| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A computerized approach to simulating system effectiveness
|
|
|
1972
|
11 |
2 |
p. 114-
1 p.
|
artikel
|
| 2 |
Active circuit trimming with abrasives
|
|
|
1972
|
11 |
2 |
p. 117-
1 p.
|
artikel
|
| 3 |
Adjusting of tantalum thin-film resistors
|
|
|
1972
|
11 |
2 |
p. 123-
1 p.
|
artikel
|
| 4 |
A major step in power hybrids
|
|
|
1972
|
11 |
2 |
p. 118-
1 p.
|
artikel
|
| 5 |
An experimental verification of the electrostatic field gradient theory for diffused semiconductors
|
|
|
1972
|
11 |
2 |
p. 120-
1 p.
|
artikel
|
| 6 |
An IC form, Hall-effect devices can take on many new applications
|
|
|
1972
|
11 |
2 |
p. 119-
1 p.
|
artikel
|
| 7 |
An investigation of lateral diffusion in silicon
|
|
|
1972
|
11 |
2 |
p. 119-
1 p.
|
artikel
|
| 8 |
Anomalous forward characteristics of a metal-thin epitaxial silicon junction
|
|
|
1972
|
11 |
2 |
p. 122-
1 p.
|
artikel
|
| 9 |
Another self-aligning MOS process has interconnecting advantages
|
|
|
1972
|
11 |
2 |
p. 118-
1 p.
|
artikel
|
| 10 |
A potentiometer network module
|
|
|
1972
|
11 |
2 |
p. 122-
1 p.
|
artikel
|
| 11 |
A reliability report on low power TTL integrated circuits
|
Adams, J.D.
|
|
1972
|
11 |
2 |
p. 171-175
5 p.
|
artikel
|
| 12 |
A review of plastic packaging for hybrid thick-film circuits
|
|
|
1972
|
11 |
2 |
p. 117-118
2 p.
|
artikel
|
| 13 |
A system designer's lament: give us better digital ICs
|
|
|
1972
|
11 |
2 |
p. 116-
1 p.
|
artikel
|
| 14 |
A thin-film transistor with an interlayer at the semiconductor-insulator interface
|
|
|
1972
|
11 |
2 |
p. 123-
1 p.
|
artikel
|
| 15 |
Availability of priority standby redundant systems
|
|
|
1972
|
11 |
2 |
p. 116-
1 p.
|
artikel
|
| 16 |
A versatile system for controlled electron-beam deposition of thin films
|
|
|
1972
|
11 |
2 |
p. 125-
1 p.
|
artikel
|
| 17 |
Bayesian confidence limits for the reliability of mixed exponential and distribution-free cascade subsystems
|
|
|
1972
|
11 |
2 |
p. 111-
1 p.
|
artikel
|
| 18 |
Beam-lead and wire thermocompression bonding
|
|
|
1972
|
11 |
2 |
p. 117-
1 p.
|
artikel
|
| 19 |
Beam lead bonding to thick-film conductors
|
|
|
1972
|
11 |
2 |
p. 123-
1 p.
|
artikel
|
| 20 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1972
|
11 |
2 |
p. 99-101
3 p.
|
artikel
|
| 21 |
Calls for papers
|
|
|
1972
|
11 |
2 |
p. 107-109
3 p.
|
artikel
|
| 22 |
C/MOS unites with silicon gate to yield micropower technology
|
|
|
1972
|
11 |
2 |
p. 118-
1 p.
|
artikel
|
| 23 |
Consequence of microcrystallite model for some amorphous elemental semiconductors
|
|
|
1972
|
11 |
2 |
p. 121-
1 p.
|
artikel
|
| 24 |
Control MOS/LSI yield by design
|
|
|
1972
|
11 |
2 |
p. 118-
1 p.
|
artikel
|
| 25 |
Courses in microelectronics and reliability
|
|
|
1972
|
11 |
2 |
p. 105-106
2 p.
|
artikel
|
| 26 |
Current transport in metal-semiconductor-metal (MSM) structures
|
|
|
1972
|
11 |
2 |
p. 121-
1 p.
|
artikel
|
| 27 |
Decrease of FET threshold voltage due to boron depletion during thermal oxidation
|
|
|
1972
|
11 |
2 |
p. 120-
1 p.
|
artikel
|
| 28 |
Design of adaptive procedures for fault detection and isolation
|
|
|
1972
|
11 |
2 |
p. 115-
1 p.
|
artikel
|
| 29 |
Discrete renewal processes
|
|
|
1972
|
11 |
2 |
p. 115-
1 p.
|
artikel
|
| 30 |
Dynamic testing of integrated circuits
|
|
|
1972
|
11 |
2 |
p. 116-
1 p.
