nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A bound dynamic programming for solving reliability redundancy optimization
|
Jianping, Li |
|
1996 |
100-101 |
10 |
p. 1515-1520 6 p. |
artikel |
2 |
Accurate negative bias temperature instability lifetime prediction based on hole injection
|
Teramoto, Akinobu |
|
2008 |
100-101 |
10 |
p. 1649-1654 6 p. |
artikel |
3 |
A finite range failure model
|
Siddiqui, S.A. |
|
1992 |
100-101 |
10 |
p. 1453-1457 5 p. |
artikel |
4 |
A general repairable system with N failure modes and k standby units
|
Chryssaphinou, O. |
|
1993 |
100-101 |
10 |
p. 1567-1572 6 p. |
artikel |
5 |
Analysis of a multiunit solar energy system model
|
Goel, L.R. |
|
1993 |
100-101 |
10 |
p. 1461-1465 5 p. |
artikel |
6 |
An economic discrete replacement policy for a shock damage model with minimal repairs
|
Lai, Min-Tsai |
|
1996 |
100-101 |
10 |
p. 1347-1355 9 p. |
artikel |
7 |
A new approach to evaluate two area interconnected power generating systems reliability
|
Azad, A.K. |
|
1996 |
100-101 |
10 |
p. 1589-1594 6 p. |
artikel |
8 |
An explanation of the dependence of the effective saturation velocity on gate voltage in sub-0.1μm metal–oxide–semiconductor transistors by quasi-ballistic transport theory
|
Lau, W.S. |
|
2008 |
100-101 |
10 |
p. 1641-1648 8 p. |
artikel |
9 |
An improved Boolean algebra method for computing the network reliability
|
Liu, H.H. |
|
1992 |
100-101 |
10 |
p. 1401-1419 19 p. |
artikel |
10 |
A note on determining component reliability and redundancy
|
Wong, Jsun Y. |
|
1993 |
100-101 |
10 |
p. 1553-1559 7 p. |
artikel |
11 |
A note on “using intuitionistic fuzzy sets for fault-tree analysis on printed circuit board assembly”
|
Li, Deng-Feng |
|
2008 |
100-101 |
10 |
p. 1741- 1 p. |
artikel |
12 |
A physical strength-stress interference model explaining infant and random mortalit
|
Blanchart, Jacques |
|
1996 |
100-101 |
10 |
p. 1379-1388 10 p. |
artikel |
13 |
A rapid smart approach for reliability and failure mode analysis of memories and large systems
|
Mehdi, K.A. |
|
1996 |
100-101 |
10 |
p. 1547-1556 10 p. |
artikel |
14 |
A recursive algorithm evaluating the exact reliability of a circular consecutive k-within-m-out-of-n:F system
|
Malinowski, Jacek |
|
1996 |
100-101 |
10 |
p. 1389-1394 6 p. |
artikel |
15 |
A reliability analysis of a k-out-of-N:G redundant system with the presence of chance common-cause shock failures
|
Who Kee Chung, |
|
1992 |
100-101 |
10 |
p. 1395-1399 5 p. |
artikel |
16 |
A simple method of in-process checking of the large area GTO homogeneity
|
Benda, V. |
|
1993 |
100-101 |
10 |
p. 1441-1445 5 p. |
artikel |
17 |
A simple spares model using Weibull theorems
|
Reiche, Hans |
|
1993 |
100-101 |
10 |
p. 1473-1475 3 p. |
artikel |
18 |
A study of failure of SMT solder joints under thermal cycles by statistics
|
Huang, J.H. |
|
1992 |
100-101 |
10 |
p. 1349-1352 4 p. |
artikel |
19 |
Attribute data reliability decay models
|
Nolander, J.L. |
|
1994 |
100-101 |
10 |
p. 1565-1596 32 p. |
artikel |
20 |
A two unit priority redundant system with three modes and correlated failures and repairs
