|
14 |
5-6 |
p. 413-
1 p.
|
artikel
|
| 121 |
Two instrument ICs sum six inputs
|
|
|
1975
|
14 |
5-6 |
p. 411-
1 p.
|
artikel
|
| 122 |
Width dependence of electromigration life in Al-Cu, Al-Cu-Si and Ag conductors
|
|
|
1975
|
14 |
5-6 |
p. 405-
1 p.
|
artikel
|
| 123 |
X-ray diffraction stress measurements in thin films
|
|
|
1975
|
14 |
5-6 |
p. 414-
1 p.
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