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                             118 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A computerized approach to simulating system effectiveness 1972
11 2 p. 114-
1 p.
artikel
2 Active circuit trimming with abrasives 1972
11 2 p. 117-
1 p.
artikel
3 Adjusting of tantalum thin-film resistors 1972
11 2 p. 123-
1 p.
artikel
4 A major step in power hybrids 1972
11 2 p. 118-
1 p.
artikel
5 An experimental verification of the electrostatic field gradient theory for diffused semiconductors 1972
11 2 p. 120-
1 p.
artikel
6 An IC form, Hall-effect devices can take on many new applications 1972
11 2 p. 119-
1 p.
artikel
7 An investigation of lateral diffusion in silicon 1972
11 2 p. 119-
1 p.
artikel
8 Anomalous forward characteristics of a metal-thin epitaxial silicon junction 1972
11 2 p. 122-
1 p.
artikel
9 Another self-aligning MOS process has interconnecting advantages 1972
11 2 p. 118-
1 p.
artikel
10 A potentiometer network module 1972
11 2 p. 122-
1 p.
artikel
11 A reliability report on low power TTL integrated circuits Adams, J.D.
1972
11 2 p. 171-175
5 p.
artikel
12 A review of plastic packaging for hybrid thick-film circuits 1972
11 2 p. 117-118
2 p.
artikel
13 A system designer's lament: give us better digital ICs 1972
11 2 p. 116-
1 p.
artikel
14 A thin-film transistor with an interlayer at the semiconductor-insulator interface 1972
11 2 p. 123-
1 p.
artikel
15 Availability of priority standby redundant systems 1972
11 2 p. 116-
1 p.
artikel
16 A versatile system for controlled electron-beam deposition of thin films 1972
11 2 p. 125-
1 p.
artikel
17 Bayesian confidence limits for the reliability of mixed exponential and distribution-free cascade subsystems 1972
11 2 p. 111-
1 p.
artikel
18 Beam-lead and wire thermocompression bonding 1972
11 2 p. 117-
1 p.
artikel
19 Beam lead bonding to thick-film conductors 1972
11 2 p. 123-
1 p.
artikel
20 Calendar of international conferences, symposia, lectures and meetings of interest 1972
11 2 p. 99-101
3 p.
artikel
21 Calls for papers 1972
11 2 p. 107-109
3 p.
artikel
22 C/MOS unites with silicon gate to yield micropower technology 1972
11 2 p. 118-
1 p.
artikel
23 Consequence of microcrystallite model for some amorphous elemental semiconductors 1972
11 2 p. 121-
1 p.
artikel
24 Control MOS/LSI yield by design 1972
11 2 p. 118-
1 p.
artikel
25 Courses in microelectronics and reliability 1972
11 2 p. 105-106
2 p.
artikel
26 Current transport in metal-semiconductor-metal (MSM) structures 1972
11 2 p. 121-
1 p.
artikel
27 Decrease of FET threshold voltage due to boron depletion during thermal oxidation 1972
11 2 p. 120-
1 p.
artikel
28 Design of adaptive procedures for fault detection and isolation 1972
11 2 p. 115-
1 p.
artikel
29 Discrete renewal processes 1972
11 2 p. 115-
1 p.
artikel
30 Dynamic testing of integrated circuits 1972
11 2 p. 116-
1 p.
artikel
31 Effects of nuclear radiation on a high-reliability silicon power diode three-junction capacitance 1972
11 2 p. 121-
1 p.
artikel
32 Effects of process variables on thick-film resistors 1972
11 2 p. 122-
1 p.
artikel
33 Electron microprobe analysis of HgTe thin films 1972
11 2 p. 122-
1 p.
artikel
34 Error data logger 1972
11 2 p. 114-
1 p.
artikel
35 Evaluation of conditional failure density from hazard rate 1972
11 2 p. 115-
1 p.
artikel
36 Excess surface currents in p-n junctions and bipolar transistors 1972
11 2 p. 120-
1 p.
artikel
37 Failure analysis of memory organization for utilization in a self-repair memory system 1972
11 2 p. 114-115
2 p.
artikel
38 Fault isolation computer methods 1972
11 2 p. 115-
1 p.
artikel
39 Flatness and surface roughness of some common film substrate materials 1972
11 2 p. 122-123
2 p.
artikel
40 Flip-chip solder terminals 1972
11 2 p. 117-
1 p.
