| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A Bayesian estimate of reliability in the Weibull distribution
|
|
|
1974
|
13 |
6 |
p. 442-
1 p.
|
artikel
|
| 2 |
A Bayesian reliability model with a stochastically memotone failure rate
|
|
|
1974
|
13 |
6 |
p. 445-
1 p.
|
artikel
|
| 3 |
A comparison of methods for analyzing censored life data to estimate relationships between and product life
|
|
|
1974
|
13 |
6 |
p. 442-
1 p.
|
artikel
|
| 4 |
A definition of probability for reliability prediction
|
|
|
1974
|
13 |
6 |
p. 444-
1 p.
|
artikel
|
| 5 |
A hermetically sealed 20-GHz integrated mixer
|
|
|
1974
|
13 |
6 |
p. 451-452
2 p.
|
artikel
|
| 6 |
A high frequency microcircuit packaging and interconnection system
|
|
|
1974
|
13 |
6 |
p. 447-
1 p.
|
artikel
|
| 7 |
Air through hollow cards cools high-power LSI
|
|
|
1974
|
13 |
6 |
p. 447-
1 p.
|
artikel
|
| 8 |
Algorithmic trimming on active circuitry
|
|
|
1974
|
13 |
6 |
p. 453-
1 p.
|
artikel
|
| 9 |
A low-noise integrated s.-band amplifier
|
|
|
1974
|
13 |
6 |
p. 448-
1 p.
|
artikel
|
| 10 |
A microelectronic analog to digital converter
|
|
|
1974
|
13 |
6 |
p. 448-
1 p.
|
artikel
|
| 11 |
Analysis and improvement of a static shift register
|
Kasperkovitz, D.
|
|
1974
|
13 |
6 |
p. 501-512
12 p.
|
artikel
|
| 12 |
A new simplified method to measure moisture in micro enclosures
|
|
|
1974
|
13 |
6 |
p. 443-
1 p.
|
artikel
|
| 13 |
A note on the statistics of reliability assessment
|
|
|
1974
|
13 |
6 |
p. 442-
1 p.
|
artikel
|
| 14 |
An overview of laser functional trimming techniques
|
|
|
1974
|
13 |
6 |
p. 453-
1 p.
|
artikel
|
| 15 |
A numerical study of field-aided diffusion
|
|
|
1974
|
13 |
6 |
p. 449-
1 p.
|
artikel
|
| 16 |
Application de la gravure ionique a la microelectronique
|
Dubée, André
|
|
1974
|
13 |
6 |
p. 455-456
2 p.
|
artikel
|
| 17 |
Application of life cycle costing to the DoD system acquisition decision process
|
|
|
1974
|
13 |
6 |
p. 441-
1 p.
|
artikel
|
| 18 |
A reliability problem treated by the additional event method
|
Råde, L.
|
|
1974
|
13 |
6 |
p. 483-485
3 p.
|
artikel
|
| 19 |
A Stochastic method of allocation of components to maximize reliability
|
|
|
1974
|
13 |
6 |
p. 442-
1 p.
|
artikel
|
| 20 |
A trimmable planar capacitor for hybrid applications
|
|
|
1974
|
13 |
6 |
p. 450-
1 p.
|
artikel
|
| 21 |
Automated electronic masking machine
|
|
|
1974
|
13 |
6 |
p. 447-
1 p.
|
artikel
|
| 22 |
Automatic heart disease diagnostic system using a MOS-IC'ed learning machine
|
|
|
1974
|
13 |
6 |
p. 447-
1 p.
|
artikel
|
| 23 |
Automatic nine-barrel repeater ANR 4 of VEB Carl Zeiss JENA a photolithographic mask-making system for the semiconductor industry
|
|
|
1974
|
13 |
6 |
p. 447-
1 p.
|
artikel
|
| 24 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1974
|
13 |
6 |
p. 433-434
2 p.
|
artikel
|
| 25 |
Characterization of localized defects in dielecteric films for electron devices
|
|
|
1974
|
13 |
6 |
p. 443-
1 p.
