| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A comparison of the strength of alumina substrates for different separation techniques
|
|
|
1973
|
12 |
2 |
p. 93-
1 p.
|
artikel
|
| 2 |
Active filters get more of the action
|
|
|
1973
|
12 |
2 |
p. 91-
1 p.
|
artikel
|
| 3 |
Advances in dichlorosilane epitaxial technology
|
|
|
1973
|
12 |
2 |
p. 98-
1 p.
|
artikel
|
| 4 |
Aluminum interconnections and beam leads on polyimide-coated copper substrates
|
|
|
1973
|
12 |
2 |
p. 94-
1 p.
|
artikel
|
| 5 |
A method for computing complex system reliability
|
|
|
1973
|
12 |
2 |
p. 90-
1 p.
|
artikel
|
| 6 |
An all-bipolar image sensor
|
|
|
1973
|
12 |
2 |
p. 95-
1 p.
|
artikel
|
| 7 |
An empirical Bayes approach to reliability
|
|
|
1973
|
12 |
2 |
p. 85-
1 p.
|
artikel
|
| 8 |
A new a.c. sputtering technique for the deposition of thin films
|
|
|
1973
|
12 |
2 |
p. 99-
1 p.
|
artikel
|
| 9 |
A new method of manufacturing multilayer circuit boards
|
|
|
1973
|
12 |
2 |
p. 96-
1 p.
|
artikel
|
| 10 |
An experimental model of the microelectronic ultrasonic wire bonding mechanism
|
|
|
1973
|
12 |
2 |
p. 92-
1 p.
|
artikel
|
| 11 |
An improved sputter-etching process
|
|
|
1973
|
12 |
2 |
p. 175-
1 p.
|
artikel
|
| 12 |
A procedure for the evaluation and failure analysis of MOS memory circuits using the scanning electron microscope in potential contrast mode
|
|
|
1973
|
12 |
2 |
p. 88-
1 p.
|
artikel
|
| 13 |
A proposal concerned with electronic component parts field reliability prediction method
|
|
|
1973
|
12 |
2 |
p. 84-
1 p.
|
artikel
|
| 14 |
A prototype assembly facility for CerDip packaging
|
|
|
1973
|
12 |
2 |
p. 92-
1 p.
|
artikel
|
| 15 |
A recommendation for ceramic over plastic IC packages for 1972 real-time commercial computer systems
|
|
|
1973
|
12 |
2 |
p. 93-
1 p.
|
artikel
|
| 16 |
A reliability model for stress vs strength problem
|
Yadav, R.P.S.
|
|
1973
|
12 |
2 |
p. 119-123
5 p.
|
artikel
|
| 17 |
A statistical model for electromigration induced failure in thin-film conductors
|
|
|
1973
|
12 |
2 |
p. 89-
1 p.
|
artikel
|
| 18 |
A stochastic approach for the anodic-oxidation process for fine adjustment of the thin-film resistors
|
|
|
1973
|
12 |
2 |
p. 98-99
2 p.
|
artikel
|
| 19 |
A tester for MOS integrated circuits
|
|
|
1973
|
12 |
2 |
p. 86-
1 p.
|
artikel
|
| 20 |
A theoretical investigation on the generation current in silicon p-n junctions under reverse bias
|
|
|
1973
|
12 |
2 |
p. 98-
1 p.
|
artikel
|
| 21 |
Avalanche breakdown in silicon diffused junctions
|
|
|
1973
|
12 |
2 |
p. 86-
1 p.
|
artikel
|
| 22 |
A yield calculation method for LSI arrays considering a defect distribution towards a wafer radius
|
|
|
1973
|
12 |
2 |
p. 87-
1 p.
|
artikel
|
| 23 |
Bayesian decision analysis of the hazard rate for a two-parameter Weibull process
|
|
|
1973
|
12 |
2 |
p. 86-
1 p.
|
artikel
|
| 24 |
B-747 component reliability program
|
|
|
1973
|
12 |
2 |
p. 89-
1 p.
|
artikel
|
| 25 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1973
|
12 |
2 |
p. 75-76
2 p.
|
artikel
|
| 26 |
CDI integrated circuits: the best of MOS and bipolars
|
|
|
1973
|
12 |
2 |
p. 91-
1 p.
