| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Accurate LCC estimating early in program development
|
|
|
1974
|
13 |
4 |
p. 243-244
2 p.
|
artikel
|
| 2 |
Achieving reliability in large scale software systems
|
|
|
1974
|
13 |
4 |
p. 242-
1 p.
|
artikel
|
| 3 |
A data modem—an application of l.s.i.
|
|
|
1974
|
13 |
4 |
p. 246-
1 p.
|
artikel
|
| 4 |
A line regulator with capacitor -MOSFET-memory for level control on wideband carrier systems over coaxial cables
|
|
|
1974
|
13 |
4 |
p. 246-
1 p.
|
artikel
|
| 5 |
An alternative approach to a reliability problem
|
Singh, N.
|
|
1974
|
13 |
4 |
p. 277-279
3 p.
|
artikel
|
| 6 |
An engineer looks at product liability cases
|
|
|
1974
|
13 |
4 |
p. 239-
1 p.
|
artikel
|
| 7 |
An evaluation of weapon system life cycle analysis models
|
|
|
1974
|
13 |
4 |
p. 243-
1 p.
|
artikel
|
| 8 |
An integrated thin-film magnetoresistive device with a hall InSb probe
|
|
|
1974
|
13 |
4 |
p. 250-
1 p.
|
artikel
|
| 9 |
An overview of silicon growing processes
|
|
|
1974
|
13 |
4 |
p. 248-
1 p.
|
artikel
|
| 10 |
Application of the graphic COM recorder to creation of LSI mask pattern drawings for checking
|
|
|
1974
|
13 |
4 |
p. 245-
1 p.
|
artikel
|
| 11 |
A realistic project planning prediction technique
|
|
|
1974
|
13 |
4 |
p. 242-243
2 p.
|
artikel
|
| 12 |
A static RAM with normally-off-type schottky barrier FET's
|
|
|
1974
|
13 |
4 |
p. 246-
1 p.
|
artikel
|
| 13 |
A study of beryllium-hydrogen complexes in silicon
|
|
|
1974
|
13 |
4 |
p. 249-250
2 p.
|
artikel
|
| 14 |
Bayes estimation in life testing and reliability: A multivariate case
|
Lwin, Thaung
|
|
1974
|
13 |
4 |
p. 267-276
10 p.
|
artikel
|
| 15 |
Calendar of International Conferences, Symposia, Lectures and Meetings of Interest
|
|
|
1974
|
13 |
4 |
p. 233-234
2 p.
|
artikel
|
| 16 |
Can plastic semiconductor devices and microcircuits be used in military equipment
|
|
|
1974
|
13 |
4 |
p. 240-241
2 p.
|
artikel
|
| 17 |
Characterization of localized defects in dielectric films for electron devices
|
|
|
1974
|
13 |
4 |
p. 241-
1 p.
|
artikel
|
| 18 |
Chemical-reaction engineering in the semiconductor industry
|
|
|
1974
|
13 |
4 |
p. 249-
1 p.
|
artikel
|
| 19 |
Component failure rates from field studies
|
|
|
1974
|
13 |
4 |
p. 241-
1 p.
|
artikel
|
| 20 |
Component reliability under nuclear radiation environment
|
Sahiar, S.K.
|
|
1974
|
13 |
4 |
p. 291-294
4 p.
|
artikel
|
| 21 |
Current diffusion effects in titanium-N silicon schottky diodes
|
|
|
1974
|
13 |
4 |
p. 246-
1 p.
|
artikel
|
| 22 |
Current-steering chip upgrades performance of d-a converter
|
|
|
1974
|
13 |
4 |
p. 245-
1 p.
|
artikel
|
| 23 |
Current steering simplifies and shrinks lk bipolar RAM
|
|
|
1974
|
13 |
4 |
p. 245-
1 p.
|
artikel
|
| 24 |
Current-voltage dependencies of heterogeneous semiconductor systems
|
|
|
1974
|
13 |
4 |
p. 250-
1 p.
|
artikel
|
| 25 |
DC-10 Avionics parts reliability in review
|
|
|
1974
|
13 |
4 |
p. 241-
1 p.
|
artikel
|
| 26 |
Deposition and Auger analysis of deposited SiO2 on AlxGa1 − xAs. I
|
|
|
1974
|
13 |
4 |
p. 250-
1 p.
|
artikel
|
| 27 |
Design of a GN and C System to meet reliability goals
|
|
|
1974
|
13 |
4 |
p. 242-
1 p.