|
Goel, L.R. |
|
1992 |
100-101 |
10 |
p. 1367-1372 6 p. |
artikel |
21 |
Availability of a man-machine system with critical and non-critical human error
|
Dhillon, B.S. |
|
1993 |
100-101 |
10 |
p. 1511-1521 11 p. |
artikel |
22 |
Bayesian estimation of a non-linear failure rate from censored samples type II
|
Salem, Samia A. |
|
1992 |
100-101 |
10 |
p. 1385-1388 4 p. |
artikel |
23 |
Bayesian prediction of the life times of the unused items for the Burr distributions with a random sample size
|
Ashour, S.K. |
|
1993 |
100-101 |
10 |
p. 1523-1532 10 p. |
artikel |
24 |
Bayesian reliability analysis for the MED
|
Bhattacharya, Samir K. |
|
1994 |
100-101 |
10 |
p. 1685-1687 3 p. |
artikel |
25 |
Book review
|
|
|
1998 |
100-101 |
10 |
p. 1645- 1 p. |
artikel |
26 |
Book review
|
|
|
1999 |
100-101 |
10 |
p. 1515-1516 2 p. |
artikel |
27 |
Book review
|
|
|
1999 |
100-101 |
10 |
p. 1513- 1 p. |
artikel |
28 |
Book review
|
|
|
1999 |
100-101 |
10 |
p. 1517-1518 2 p. |
artikel |
29 |
Book review
|
|
|
1999 |
100-101 |
10 |
p. 1511- 1 p. |
artikel |
30 |
Building in reliability with latch-up, ESD and hot carrier effects on 0.25 μm CMOS technology
|
Leroux, C |
|
1998 |
100-101 |
10 |
p. 1547-1552 6 p. |
artikel |
31 |
Calendar
|
|
|
2008 |
100-101 |
10 |
p. I-II nvt p. |
artikel |
32 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1994 |
100-101 |
10 |
p. 1701-1704 4 p. |
artikel |
33 |
Call for papers
|
|
|
1994 |
100-101 |
10 |
p. 1705- 1 p. |
artikel |
34 |
Characterization of defects in flexible circuits with ultrasonic atomic force microscopy
|
Nalladega, Vijayaraghava |
|
2008 |
100-101 |
10 |
p. 1683-1688 6 p. |
artikel |
35 |
Classifications of discrete lives
|
Roy, Dilip |
|
1992 |
100-101 |
10 |
p. 1459-1473 15 p. |
artikel |
36 |
Cold standby systems with imperfect and noninstantaneous switch-over mechanism
|
Gurov, Sergey V. |
|
1996 |
100-101 |
10 |
p. 1425-1438 14 p. |
artikel |
37 |
Common-cause failure analysis of a redundant system with non-repairable units
|
Dhillon, B.S. |
|
1993 |
100-101 |
10 |
p. 1499-1509 11 p. |
artikel |
38 |
Comparative study of the profit of a two server system including patience time and instruction time
|
Kumar, A. |
|
1996 |
100-101 |
10 |
p. 1595-1601 7 p. |
artikel |
39 |
Composite material behavior under applied electric field: material switches to a high-resistive state
|
Javadi, Hamid H.S. |
|
1996 |
100-101 |
10 |
p. 1499-1513 15 p. |
artikel |
40 |
Concurrent engineering and design for manufacture of electronic products
|
Catuneanu, V.M. |
|
1994 |
100-101 |
10 |
p. 1693- 1 p. |
artikel |
41 |
Confidence regions having different shapes for the failure distribution function
|
Arsham, H. |
|
1996 |
100-101 |
10 |
p. 1439-1457 19 p. |
artikel |
42 |
Contamination control and cleanrooms Problems, Engineering Solutions, and Applications
|
Elena, Radu Mihakla |
|
1993 |
100-101 |
10 |
p. 1631-1632 2 p. |
artikel |
43 |
Contamination effects on electronic products
|
G.W.A.D., |
|
1992 |
100-101 |
10 |
p. 1491- 1 p. |
artikel |
44 |
Cost-benefit analysis of a two-server, two-unit, warm standby system with different types of failure