|
artikel
|
| 31 |
Effects of nuclear radiation on a high-reliability silicon power diode three-junction capacitance
|
|
|
1972
|
11 |
2 |
p. 121-
1 p.
|
artikel
|
| 32 |
Effects of process variables on thick-film resistors
|
|
|
1972
|
11 |
2 |
p. 122-
1 p.
|
artikel
|
| 33 |
Electron microprobe analysis of HgTe thin films
|
|
|
1972
|
11 |
2 |
p. 122-
1 p.
|
artikel
|
| 34 |
Error data logger
|
|
|
1972
|
11 |
2 |
p. 114-
1 p.
|
artikel
|
| 35 |
Evaluation of conditional failure density from hazard rate
|
|
|
1972
|
11 |
2 |
p. 115-
1 p.
|
artikel
|
| 36 |
Excess surface currents in p-n junctions and bipolar transistors
|
|
|
1972
|
11 |
2 |
p. 120-
1 p.
|
artikel
|
| 37 |
Failure analysis of memory organization for utilization in a self-repair memory system
|
|
|
1972
|
11 |
2 |
p. 114-115
2 p.
|
artikel
|
| 38 |
Fault isolation computer methods
|
|
|
1972
|
11 |
2 |
p. 115-
1 p.
|
artikel
|
| 39 |
Flatness and surface roughness of some common film substrate materials
|
|
|
1972
|
11 |
2 |
p. 122-123
2 p.
|
artikel
|
| 40 |
Flip-chip solder terminals
|
|
|
1972
|
11 |
2 |
p. 117-
1 p.
|
artikel
|
| 41 |
FRAM Failure rate appraisal machine An outline of its concept and application
|
Murphy, C.S.
|
|
1972
|
11 |
2 |
p. 185-188
4 p.
|
artikel
|
| 42 |
GaAs junction field-effect transistor radiation study
|
|
|
1972
|
11 |
2 |
p. 121-122
2 p.
|
artikel
|
| 43 |
Generalized reliability function for systems of arbitrary configurations
|
|
|
1972
|
11 |
2 |
p. 114-
1 p.
|
artikel
|
| 44 |
Good masks, good yields
|
|
|
1972
|
11 |
2 |
p. 117-
1 p.
|
artikel
|
| 45 |
High current transient induced junction shorts
|
|
|
1972
|
11 |
2 |
p. 112-
1 p.
|
artikel
|
| 46 |
Highly reliable computing systems
|
|
|
1972
|
11 |
2 |
p. 115-
1 p.
|
artikel
|
| 47 |
High stability co-sputtered Ta-50 at. % Al alloy film resistors
|
|
|
1972
|
11 |
2 |
p. 123-124
2 p.
|
artikel
|
| 48 |
How small is small?
|
|
|
1972
|
11 |
2 |
p. 116-
1 p.
|
artikel
|
| 49 |
ICs can simplify conversion between binary and b.c.d.
|
|
|
1972
|
11 |
2 |
p. 118-
1 p.
|
artikel
|
| 50 |
In-house microelectronics—fostering a delicate fledgling
|
|
|
1972
|
11 |
2 |
p. 116-
1 p.
|
artikel
|
| 51 |
Integrated high-speed logic circuits in NEC
|
|
|
1972
|
11 |
2 |
p. 119-
1 p.
|
artikel
|
| 52 |
Integrierte Schaltungen für electronische uhren
|
|
|
1972
|
11 |
2 |
p. 119-
1 p.
|
artikel
|
| 53 |
Interconnections with gold beam leads
|
|
|
1972
|
11 |
2 |
p. 122-
1 p.
|
artikel
|
| 54 |
Interpretation of surface and bulk effects using the pulsed MIS capacitor
|
|
|
1972
|
11 |
2 |
p. 119-
1 p.
|
artikel
|
| 55 |
Investigation of the possibility of laser beam micromachining of semiconductors and metals
|
|
|
1972
|
11 |
2 |
p. 125-
1 p.
|
artikel
|
| 56 |
Irradiation defects and the electrical quality of ion implanted silicon
|
|
|
1972
|
11 |
2 |
p. 124-
1 p.
|
artikel
|
| 57 |
Laser trimming of thick-film resistors
|
|
|
1972
|
11 |
2 |
p. 124-125
2 p.
|
artikel
|
| 58 |
Letter to the editor
|
Boswell, D.
|
|
1972
|
11 |
2 |
p. 97-
1 p.
|
artikel
|
| 59 |
Linear estimation of the parameters of the extreme-value distribution based on suitably chosen order statistics
|
|
|
1972
|
11 |
2 |
p. 111-112
2 p.
|
artikel
|
| 60 |
Liquid cooling of microelectronic devices by free and forced convection
|
Baker, E.
|
|
1972
|
11 |
2 |
p. 213-222
10 p.
