Digitale Bibliotheek
Sluiten Bladeren door artikelen uit een tijdschrift
     Tijdschrift beschrijving
       Alle jaargangen van het bijbehorende tijdschrift
         Alle afleveringen van het bijbehorende jaargang
                                       Alle artikelen van de bijbehorende aflevering
 
                             124 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A bipolar control storage memory-design-considerations and test problems 1973
12 5 p. 414-
1 p.
artikel
2 Aceelerated testing of air-to-air guided minsiles 1973
12 5 p. 409-
1 p.
artikel
3 A consistent shape parameter estimator for the Weibull distribution 1973
12 5 p. 405-406
2 p.
artikel
4 Advances in resistor fabrication yield monolithic 10-bit DACs 1973
12 5 p. 417-
1 p.
artikel
5 Aegis An/Spy radar system—design for availability 1973
12 5 p. 410-
1 p.
artikel
6 Aegis operational readiness test system—design for system effectiveness 1973
12 5 p. 410-
1 p.
artikel
7 A fast logic gate for large scale integration 1973
12 5 p. 414-
1 p.
artikel
8 A glow discharge ion gun for etching 1973
12 5 p. 418-
1 p.
artikel
9 Analysis of early failures in unequal size samples 1973
12 5 p. 406-
1 p.
artikel
10 An empirical Bayes approach for the Poisson life distribution 1973
12 5 p. 405-
1 p.
artikel
11 A new method for system reliability evaluation Aggarwal, K.K.
1973
12 5 p. 435-440
6 p.
artikel
12 A new method to determine the failure frequency of a complex system Singh, C.
1973
12 5 p. 459-465
7 p.
artikel
13 A new type of charge trapping in MOS systems 1973
12 5 p. 416-
1 p.
artikel
14 An improvement on structure of charge coupled devices 1973
12 5 p. 416-
1 p.
artikel
15 An investigation of integrated circuit destruction by noise pulses 1973
12 5 p. 407-
1 p.
artikel
16 An investigation of soldered copper-tin bond brittleness by electron microscopy 1973
12 5 p. 407-
1 p.
artikel
17 Anisotropic boron diffusion in silicon under oxidizing atmospheres 1973
12 5 p. 416-
1 p.
artikel
18 A note on distributed lumped active all-pass network configuration Bozic, S.M.
1973
12 5 p. 483-484
2 p.
artikel
19 Approach to reliability for the SM-2 Missile 1973
12 5 p. 409-
1 p.
artikel
20 A reliability and comparative analysis of two standby system configurations 1973
12 5 p. 409-
1 p.
artikel
21 Auftrag, Aufgaben, Arbeitsweise eines Qualitätsprüflabors für Bauelemente 1973
12 5 p. 407-408
2 p.
artikel
22 A unified method for analyzing mission reliability for fault tolerant computer systems 1973
12 5 p. 408-409
2 p.
artikel
23 Beam leads gaining 1973
12 5 p. 411-
1 p.
artikel
24 Biphase data transmission system uses IC one-shot as converter doubler 1973
12 5 p. 412-
1 p.
artikel
25 1024-Bit, N-Channel, MOS high-speed read/write memory 1973
12 5 p. 412-
1 p.
artikel
26 4096-Bit RAMs are on the doorstep 1973
12 5 p. 413-
1 p.
artikel
27 Blend ECL and TTL ICs to obtain high frequency counter circuits. Counters up to 500 MHz can be built for systems or beach use 1973
12 5 p. 411-412
2 p.
artikel
28 BS 9000 and custom-built microelectromics 1973
12 5 p. 410-411
2 p.
artikel
29 CAD in circuit packaging 1973
12 5 p. 411-
1 p.
artikel
30 Calculation of avalanche breakdown voltage and depletion layer thickness in a p-n junction with a double error function doping profile 1973
12 5 p. 415-
1 p.
artikel
31 Calendar of International Conferences, Symposia, Lectures and Meetings of Interest 1973
12 5 p. 397-398
2 p.
artikel
32 Carrier heating or cooling in semiconductor devices 1973
12 5 p. 415-416
2 p.
artikel
33 Censored sample size selection for life tests 1973
12 5 p. 406-
1 p.
artikel
34 Circuit designer can influence custom i.c. yields 1973
12 5 p. 411-
1 p.
artikel
35 C-MOS holds down parts count for digital clocks 1973
12 5 p. 414-
1 p.
artikel
36 Complex system reliability with general repair time distributions under head-of-line-repair-discipline Gupta, P.P.
1973
12 5 p. 445-449
5 p.
artikel
37 Component defects and system reliability 1973
12 5 p. 407-
1 p.
artikel
38 Computers help design reliable telephone systems 1973
12 5 p. 408-
1 p.