|
artikel
|
| 27 |
Chemicals for semiconductor processing
|
|
|
1973
|
12 |
2 |
p. 93-
1 p.
|
artikel
|
| 28 |
Classification of reliability tests
|
|
|
1973
|
12 |
2 |
p. 85-86
2 p.
|
artikel
|
| 29 |
Compatibility and testing of electronic components
|
G.W.A.D.,
|
|
1973
|
12 |
2 |
p. 103-104
2 p.
|
artikel
|
| 30 |
Complementary MOS circuits in process control instrumentation
|
|
|
1973
|
12 |
2 |
p. 92-
1 p.
|
artikel
|
| 31 |
Complex system reliability with exponential repair time distributions under head-of-line-repair-discipline
|
Gupta, P.P.
|
|
1973
|
12 |
2 |
p. 151-158
8 p.
|
artikel
|
| 32 |
Complex system reliability with general repair time distributions under preemptive repeat repair discipline
|
Gupta, P.P.
|
|
1973
|
12 |
2 |
p. 145-150
6 p.
|
artikel
|
| 33 |
Component data for statistical circuit analysis
|
|
|
1973
|
12 |
2 |
p. 88-
1 p.
|
artikel
|
| 34 |
Computer program for designing optimal networks with MOS gates
|
|
|
1973
|
12 |
2 |
p. 91-
1 p.
|
artikel
|
| 35 |
Conductance associated with interface states in MOS tunnel structures
|
|
|
1973
|
12 |
2 |
p. 97-98
2 p.
|
artikel
|
| 36 |
Courses
|
|
|
1973
|
12 |
2 |
p. 79-81
3 p.
|
artikel
|
| 37 |
Current and future uses of vacuum deposition
|
|
|
1973
|
12 |
2 |
p. 101-
1 p.
|
artikel
|
| 38 |
Custom-designed MOS arrays for use in digital systems
|
|
|
1973
|
12 |
2 |
p. 92-
1 p.
|
artikel
|
| 39 |
Debugging computer programs. A survey with special emphasis on ALGOL
|
|
|
1973
|
12 |
2 |
p. 89-
1 p.
|
artikel
|
| 40 |
Degradation of MNOS memory transistor characteristics and failure mechanism model
|
|
|
1973
|
12 |
2 |
p. 87-
1 p.
|
artikel
|
| 41 |
Description and use of the dynamic memory TMS 4062
|
|
|
1973
|
12 |
2 |
p. 96-
1 p.
|
artikel
|
| 42 |
Designing a television line flywheel generator using a phase-locked loop integrated circuit
|
|
|
1973
|
12 |
2 |
p. 94-95
2 p.
|
artikel
|
| 43 |
Designing with high power hybrid control circuits
|
|
|
1973
|
12 |
2 |
p. 100-
1 p.
|
artikel
|
| 44 |
Determination of the relative nitrogen doping level of tantalum nitride resistor film by means of the Seebeck effect
|
|
|
1973
|
12 |
2 |
p. 99-
1 p.
|
artikel
|
| 45 |
Direct current conductivity in amorphous semiconductors
|
|
|
1973
|
12 |
2 |
p. 96-
1 p.
|
artikel
|
| 46 |
Discharge sputtering
|
|
|
1973
|
12 |
2 |
p. 100-101
2 p.
|
artikel
|
| 47 |
Discussing complementary MOS
|
|
|
1973
|
12 |
2 |
p. 91-
1 p.
|
artikel
|
| 48 |
Electromigration in gold-silver alloys
|
|
|
1973
|
12 |
2 |
p. 93-
1 p.
|
artikel
|
| 49 |
Electron trapping levels in silicon dioxide thermally grown on silicon
|
|
|
1973
|
12 |
2 |
p. 97-
1 p.
|
artikel
|
| 50 |
Environmental factors governing field reliability of plastic transistors and integrated circuits
|
|
|
1973
|
12 |
2 |
p. 88-
1 p.
|
artikel
|
| 51 |
Epitaxial growth of silicon from SiH4 in the temperature range 800–1150°C
|
|
|
1973
|
12 |
2 |
p. 96-
1 p.
|
artikel
|
| 52 |
Estimating substrate area and density for hybrid microcircuits
|
|
|
1973
|
12 |
2 |
p. 99-100
2 p.