|
artikel
|
| 61 |
Literature survey of some surface and subsurface processes affecting materials in thermionic diodes
|
|
|
1972
|
11 |
2 |
p. 113-
1 p.
|
artikel
|
| 62 |
Low density tantalum thin-film capacitors with an aluminum underlay
|
|
|
1972
|
11 |
2 |
p. 123-
1 p.
|
artikel
|
| 63 |
Lumped approximation to distributed RC notch networks for linear integrated circuits
|
Bozic, S.M.
|
|
1972
|
11 |
2 |
p. 191-199
9 p.
|
artikel
|
| 64 |
Magnetic handling of beam lead integrated circuits
|
|
|
1972
|
11 |
2 |
p. 118-
1 p.
|
artikel
|
| 65 |
Maintainability application to system effectiveness quantification
|
|
|
1972
|
11 |
2 |
p. 115-
1 p.
|
artikel
|
| 66 |
Mathematical models: uses and limitations
|
|
|
1972
|
11 |
2 |
p. 111-
1 p.
|
artikel
|
| 67 |
Mean times of interest in Markovian systems
|
|
|
1972
|
11 |
2 |
p. 111-
1 p.
|
artikel
|
| 68 |
Measurement of charge carrier mobility in inhomogeneous semiconductor
|
|
|
1972
|
11 |
2 |
p. 120-
1 p.
|
artikel
|
| 69 |
Measurements on high frequency transmission characteristic of metallization patterns in monolithic ICs
|
|
|
1972
|
11 |
2 |
p. 120-
1 p.
|
artikel
|
| 70 |
Method of characterizing gallium arsenide crystals
|
|
|
1972
|
11 |
2 |
p. 113-
1 p.
|
artikel
|
| 71 |
Microélectronique Analogique
|
G.W.A.D,
|
|
1972
|
11 |
2 |
p. 127-
1 p.
|
artikel
|
| 72 |
Microwave lines and elements in stripline technique
|
|
|
1972
|
11 |
2 |
p. 117-
1 p.
|
artikel
|
| 73 |
Minimizing life test costs
|
|
|
1972
|
11 |
2 |
p. 111-
1 p.
|
artikel
|
| 74 |
Mixing of two renewal processes and its applications to reliability theory
|
|
|
1972
|
11 |
2 |
p. 114-
1 p.
|
artikel
|
| 75 |
Monolithic level shifter lets MOS, TTL share same network
|
|
|
1972
|
11 |
2 |
p. 119-
1 p.
|
artikel
|
| 76 |
Monte Carlo simulation of the nucleation of thin films
|
|
|
1972
|
11 |
2 |
p. 123-
1 p.
|
artikel
|
| 77 |
Mössbauer effect and lattice parameter for silicon doped with antimony
|
|
|
1972
|
11 |
2 |
p. 120-
1 p.
|
artikel
|
| 78 |
New aspects of failure mechanism in germanium tunnel diodes
|
|
|
1972
|
11 |
2 |
p. 113-
1 p.
|
artikel
|
| 79 |
New test target helps microphotographers find limits of photographic systems
|
|
|
1972
|
11 |
2 |
p. 118-
1 p.
|
artikel
|
| 80 |
Non-equilibrium effects of metal-oxide-semiconductor tunnel currents
|
|
|
1972
|
11 |
2 |
p. 121-
1 p.
|
artikel
|
| 81 |
Notice
|
|
|
1972
|
11 |
2 |
p. 103-
1 p.
|
artikel
|
| 82 |
Optimal design for system reliability and maintainability
|
|
|
1972
|
11 |
2 |
p. 114-
1 p.
|
artikel
|
| 83 |
Optimum reliability route in communication net-works
|
Srivastava, S.S.
|
|
1972
|
11 |
2 |
p. 147-150
4 p.
|
artikel
|
| 84 |
Performance and reliability aspects of current trends in t.t.1
|
|
|
1972
|
11 |
2 |
p. 113-
1 p.
|
artikel
|
| 85 |
Probability of error considerations for certain M-ary block codes with bit-by-bit decisions
|
|
|
1972
|
11 |
2 |
p. 116-
1 p.
|
artikel
|
| 86 |
Problems of failure on various capacitors in operation field
|
|
|
1972
|
11 |
2 |
p. 112-
1 p.
|
artikel
|
| 87 |
Reliability and switching technique of integrated switching circuit with complementary MOSFET transistors
|
|
|
1972
|
11 |
2 |
p. 115-
1 p.
|
artikel
|
| 88 |
Reliability assessment Myths and misuse of statistics
|
Lukis, L.W.F.
|
|
1972
|
11 |
2 |
p. 177-184
8 p.
|
artikel
|
| 89 |
Reliability considerations in design trade studies
|
|
|
1972
|
11 |
2 |
p. 115-
1 p.
