| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
A Bayesian approach to reliability: theory and simulation
|
|
|
1972
|
11 |
5 |
p. 409-
1 p.
|
article
|
| 2 |
A complete reliability program
|
|
|
1972
|
11 |
5 |
p. 410-
1 p.
|
article
|
| 3 |
A method for predicting the probability of effective maintenance
|
|
|
1972
|
11 |
5 |
p. 414-
1 p.
|
article
|
| 4 |
A moment method for the calculation of a confidence interval for the failure probability of a system
|
|
|
1972
|
11 |
5 |
p. 414-
1 p.
|
article
|
| 5 |
An automated integrated circuit layout design program of a systematic chip using building blocks
|
|
|
1972
|
11 |
5 |
p. 417-
1 p.
|
article
|
| 6 |
An essay on reliability, cost and modelling
|
|
|
1972
|
11 |
5 |
p. 410-
1 p.
|
article
|
| 7 |
A new gold-tin alloy composition for hermetic package sealing and attachment of hybrid parts
|
|
|
1972
|
11 |
5 |
p. 415-
1 p.
|
article
|
| 8 |
An investigation of carrier transport in thin silicon-on-sapphire films using MIS deep depletion Hall effect structures
|
|
|
1972
|
11 |
5 |
p. 420-
1 p.
|
article
|
| 9 |
A perspective on computer reliability
|
|
|
1972
|
11 |
5 |
p. 413-
1 p.
|
article
|
| 10 |
A practical analysis of the sedentary failure rate
|
|
|
1972
|
11 |
5 |
p. 413-
1 p.
|
article
|
| 11 |
A reliability cost-benefit analysis study
|
|
|
1972
|
11 |
5 |
p. 409-
1 p.
|
article
|
| 12 |
A simple equivalent circuit for the MNOST memory element
|
|
|
1972
|
11 |
5 |
p. 416-417
2 p.
|
article
|
| 13 |
Assembling large-array IC memories
|
|
|
1972
|
11 |
5 |
p. 416-
1 p.
|
article
|
| 14 |
A summary of thin-film technology
|
|
|
1972
|
11 |
5 |
p. 421-
1 p.
|
article
|
| 15 |
Automatically tuned filter uses IC operational amplifiers
|
|
|
1972
|
11 |
5 |
p. 417-
1 p.
|
article
|
| 16 |
Beam leads start to connect
|
|
|
1972
|
11 |
5 |
p. 415-
1 p.
|
article
|
| 17 |
Bipolar techniques approach MOS in density, cost and power drain, yet retain speed
|
|
|
1972
|
11 |
5 |
p. 418-
1 p.
|
article
|
| 18 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1972
|
11 |
5 |
p. 401-402
2 p.
|
article
|
| 19 |
Calls for papers
|
|
|
1972
|
11 |
5 |
p. 405-408
4 p.
|
article
|
| 20 |
Chip set makes a powerful processor
|
|
|
1972
|
11 |
5 |
p. 418-
1 p.
|
article
|
| 21 |
CMOS digital wristwatch features liquid crystal display
|
|
|
1972
|
11 |
5 |
p. 418-
1 p.
|
article
|
| 22 |
Collector coupling minimizes interconnections in chip
|
|
|
1972
|
11 |
5 |
p. 415-
1 p.
|
article
|
| 23 |
Colour decoder using integrated circuits
|
|
|
1972
|
11 |
5 |
p. 418-
1 p.
|
article
|
| 24 |
Components of the integrated TTL circuit
|
|
|
1972
|
11 |
5 |
p. 418-
1 p.
|
article
|
| 25 |
Computer-aided drawing equipment for integrated-circuit manufacture
|
|
|
1972
|
11 |
5 |
p. 415-
1 p.
|
article
|
| 26 |
Computer-aided evaluation of circuits and test structures
|
|
|
1972
|
11 |
5 |
p. 416-
1 p.
|
article
|
| 27 |
Computer simulation of the thermal environment of large-scale integrated circuits: computer time-saving techniques
|
|
|
1972
|
11 |
5 |
p. 414-
1 p.
|
article
|
| 28 |
Confidence calculations for Mil-Std-781
|
|
|
1972
|
11 |
5 |
p. 410-
1 p.
|
article
|
| 29 |
Coplamos keeps n-channels in line
|
|
|
1972
|
11 |
5 |
p. 417-
1 p.
|
article
|
| 30 |
Corrosive effects of solder flux on printed-circuit boards
|
|
|
1972
|
11 |
5 |
p. 412-
1 p.
