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                             96 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Accurate measurement of the work function of electron-hole drops in germanium 1974
 13 2 p. 81-
1 p.
 artikel
2 A depletion load self-aligned technology 1974
 13 2 p. 79-
1 p.
 artikel
3 A fast method for redundancy allocation 1974
 13 2 p. 77-
1 p.
 artikel
4 A method of redundancy allocation 1974
 13 2 p. 77-
1 p.
 artikel
5 Analytic study of a stand-by redundant equipment with switching and shelf life failures 1974
 13 2 p. 77-
1 p.
 artikel
6 A new interpretation of the valence band density of states of amorphous group IV-semiconductors 1974
 13 2 p. 82-
1 p.
 artikel
7 Application of Low-Power current mode logic 1974
 13 2 p. 78-
1 p.
 artikel
8 A production reactor for continuous deposition of silicon dioxide 1974
 13 2 p. 78-
1 p.
 artikel
9 A review of new methods and attitudes in reliability engineering 1974
 13 2 p. 75-
1 p.
 artikel
10 A test structure for controlling the process of manufacturing MOS circuits 1974
 13 2 p. 78-
1 p.
 artikel
11 Build power amplifiers with IC drivers 1974
 13 2 p. 79-80
2 p.
 artikel
12 Built-in getter-ion pumps 1974
 13 2 p. 83-
1 p.
 artikel
13 Burn-in programs for repairable systems 1974
 13 2 p. 76-
1 p.
 artikel
14 Calendar of international conferences, symposia, lectures and meetings of interest 1974
 13 2 p. 61-62
2 p.
 artikel
15 Complex system reliability with general repair time distributions under preemptive resume repair discipline 1974
 13 2 p. 76-77
2 p.
 artikel
16 Control of resistivity, microstructure, and stress in electron beam evaporated tungsten films 1974
 13 2 p. 84-
1 p.
 artikel
17 Cooperative effects between arsenic and boron in silicon during simultaneous diffusions from ion implanted and chemical source predepositions 1974
 13 2 p. 83-84
2 p.
 artikel
18 Courses 1974
 13 2 p. 65-
1 p.
 artikel
19 Cr-Cu and Cr-Cu-Cr thin film metallization 1974
 13 2 p. 83-
1 p.
 artikel
20 Custom LSI fades into background 1974
 13 2 p. 77-
1 p.
 artikel
21 Cylindrical diode continuous vacuum sputtering equipment for laboratory and high volume production 1974
 13 2 p. 82-83
2 p.
 artikel
22 Data processing, LSI will help to bring sight to the blind 1974
 13 2 p. 80-
1 p.
 artikel
23 Deionized water for integrated circuit fabrication 1974
 13 2 p. 78-
1 p.
 artikel
24 Development of generalized theory of floating-emitter potential based on studies of germanium and silicon transistors 1974
 13 2 p. 81-
1 p.
 artikel
25 Digital-IC models for computer-aided design. Part 2: TTL flip-flops 1974
 13 2 p. 77-
1 p.
 artikel
26 Distribution of time to non-availability of a reliability system 1974
 13 2 p. 77-
1 p.
 artikel
27 Double diffused MOSFETs 1974
 13 2 p. 79-
1 p.
 artikel
28 Effects of bulk trapping on the memory characteristics of thick-oxide MNOS variable-threshold capacitors 1974
 13 2 p. 78-79
2 p.
 artikel
29 Effects of diffused nickel on the silicon-silicon dioxide interface 1974
 13 2 p. 81-
1 p.
 artikel
30 Effects of temperature on current instabilities caused by recombination centers in semiconductors 1974
 13 2 p. 80-
1 p.
 artikel
31 Encapsulation of high reliability devices 1974
 13 2 p. 76-
1 p.
 artikel
32 Evaporation, sputtering and ion-plating; pros and cons 1974
 13 2 p. 82-
1 p.
 artikel
33 Exchange and dipolar fields in phosphorus-doped silicon measured by electron spin echoes 1974
 13 2 p. 81-
1 p.
 artikel
34 Failure analysis of linear ICs 1974
 13 2 p. 75-
1 p.
 artikel
35 Faulty-contact detection in communications systems 1974
 13 2 p. 75-
1 p.
 artikel
36 First oxide-isolated C-MOS circuits cut chip area by one-third 1974
 13 2 p. 78-
1 p.
 artikel
37 Formation kinetics and structure of Pd2Si films on Si 1974
 13 2 p. 81-82
2 p.
 artikel
38 High frequency small signal characteristics of the SCL heterojunction transistor 1974
 13 2 p. 79-
1 p.
 artikel
39 High resolution fabrication by ion beam sputtering 1974
 13 2 p. 84-
1 p.
 artikel
40 Hybrid microelectronic circuits the thick film G.W.A.D.,
 1974
 13 2 p. 85-
1 p.
 artikel
41 Hybrid microelectronics 1974
 13 2 p. 69-72
4 p.
 artikel
42 IC monostable SN74121 for easier detection of IR pulsed lasers 1974
 13 2 p. 80-
1 p.
 artikel
43 IC simulates power transistor 1974
 13 2 p. 79-
1 p.
 artikel
44 IC with load protection simulates power transistor 1974
 13 2 p. 79-
1 p.
 artikel
45 IEEE Reliability & Maintainability Symposium 1974 1974
 13 2 p. 72-73
2 p.
 artikel
46 Improve CRT-display systems with NMOS 1974
 13 2 p. 79-
1 p.
 artikel
47 Is there a reliable screen for VHF power transistors? 1974
 13 2 p. 76-
1 p.
 artikel
48 Life tests of SSI integrated circuits Kemény, A.P.
 1974
 13 2 p. 119-120
2 p.