artikel
39 Conduction mechanisms in screen-and-fired film resistors 1973
12 5 p. 417-
1 p.
artikel
40 Data communications and the minicomputer 1973
12 5 p. 414-
1 p.
artikel
41 Device design of E/D gate MOSFET 1973
12 5 p. 411-
1 p.
artikel
42 Digital panel meter. Design, operation and construction of an instrument with a salid-state display and based on an MOS, LSI chip 1973
12 5 p. 412-
1 p.
artikel
43 Discharge of MNOS structures 1973
12 5 p. 413-
1 p.
artikel
44 Discounting utilization in order to optimise reliability choices on an economic level 1973
12 5 p. 406-
1 p.
artikel
45 Economic models for statellite system effectiveness 1973
12 5 p. 408-
1 p.
artikel
46 Economics influence the design of consumer microcircuits 1973
12 5 p. 411-
1 p.
artikel
47 Effect of oxidation on orientation-dependent boron diffusion in silicon 1973
12 5 p. 415-
1 p.
artikel
48 Electron-probe: tool for failure analysis for semiconductor devices 1973
12 5 p. 407-
1 p.
artikel
49 Enterprise liability—let the vendor prepare 1973
12 5 p. 405-
1 p.
artikel
50 Failure analysis and ebservations with scanning electron microscope 1973
12 5 p. 408-
1 p.
artikel
51 Failure rate functions from test data 1973
12 5 p. 406-
1 p.
artikel
52 Family of inductorless oscillators derived from gyrater circuits 1973
12 5 p. 414-
1 p.
artikel
53 Fast buffer store has self-control 1973
12 5 p. 412-413
2 p.
artikel
54 FETs as analog switches Givens, Shelby
1973
12 5 p. 421-428
8 p.
artikel
55 Field data collection and reliability assurance of solid state devices for industrial use 1973
12 5 p. 409-410
2 p.
artikel
56 Generating pulses with C-MOS flip-flops 1973
12 5 p. 412-
1 p.
artikel
57 Gold-free film cuts LSI package cost 1973
12 5 p. 412-
1 p.
artikel
58 High-resolution SEM observation of semiconductor device cross-sections 1973
12 5 p. 414-415
2 p.
artikel
59 IC timers make the most of delay 1973
12 5 p. 414-
1 p.
artikel
60 Improvement of shallow base transistor technology by using a doped poly-silicon diffusion source 1973
12 5 p. 415-
1 p.
artikel
61 Infrared transmission microscopy utilizing a high-resolution video display 1973
12 5 p. 407-
1 p.
artikel
62 Integrated line oscillator combination TBA920 1973
12 5 p. 413-
1 p.
artikel
63 Interfacing with CMOS 1973
12 5 p. 413-
1 p.
artikel
64 Irradiation test and preselection of maverick diodes for the project symphonie satellite Wagemann, H.G.
1973
12 5 p. 467-472
6 p.
artikel
65 Laser trimming is an art that must be learned 1973
12 5 p. 418-
1 p.
artikel
66 Low-cost minicomputer opens up many new system opportunities 1973
12 5 p. 413-
1 p.
artikel
67 Low-energy implantation of boron in silicon 1973
12 5 p. 418-
1 p.
artikel
68 Maintainability engineering G.W.A.D.,
1973
12 5 p. 419-
1 p.
artikel
69 Maintenance float for small fleet sizes 1973
12 5 p. 408-
1 p.
artikel
70 Maintenance strategies for ambiguous faults 1973
12 5 p. 410-
1 p.
artikel
71 Maskentechuik für Integrierte Schaltkreise 1973
12 5 p. 412-
1 p.
artikel
72 Methodology for value engineering 1973
12 5 p. 405-
1 p.
artikel
73 Microcomputers and QC. statistics: programs and tables 1973
12 5 p. 410-
1 p.
artikel
74 Microdefects in dislocation-free silicon crystals 1973
12 5 p. 415-
1 p.
artikel
75 Mimimizing the cost of reliability assurance 1973
12 5 p. 405-
1 p.
artikel
76 Minimizing the area required for time constants in integrated circuits 1973
12 5 p. 411-
1 p.
artikel
77 Modeling the bathtub curve 1973
12 5 p. 406-
1 p.
artikel
78 More reliability data from in-flight spacecraft 1973
12 5 p. 408-
1 p.
artikel
79 MOS circuits in industrial and domestric control 1973
12 5 p. 414-
1 p.
artikel
80 MOS system reduces exhaust pollution 1973
12 5 p. 414-
1 p.
artikel
81 Nonvolatile optical pattern memory using MAOS structure 1973
12 5 p. 413-
1 p.
artikel
82 Notice 1973
12 5 p. 399-
1 p.
artikel
83 Notices and calls for papers 1973
12 5 p. 401-404
4 p.