|
article
|
| 31 |
Courses
|
|
|
1972
|
11 |
5 |
p. 403-404
2 p.
|
article
|
| 32 |
Data collection techniques
|
|
|
1972
|
11 |
5 |
p. 410-
1 p.
|
article
|
| 33 |
Density of states of superconductors with overlapping bands
|
|
|
1972
|
11 |
5 |
p. 420-
1 p.
|
article
|
| 34 |
Depletion layer formation, space-charge injection and current-voltage characteristics for the silicon p-n-p (n-p-n) structure
|
|
|
1972
|
11 |
5 |
p. 419-
1 p.
|
article
|
| 35 |
Determination of low energy barriers in metal-insulator-metal tunneling junctions
|
|
|
1972
|
11 |
5 |
p. 420-
1 p.
|
article
|
| 36 |
Determination of the doping structure of integrated bipolar transistorized circuits, evaluating electric data by means of a computer
|
|
|
1972
|
11 |
5 |
p. 419-
1 p.
|
article
|
| 37 |
Digital ICs offer new solutions for rough industrial problems
|
|
|
1972
|
11 |
5 |
p. 418-
1 p.
|
article
|
| 38 |
Digital testing costs can be cut
|
|
|
1972
|
11 |
5 |
p. 415-
1 p.
|
article
|
| 39 |
Do not be confused by IC switching time specifications
|
|
|
1972
|
11 |
5 |
p. 416-
1 p.
|
article
|
| 40 |
Economics of reliability for spacecraft computers
|
|
|
1972
|
11 |
5 |
p. 414-
1 p.
|
article
|
| 41 |
Effective testing of digital integrated circuits
|
|
|
1972
|
11 |
5 |
p. 415-
1 p.
|
article
|
| 42 |
Effects of base doping and width on the J-V characteristics of the n+-n-p+ structure
|
|
|
1972
|
11 |
5 |
p. 421-
1 p.
|
article
|
| 43 |
Electromigration in thin silver, copper, gold, indium, tin, lead and magnesium films
|
|
|
1972
|
11 |
5 |
p. 412-
1 p.
|
article
|
| 44 |
Enhancement of breakdown properties of overlay annular diodes by field shaping resistive films
|
|
|
1972
|
11 |
5 |
p. 412-
1 p.
|
article
|
| 45 |
Factory cleanliness for the manufacture of microelectronic devices
|
|
|
1972
|
11 |
5 |
p. 416-
1 p.
|
article
|
| 46 |
Failure mode control in plastic ICs
|
|
|
1972
|
11 |
5 |
p. 412-
1 p.
|
article
|
| 47 |
Failure modes, effects and criticality analyses
|
|
|
1972
|
11 |
5 |
p. 413-414
2 p.
|
article
|
| 48 |
Focus on CMOS
|
|
|
1972
|
11 |
5 |
p. 417-
1 p.
|
article
|
| 49 |
Functional digital ICs: devices to delight the systems man
|
|
|
1972
|
11 |
5 |
p. 418-
1 p.
|
article
|
| 50 |
Functional trimming gains economics for hybrid ICs
|
|
|
1972
|
11 |
5 |
p. 422-
1 p.
|
article
|
| 51 |
Gas incorporation in sputtered and evaporated gold films
|
|
|
1972
|
11 |
5 |
p. 421-422
2 p.
|
article
|
| 52 |
Hall effect of hot electrons in silicon
|
|
|
1972
|
11 |
5 |
p. 419-420
2 p.
|
article
|
| 53 |
High-frequency measurement of integrated circuit components
|
|
|
1972
|
11 |
5 |
p. 418-
1 p.
|
article
|
| 54 |
High negative bias sputtering: a revolution for thick films?
|
|
|
1972
|
11 |
5 |
p. 422-
1 p.
|
article
|
| 55 |
IC monostables can be economical
|
|
|
1972
|
11 |
5 |
p. 417-
1 p.
|
article
|
| 56 |
IC op amps simplify regulator design
|
|
|
1972
|
11 |
5 |
p. 418-
1 p.
|
article
|
| 57 |
Implanted depletion loads boost MOS array performance
|
|
|
1972
|
11 |
5 |
p. 416-
1 p.
|
article
|
| 58 |
Integrated arrays offer many advantages in o.c.r. systems
|
|
|
1972
|
11 |
5 |
p. 417-
1 p.
|
article
|
| 59 |
Interface states in Si-SiO2 interfaces
|
|
|
1972
|
11 |
5 |
p. 419-
1 p.
|
article
|
| 60 |
Ion impact sputtering for etching and micro-machining
|
|
|
1972
|
11 |
5 |
p. 418-
1 p.