|
artikel
|
| 28 |
Determination of subjective prior distributions for Bayesian analysis of Maintainability problems
|
|
|
1974
|
13 |
4 |
p. 239-
1 p.
|
artikel
|
| 29 |
DIP inserter aims at low-volume users
|
|
|
1974
|
13 |
4 |
p. 245-
1 p.
|
artikel
|
| 30 |
Direct observation of split-off exciton and phonon structures in absorption spectrum of silicon
|
|
|
1974
|
13 |
4 |
p. 248-
1 p.
|
artikel
|
| 31 |
Dislocation generation along swirls in dislocation-free silicon crystals
|
|
|
1974
|
13 |
4 |
p. 250-
1 p.
|
artikel
|
| 32 |
Drain voltage limitations of MOS transistors
|
|
|
1974
|
13 |
4 |
p. 246-247
2 p.
|
artikel
|
| 33 |
Effect of moisture on solid tantalum capacitors
|
|
|
1974
|
13 |
4 |
p. 242-
1 p.
|
artikel
|
| 34 |
Effect of O+ implantation on silicon-silicon dioxide interface properties
|
|
|
1974
|
13 |
4 |
p. 251-
1 p.
|
artikel
|
| 35 |
Electrical applications of thin-films produced by metalloorganic deposition
|
|
|
1974
|
13 |
4 |
p. 251-
1 p.
|
artikel
|
| 36 |
Electrical characteristics of boron-implanted n-channel MOS transistors
|
|
|
1974
|
13 |
4 |
p. 251-
1 p.
|
artikel
|
| 37 |
Electron optical investigation of the cross sectional structure of vacuum deposited multilayer systems
|
|
|
1974
|
13 |
4 |
p. 247-248
2 p.
|
artikel
|
| 38 |
Equipment procured reliability and real-life survival
|
|
|
1974
|
13 |
4 |
p. 243-
1 p.
|
artikel
|
| 39 |
Error analysis of high-frequency MOS capacitance calculations
|
|
|
1974
|
13 |
4 |
p. 245-
1 p.
|
artikel
|
| 40 |
Estimating life parameters from burn-in data
|
|
|
1974
|
13 |
4 |
p. 241-
1 p.
|
artikel
|
| 41 |
Evolution of Quality and Reliability
|
|
|
1974
|
13 |
4 |
p. 239-240
2 p.
|
artikel
|
| 42 |
Excess noise measurements in ion-implanted silicon resistors
|
|
|
1974
|
13 |
4 |
p. 251-
1 p.
|
artikel
|
| 43 |
Experimental determination of the avalanche region of one-sided abrupt barriers
|
|
|
1974
|
13 |
4 |
p. 249-
1 p.
|
artikel
|
| 44 |
Factors affecting avalanche injection into insulating layers from a semiconductor surface
|
|
|
1974
|
13 |
4 |
p. 247-
1 p.
|
artikel
|
| 45 |
Film-carrier technique automates the packaging of IC chips
|
|
|
1974
|
13 |
4 |
p. 245-
1 p.
|
artikel
|
| 46 |
Forcing functions integrate R & M into design
|
|
|
1974
|
13 |
4 |
p. 243-
1 p.
|
artikel
|
| 47 |
For fast digital troubleshooting, low-cost detectors can't be beat
|
|
|
1974
|
13 |
4 |
p. 243-
1 p.
|
artikel
|
| 48 |
Formation of ohmic contacts to III–V semiconductors, using a laser beam
|
|
|
1974
|
13 |
4 |
p. 251-
1 p.
|
artikel
|
| 49 |
Hazard function monitoring of airline components
|
|
|
1974
|
13 |
4 |
p. 240-
1 p.
|
artikel
|
| 50 |
High frequency space charge layer capacitance of strongly inverted semiconductor surfaces
|
|
|
1974
|
13 |
4 |
p. 248-
1 p.
|
artikel
|
| 51 |
Hybrid thick film circuits in the telecommunication industry
|
|
|
1974
|
13 |
4 |
p. 250-
1 p.
|
artikel
|
| 52 |
IC logic units simplify binary number conversion
|
|
|
1974
|
13 |
4 |
p. 247-
1 p.
|
artikel
|
| 53 |
In switch to n-MOS microprocessor gets a 2-μsec cycle time
|
|
|
1974
|
13 |
4 |
p. 247-
1 p.
|
artikel
|
| 54 |
Integration of R & M into the design process
|
|
|
1974
|
13 |
4 |
p. 243-
1 p.
|
artikel
|
| 55 |
Is 1974 the year of the digital watch?