artikel
84 Observation of lattices defects in ion-implanted Si wafer by a double crystal spectrometer method 1973
12 5 p. 418-
1 p.
artikel
85 On prediction problems in reliability Singh, N.
1973
12 5 p. 451-457
7 p.
artikel
86 Optimization of system reliability using a parametric approach 1973
12 5 p. 409-
1 p.
artikel
87 Papers to be published in future issues 1973
12 5 p. 420-
1 p.
artikel
88 Plasma ions clean and etch integrated circuits 1973
12 5 p. 412-
1 p.
artikel
89 Polycrystalline silicon resistors for integrated circuits 1973
12 5 p. 416-
1 p.
artikel
90 Polysilicon-filled notch produces flat, well-isolated bipolar memory 1973
12 5 p. 416-417
2 p.
artikel
91 Precision comparator circuit satifies L.S.I. testing needs 1973
12 5 p. 414-
1 p.
artikel
92 Product liability and consumer risk taking—economic tradeoffs 1973
12 5 p. 405-
1 p.
artikel
93 Product liability—is no-fault the answer 1973
12 5 p. 405-
1 p.
artikel
94 Properties of MOS structures prepared on substrates having ion-implanted impurity distribution profile 1973
12 5 p. 418-
1 p.
artikel
95 Recent advances in the design of micropower operational amplifiers 1973
12 5 p. 413-
1 p.
artikel
96 Reliability analysis of a series system with a standby and a repair facility Gopalan, M.N.
1973
12 5 p. 473-474
2 p.
artikel
97 Reliability data plotting using the Pearson curves 1973
12 5 p. 406-
1 p.
artikel
98 Reliability in hospital instrumentation 1973
12 5 p. 409-
1 p.
artikel
99 Reliability of GaAs 1−xPx light emitting diodes 1973
12 5 p. 407-
1 p.
artikel
100 Reliability of maintainable structures 1973
12 5 p. 410-
1 p.
artikel
101 Reliability optimization with integer constraint coefficients Misra, K.B.
1973
12 5 p. 431-433
3 p.
artikel
102 Reliability study organization about electromechanical device 1973
12 5 p. 407-
1 p.
artikel
103 Sampling programs for reliability 1973
12 5 p. 406-
1 p.
artikel
104 Self-diagnesis and self-repair in memory: an integrated system approach 1973
12 5 p. 409-
1 p.
artikel
105 Semiconductor characterization by measurements of non-equilibrium current in MOS capacitors 1973
12 5 p. 416-
1 p.
artikel
106 Semiconductor memory COFMOS 418 1973
12 5 p. 412-
1 p.
artikel
107 Stacked-gate avalanche-injection type MOS (SAMOS) memory 1973
12 5 p. 413-
1 p.
artikel
108 Study on three-dimensional distribution of implanted ions by He+ backscattering technique 1973
12 5 p. 417-
1 p.
artikel
109 Testing of spacecraft in long-term sterage 1973
12 5 p. 410-
1 p.
artikel
110 The assessment of connector reliability Lovelock, R.T.
1973
12 5 p. 475-481
7 p.
artikel
111 The electrical properties of phosphorous doped silicon layers obtained by ion implantation through a passivating oxide 1973
12 5 p. 417-418
2 p.
artikel
112 The evaluation of failure and failure related data 1973
12 5 p. 408-
1 p.
artikel
113 The Intel 1103: the MOS memory that defied cores 1973
12 5 p. 414-
1 p.
artikel
114 The microwave tubes reliability problem 1973
12 5 p. 407-
1 p.
artikel
115 Theory of a travelling-wave thin-film GaAs amplifier 1973
12 5 p. 417-
1 p.
artikel
116 The reliability of coherent structures—A parametric approach Cunningham, L.A.
1973
12 5 p. 441-444
4 p.
artikel
117 The reliability of failure rates 1973
12 5 p. 406-
1 p.
artikel
118 The rôle of testing in achieving serospace systems effectiveness 1973
12 5 p. 409-
1 p.
artikel
119 Thermal noise measurements on space-charge-limited hole current in silicon 1973
12 5 p. 415-
1 p.
artikel
120 The year for NMOS is coming, with 4-k-bit RAMs and more 1973
12 5 p. 413-
1 p.
artikel
121 Time dependence of injection currents in SiO2 1973
12 5 p. 417-
1 p.
artikel
122 Touchless wafer handling 1973
12 5 p. 412-
1 p.
artikel
123 Transient analysis of complimentary MOS IC inverter 1973
12 5 p. 411-
1 p.
artikel
124 Trap structure of pyrolytic A1203 in MOS capacitors 1973
12 5 p. 416-
1 p.
artikel
                             124 gevonden resultaten
 
 Koninklijke Bibliotheek - Nationale Bibliotheek van Nederland