|
Tuteja, R.K. |
|
1992 |
100-101 |
10 |
p. 1353-1359 7 p. |
artikel |
45 |
Decision modeling for thermal stress screening of commercial electronics
|
Landers, Thomas L. |
|
1994 |
100-101 |
10 |
p. 1643-1656 14 p. |
artikel |
46 |
Degradation and breakdown in thin oxide layers: mechanisms, models and reliability prediction
|
Degraeve, R. |
|
1999 |
100-101 |
10 |
p. 1445-1460 16 p. |
artikel |
47 |
Digital integrated circuit testing from a quality persepctive
|
Nikolić, Z. |
|
1994 |
100-101 |
10 |
p. 1697-1698 2 p. |
artikel |
48 |
Dislocations structure investigation in neutron irradiated silicon detectors using AFM and microhardness measurements
|
Golan, G |
|
1999 |
100-101 |
10 |
p. 1497-1504 8 p. |
artikel |
49 |
Dynamic study of the thermal laser stimulation response on advanced technology structures
|
Reverdy, A. |
|
2008 |
100-101 |
10 |
p. 1689-1695 7 p. |
artikel |
50 |
Editorial
|
Dummer, G.W.A. |
|
1993 |
100-101 |
10 |
p. 1439- 1 p. |
artikel |
51 |
Effect of crystallographic defects on the reverse performance of 4H–SiC JBS diodes
|
Grekov, A. |
|
2008 |
100-101 |
10 |
p. 1664-1668 5 p. |
artikel |
52 |
Effects of continuously applied stress on tin whisker growth
|
Lin, Chih-Kuang |
|
2008 |
100-101 |
10 |
p. 1737-1740 4 p. |
artikel |
53 |
Effects of gamma irradiation on the insulated-gate bipolar transistor
|
Tong, Z.H. |
|
1996 |
100-101 |
10 |
p. 1489-1498 10 p. |
artikel |
54 |
Electrothermal compact macromodel of monolithic switching voltage regulator MC34063A
|
Zarębski, Janusz |
|
2008 |
100-101 |
10 |
p. 1703-1710 8 p. |
artikel |
55 |
Entropy measures and some distribution approximations
|
Azzam, M.M. |
|
1996 |
100-101 |
10 |
p. 1569-1580 12 p. |
artikel |
56 |
Estimating the three Weibull parameters by maximizing the logarithm of the likelihood function directly
|
Wong, Jsun Y. |
|
1993 |
100-101 |
10 |
p. 1561-1565 5 p. |
artikel |
57 |
Experimental characterization of the continuous switching regime in floating-body PD SOI MOSFETs
|
Perron, L.M |
|
1998 |
100-101 |
10 |
p. 1553-1559 7 p. |
artikel |
58 |
FPGA-based switch-level fault emulation using module-based dynamic partial reconfiguration
|
Lee, Peter Ming-Han |
|
2008 |
100-101 |
10 |
p. 1724-1733 10 p. |
artikel |
59 |
Fractal description of dendrite growth during electrochemical migration
|
Dominkovics, Csaba |
|
2008 |
100-101 |
10 |
p. 1628-1634 7 p. |
artikel |
60 |
Fuzzy repairable reliability based on fuzzy gert
|
Cheng, Ching-Hsue |
|
1996 |
100-101 |
10 |
p. 1557-1563 7 p. |
artikel |
61 |
Genetic algorithms for reliability design problems
|
Hsieh, Yi-Chih |
|
1998 |
100-101 |
10 |
p. 1599-1605 7 p. |
artikel |
62 |
Heat dissipation effect of Al plate embedded substrate in network system
|
Cho, Seung Hyun |
|
2008 |
100-101 |
10 |
p. 1696-1702 7 p. |
artikel |
63 |
High-temperature performance of AlGaN/GaN HFETs and MOSHFETs
|
Donoval, D. |
|
2008 |
100-101 |
10 |
p. 1669-1672 4 p. |
artikel |
64 |
High temperature reliability of aluminium wire-bonds to thin film, thick film and low temperature co-fired ceramic (LTCC) substrate metallization
|
Johannessen, Rolf |