|
artikel
|
| 90 |
Reliability modeling Tool of the system analyst
|
Malec, H.A.
|
|
1972
|
11 |
2 |
p. 159-169
11 p.
|
artikel
|
| 91 |
Reliability of special redundant systems considering exchange time and repair time
|
|
|
1972
|
11 |
2 |
p. 115-116
2 p.
|
artikel
|
| 92 |
Resistivity measurements on germanium crystals by the spreading resistance technique
|
|
|
1972
|
11 |
2 |
p. 119-120
2 p.
|
artikel
|
| 93 |
Results of a computer prediction of after-radiation reliability
|
|
|
1972
|
11 |
2 |
p. 112-
1 p.
|
artikel
|
| 94 |
Review of electronic techniques Radio components Reliability of thin-film resistors
|
Malinin, V.V.
|
|
1972
|
11 |
2 |
p. 201-212
12 p.
|
artikel
|
| 95 |
RF sputtering of zinc sulphide
|
|
|
1972
|
11 |
2 |
p. 121-
1 p.
|
artikel
|
| 96 |
Safety—intrinsic or invulnerable?
|
|
|
1972
|
11 |
2 |
p. 112-
1 p.
|
artikel
|
| 97 |
Setting up a cost-effective screening program for ICs
|
|
|
1972
|
11 |
2 |
p. 112-113
2 p.
|
artikel
|
| 98 |
Solder-circuitry separation problems associated with plated printed circuit boards
|
|
|
1972
|
11 |
2 |
p. 113-
1 p.
|
artikel
|
| 99 |
Some problems of the theory of forward biased p-n junction
|
|
|
1972
|
11 |
2 |
p. 120-121
2 p.
|
artikel
|
| 100 |
Space-charge recombination in a forward-biased diffused p-n junction
|
|
|
1972
|
11 |
2 |
p. 121-
1 p.
|
artikel
|
| 101 |
Speech coder as a special integrated circuit
|
|
|
1972
|
11 |
2 |
p. 119-
1 p.
|
artikel
|
| 102 |
Stresses and strains in a plate bonded to a substrate: semiconductor devices
|
|
|
1972
|
11 |
2 |
p. 118-
1 p.
|
artikel
|
| 103 |
Study of the validity of electronic parts stress models
|
|
|
1972
|
11 |
2 |
p. 113-
1 p.
|
artikel
|
| 104 |
Tantalum thin-film circuits for space flight applications
|
|
|
1972
|
11 |
2 |
p. 124-
1 p.
|
artikel
|
| 105 |
The A-6 channel bank: putting new technologies to work
|
|
|
1972
|
11 |
2 |
p. 118-119
2 p.
|
artikel
|
| 106 |
The computation of yield and drift reliability of electronic circuits
|
Jensen, F.
|
|
1972
|
11 |
2 |
p. 139-145
7 p.
|
artikel
|
| 107 |
The correlation method for computer-aided statistical analysis
|
|
|
1972
|
11 |
2 |
p. 112-
1 p.
|
artikel
|
| 108 |
The effectivity of screening hybrid microcircuits per MIL-STD-883
|
|
|
1972
|
11 |
2 |
p. 117-
1 p.
|
artikel
|
| 109 |
The effect of the substrate on MOST and MOS-IC: mainly on the DC characteristics
|
|
|
1972
|
11 |
2 |
p. 117-
1 p.
|
artikel
|
| 110 |
The failure physics approach to IC reliability
|
Farrow, R.H.
|
|
1972
|
11 |
2 |
p. 151-157
7 p.
|
artikel
|
| 111 |
The package-lead interface in hybrid arrays
|
|
|
1972
|
11 |
2 |
p. 124-
1 p.
|
artikel
|
| 112 |
The quality assurance of semiconductor devices
|
Durso, J.
|
|
1972
|
11 |
2 |
p. 129-137
9 p.
|
artikel
|
| 113 |
Thick-film filter for television signals
|
|
|
1972
|
11 |
2 |
p. 122-
1 p.
|
artikel
|
| 114 |
Thin-film thermistors
|
|
|
1972
|
11 |
2 |
p. 124-
1 p.
|
artikel
|
| 115 |
Three-dimensional planar Coax packaging for microelectronic computer systems
|
|
|
1972
|
11 |
2 |
p. 116-
1 p.
|
artikel
|
| 116 |
What price reliability?
|
|
|
1972
|
11 |
2 |
p. 112-
1 p.
|
artikel
|
| 117 |
Will MOS stimulate a new computer generation?
|
|
|
1972
|
11 |
2 |
p. 116-
1 p.
|
artikel
|
| 118 |
Wire-bond electrical connections: Testing, fabrication and degradation. A bibliography 1957–1971
|
G.W.A.D.,
|
|
1972
|
11 |
2 |
p. 127-
1 p.
|
artikel
|
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