nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A Bayesian approach to reliability: theory and simulation
|
|
|
1972 |
11 |
5 |
p. 409- 1 p. |
artikel |
2 |
A complete reliability program
|
|
|
1972 |
11 |
5 |
p. 410- 1 p. |
artikel |
3 |
A method for predicting the probability of effective maintenance
|
|
|
1972 |
11 |
5 |
p. 414- 1 p. |
artikel |
4 |
A moment method for the calculation of a confidence interval for the failure probability of a system
|
|
|
1972 |
11 |
5 |
p. 414- 1 p. |
artikel |
5 |
An automated integrated circuit layout design program of a systematic chip using building blocks
|
|
|
1972 |
11 |
5 |
p. 417- 1 p. |
artikel |
6 |
An essay on reliability, cost and modelling
|
|
|
1972 |
11 |
5 |
p. 410- 1 p. |
artikel |
7 |
A new gold-tin alloy composition for hermetic package sealing and attachment of hybrid parts
|
|
|
1972 |
11 |
5 |
p. 415- 1 p. |
artikel |
8 |
An investigation of carrier transport in thin silicon-on-sapphire films using MIS deep depletion Hall effect structures
|
|
|
1972 |
11 |
5 |
p. 420- 1 p. |
artikel |
9 |
A perspective on computer reliability
|
|
|
1972 |
11 |
5 |
p. 413- 1 p. |
artikel |
10 |
A practical analysis of the sedentary failure rate
|
|
|
1972 |
11 |
5 |
p. 413- 1 p. |
artikel |
11 |
A reliability cost-benefit analysis study
|
|
|
1972 |
11 |
5 |
p. 409- 1 p. |
artikel |
12 |
A simple equivalent circuit for the MNOST memory element
|
|
|
1972 |
11 |
5 |
p. 416-417 2 p. |
artikel |
13 |
Assembling large-array IC memories
|
|
|
1972 |
11 |
5 |
p. 416- 1 p. |
artikel |
14 |
A summary of thin-film technology
|
|
|
1972 |
11 |
5 |
p. 421- 1 p. |
artikel |
15 |
Automatically tuned filter uses IC operational amplifiers
|
|
|
1972 |
11 |
5 |
p. 417- 1 p. |
artikel |
16 |
Beam leads start to connect
|
|
|
1972 |
11 |
5 |
p. 415- 1 p. |
artikel |
17 |
Bipolar techniques approach MOS in density, cost and power drain, yet retain speed
|
|
|
1972 |
11 |
5 |
p. 418- 1 p. |
artikel |
18 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1972 |
11 |
5 |
p. 401-402 2 p. |
artikel |
19 |
Calls for papers
|
|
|
1972 |
11 |
5 |
p. 405-408 4 p. |
artikel |
20 |
Chip set makes a powerful processor
|
|
|
1972 |
11 |
5 |
p. 418- 1 p. |
artikel |
21 |
CMOS digital wristwatch features liquid crystal display
|
|
|
1972 |
11 |
5 |
p. 418- 1 p. |
artikel |
22 |
Collector coupling minimizes interconnections in chip
|
|
|
1972 |
11 |
5 |
p. 415- 1 p. |
artikel |
23 |
Colour decoder using integrated circuits
|
|
|
1972 |
11 |
5 |
p. 418- 1 p. |
artikel |
24 |
Components of the integrated TTL circuit
|
|
|
1972 |
11 |
5 |
p. 418- 1 p. |
artikel |
25 |
Computer-aided drawing equipment for integrated-circuit manufacture
|
|
|
1972 |
11 |
5 |
p. 415- 1 p. |
artikel |
26 |
Computer-aided evaluation of circuits and test structures
|
|
|
1972 |
11 |
5 |
p. 416- 1 p. |
artikel |
27 |
Computer simulation of the thermal environment of large-scale integrated circuits: computer time-saving techniques
|
|
|
1972 |
11 |
5 |
p. 414- 1 p. |
artikel |
28 |
Confidence calculations for Mil-Std-781
|
|
|
1972 |
11 |
5 |
p. 410- 1 p. |
artikel |
29 |
Coplamos keeps n-channels in line
|
|
|
1972 |
11 |
5 |
p. 417- 1 p. |
artikel |
30 |
Corrosive effects of solder flux on printed-circuit boards
|
|
|
1972 |
11 |
5 |
p. 412- 1 p. |
artikel |
31 |
Courses
|
|
|
1972 |
11 |
5 |
p. 403-404 2 p. |
artikel |
32 |