|
2008 |
100-101 |
10 |
p. 1711-1719 9 p. |
artikel |
65 |
Impact of geometrical scaling on parasitic pnp bipolar transistor in N-well, 0.25 μm CMOS devices and its effect on latchup immunity
|
Leong, Kam-Chew |
|
1998 |
100-101 |
10 |
p. 1621-1626 6 p. |
artikel |
66 |
Impact of power electronics packaging on the reliability of grid connected photovoltaic converters for outdoor applications
|
Meinhardt, M |
|
1999 |
100-101 |
10 |
p. 1461-1472 12 p. |
artikel |
67 |
Improving the precision on forecasting
|
Peiris, M.Shelton |
|
1996 |
100-101 |
10 |
p. 1375-1378 4 p. |
artikel |
68 |
Influence of thermal heating effect on pulsed DC electromigration result analysis
|
Waltz, P |
|
1998 |
100-101 |
10 |
p. 1531-1537 7 p. |
artikel |
69 |
Inside front cover - Editorial board
|
|
|
2008 |
100-101 |
10 |
p. IFC- 1 p. |
artikel |
70 |
Introduction to semiconductor device yield modeling
|
Dimitrijev, S. |
|
1994 |
100-101 |
10 |
p. 1696- 1 p. |
artikel |
71 |
Inverse gaussian distribution and its application to reliability
|
Jain, R.K. |
|
1996 |
100-101 |
10 |
p. 1323-1335 13 p. |
artikel |
72 |
Investigation of diode geometry and metal line pattern for robust ESD protection applications
|
Li, You |
|
2008 |
100-101 |
10 |
p. 1660-1663 4 p. |
artikel |
73 |
Investigation of morphology and fractal behaviour on compound semiconductor surface after electrochemical layer removal
|
Nemcsics, Ákos |
|
1999 |
100-101 |
10 |
p. 1505-1509 5 p. |
artikel |
74 |
Key reliability concerns with lead-free connectors
|
Shibutani, Tadahiro |
|
2008 |
100-101 |
10 |
p. 1613-1627 15 p. |
artikel |
75 |
Leakage currents and dielectric breakdown of Si1−x−y Ge x C y thermal oxides
|
Cuadras, A. |
|
2008 |
100-101 |
10 |
p. 1635-1640 6 p. |
artikel |
76 |
Low-frequency noise in thick-film structures caused by traps in glass barriers
|
Mrak, I. |
|
1998 |
100-101 |
10 |
p. 1569-1576 8 p. |
artikel |
77 |
Maintenance minimization for competitive advantage: A Life Cycle Approach for Product Manufacturers and End-Users
|
G.W.A.D., |
|
1993 |
100-101 |
10 |
p. 1629-1630 2 p. |
artikel |
78 |
Mean time to failure formulas for standard reliability networks with erlangian distributed component failure times
|
Dhillon, B.S. |
|
1996 |
100-101 |
10 |
p. 1521-1523 3 p. |
artikel |
79 |
Methods and models for computing survivability and fault-tolerance of a network
|
Gagin, Alexander A. |
|
1993 |
100-101 |
10 |
p. 1533-1552 20 p. |
artikel |
80 |
Mixed-Weibull parameter estimation for burn-in data using the Bayesian approach
|
Kececioglu, Dimitri |
|
1994 |
100-101 |
10 |
p. 1657-1679 23 p. |
artikel |
81 |
Modelling common cause failures under data uncertainty of the system unavailability
|
Kulkarni, R.N. |
|
1994 |
100-101 |
10 |
p. 1615-1622 8 p. |
artikel |
82 |
Modification of scheduled data flow graph for on-line testability
|
Ismaeel, A.A. |
|
1999 |
100-101 |
10 |
p. 1473-1484 12 p. |
artikel |
83 |
MTTF and availability evaluation of a two unit, three state redundant system with a proviso of random activation
|
Singh, S.K. |
|
1992 |
100-101 |
10 |
p. 1443-1452 10 p. |
artikel |
84 |