artikel
41 FRAM Failure rate appraisal machine An outline of its concept and application Murphy, C.S.
1972
11 2 p. 185-188
4 p.
artikel
42 GaAs junction field-effect transistor radiation study 1972
11 2 p. 121-122
2 p.
artikel
43 Generalized reliability function for systems of arbitrary configurations 1972
11 2 p. 114-
1 p.
artikel
44 Good masks, good yields 1972
11 2 p. 117-
1 p.
artikel
45 High current transient induced junction shorts 1972
11 2 p. 112-
1 p.
artikel
46 Highly reliable computing systems 1972
11 2 p. 115-
1 p.
artikel
47 High stability co-sputtered Ta-50 at. % Al alloy film resistors 1972
11 2 p. 123-124
2 p.
artikel
48 How small is small? 1972
11 2 p. 116-
1 p.
artikel
49 ICs can simplify conversion between binary and b.c.d. 1972
11 2 p. 118-
1 p.
artikel
50 In-house microelectronics—fostering a delicate fledgling 1972
11 2 p. 116-
1 p.
artikel
51 Integrated high-speed logic circuits in NEC 1972
11 2 p. 119-
1 p.
artikel
52 Integrierte Schaltungen für electronische uhren 1972
11 2 p. 119-
1 p.
artikel
53 Interconnections with gold beam leads 1972
11 2 p. 122-
1 p.
artikel
54 Interpretation of surface and bulk effects using the pulsed MIS capacitor 1972
11 2 p. 119-
1 p.
artikel
55 Investigation of the possibility of laser beam micromachining of semiconductors and metals 1972
11 2 p. 125-
1 p.
artikel
56 Irradiation defects and the electrical quality of ion implanted silicon 1972
11 2 p. 124-
1 p.
artikel
57 Laser trimming of thick-film resistors 1972
11 2 p. 124-125
2 p.
artikel
58 Letter to the editor Boswell, D.
1972
11 2 p. 97-
1 p.
artikel
59 Linear estimation of the parameters of the extreme-value distribution based on suitably chosen order statistics 1972
11 2 p. 111-112
2 p.
artikel
60 Liquid cooling of microelectronic devices by free and forced convection Baker, E.
1972
11 2 p. 213-222
10 p.
artikel
61 Literature survey of some surface and subsurface processes affecting materials in thermionic diodes 1972
11 2 p. 113-
1 p.
artikel
62 Low density tantalum thin-film capacitors with an aluminum underlay 1972
11 2 p. 123-
1 p.
artikel
63 Lumped approximation to distributed RC notch networks for linear integrated circuits Bozic, S.M.
1972
11 2 p. 191-199
9 p.
artikel
64 Magnetic handling of beam lead integrated circuits 1972
11 2 p. 118-
1 p.
artikel
65 Maintainability application to system effectiveness quantification 1972
11 2 p. 115-
1 p.
artikel
66 Mathematical models: uses and limitations 1972
11 2 p. 111-
1 p.
artikel
67 Mean times of interest in Markovian systems 1972
11 2 p. 111-
1 p.
artikel
68 Measurement of charge carrier mobility in inhomogeneous semiconductor 1972
11 2 p. 120-
1 p.
artikel
69 Measurements on high frequency transmission characteristic of metallization patterns in monolithic ICs 1972
11 2 p. 120-
1 p.
artikel
70 Method of characterizing gallium arsenide crystals 1972
11 2 p. 113-
1 p.
artikel
71 Microélectronique Analogique G.W.A.D,
1972
11 2 p. 127-
1 p.
artikel
72 Microwave lines and elements in stripline technique 1972
11 2 p. 117-
1 p.
artikel
73 Minimizing life test costs 1972
11 2 p. 111-
1 p.
artikel
74 Mixing of two renewal processes and its applications to reliability theory 1972
11 2 p. 114-
1 p.
artikel
75 Monolithic level shifter lets MOS, TTL share same network 1972
11 2 p. 119-
1 p.
artikel
76 Monte Carlo simulation of the nucleation of thin films 1972
11 2 p. 123-
1 p.
artikel
77 Mössbauer effect and lattice parameter for silicon doped with antimony 1972
11 2 p. 120-
1 p.
artikel
78 New aspects of failure mechanism in germanium tunnel diodes 1972
11 2 p. 113-
1 p.
artikel
79 New test target helps microphotographers find limits of photographic systems 1972
11 2 p. 118-
1 p.
artikel
80 Non-equilibrium effects of metal-oxide-semiconductor tunnel currents 1972
11 2 p. 121-
1 p.