|
artikel
|
| 26 |
Charge-coupled devices and applications
|
|
|
1974
|
13 |
6 |
p. 446-
1 p.
|
artikel
|
| 27 |
Component reliability under environmental stress
|
Yadav, R.P.S.
|
|
1974
|
13 |
6 |
p. 473-475
3 p.
|
artikel
|
| 28 |
Computer aided mask generation for integrated circuits
|
|
|
1974
|
13 |
6 |
p. 446-
1 p.
|
artikel
|
| 29 |
Computer-aided sequential testing for equipment reliability
|
Lafond, G.
|
|
1974
|
13 |
6 |
p. 477-482
6 p.
|
artikel
|
| 30 |
Current multiplication in metal-insulator-semiconductor (MIS) tunnel diodes
|
|
|
1974
|
13 |
6 |
p. 449-
1 p.
|
artikel
|
| 31 |
Degradation of bipolar transistor electrical parameters during sem evaluation
|
Pease, R.L.
|
|
1974
|
13 |
6 |
p. 549-550
2 p.
|
artikel
|
| 32 |
Delay line using thick film ferromagnetic material
|
|
|
1974
|
13 |
6 |
p. 452-
1 p.
|
artikel
|
| 33 |
Deposition and Auger analysis of deposited SiO2 on AlxGa (1 − x) As
|
|
|
1974
|
13 |
6 |
p. 449-
1 p.
|
artikel
|
| 34 |
Design and realization of microwave amplifiers for S-band by thin film distributed networks
|
|
|
1974
|
13 |
6 |
p. 452-453
2 p.
|
artikel
|
| 35 |
Designing logic boards for automatic testing
|
|
|
1974
|
13 |
6 |
p. 446-447
2 p.
|
artikel
|
| 36 |
Design of temperature-controlled substrate for hybrid microcircuits
|
|
|
1974
|
13 |
6 |
p. 452-
1 p.
|
artikel
|
| 37 |
Distribution of downtimes
|
|
|
1974
|
13 |
6 |
p. 445-
1 p.
|
artikel
|
| 38 |
Economic considerations in multilayer thick film hybrids
|
|
|
1974
|
13 |
6 |
p. 452-
1 p.
|
artikel
|
| 39 |
E/D gate MOSFET
|
|
|
1974
|
13 |
6 |
p. 448-
1 p.
|
artikel
|
| 40 |
Effects of industrial air pollutants on electrical contact materials
|
|
|
1974
|
13 |
6 |
p. 442-
1 p.
|
artikel
|
| 41 |
Electrical characteristics of ion-implanted p-channel MOS transistors
|
|
|
1974
|
13 |
6 |
p. 453-
1 p.
|
artikel
|
| 42 |
Electron beam microanalysis of electrochemical attack on thin film nickel-chromium resistors (Technical rept.)
|
|
|
1974
|
13 |
6 |
p. 443-
1 p.
|
artikel
|
| 43 |
Electronic equipment reliability
|
G.W.A.D.,
|
|
1974
|
13 |
6 |
p. 440-
1 p.
|
artikel
|
| 44 |
Electron-sensitive resins
|
|
|
1974
|
13 |
6 |
p. 447-
1 p.
|
artikel
|
| 45 |
Energy distribution of electrons contributing to the current in reverse biased metal-semiconductor junction
|
|
|
1974
|
13 |
6 |
p. 449-
1 p.
|
artikel
|
| 46 |
Excess noise measurements in ion-implanted silicon resistors
|
|
|
1974
|
13 |
6 |
p. 453-
1 p.
|
artikel
|
| 47 |
Fabrication aid for hybrid microcircuits
|
|
|
1974
|
13 |
6 |
p. 451-
1 p.
|
artikel
|
| 48 |
Fault trees—a state of the art discussion
|
|
|
1974
|
13 |
6 |
p. 444-
1 p.
|
artikel
|
| 49 |
FETs as analog switches
|
|
|
1974
|
13 |
6 |
p. 443-
1 p.