Negative bias temperature instability (NBTI) recovery with bake
|
Katsetos, Anastasios A. |
|
2008 |
100-101 |
10 |
p. 1655-1659 5 p. |
artikel |
85 |
New trends in system reliability evaluation
|
G.W.A.D., |
|
1994 |
100-101 |
10 |
p. 1699-1700 2 p. |
artikel |
86 |
Non-parametric estimation of sample size and censoring time in life testing experiments
|
Sharma, K.K. |
|
1992 |
100-101 |
10 |
p. 1479-1481 3 p. |
artikel |
87 |
[No title]
|
Stojcev, Mile |
|
2008 |
100-101 |
10 |
p. 1744-1745 2 p. |
artikel |
88 |
[No title]
|
Stojcev, Mile |
|
2008 |
100-101 |
10 |
p. 1742-1743 2 p. |
artikel |
89 |
Off-state gate current with quasi-zero temperature coefficient in n-MOSFETs with reoxidized nitrided oxide as gate dielectric
|
Lai, P.T |
|
1998 |
100-101 |
10 |
p. 1585-1589 5 p. |
artikel |
90 |
On Bayesian estimation of system reliability
|
Soman, K.P. |
|
1993 |
100-101 |
10 |
p. 1455-1459 5 p. |
artikel |
91 |
On distribution of cycles in a Markovian queueing system
|
Bhandari, Rajiv |
|
1992 |
100-101 |
10 |
p. 1483-1487 5 p. |
artikel |
92 |
On some partial ordering of interest in reliability
|
Ahmed, A.N. |
|
1996 |
100-101 |
10 |
p. 1337-1346 10 p. |
artikel |
93 |
On the effect of weather condition in a two unit cold standby system
|
Singh, S.K. |
|
1994 |
100-101 |
10 |
p. 1681-1684 4 p. |
artikel |
94 |
On the relation of errors and its syndrome in signature analysis
|
Chan, John C. |
|
1992 |
100-101 |
10 |
p. 1379-1383 5 p. |
artikel |
95 |
Optimal arrangement of components in a consecutive k-out-of-r-from n:F system
|
Sfakianakis, Michael |
|
1993 |
100-101 |
10 |
p. 1573-1578 6 p. |
artikel |
96 |
Optimal burn-in for minimizing cost and multiobjectives
|
Kim, K.N. |
|
1998 |
100-101 |
10 |
p. 1577-1583 7 p. |
artikel |
97 |
Optimal planned maintenance with salvage cost for a two-unit standby redundant system
|
Dohi, Tadashi |
|
1996 |
100-101 |
10 |
p. 1581-1588 8 p. |
artikel |
98 |
Optimal redundancies for reliability and availability of series systems
|
Galikowsky, C. |
|
1996 |
100-101 |
10 |
p. 1537-1546 10 p. |
artikel |
99 |
Optimal repair-cost limit for a consumer following expiry of a warranty
|
Chung, Kun-Jen |
|
1994 |
100-101 |
10 |
p. 1689-1692 4 p. |
artikel |
100 |
Optimum stochastic inspection policies for a system with safety device
|
Schabe, H. |
|
1996 |
100-101 |
10 |
p. 1395-1405 11 p. |
artikel |
101 |
Physics-of-failure assessment of a cruise control module
|
Kimseng, K |
|
1999 |
100-101 |
10 |
p. 1423-1444 22 p. |
artikel |
102 |
Probabilistic analysis of a two-unit warm standby system subject to hardware and human error failures
|
Mahmoud, M.A.W. |
|
1996 |
100-101 |
10 |
p. 1565-1568 4 p. |
artikel |
103 |
Process Improvement in the Electronics Industry
|
G.W.A.D., |
|
1992 |
100-101 |
10 |
p. 1490- 1 p. |
artikel |
104 |
Profit analysis of the machine repair problem with cold standbys and two modes of failure
|
Wang, Kuo-Hsiung |
|
1994 |
100-101 |
10 |
p. 1635-1642 8 p. |
artikel |
105 |
Publications, notices, calls for papers, etc.
|
|
|
1993 |
100-101 |
10 |
p. 1633- 1 p. |
artikel |
106 |
Publications, notices, calls for papers, etc.