Data collection techniques
|
|
|
1972 |
11 |
5 |
p. 410- 1 p. |
artikel |
33 |
Density of states of superconductors with overlapping bands
|
|
|
1972 |
11 |
5 |
p. 420- 1 p. |
artikel |
34 |
Depletion layer formation, space-charge injection and current-voltage characteristics for the silicon p-n-p (n-p-n) structure
|
|
|
1972 |
11 |
5 |
p. 419- 1 p. |
artikel |
35 |
Determination of low energy barriers in metal-insulator-metal tunneling junctions
|
|
|
1972 |
11 |
5 |
p. 420- 1 p. |
artikel |
36 |
Determination of the doping structure of integrated bipolar transistorized circuits, evaluating electric data by means of a computer
|
|
|
1972 |
11 |
5 |
p. 419- 1 p. |
artikel |
37 |
Digital ICs offer new solutions for rough industrial problems
|
|
|
1972 |
11 |
5 |
p. 418- 1 p. |
artikel |
38 |
Digital testing costs can be cut
|
|
|
1972 |
11 |
5 |
p. 415- 1 p. |
artikel |
39 |
Do not be confused by IC switching time specifications
|
|
|
1972 |
11 |
5 |
p. 416- 1 p. |
artikel |
40 |
Economics of reliability for spacecraft computers
|
|
|
1972 |
11 |
5 |
p. 414- 1 p. |
artikel |
41 |
Effective testing of digital integrated circuits
|
|
|
1972 |
11 |
5 |
p. 415- 1 p. |
artikel |
42 |
Effects of base doping and width on the J-V characteristics of the n+-n-p+ structure
|
|
|
1972 |
11 |
5 |
p. 421- 1 p. |
artikel |
43 |
Electromigration in thin silver, copper, gold, indium, tin, lead and magnesium films
|
|
|
1972 |
11 |
5 |
p. 412- 1 p. |
artikel |
44 |
Enhancement of breakdown properties of overlay annular diodes by field shaping resistive films
|
|
|
1972 |
11 |
5 |
p. 412- 1 p. |
artikel |
45 |
Factory cleanliness for the manufacture of microelectronic devices
|
|
|
1972 |
11 |
5 |
p. 416- 1 p. |
artikel |
46 |
Failure mode control in plastic ICs
|
|
|
1972 |
11 |
5 |
p. 412- 1 p. |
artikel |
47 |
Failure modes, effects and criticality analyses
|
|
|
1972 |
11 |
5 |
p. 413-414 2 p. |
artikel |
48 |
Focus on CMOS
|
|
|
1972 |
11 |
5 |
p. 417- 1 p. |
artikel |
49 |
Functional digital ICs: devices to delight the systems man
|
|
|
1972 |
11 |
5 |
p. 418- 1 p. |
artikel |
50 |
Functional trimming gains economics for hybrid ICs
|
|
|
1972 |
11 |
5 |
p. 422- 1 p. |
artikel |
51 |
Gas incorporation in sputtered and evaporated gold films
|
|
|
1972 |
11 |
5 |
p. 421-422 2 p. |
artikel |
52 |
Hall effect of hot electrons in silicon
|
|
|
1972 |
11 |
5 |
p. 419-420 2 p. |
artikel |
53 |
High-frequency measurement of integrated circuit components
|
|
|
1972 |
11 |
5 |
p. 418- 1 p. |
artikel |
54 |
High negative bias sputtering: a revolution for thick films?
|
|
|
1972 |
11 |
5 |
p. 422- 1 p. |
artikel |
55 |
IC monostables can be economical
|
|
|
1972 |
11 |
5 |
p. 417- 1 p. |
artikel |
56 |
IC op amps simplify regulator design
|
|
|
1972 |
11 |
5 |
p. 418- 1 p. |
artikel |
57 |
Implanted depletion loads boost MOS array performance
|
|
|
1972 |
11 |
5 |
p. 416- 1 p. |
artikel |
58 |
Integrated arrays offer many advantages in o.c.r. systems
|
|
|
1972 |
11 |
5 |
p. 417- 1 p. |
artikel |
59 |
Interface states in Si-SiO2 interfaces
|
|
|
1972 |
11 |
5 |
p. 419- 1 p. |
artikel |
60 |
Ion impact sputtering for etching and micro-machining
|
|
|
1972 |
11 |
5 |
p. 418- 1 p. |
artikel |
61 |
IOTA, a new computer controlled thin-film thick-ness measurement tool
|
|
|
1972 |
11 |
5 |
p. 422- 1 p. |
artikel |
62 |
Is there a reliable screen for VHF power transistors?