|
article
|
| 61 |
IOTA, a new computer controlled thin-film thick-ness measurement tool
|
|
|
1972
|
11 |
5 |
p. 422-
1 p.
|
article
|
| 62 |
Is there a reliable screen for VHF power transistors?
|
|
|
1972
|
11 |
5 |
p. 411-
1 p.
|
article
|
| 63 |
Low-level currents in insulated gate field effect transistors
|
|
|
1972
|
11 |
5 |
p. 419-
1 p.
|
article
|
| 64 |
Low-power digital phase locked loop utilizes CMOS logic
|
|
|
1972
|
11 |
5 |
p. 418-
1 p.
|
article
|
| 65 |
Measuring reliability
|
|
|
1972
|
11 |
5 |
p. 409-
1 p.
|
article
|
| 66 |
Mechanical connectors for aluminium cables in investigation of degradation mechanisms in connector clamps and bolted terminations
|
|
|
1972
|
11 |
5 |
p. 411-
1 p.
|
article
|
| 67 |
MIL-STD-721 B Definitions of effectiveness terms for reliability, maintainability, human factors, and safety
|
|
|
1972
|
11 |
5 |
p. 429-433
5 p.
|
article
|
| 68 |
Minority carrier lifetime in highly doped Ge
|
|
|
1972
|
11 |
5 |
p. 419-
1 p.
|
article
|
| 69 |
MOS/LSI reliability prediction
|
|
|
1972
|
11 |
5 |
p. 411-
1 p.
|
article
|
| 70 |
NASA program decisions using reliability analysis
|
|
|
1972
|
11 |
5 |
p. 409-410
2 p.
|
article
|
| 71 |
Negative differential conductivity and current oscillations in lightly doped n-type silicon
|
|
|
1972
|
11 |
5 |
p. 419-
1 p.
|
article
|
| 72 |
New growth: silicon on sapphire
|
|
|
1972
|
11 |
5 |
p. 420-
1 p.
|
article
|
| 73 |
On analysing transitional processes in digital circuits by means of probability functions
|
|
|
1972
|
11 |
5 |
p. 415-
1 p.
|
article
|
| 74 |
On reliability prediction by pattern classification
|
|
|
1972
|
11 |
5 |
p. 414-
1 p.
|
article
|
| 75 |
Packaging with integrated circuits
|
|
|
1972
|
11 |
5 |
p. 416-
1 p.
|
article
|
| 76 |
Papers to be published in future issues
|
|
|
1972
|
11 |
5 |
p. 424-
1 p.
|
article
|
| 77 |
Penetrate the mystique of MOS specifications
|
|
|
1972
|
11 |
5 |
p. 414-415
2 p.
|
article
|
| 78 |
Planning optimum maintainability demonstrations
|
|
|
1972
|
11 |
5 |
p. 414-
1 p.
|
article
|
| 79 |
Potential distributions in surface p-n junctions
|
|
|
1972
|
11 |
5 |
p. 418-419
2 p.
|
article
|
| 80 |
Probleme schneller integrierter Schaltungen
|
|
|
1972
|
11 |
5 |
p. 416-
1 p.
|
article
|
| 81 |
Problems of large-scale integration (Part 1)
|
|
|
1972
|
11 |
5 |
p. 416-
1 p.
|
article
|
| 82 |
Producing prototype thin-film hybrids
|
|
|
1972
|
11 |
5 |
p. 422-
1 p.
|
article
|
| 83 |
Properties of hafnium dioxide thin-film capacitors
|
|
|
1972
|
11 |
5 |
p. 421-
1 p.
|
article
|
| 84 |
Pumping speed of cryosorption pumps in the pressure 10−6 to 10−3 torr
|
|
|
1972
|
11 |
5 |
p. 422-
1 p.
|
article
|
| 85 |
Rapid photomask measurement using video scanning time intervals
|
|
|
1972
|
11 |
5 |
p. 416-
1 p.
|
article
|
| 86 |
Recombination dependent characteristics of silicon p+-n-n+ epitaxial diodes
|
|
|
1972
|
11 |
5 |
p. 420-
1 p.
|
article
|
| 87 |
Reed switch circuit hazards and their mitigation
|
|
|
1972
|
11 |
5 |
p. 411-
1 p.
|
article
|
| 88 |
Relationship of MOS circuit properties to LSI testing
|
|
|
1972
|
11 |
5 |
p. 414-
1 p.
|
article
|
| 89 |
Reliability and ESP
|
|
|
1972
|
11 |
5 |
p. 410-
1 p.