|
artikel
|
| 53 |
Estimating the reliability of electronic tubes with the aid of truncated life tests
|
|
|
1973
|
12 |
2 |
p. 86-
1 p.
|
artikel
|
| 54 |
Failure characteristics of thin-film capacitors
|
|
|
1973
|
12 |
2 |
p. 87-
1 p.
|
artikel
|
| 55 |
Focus on comparator ICs
|
|
|
1973
|
12 |
2 |
p. 95-
1 p.
|
artikel
|
| 56 |
Good things come in small packages
|
|
|
1973
|
12 |
2 |
p. 86-
1 p.
|
artikel
|
| 57 |
Higher packing density and lower power with complementary MOS
|
|
|
1973
|
12 |
2 |
p. 91-
1 p.
|
artikel
|
| 58 |
Hybrid circuits—where should the split be?
|
|
|
1973
|
12 |
2 |
p. 99-
1 p.
|
artikel
|
| 59 |
IC device integrates inductors: coil-less radio and TV coming
|
|
|
1973
|
12 |
2 |
p. 95-
1 p.
|
artikel
|
| 60 |
Inclusion of minority charge carriers in the solution of Poisson's equation for a metal semiconductor contact in thermal equilibrium
|
|
|
1973
|
12 |
2 |
p. 96-97
2 p.
|
artikel
|
| 61 |
Influence of surface energies on line resolution in screen printing
|
|
|
1973
|
12 |
2 |
p. 92-
1 p.
|
artikel
|
| 62 |
Instrument for thickness measurement of transparent thin films on silicon substrates
|
|
|
1973
|
12 |
2 |
p. 99-
1 p.
|
artikel
|
| 63 |
Integrated MOS distributed RC networks for frequency selective circuits
|
Bozic, S.M.
|
|
1973
|
12 |
2 |
p. 139-144
6 p.
|
artikel
|
| 64 |
Items of interest
|
Gianelle, W.H.
|
|
1973
|
12 |
2 |
p. 73-
1 p.
|
artikel
|
| 65 |
Laser beam controls crystal growth
|
|
|
1973
|
12 |
2 |
p. 179-180
2 p.
|
artikel
|
| 66 |
Lasers in chemical vapour deposition
|
|
|
1973
|
12 |
2 |
p. 177-IN6
nvt p.
|
artikel
|
| 67 |
LEED and Auger electron spectroscopic observations of the substrate surface during sputtering and vacuum vapour deposition
|
|
|
1973
|
12 |
2 |
p. 101-
1 p.
|
artikel
|
| 68 |
Limitations in microelectronics—II. Bipolar technology
|
|
|
1973
|
12 |
2 |
p. 86-
1 p.
|
artikel
|
| 69 |
Liquid immersion cooling of small electronic devices
|
Baker, E.
|
|
1973
|
12 |
2 |
p. 163-173
11 p.
|
artikel
|
| 70 |
Low concentration diffusion in silicon under sealed tube conditions
|
|
|
1973
|
12 |
2 |
p. 97-
1 p.
|
artikel
|
| 71 |
Low-power bipolar technique begets low-power LSI logic
|
|
|
1973
|
12 |
2 |
p. 91-
1 p.
|
artikel
|
| 72 |
Microcircuit reliability bibliography
|
|
|
1973
|
12 |
2 |
p. 90-
1 p.
|
artikel
|
| 73 |
MNOS memory devices
|
|
|
1973
|
12 |
2 |
p. 95-96
2 p.
|
artikel
|
| 74 |
MOS custom design meets digital-system requirements
|
|
|
1973
|
12 |
2 |
p. 91-
1 p.
|
artikel
|
| 75 |
MOS C-V techniques for IC process control
|
|
|
1973
|
12 |
2 |
p. 93-
1 p.
|
artikel
|
| 76 |
MOS/LSI launches the low-cost processor
|
|
|
1973
|
12 |
2 |
p. 95-
1 p.
|
artikel
|
| 77 |
Nickel-chromium resistor failure modes and their identification
|
Keenan, W.F.
|
|
1973
|
12 |
2 |
p. 125-126
2 p.
