| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
Aging renewal process characterizations of exponential distributions
|
Bhattacharjee, M.C.
|
|
1993
|
100-101 |
14 |
p. 2143-2147
5 p.
|
article
|
| 2 |
A two unit series system with correlated failures and repairs
|
Goel, L.R.
|
|
1993
|
100-101 |
14 |
p. 2165-2169
5 p.
|
article
|
| 3 |
Availability analysis of a two dissimilar-unit deteriorating standby system with inspection
|
Mokaddis, G.S.
|
|
1993
|
100-101 |
14 |
p. 2119-2141
23 p.
|
article
|
| 4 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1993
|
100-101 |
14 |
p. 2171-2174
4 p.
|
article
|
| 5 |
Hot-carrier effects in polysilicon emitter vertical PNP and NPN transistors
|
Sparks, D.R.
|
|
1993
|
100-101 |
14 |
p. 2087-2092
6 p.
|
article
|
| 6 |
Influence of the testing environment in bipolar transistors radiation resistance results: A benchmark exercise
|
Decréton, M.
|
|
1993
|
100-101 |
14 |
p. 2107-2117
11 p.
|
article
|
| 7 |
Modeling metastable states in ASIC
|
Wild, Andreas
|
|
1993
|
100-101 |
14 |
p. 2079-2086
8 p.
|
article
|
| 8 |
On stability of stochastic multiobjective programming problems with random coefficients in the objective functions
|
El-Banna, Abou-Zaid H.
|
|
1993
|
100-101 |
14 |
p. 2149-2151
3 p.
|
article
|
| 9 |
Publications, notices, calls for papers, etc.
|
|
|
1993
|
100-101 |
14 |
p. 2175-2177
3 p.
|
article
|
| 10 |
Reliability evaluation of flow networks considering multistate modelling of network elements
|
Patra, S.
|
|
1993
|
100-101 |
14 |
p. 2161-2164
4 p.
|
article
|
| 11 |
The yield models and defect density monitors for integrated circuit diagnosis
|
Nahar, R.K.
|
|
1993
|
100-101 |
14 |
p. 2153-2159
7 p.
|
article
|
| 12 |
Unreliable queuing with repeated orders
|
Aissani, A.
|
|
1993
|
100-101 |
14 |
p. 2093-2106
14 p.
|
article
|
Journal description