|
artikel
|
| 50 |
Frequency dividers made by I2L process to debut in Japan
|
|
|
1974
|
13 |
6 |
p. 446-
1 p.
|
artikel
|
| 51 |
Generating and validating RAM requirements
|
|
|
1974
|
13 |
6 |
p. 444-
1 p.
|
artikel
|
| 52 |
Generating tone bursts with only two IC timers
|
|
|
1974
|
13 |
6 |
p. 448-
1 p.
|
artikel
|
| 53 |
ICs help to beat that power crisis
|
|
|
1974
|
13 |
6 |
p. 448-
1 p.
|
artikel
|
| 54 |
IC tester aims at small user
|
|
|
1974
|
13 |
6 |
p. 448-
1 p.
|
artikel
|
| 55 |
Interfacing a teletypewriter with an IC microprocessor
|
|
|
1974
|
13 |
6 |
p. 448-
1 p.
|
artikel
|
| 56 |
Inversion charge redistribution model of the high-frequency MOS capacitance
|
|
|
1974
|
13 |
6 |
p. 450-
1 p.
|
artikel
|
| 57 |
Irradiation test and preselection of maverick diedes for the Project Symphonie satellite
|
|
|
1974
|
13 |
6 |
p. 443-
1 p.
|
artikel
|
| 58 |
ISHM panel discussion on hybrids
|
|
|
1974
|
13 |
6 |
p. 446-
1 p.
|
artikel
|
| 59 |
Life tests with periodic change in the scale parameter of a Weibull distribution
|
|
|
1974
|
13 |
6 |
p. 445-
1 p.
|
artikel
|
| 60 |
Low temperature processing for hi-rel multi-chip hybrids
|
|
|
1974
|
13 |
6 |
p. 451-
1 p.
|
artikel
|
| 61 |
Methods for testing wire-bend electrical connections (Final rept.)
|
|
|
1974
|
13 |
6 |
p. 447-
1 p.
|
artikel
|
| 62 |
Methods of measurement for semiconductor materials, process control and devices (Quarterly rept.)
|
|
|
1974
|
13 |
6 |
p. 450-
1 p.
|
artikel
|
| 63 |
Microelectronics and its future trends
|
|
|
1974
|
13 |
6 |
p. 446-
1 p.
|
artikel
|
| 64 |
Microprogramability lets user tailor new minicomputer to his requirements
|
|
|
1974
|
13 |
6 |
p. 448-
1 p.
|
artikel
|
| 65 |
Moat-etched two-phase charge-coupled devices
|
|
|
1974
|
13 |
6 |
p. 449-
1 p.
|
artikel
|
| 66 |
Moments expressed in terms of the hazard function and applications
|
Muth, E.J.
|
|
1974
|
13 |
6 |
p. 469-471
3 p.
|
artikel
|
| 67 |
Nanowatt operation of monolithic operational amplifiers
|
|
|
1974
|
13 |
6 |
p. 448-
1 p.
|
artikel
|
| 68 |
Notices and calls for papers
|
|
|
1974
|
13 |
6 |
p. 435-439
5 p.
|
artikel
|
| 69 |
On prediction problems in reliability
|
|
|
1974
|
13 |
6 |
p. 442-
1 p.
|
artikel
|
| 70 |
On the efficacy of r-on-m redundancy
|
|
|
1974
|
13 |
6 |
p. 444-
1 p.
|
artikel
|
| 71 |
On the software reliability
|
Sugiura, N.
|
|
1974
|
13 |
6 |
p. 529-533
5 p.
|
artikel
|
| 72 |
Patterns created without masks
|
|
|
1974
|
13 |
6 |
p. 453-
1 p.
|
artikel
|
| 73 |
Photomask array placement on slices in LSI processing
|
|
|
1974
|
13 |
6 |
p. 446-
1 p.
|
artikel
|
| 74 |
Polarizabilities of shallow donors in silicon
|
|
|
1974
|
13 |
6 |
p. 449-
1 p.