|
artikel
|
| 78 |
Non-contact printing and automatic alignment of chromium mask patterns on silicon slices
|
|
|
1973
|
12 |
2 |
p. 92-
1 p.
|
artikel
|
| 79 |
Non-repairable items
|
|
|
1973
|
12 |
2 |
p. 85-
1 p.
|
artikel
|
| 80 |
Notice
|
|
|
1973
|
12 |
2 |
p. 77-
1 p.
|
artikel
|
| 81 |
Notices and calls for papers
|
|
|
1973
|
12 |
2 |
p. 83-
1 p.
|
artikel
|
| 82 |
On-line integrated circuit design system using graphic display
|
|
|
1973
|
12 |
2 |
p. 92-
1 p.
|
artikel
|
| 83 |
On sputtered thin-films of chrome, nitrided chrome and nickel-chromium
|
Abita, J.L.
|
|
1973
|
12 |
2 |
p. 111-117
7 p.
|
artikel
|
| 84 |
Operational adjustment of thick-film circuits
|
|
|
1973
|
12 |
2 |
p. 100-
1 p.
|
artikel
|
| 85 |
Operational behaviour of a complex system with two out of M failed components
|
Varma, G.K.
|
|
1973
|
12 |
2 |
p. 107-110
4 p.
|
artikel
|
| 86 |
Optical isolators: outlook is bright
|
|
|
1973
|
12 |
2 |
p. 86-
1 p.
|
artikel
|
| 87 |
Papers to be published in future issues
|
|
|
1973
|
12 |
2 |
p. 105-
1 p.
|
artikel
|
| 88 |
Physical and electrical properties of thin-film barium titanate prepared by r.f. sputtering on silicon substrates
|
|
|
1973
|
12 |
2 |
p. 100-
1 p.
|
artikel
|
| 89 |
Physical problems of small structures in electronics
|
|
|
1973
|
12 |
2 |
p. 91-
1 p.
|
artikel
|
| 90 |
Potentials and direct current in Si-(20–40 Å)SiO2—metal structures
|
|
|
1973
|
12 |
2 |
p. 98-
1 p.
|
artikel
|
| 91 |
Preparation of tantalum-titanium alloy thin films
|
|
|
1973
|
12 |
2 |
p. 100-
1 p.
|
artikel
|
| 92 |
Purple plague and gold purity
|
|
|
1973
|
12 |
2 |
p. 88-
1 p.
|
artikel
|
| 93 |
Quantitative aspects of reliability in process-control systems
|
|
|
1973
|
12 |
2 |
p. 89-90
2 p.
|
artikel
|
| 94 |
Reliability aspects of plastic encapsulated integrated circuits
|
|
|
1973
|
12 |
2 |
p. 88-
1 p.
|
artikel
|
| 95 |
Reliability comparisons
|
|
|
1973
|
12 |
2 |
p. 85-
1 p.
|
artikel
|
| 96 |
Reliability of microwave mixer diodes
|
|
|
1973
|
12 |
2 |
p. 86-87
2 p.
|
artikel
|
| 97 |
Reliability optimization of a series-parallel system
|
|
|
1973
|
12 |
2 |
p. 90-
1 p.
|
artikel
|
| 98 |
Reliability program of ISS (ionosphere sounding satellite)
|
|
|
1973
|
12 |
2 |
p. 89-
1 p.
|
artikel
|
| 99 |
Reliability technology
|
G.W.A.D.,
|
|
1973
|
12 |
2 |
p. 103-
1 p.
|
artikel
|
| 100 |
Selecting inputs to test digital circuits on complex IC boards
|
|
|
1973
|
12 |
2 |
p. 86-
1 p.
|
artikel
|
| 101 |
Silicon on sapphire substrates overcome MOS limitations
|
|
|
1973
|
12 |
2 |
p. 94-
1 p.
|
artikel
|
| 102 |
Single crystal oxide substrates
|
|
|
1973
|
12 |
2 |
p. 94-
1 p.
|
artikel
|
| 103 |
Special report: consumer gear benefits from IC design trade-offs
|
|
|
1973
|
12 |
2 |
p. 91-
1 p.
|
artikel
|
| 104 |
Structure and electrical characteristics of epitaxial palladium silicide contacts on single crystal silicon and diffused p-n diodes
|
|
|
1973
|
12 |
2 |
p. 96-
1 p.