|
|
|
1972 |
11 |
5 |
p. 411- 1 p. |
artikel |
63 |
Low-level currents in insulated gate field effect transistors
|
|
|
1972 |
11 |
5 |
p. 419- 1 p. |
artikel |
64 |
Low-power digital phase locked loop utilizes CMOS logic
|
|
|
1972 |
11 |
5 |
p. 418- 1 p. |
artikel |
65 |
Measuring reliability
|
|
|
1972 |
11 |
5 |
p. 409- 1 p. |
artikel |
66 |
Mechanical connectors for aluminium cables in investigation of degradation mechanisms in connector clamps and bolted terminations
|
|
|
1972 |
11 |
5 |
p. 411- 1 p. |
artikel |
67 |
MIL-STD-721 B Definitions of effectiveness terms for reliability, maintainability, human factors, and safety
|
|
|
1972 |
11 |
5 |
p. 429-433 5 p. |
artikel |
68 |
Minority carrier lifetime in highly doped Ge
|
|
|
1972 |
11 |
5 |
p. 419- 1 p. |
artikel |
69 |
MOS/LSI reliability prediction
|
|
|
1972 |
11 |
5 |
p. 411- 1 p. |
artikel |
70 |
NASA program decisions using reliability analysis
|
|
|
1972 |
11 |
5 |
p. 409-410 2 p. |
artikel |
71 |
Negative differential conductivity and current oscillations in lightly doped n-type silicon
|
|
|
1972 |
11 |
5 |
p. 419- 1 p. |
artikel |
72 |
New growth: silicon on sapphire
|
|
|
1972 |
11 |
5 |
p. 420- 1 p. |
artikel |
73 |
On analysing transitional processes in digital circuits by means of probability functions
|
|
|
1972 |
11 |
5 |
p. 415- 1 p. |
artikel |
74 |
On reliability prediction by pattern classification
|
|
|
1972 |
11 |
5 |
p. 414- 1 p. |
artikel |
75 |
Packaging with integrated circuits
|
|
|
1972 |
11 |
5 |
p. 416- 1 p. |
artikel |
76 |
Papers to be published in future issues
|
|
|
1972 |
11 |
5 |
p. 424- 1 p. |
artikel |
77 |
Penetrate the mystique of MOS specifications
|
|
|
1972 |
11 |
5 |
p. 414-415 2 p. |
artikel |
78 |
Planning optimum maintainability demonstrations
|
|
|
1972 |
11 |
5 |
p. 414- 1 p. |
artikel |
79 |
Potential distributions in surface p-n junctions
|
|
|
1972 |
11 |
5 |
p. 418-419 2 p. |
artikel |
80 |
Probleme schneller integrierter Schaltungen
|
|
|
1972 |
11 |
5 |
p. 416- 1 p. |
artikel |
81 |
Problems of large-scale integration (Part 1)
|
|
|
1972 |
11 |
5 |
p. 416- 1 p. |
artikel |
82 |
Producing prototype thin-film hybrids
|
|
|
1972 |
11 |
5 |
p. 422- 1 p. |
artikel |
83 |
Properties of hafnium dioxide thin-film capacitors
|
|
|
1972 |
11 |
5 |
p. 421- 1 p. |
artikel |
84 |
Pumping speed of cryosorption pumps in the pressure 10−6 to 10−3 torr
|
|
|
1972 |
11 |
5 |
p. 422- 1 p. |
artikel |
85 |
Rapid photomask measurement using video scanning time intervals
|
|
|
1972 |
11 |
5 |
p. 416- 1 p. |
artikel |
86 |
Recombination dependent characteristics of silicon p+-n-n+ epitaxial diodes
|
|
|
1972 |
11 |
5 |
p. 420- 1 p. |
artikel |
87 |
Reed switch circuit hazards and their mitigation
|
|
|
1972 |
11 |
5 |
p. 411- 1 p. |
artikel |
88 |
Relationship of MOS circuit properties to LSI testing
|
|
|
1972 |
11 |
5 |
p. 414- 1 p. |
artikel |
89 |
Reliability and ESP
|
|
|
1972 |
11 |
5 |
p. 410- 1 p. |
artikel |
90 |
Reliability definitions
|
Reiche, H. |
|
1972 |
11 |
5 |
p. 425-427 3 p. |
artikel |
91 |
Reliability definitions
|
Dummer, G.W.A. |
|
1972 |