|
artikel
|
| 75 |
Preparation and properties of plasma-anodized silicon dioxide films
|
|
|
1974
|
13 |
6 |
p. 451-
1 p.
|
artikel
|
| 76 |
Quality assurance of electronic components in defence
|
|
|
1974
|
13 |
6 |
p. 443-
1 p.
|
artikel
|
| 77 |
Questionability of drift-diffusion transport in the analysis of small semiconductor devices
|
|
|
1974
|
13 |
6 |
p. 450-
1 p.
|
artikel
|
| 78 |
Receiver for a 2706 channel FM-system using mixer and isolator IC's (IC'S on ceramic substrate) and low noise preamplifier for 140 MHz
|
|
|
1974
|
13 |
6 |
p. 448-
1 p.
|
artikel
|
| 79 |
Reformulation of basic semiconductor transport equations—II
|
|
|
1974
|
13 |
6 |
p. 450-
1 p.
|
artikel
|
| 80 |
Reliability analysis of a 2-dissimilar units redundant system with erlang-failure and general repair distributions
|
Kodama, Masanori
|
|
1974
|
13 |
6 |
p. 523-528
6 p.
|
artikel
|
| 81 |
Reliability analysis of large repairable systems
|
Singh, C.
|
|
1974
|
13 |
6 |
p. 487-493
7 p.
|
artikel
|
| 82 |
Reliability and choosing number of prototypes
|
|
|
1974
|
13 |
6 |
p. 445-
1 p.
|
artikel
|
| 83 |
Reliability as a capital investment
|
|
|
1974
|
13 |
6 |
p. 442-
1 p.
|
artikel
|
| 84 |
Reliability aspects of module defoaming operation
|
|
|
1974
|
13 |
6 |
p. 445-446
2 p.
|
artikel
|
| 85 |
Reliability calculations with a list processing technique
|
|
|
1974
|
13 |
6 |
p. 444-
1 p.
|
artikel
|
| 86 |
Reliability demonstration testing using failure-free trials
|
|
|
1974
|
13 |
6 |
p. 445-
1 p.
|
artikel
|
| 87 |
Reliability design of a maintained system
|
Misra, K.B.
|
|
1974
|
13 |
6 |
p. 495-500
6 p.
|
artikel
|
| 88 |
Reliability evaluation of communication systems using flow graphs
|
Aggarwal, K.K.A.
|
|
1974
|
13 |
6 |
p. 535-538
4 p.
|
artikel
|
| 89 |
Reliability of high field semiconductor devices (Semi-annual rept. No. 2)
|
|
|
1974
|
13 |
6 |
p. 443-
1 p.
|
artikel
|
| 90 |
Reliability—problem of the profession in India
|
|
|
1974
|
13 |
6 |
p. 441-
1 p.
|
artikel
|
| 91 |
Reliability program elements—Who needs them?
|
|
|
1974
|
13 |
6 |
p. 441-
1 p.
|
artikel
|
| 92 |
Reliability targets—Are they valid and can they be specified?
|
Reid, David A.
|
|
1974
|
13 |
6 |
p. 517-521
5 p.
|
artikel
|
| 93 |
Saturation capacitance of thin oxide MOS structures and the effective surface density of states of silicon
|
|
|
1974
|
13 |
6 |
p. 449-
1 p.
|
artikel
|
| 94 |
Screened multilayer ceramics for thick film hybrids
|
|
|
1974
|
13 |
6 |
p. 452-
1 p.
|
artikel
|
| 95 |
SC reliability depends on proper mounting procedure
|
|
|
1974
|
13 |
6 |
p. 442-
1 p.
|
artikel
|
| 96 |
Signal-flow graphs in reliability theory
|
Osaki, Shunji
|
|
1974
|
13 |
6 |
p. 539-541
3 p.
|
artikel
|
| 97 |
Silicon gate MOS technologies applications. (In French)
|
|
|
1974
|
13 |
6 |
p. 448-
1 p.
|
artikel
|
| 98 |
Single crystal growing apparatus using infrared heating
|
|
|
1974
|
13 |
6 |
p. 448-
1 p.