|
artikel
|
| 105 |
Survey of circuitry for wristwatches
|
|
|
1973
|
12 |
2 |
p. 94-
1 p.
|
artikel
|
| 106 |
Synthesis of fault diagnosable logical circuits
|
|
|
1973
|
12 |
2 |
p. 90-
1 p.
|
artikel
|
| 107 |
Synthèse des différentes technologies de réalisation de couches minces diélectriques. Caractéristiques dès dépots
|
|
|
1973
|
12 |
2 |
p. 98-
1 p.
|
artikel
|
| 108 |
Systematic computer-aided multidimensional modeling of integrated bipolar devices
|
|
|
1973
|
12 |
2 |
p. 95-
1 p.
|
artikel
|
| 109 |
System design with MOS dynamic shift registers
|
|
|
1973
|
12 |
2 |
p. 92-
1 p.
|
artikel
|
| 110 |
Ten-bit digital-to-analog converter with thin-film ladder network
|
|
|
1973
|
12 |
2 |
p. 99-
1 p.
|
artikel
|
| 111 |
Testing for faults in cellular logic arrays (1 January 1970–1976 January 1972)
|
|
|
1973
|
12 |
2 |
p. 89-
1 p.
|
artikel
|
| 112 |
The diffusion of boron in the Si-SiO2 system
|
|
|
1973
|
12 |
2 |
p. 98-
1 p.
|
artikel
|
| 113 |
The element approach to the design of complex MOST integrated circuits
|
|
|
1973
|
12 |
2 |
p. 91-
1 p.
|
artikel
|
| 114 |
The IC plastic package: a simple method of predicting package performance
|
|
|
1973
|
12 |
2 |
p. 93-
1 p.
|
artikel
|
| 115 |
The life and times of the Enfield Microelectronics Centre
|
|
|
1973
|
12 |
2 |
p. 90-
1 p.
|
artikel
|
| 116 |
Theory of dynamic charge and capacitance characteristics in MIS systems containing discrete surface traps
|
|
|
1973
|
12 |
2 |
p. 96-
1 p.
|
artikel
|
| 117 |
The performance of gyrator and leapfrog inductorless filters, using integrated circuits
|
Roberts, G.M.
|
|
1973
|
12 |
2 |
p. 159-161
3 p.
|
artikel
|
| 118 |
The quality assurance of semiconductor devices
|
|
|
1973
|
12 |
2 |
p. 88-
1 p.
|
artikel
|
| 119 |
The reliability of the TO-92 plastic transistor
|
|
|
1973
|
12 |
2 |
p. 88-89
2 p.
|
artikel
|
| 120 |
Thermal chip evaluation of IC packaging
|
|
|
1973
|
12 |
2 |
p. 94-
1 p.
|
artikel
|
| 121 |
Thermally-stimulated current from the gold acceptor trapping level in silicon
|
|
|
1973
|
12 |
2 |
p. 97-
1 p.
|
artikel
|
| 122 |
The use of a diamond heat sink for a high reliability impatt diode
|
|
|
1973
|
12 |
2 |
p. 87-
1 p.
|
artikel
|
| 123 |
Thick-film microcircuits—guide lines for custom design
|
|
|
1973
|
12 |
2 |
p. 100-
1 p.
|
artikel
|
| 124 |
Thick-film technique promises switches at a fraction of a cent
|
|
|
1973
|
12 |
2 |
p. 99-
1 p.
|
artikel
|
| 125 |
Use of lead dioxide counterelectrodes in thin-film capacitors: the TLM compacitor
|
|
|
1973
|
12 |
2 |
p. 100-
1 p.
|
artikel
|
| 126 |
Vapor-phase growth of several 111-V compound semiconductors
|
|
|
1973
|
12 |
2 |
p. 96-
1 p.
|
artikel
|
| 127 |
V-ATE memory scores a new high in combining speed and bit density
|
|
|
1973
|
12 |
2 |
p. 91-
1 p.
|
artikel
|
| 128 |
Wafer probe yield improvement
|
|
|
1973
|
12 |
2 |
p. 93-
1 p.
|
artikel
|
| 129 |
Yield degradation of integrated circuits due to spot defects
|
|
|
1973
|
12 |
2 |
p. 88-
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