11 |
5 |
p. 399- 1 p. |
artikel |
92 |
Reliability measurements for third-generation computer systems
|
|
|
1972 |
11 |
5 |
p. 413- 1 p. |
artikel |
93 |
Reliability of ceramic capacitors
|
|
|
1972 |
11 |
5 |
p. 411- 1 p. |
artikel |
94 |
Reliability terms and definitions based on the conceptual relationship between reliability and quality
|
Brewer, R. |
|
1972 |
11 |
5 |
p. 435-461 27 p. |
artikel |
95 |
Reliability test of MOS/LSI-memory for the improvement of the fabrication techniques
|
|
|
1972 |
11 |
5 |
p. 413- 1 p. |
artikel |
96 |
Reliable interconnections for Army avionics
|
|
|
1972 |
11 |
5 |
p. 412- 1 p. |
artikel |
97 |
Rheology of pastes in thick-film printing
|
|
|
1972 |
11 |
5 |
p. 422- 1 p. |
artikel |
98 |
SAMNOS technology
|
|
|
1972 |
11 |
5 |
p. 417- 1 p. |
artikel |
99 |
Semiconductors, characterization: kinetics of one energy-level recombination centers and surface states
|
|
|
1972 |
11 |
5 |
p. 421- 1 p. |
artikel |
100 |
Semiconductor surface contamination investigated by radioactive tracer techniques, Part I
|
|
|
1972 |
11 |
5 |
p. 411- 1 p. |
artikel |
101 |
Silicon-on-sapphire: a technology comes of age
|
|
|
1972 |
11 |
5 |
p. 419- 1 p. |
artikel |
102 |
Specific contact resistance of ohmic contacts to gallium arsenide
|
|
|
1972 |
11 |
5 |
p. 420- 1 p. |
artikel |
103 |
Stable germanium dioxide films on germanium
|
|
|
1972 |
11 |
5 |
p. 419- 1 p. |
artikel |
104 |
Standard parts and custom design merge in four-chip processor kit
|
|
|
1972 |
11 |
5 |
p. 416- 1 p. |
artikel |
105 |
Super-integrated memory shares functions on diffused islands
|
|
|
1972 |
11 |
5 |
p. 415- 1 p. |
artikel |
106 |
System considerations in dynamic MOS RAM's
|
|
|
1972 |
11 |
5 |
p. 418- 1 p. |
artikel |
107 |
Tantalum-glass cermet thin-film resistors
|
|
|
1972 |
11 |
5 |
p. 422- 1 p. |
artikel |
108 |
Test cost minimization for reliability assessment
|
|
|
1972 |
11 |
5 |
p. 410-411 2 p. |
artikel |
109 |
Testing in electronics
|
G.W.A.D., |
|
1972 |
11 |
5 |
p. 423- 1 p. |
artikel |
110 |
The combination of silicon nitride and aluminum anodization for semiconductor device passivation
|
|
|
1972 |
11 |
5 |
p. 417- 1 p. |
artikel |
111 |
The design of interactive graphic aids to mask layout
|
|
|
1972 |
11 |
5 |
p. 415- 1 p. |
artikel |
112 |
The dielectric constant and plasma frequency of p-type Ge-like semiconductors
|
|
|
1972 |
11 |
5 |
p. 420- 1 p. |
artikel |
113 |
The influence of phase boundary reactions on the diffusion during double conversions in solid state
|
|
|
1972 |
11 |
5 |
p. 420-421 2 p. |
artikel |
114 |
The operation and performance of an r.f. diode sputtering system in relation to its use as a research facility
|
|
|
1972 |
11 |
5 |
p. 421- 1 p. |
artikel |
115 |
The reliability engineer and the interactive terminal
|
|
|
1972 |
11 |
5 |
p. 413- 1 p. |
artikel |
116 |
Thermal cycling ratings of power transistors
|
|
|
1972 |
11 |
5 |
p. 411-412 2 p. |
artikel |
117 |
The TTL circuits D120C and D140C
|
|
|
1972 |
11 |
5 |
p. 417- 1 p. |
artikel |
118 |
Weibull, Bayes and Entropy
|
|
|
1972 |
11 |
5 |
p. 410- 1 p. |
artikel |