 artikel
49 Logic tester uses single trial procedure to troubleshoot digital IC boards 1974
 13 2 p. 75-
1 p.
 artikel
50 Low-power current mode logic 1974
 13 2 p. 78-
1 p.
 artikel
51 Low-temperature photocapacity measurement in MOS structure 1974
 13 2 p. 81-
1 p.
 artikel
52 Measurement of low densities of surface states at the Si-SiO2-interface 1974
 13 2 p. 82-
1 p.
 artikel
53 Measuring semi-conductor properties of thermoelectric materials 1974
 13 2 p. 80-
1 p.
 artikel
54 Metal-germanium Schottky barriers 1974
 13 2 p. 80-
1 p.
 artikel
55 Metal semiconductor contact: resistivity and noise 1974
 13 2 p. 80-
1 p.
 artikel
56 Method for fast-switching the ion beam in an ion-implantation facility 1974
 13 2 p. 84-
1 p.
 artikel
57 MIS capacitance and derivative of capacitance, with application to non-parabolic band semiconductors 1974
 13 2 p. 82-
1 p.
 artikel
58 New geometry in Sputtering technology 1974
 13 2 p. 83-
1 p.
 artikel
59 Nitride Makes its mark 1974
 13 2 p. 78-
1 p.
 artikel
60 No. 1 ESS Processors: How dependable have they been? 1974
 13 2 p. 76-
1 p.
 artikel
61 Notice 1974
 13 2 p. 63-
1 p.
 artikel
62 Notices and calls for papers 1974
 13 2 p. 67-68
2 p.
 artikel
63 On phosphorus diffusion in silicon under oxidizing atmospheres 1974
 13 2 p. 81-
1 p.
 artikel
64 On the effect of gate oxide thickness upon the hall mobility and other magneto-electrical characteristics in most structures 1974
 13 2 p. 82-
1 p.
 artikel
65 Operational behaviour of a complex system having shelf-life of the components under preemptive resume repair discipline Govil, A.K.
 1974
 13 2 p. 97-101
5 p.
 artikel
66 Optimal reliability design of a system: A new look 1974
 13 2 p. 76-
1 p.
 artikel
67 Optimization of a reliability growth problem Sen, P.
 1974
 13 2 p. 87-89
3 p.
 artikel
68 Oxygen vacancy model for the E1 ′ center in SiO2 1974
 13 2 p. 81-
1 p.
 artikel
69 Papers to be published in future issues 1974
 13 2 p. 86-
1 p.
 artikel
70 Peak temperature during turnover and the volumetric degradation of switching transistors and IC-s Kemény, A.P.
 1974
 13 2 p. 103-110
8 p.
 artikel
71 PLAs replace ROMs for logic designs 1974
 13 2 p. 78-
1 p.
 artikel
72 Probabilistic analysis of a 2-unit cold-standby system with a single repair facility 1974
 13 2 p. 77-
1 p.
 artikel
73 Quad-linear ICs racing up the pike, paced by automotive applications 1974
 13 2 p. 80-
1 p.
 artikel
74 Redistribution and anisotropic diffusion of boron in (100) and (111) oriented silicon 1974
 13 2 p. 80-81
2 p.
 artikel
75 Relating factory test failure results to field reliability, required field maintenance, and to total life cycle costs 1974
 13 2 p. 75-
1 p.
 artikel
76 Reliability and maintenance aspects 1974
 13 2 p. 76-
1 p.
 artikel
77 Reliability of a laser communication system Kamal, A.K.
 1974
 13 2 p. 91-95
5 p.
 artikel
78 Reliability of a Quasi-Redundant electronic system with “Standby” in the main unit 1974
 13 2 p. 77-
1 p.
 artikel
79 Reliability of redundant systems with dependent failures 1974
 13 2 p. 76-
1 p.
 artikel
80 Screening of metallization step coverage on integrated circuits 1974
 13 2 p. 82-
1 p.
 artikel
81 Semiconductor devices in hostile electrical environments 1974
 13 2 p. 81-
1 p.
 artikel
82 Semiconductor memories—an electronics revolution 1974
 13 2 p. 79-
1 p.
 artikel
83 Significance of strength for the reliability of selder joints in electronics 1974
 13 2 p. 75-
1 p.
 artikel
84 Silicon single crystals of extreme perfection 1974
 13 2 p. 149-
1 p.
 artikel
85 Silicon wafer processing by application of spun-on doped and undoped silica layers 1974
 13 2 p. 78-
1 p.
 artikel
86 Simplify minicomputer maintenance 1974
 13 2 p. 76-
1 p.
 artikel
87 Stand-by redundancy complex system's reliability 1974
 13 2 p. 77-
1 p.
 artikel
88 Stochastic behavior of a two-dissimilar-unit standby redundant system with repair maintenance Nakagawa, T.
 1974
 13 2 p. 143-148
6 p.
 artikel
89 Surface charge and stress in the Si/SiO2 system 1974
 13 2 p. 80-
1 p.
 artikel
90 Testing ICs at high temperatures 1974
 13 2 p. 77-
1 p.
 artikel
91 The application of ion implantation to CMOS 1974
 13 2 p. 84-
1 p.
 artikel
92 The production of intense atomic beams 1974
 13 2 p. 84-
1 p.
 artikel
93 Thermal properties of amular and array geometry semiconductor devices on composite heat sinks 1974
 13 2 p. 79-
1 p.
 artikel
94 Thin-film laser switch 1974
 13 2 p. 83-
1 p.
 artikel
95 Thin-film thermoelectric transducer for measurements of low-level power between 0 and 11 GHz 1974
 13 2 p. 83-
1 p.
 artikel
96 Thin film vacuum equipment 1974
 13 2 p. 82-
1 p.
 artikel
                             96 gevonden resultaten
 
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