|
|
|
1992 |
100-101 |
10 |
p. 1493-1496 4 p. |
artikel |
107 |
Relaxation of operational amplifier parameters after pulsed electron beam irradiation
|
Betty, C.A. |
|
1999 |
100-101 |
10 |
p. 1485-1495 11 p. |
artikel |
108 |
Reliability analysis of a repairable system in a randomly changing environment
|
Zhao-Tung, Lien |
|
1992 |
100-101 |
10 |
p. 1373-1377 5 p. |
artikel |
109 |
Reliability analysis of a two-unit parallel system with “preemptive priority” rule
|
Li, Wei |
|
1993 |
100-101 |
10 |
p. 1447-1453 7 p. |
artikel |
110 |
Reliability analysis of k-out-of-n systems with partially repairable multi-state components
|
Pham, Hoang |
|
1996 |
100-101 |
10 |
p. 1407-1415 9 p. |
artikel |
111 |
Reliability and life testing handbook Volume 1
|
Elena, Radu Mihaela |
|
1993 |
100-101 |
10 |
p. 1630-1631 2 p. |
artikel |
112 |
Reliability and yield in fabrication of microcantilever structures using bulk silicon micromachining
|
Rawicz, A. |
|
1996 |
100-101 |
10 |
p. 1369-1374 6 p. |
artikel |
113 |
Reliability assessment of a plastic encapsulated RF switching device
|
Mahajan, R. |
|
1998 |
100-101 |
10 |
p. 1607-1610 4 p. |
artikel |
114 |
Reliability a 2-way linear consecutively connected system with multistate components
|
Malinowski, Jacek |
|
1996 |
100-101 |
10 |
p. 1483-1488 6 p. |
artikel |
115 |
Reliability evaluation of a hydraulic truck crane using field data with fuzziness
|
Huang, H.-Z. |
|
1996 |
100-101 |
10 |
p. 1531-1536 6 p. |
artikel |
116 |
Reliability growth of a software model under imperfect debugging and generation of errors
|
Zeephongsekul, P. |
|
1996 |
100-101 |
10 |
p. 1475-1482 8 p. |
artikel |
117 |
Reliability increase of consecutive k-out-of-n:f and related systems through components' rearrangement
|
Malinowski, Jacek |
|
1996 |
100-101 |
10 |
p. 1417-1423 7 p. |
artikel |
118 |
Reliability of composite software by different forms of uncertainty
|
Utkin, Lev V. |
|
1996 |
100-101 |
10 |
p. 1459-1473 15 p. |
artikel |
119 |
Reliability of single strength under n-stresses
|
Uma Maheswari, T.S. |
|
1992 |
100-101 |
10 |
p. 1475-1478 4 p. |
artikel |
120 |
RTS noise due to lateral isolation related defects in submicron nMOSFETs
|
Lukyanchikova, N. |
|
1998 |
100-101 |
10 |
p. 1561-1568 8 p. |
artikel |
121 |
Saline soak tests to determine the short-term reliability of an in situ thin film resistance temperature detector
|
Post, Julian W. |
|
2008 |
100-101 |
10 |
p. 1673-1682 10 p. |
artikel |
122 |
Society of reliability engineers bulletin
|
Reiche, Hans |
|
1993 |
100-101 |
10 |
p. 1627- 1 p. |
artikel |
123 |
Solder joint reliability of a low cost chip size package—NuCSP
|
Lau, J.H |
|
1998 |
100-101 |
10 |
p. 1519-1529 11 p. |
artikel |
124 |
Some possibilities of restoration organization selection for complex radioelectronic systems
|
Martynenko, Oleg |
|
1992 |
100-101 |
10 |
p. 1421-1429 9 p. |
artikel |
125 |
Stochastic analysis of a redundant system with two types of failure
|
Agnihotri, R.K. |
|
1993 |
100-101 |
10 |
p. 1467-1471 5 p. |
artikel |
126 |
Stochastic analysis of a two-unit warm standby system with slow switch subject to hardware and human error failures
|