|
|
|
1974
|
13 |
4 |
p. 244-
1 p.
|
artikel
|
| 56 |
Japanese makers improving reliability of IC sockets
|
|
|
1974
|
13 |
4 |
p. 241-
1 p.
|
artikel
|
| 57 |
Junction capacitance techniques to characterize radiation damage in silicon
|
|
|
1974
|
13 |
4 |
p. 248-
1 p.
|
artikel
|
| 58 |
Large-Signal analysis of silicon BARITT diodes
|
|
|
1974
|
13 |
4 |
p. 245-246
2 p.
|
artikel
|
| 59 |
Life cycle cost impact on high reliability systems
|
|
|
1974
|
13 |
4 |
p. 240-
1 p.
|
artikel
|
| 60 |
Life cycle system/cost effectiveness
|
|
|
1974
|
13 |
4 |
p. 243-
1 p.
|
artikel
|
| 61 |
Low-noise implanted-base microwave transistors
|
|
|
1974
|
13 |
4 |
p. 251-
1 p.
|
artikel
|
| 62 |
MOS-CV test system for IC process control and Monitoring
|
|
|
1974
|
13 |
4 |
p. 245-
1 p.
|
artikel
|
| 63 |
N-channel MOS technology yields new generation of microprocessors
|
|
|
1974
|
13 |
4 |
p. 247-
1 p.
|
artikel
|
| 64 |
Notices and calls for papers
|
|
|
1974
|
13 |
4 |
p. 235-236
2 p.
|
artikel
|
| 65 |
On the magnetic properties of dislocations in silicon
|
|
|
1974
|
13 |
4 |
p. 248-
1 p.
|
artikel
|
| 66 |
Optimum life cycle costing
|
|
|
1974
|
13 |
4 |
p. 244-
1 p.
|
artikel
|
| 67 |
Papers to be published in future issues
|
|
|
1974
|
13 |
4 |
p. 252-
1 p.
|
artikel
|
| 68 |
Pocket programs for reliability computation
|
|
|
1974
|
13 |
4 |
p. 244-
1 p.
|
artikel
|
| 69 |
Practical R/M design techniques
|
|
|
1974
|
13 |
4 |
p. 244-
1 p.
|
artikel
|
| 70 |
Preparation and properties of plasma-anodized silicon dioxide films
|
|
|
1974
|
13 |
4 |
p. 250-
1 p.
|
artikel
|
| 71 |
Pressure coefficients for band gaps in silicon
|
|
|
1974
|
13 |
4 |
p. 247-
1 p.
|
artikel
|
| 72 |
Probe parameters and considerations
|
|
|
1974
|
13 |
4 |
p. 244-
1 p.
|
artikel
|
| 73 |
Realization and characterization of reliable and reproducible GaAs avalanche diodes
|
|
|
1974
|
13 |
4 |
p. 240-
1 p.
|
artikel
|
| 74 |
Reliability and availability of a safely shutdown system
|
|
|
1974
|
13 |
4 |
p. 243-
1 p.
|
artikel
|
| 75 |
Reliability evaluation of microwave communication systems
|
|
|
1974
|
13 |
4 |
p. 244-
1 p.
|
artikel
|
| 76 |
Reliability growth—actual vs predicted
|
|
|
1974
|
13 |
4 |
p. 241-
1 p.
|
artikel
|
| 77 |
Reliability inputs to Mariner 9 data explosion
|
|
|
1974
|
13 |
4 |
p. 242-
1 p.
|
artikel
|
| 78 |
Reliability optimization through random search algorithm
|
Beraha, David
|
|
1974
|
13 |
4 |
p. 295-297
3 p.
|
artikel
|
| 79 |
Reliability testing pitfalls
|
|
|
1974
|
13 |
4 |
p. 239-
1 p.
|
artikel
|
| 80 |
Semiconductor elements—the new manufacturing concept
|
|
|
1974
|
13 |
4 |
p. 244-245
2 p.
|
artikel
|
| 81 |
Semiconductor wafer measurements
|
|
|
1974
|
13 |
4 |
p. 249-
1 p.
|
artikel
|
| 82 |
Silicon nitride films and varying excess Si. K.
|
|
|
1974
|
13 |
4 |
p. 247-
1 p.
|
artikel
|
| 83 |
Some aspects of damage models
|
Nakagawa, Toshio
|
|
1974
|
13 |
4 |
p. 253-257
5 p.
|
artikel
|
| 84 |
Some practical remarks on the design of experimental systems for expitaxial growth of Si, Ge and Si-Ge
|
|
|
1974
|
13 |
4 |
p. 249-
1 p.