|
article
|
| 90 |
Reliability definitions
|
Reiche, H.
|
|
1972
|
11 |
5 |
p. 425-427
3 p.
|
article
|
| 91 |
Reliability definitions
|
Dummer, G.W.A.
|
|
1972
|
11 |
5 |
p. 399-
1 p.
|
article
|
| 92 |
Reliability measurements for third-generation computer systems
|
|
|
1972
|
11 |
5 |
p. 413-
1 p.
|
article
|
| 93 |
Reliability of ceramic capacitors
|
|
|
1972
|
11 |
5 |
p. 411-
1 p.
|
article
|
| 94 |
Reliability terms and definitions based on the conceptual relationship between reliability and quality
|
Brewer, R.
|
|
1972
|
11 |
5 |
p. 435-461
27 p.
|
article
|
| 95 |
Reliability test of MOS/LSI-memory for the improvement of the fabrication techniques
|
|
|
1972
|
11 |
5 |
p. 413-
1 p.
|
article
|
| 96 |
Reliable interconnections for Army avionics
|
|
|
1972
|
11 |
5 |
p. 412-
1 p.
|
article
|
| 97 |
Rheology of pastes in thick-film printing
|
|
|
1972
|
11 |
5 |
p. 422-
1 p.
|
article
|
| 98 |
SAMNOS technology
|
|
|
1972
|
11 |
5 |
p. 417-
1 p.
|
article
|
| 99 |
Semiconductors, characterization: kinetics of one energy-level recombination centers and surface states
|
|
|
1972
|
11 |
5 |
p. 421-
1 p.
|
article
|
| 100 |
Semiconductor surface contamination investigated by radioactive tracer techniques, Part I
|
|
|
1972
|
11 |
5 |
p. 411-
1 p.
|
article
|
| 101 |
Silicon-on-sapphire: a technology comes of age
|
|
|
1972
|
11 |
5 |
p. 419-
1 p.
|
article
|
| 102 |
Specific contact resistance of ohmic contacts to gallium arsenide
|
|
|
1972
|
11 |
5 |
p. 420-
1 p.
|
article
|
| 103 |
Stable germanium dioxide films on germanium
|
|
|
1972
|
11 |
5 |
p. 419-
1 p.
|
article
|
| 104 |
Standard parts and custom design merge in four-chip processor kit
|
|
|
1972
|
11 |
5 |
p. 416-
1 p.
|
article
|
| 105 |
Super-integrated memory shares functions on diffused islands
|
|
|
1972
|
11 |
5 |
p. 415-
1 p.
|
article
|
| 106 |
System considerations in dynamic MOS RAM's
|
|
|
1972
|
11 |
5 |
p. 418-
1 p.
|
article
|
| 107 |
Tantalum-glass cermet thin-film resistors
|
|
|
1972
|
11 |
5 |
p. 422-
1 p.
|
article
|
| 108 |
Test cost minimization for reliability assessment
|
|
|
1972
|
11 |
5 |
p. 410-411
2 p.
|
article
|
| 109 |
Testing in electronics
|
G.W.A.D.,
|
|
1972
|
11 |
5 |
p. 423-
1 p.
|
article
|
| 110 |
The combination of silicon nitride and aluminum anodization for semiconductor device passivation
|
|
|
1972
|
11 |
5 |
p. 417-
1 p.
|
article
|
| 111 |
The design of interactive graphic aids to mask layout
|
|
|
1972
|
11 |
5 |
p. 415-
1 p.
|
article
|
| 112 |
The dielectric constant and plasma frequency of p-type Ge-like semiconductors
|
|
|
1972
|
11 |
5 |
p. 420-
1 p.
|
article
|
| 113 |
The influence of phase boundary reactions on the diffusion during double conversions in solid state
|
|
|
1972
|
11 |
5 |
p. 420-421
2 p.
|
article
|
| 114 |
The operation and performance of an r.f. diode sputtering system in relation to its use as a research facility
|
|
|
1972
|
11 |
5 |
p. 421-
1 p.
|
article
|
| 115 |
The reliability engineer and the interactive terminal
|
|
|
1972
|
11 |
5 |
p. 413-
1 p.
|
article
|
| 116 |
Thermal cycling ratings of power transistors
|
|
|
1972
|
11 |
5 |
p. 411-412
2 p.
|
article
|
| 117 |
The TTL circuits D120C and D140C
|
|
|
1972
|
11 |
5 |
p. 417-
1 p.
|
article
|
| 118 |
Weibull, Bayes and Entropy
|
|
|
1972
|
11 |
5 |
p. 410-
1 p.
|
article
|
Journal description