artikel
81 Notice 1972
11 2 p. 103-
1 p.
artikel
82 Optimal design for system reliability and maintainability 1972
11 2 p. 114-
1 p.
artikel
83 Optimum reliability route in communication net-works Srivastava, S.S.
1972
11 2 p. 147-150
4 p.
artikel
84 Performance and reliability aspects of current trends in t.t.1 1972
11 2 p. 113-
1 p.
artikel
85 Probability of error considerations for certain M-ary block codes with bit-by-bit decisions 1972
11 2 p. 116-
1 p.
artikel
86 Problems of failure on various capacitors in operation field 1972
11 2 p. 112-
1 p.
artikel
87 Reliability and switching technique of integrated switching circuit with complementary MOSFET transistors 1972
11 2 p. 115-
1 p.
artikel
88 Reliability assessment Myths and misuse of statistics Lukis, L.W.F.
1972
11 2 p. 177-184
8 p.
artikel
89 Reliability considerations in design trade studies 1972
11 2 p. 115-
1 p.
artikel
90 Reliability modeling Tool of the system analyst Malec, H.A.
1972
11 2 p. 159-169
11 p.
artikel
91 Reliability of special redundant systems considering exchange time and repair time 1972
11 2 p. 115-116
2 p.
artikel
92 Resistivity measurements on germanium crystals by the spreading resistance technique 1972
11 2 p. 119-120
2 p.
artikel
93 Results of a computer prediction of after-radiation reliability 1972
11 2 p. 112-
1 p.
artikel
94 Review of electronic techniques Radio components Reliability of thin-film resistors Malinin, V.V.
1972
11 2 p. 201-212
12 p.
artikel
95 RF sputtering of zinc sulphide 1972
11 2 p. 121-
1 p.
artikel
96 Safety—intrinsic or invulnerable? 1972
11 2 p. 112-
1 p.
artikel
97 Setting up a cost-effective screening program for ICs 1972
11 2 p. 112-113
2 p.
artikel
98 Solder-circuitry separation problems associated with plated printed circuit boards 1972
11 2 p. 113-
1 p.
artikel
99 Some problems of the theory of forward biased p-n junction 1972
11 2 p. 120-121
2 p.
artikel
100 Space-charge recombination in a forward-biased diffused p-n junction 1972
11 2 p. 121-
1 p.
artikel
101 Speech coder as a special integrated circuit 1972
11 2 p. 119-
1 p.
artikel
102 Stresses and strains in a plate bonded to a substrate: semiconductor devices 1972
11 2 p. 118-
1 p.
artikel
103 Study of the validity of electronic parts stress models 1972
11 2 p. 113-
1 p.
artikel
104 Tantalum thin-film circuits for space flight applications 1972
11 2 p. 124-
1 p.
artikel
105 The A-6 channel bank: putting new technologies to work 1972
11 2 p. 118-119
2 p.
artikel
106 The computation of yield and drift reliability of electronic circuits Jensen, F.
1972
11 2 p. 139-145
7 p.
artikel
107 The correlation method for computer-aided statistical analysis 1972
11 2 p. 112-
1 p.
artikel
108 The effectivity of screening hybrid microcircuits per MIL-STD-883 1972
11 2 p. 117-
1 p.
artikel
109 The effect of the substrate on MOST and MOS-IC: mainly on the DC characteristics 1972
11 2 p. 117-
1 p.
artikel
110 The failure physics approach to IC reliability Farrow, R.H.
1972
11 2 p. 151-157
7 p.
artikel
111 The package-lead interface in hybrid arrays 1972
11 2 p. 124-
1 p.
artikel
112 The quality assurance of semiconductor devices Durso, J.
1972
11 2 p. 129-137
9 p.
artikel
113 Thick-film filter for television signals 1972
11 2 p. 122-
1 p.
artikel
114 Thin-film thermistors 1972
11 2 p. 124-
1 p.
artikel
115 Three-dimensional planar Coax packaging for microelectronic computer systems 1972
11 2 p. 116-
1 p.
artikel
116 What price reliability? 1972
11 2 p. 112-
1 p.
artikel
117 Will MOS stimulate a new computer generation? 1972
11 2 p. 116-
1 p.
artikel
118 Wire-bond electrical connections: Testing, fabrication and degradation. A bibliography 1957–1971 G.W.A.D.,
1972
11 2 p. 127-
1 p.
artikel
                             118 gevonden resultaten
 
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