|
artikel
|
| 85 |
SOS Technology for MOS integrated circuits
|
|
|
1974
|
13 |
4 |
p. 247-
1 p.
|
artikel
|
| 86 |
Stability and deterioration mechanism of thick film resistors
|
Taketa, Yoshiaki
|
|
1974
|
13 |
4 |
p. 281-289
9 p.
|
artikel
|
| 87 |
Step-stress failure rate models for electronic components
|
Bora, J.S.
|
|
1974
|
13 |
4 |
p. 259-266
8 p.
|
artikel
|
| 88 |
Study of charge storage behaviour in metal-alumina-silicon dioxide-silicon (MAOS) field effect transistor
|
|
|
1974
|
13 |
4 |
p. 248-249
2 p.
|
artikel
|
| 89 |
Surface desorption of gases from photoresist
|
|
|
1974
|
13 |
4 |
p. 245-
1 p.
|
artikel
|
| 90 |
Technologie MOS a grille refractaire
|
|
|
1974
|
13 |
4 |
p. 247-
1 p.
|
artikel
|
| 91 |
Technology transfer through GIDEP
|
|
|
1974
|
13 |
4 |
p. 240-
1 p.
|
artikel
|
| 92 |
Temperature measurement on an IC-chip
|
|
|
1974
|
13 |
4 |
p. 244-
1 p.
|
artikel
|
| 93 |
The emitter-base breakdown voltage of planar transistors
|
|
|
1974
|
13 |
4 |
p. 240-
1 p.
|
artikel
|
| 94 |
The First Canadian SRE Reliability Symposium
|
|
|
1974
|
13 |
4 |
p. 237-
1 p.
|
artikel
|
| 95 |
The influence of the silicon and oxide layer surface treatment on the effective defect charge density in a MOS structure
|
|
|
1974
|
13 |
4 |
p. 248-
1 p.
|
artikel
|
| 96 |
The London sector plan: Maintenance of sector switching centres
|
|
|
1974
|
13 |
4 |
p. 243-
1 p.
|
artikel
|
| 97 |
Theory of non-steady-state interfacial thermal currents in MOS devices, and the direct determination of interfacia; trap parameters
|
|
|
1974
|
13 |
4 |
p. 247-
1 p.
|
artikel
|
| 98 |
The use of warranties for defense avionics procurement
|
|
|
1974
|
13 |
4 |
p. 239-
1 p.
|
artikel
|
| 99 |
Thick film resistors with improved voltage stability
|
|
|
1974
|
13 |
4 |
p. 250-
1 p.
|
artikel
|
| 100 |
Thin-film hybrid circuits—I
|
|
|
1974
|
13 |
4 |
p. 250-
1 p.
|
artikel
|
| 101 |
Titanium-gold high-reliability transistor metallization
|
|
|
1974
|
13 |
4 |
p. 242-
1 p.
|
artikel
|
| 102 |
To cycle or not to cycle?—the trade-off is the question
|
|
|
1974
|
13 |
4 |
p. 240-
1 p.
|
artikel
|
| 103 |
Transport properties of conduction electron in n-type inversion layers in (100) surfaces of silicon
|
|
|
1974
|
13 |
4 |
p. 248-
1 p.
|
artikel
|
| 104 |
Trapping, emission and generation in MNOS memory devices
|
|
|
1974
|
13 |
4 |
p. 246-
1 p.
|
artikel
|
| 105 |
Two new IC technologies improve LSI Manufacturing processes
|
|
|
1974
|
13 |
4 |
p. 245-
1 p.
|
artikel
|
| 106 |
Ultra-reliable voter switches, with a bibliography of mechanization
|
Dennis, Norman G.
|
|
1974
|
13 |
4 |
p. 299-308
10 p.
|
artikel
|
| 107 |
Uniformity and Reproducibility Tests in the Production of Component Parts
|
|
|
1974
|
13 |
4 |
p. 240-
1 p.
|
artikel
|
| 108 |
Updating N1 repeaters
|
|
|
1974
|
13 |
4 |
p. 251-
1 p.
|
artikel
|
| 109 |
Very high vacuum (VHV) electron beam floating zone (EBFZ) furnace
|
|
|
1974
|
13 |
4 |
p. 249-
1 p.
|
artikel
|
| 110 |
Visual decision making
|
|
|
1974
|
13 |
4 |
p. 240-
1 p.
|
artikel
|
Tijdschrift beschrijving