|
artikel
|
| 99 |
State of art and future trends of computer-aided design of microwave integrated circuits. (In German)
|
|
|
1974
|
13 |
6 |
p. 447-
1 p.
|
artikel
|
| 100 |
Static electrification hazards in microelectronics production
|
Jowett, C.E.
|
|
1974
|
13 |
6 |
p. 543-547
5 p.
|
artikel
|
| 101 |
Stochastic behaviour of a two-dissimilar-unit standby redundant system with repair maintainance
|
|
|
1974
|
13 |
6 |
p. 446-
1 p.
|
artikel
|
| 102 |
Synthesis and crystal growth of GaAs and GaP for substrates
|
|
|
1974
|
13 |
6 |
p. 449-450
2 p.
|
artikel
|
| 103 |
System availability predictions
|
|
|
1974
|
13 |
6 |
p. 444-
1 p.
|
artikel
|
| 104 |
System Effectiveness task status report
|
|
|
1974
|
13 |
6 |
p. 444-
1 p.
|
artikel
|
| 105 |
System safely on the fleet satellite communications program
|
|
|
1974
|
13 |
6 |
p. 445-
1 p.
|
artikel
|
| 106 |
The accelerated ageing of plastic encapsulated semiconductor devices in environments containing a high vapour pressure of water
|
|
|
1974
|
13 |
6 |
p. 444-
1 p.
|
artikel
|
| 107 |
The assessment of connector reliability
|
|
|
1974
|
13 |
6 |
p. 443-444
2 p.
|
artikel
|
| 108 |
The choice between atribute and variable data
|
|
|
1974
|
13 |
6 |
p. 442-
1 p.
|
artikel
|
| 109 |
The confusion in the quality field
|
Prasad, P.S.K.
|
|
1974
|
13 |
6 |
p. 463-467
5 p.
|
artikel
|
| 110 |
The evolution of organic vapors from plastic materials associated with electromechanical relays
|
|
|
1974
|
13 |
6 |
p. 442-443
2 p.
|
artikel
|
| 111 |
The fabrication of reproducible thick film resistors
|
|
|
1974
|
13 |
6 |
p. 450-451
2 p.
|
artikel
|
| 112 |
The failure mode concept in reliability engineering
|
|
|
1974
|
13 |
6 |
p. 441-
1 p.
|
artikel
|
| 113 |
The reliability of coherent structures—a parametric approach
|
|
|
1974
|
13 |
6 |
p. 445-
1 p.
|
artikel
|
| 114 |
The reliability of failure rates
|
|
|
1974
|
13 |
6 |
p. 441-
1 p.
|
artikel
|
| 115 |
Thermal and radiation polarization in organic dielectric films
|
|
|
1974
|
13 |
6 |
p. 451-
1 p.
|
artikel
|
| 116 |
Thick film moisture sensors
|
|
|
1974
|
13 |
6 |
p. 452-
1 p.
|
artikel
|
| 117 |
Thin film display switches
|
|
|
1974
|
13 |
6 |
p. 452-
1 p.
|
artikel
|
| 118 |
Tiny thin-film chip resistors
|
|
|
1974
|
13 |
6 |
p. 451-
1 p.
|
artikel
|
| 119 |
Trends in crystal growing
|
|
|
1974
|
13 |
6 |
p. 449-
1 p.
|
artikel
|
| 120 |
Two-electron transitions in germanium
|
|
|
1974
|
13 |
6 |
p. 450-
1 p.
|
artikel
|
| 121 |
Using a traffic monitoring system as a maintenance tool
|
|
|
1974
|
13 |
6 |
p. 445-
1 p.
|
artikel
|
| 122 |
Which hybrid converter, single-switch or quad
|
|
|
1974
|
13 |
6 |
p. 452-
1 p.
|
artikel
|
| 123 |
X-ray lithography highlights move to tiny IC patterns
|
|
|
1974
|
13 |
6 |
p. 453-
1 p.
|
artikel
|
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