Mahmoud, M.A.W. |
|
1998 |
100-101 |
10 |
p. 1639-1644 6 p. |
artikel |
127 |
Stochastic behaviour of a standby redundant repairable complex system under various modes of failure
|
Mokhles, N. |
|
1993 |
100-101 |
10 |
p. 1477-1498 22 p. |
artikel |
128 |
Stochastic optimization of discrete event systems simulation
|
Arsham, H. |
|
1996 |
100-101 |
10 |
p. 1357-1368 12 p. |
artikel |
129 |
Strain relaxation in SiGe due to process induced defects and their subsequent annealing behavior
|
Misra, D. |
|
1998 |
100-101 |
10 |
p. 1611-1619 9 p. |
artikel |
130 |
Stuck fault test generation for dynamic CMOS
|
Ismaeel, Asad A. |
|
1994 |
100-101 |
10 |
p. 1597-1613 17 p. |
artikel |
131 |
Systems with two dual failure modes — A survey
|
Lešanovský, Antonín |
|
1993 |
100-101 |
10 |
p. 1597-1626 30 p. |
artikel |
132 |
Tensile tests of micro anchors anodically bonded between Pyrex glass and aluminum thin film coated on silicon wafer
|
Hu, Yu-Qun |
|
2008 |
100-101 |
10 |
p. 1720-1723 4 p. |
artikel |
133 |
The degradation of GaAlAs red light-emitting diodes under continuous and low-speed pulse operations
|
Yanagisawa, T. |
|
1998 |
100-101 |
10 |
p. 1627-1630 4 p. |
artikel |
134 |
The failure time random variable modelling
|
Jóźwiak, I.J. |
|
1996 |
100-101 |
10 |
p. 1525-1529 5 p. |
artikel |
135 |
Thermal stress and strain in microelectronics packaging
|
Stojadinović, N.D. |
|
1994 |
100-101 |
10 |
p. 1694-1695 2 p. |
artikel |
136 |
Thermomechanical effects in metal lines on integrated circuits analysed with a differential polarimetric interferometer
|
Dilhaire, S. |
|
1998 |
100-101 |
10 |
p. 1591-1597 7 p. |
artikel |
137 |
The single-server Markovian overflow queue with balking, reneging and an additional server for longer queues
|
Abou-El-Ata, M.O. |
|
1992 |
100-101 |
10 |
p. 1389-1394 6 p. |
artikel |
138 |
The use of impedance spectroscopy, SEM and SAM imaging for early detection of failure in SMT assemblies
|
Ousten, Y. |
|
1998 |
100-101 |
10 |
p. 1539-1545 7 p. |
artikel |
139 |
Time-dependent optimality of an alarm subsystem
|
Wang, D. |
|
1994 |
100-101 |
10 |
p. 1623-1633 11 p. |
artikel |
140 |
Transient analysis of a multiple-unit redundant system
|
Goel, L.R. |
|
1992 |
100-101 |
10 |
p. 1361-1365 5 p. |
artikel |
141 |
Two-dimensional dopant profiling in semiconductor devices by electron holography and chemical etching delineation techniques with the same specimen
|
Shaislamov, Ulugbek |
|
2008 |
100-101 |
10 |
p. 1734-1736 3 p. |
artikel |
142 |
Two-polarity pulse noise in reverse biased degraded p–n junctions
|
Jevtić, M.M. |
|
1998 |
100-101 |
10 |
p. 1631-1637 7 p. |
artikel |
143 |
Two-unit redundant system with random shocks and inspection
|
Agnihotri, R.K. |
|
1992 |
100-101 |
10 |
p. 1431-1441 11 p. |
artikel |
144 |
Wafer level tunnel oxide reliability evaluation by means of the Exponentially Ramped Current Stress method
|
Cappelletti, P. |
|
1993 |
100-101 |
10 |
p. 1579-1596 18 p. |
artikel |
145 |
What every engineer should know about microcomputers hardware/software design — A step-by-step example (Second edition, revised and expanded)
|
G.W.A.D., |
|
1992 |
100-101 |
10 |
p. 1489- 1 p. |
artikel |