Digitale Bibliotheek
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                             253 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A CAD coupled laser beam test system for digital circuit failure analysis 1992
100-101 1-2 p. 300-301
2 p.
artikel
2 A case study of ethernet anomalies in a distributed computing environment 1992
100-101 1-2 p. 289-
1 p.
artikel
3 A census of tandem system availability between 1985 and 1990 1992
100-101 1-2 p. 283-
1 p.
artikel
4 A class of shrinkage estimators for the scale parameter of the exponential distribution 1992
100-101 1-2 p. 290-
1 p.
artikel
5 A compact high power semiconductor laser array Douglas, P.E.
1978
100-101 1-2 p. 163-174
12 p.
artikel
6 A comparison study of the reliability of the two majority-vote instrumentation systems Nieuwhof, G.W.E
1980
100-101 1-2 p. 13-24
12 p.
artikel
7 A confidence interval for the availability ratio for systems with weibull operating time and lognormal repair time Masters, B.N.
1992
100-101 1-2 p. 89-99
11 p.
artikel
8 A- consecutive-k-out-of-n: G system: the mirror image of a consecutive-k-out-of-n: F system 1992
100-101 1-2 p. 292-
1 p.
artikel
9 Ada's fundamental language structures build reliable systems 1992
100-101 1-2 p. 283-
1 p.
artikel
10 Addendum Nieuwhof, G.W.E.
1979
100-101 1-2 p. 161-168
8 p.
artikel
11 A design review approach toward dynamic RAM reliability Roberts, J.A.
1979
100-101 1-2 p. 97-105
9 p.
artikel
12 Ag-Pd thick film conductor for AIN ceramics 1992
100-101 1-2 p. 298-
1 p.
artikel
13 A look at optoelectronic integrated circuits 1992
100-101 1-2 p. 292-
1 p.
artikel
14 A low cost reliability test specification de Corlieu, Jacques
1979
100-101 1-2 p. 11-14
4 p.
artikel
15 A microcomputer for control applications Walsh, M.J.
1978
100-101 1-2 p. 5-8
4 p.
artikel
16 A model for moisture induced corrosion failures in microelectronic packages 1992
100-101 1-2 p. 284-
1 p.
artikel
17 A model of charge transport in thermal SiO2 implanted with Si 1992
100-101 1-2 p. 301-
1 p.
artikel
18 A model of 1/f noise in polysilicon resistors 1992
100-101 1-2 p. 299-
1 p.
artikel
19 Analyzing the mechanical strength of SMT attached solder joints 1992
100-101 1-2 p. 285-
1 p.
artikel
20 An approximation analysis for the availability of a parallel redundant system with general distributions Yanagi, Shigeru
1992
100-101 1-2 p. 143-157
15 p.
artikel
21 An efficient algorithm to solve inter-programming problems arising in system-reliability design 1992
100-101 1-2 p. 292-
1 p.
artikel
22 A new approach toward evaluation of reliability of electronic equipment during maintenance and designing Lerner, Moisey M
1980
100-101 1-2 p. 147-151
5 p.
artikel
23 A new ERA in reliability Balke, Nicholas
1979
100-101 1-2 p. iii-
1 p.
artikel
24 A new intelligent one-chip microcomputer: the application-specific microcomputer 1992
100-101 1-2 p. 295-296
2 p.
artikel
25 A new recursive algorithm for the reliability evaluation of a distributed program Chen, Den-Jyi
1992
100-101 1-2 p. 25-33
9 p.
artikel
26 An introduction to assemblers and loaders for microprocessor systems Spratt, E.B.
1978
100-101 1-2 p. 133-142
10 p.
artikel
27 An investigation of pnp polysilicon emitter transistors 1992
100-101 1-2 p. 297-
1 p.
artikel
28 A note on recursive estimator of the density function which is not necessarily continuous El-Fahham, M.M.
1992
100-101 1-2 p. 79-87
9 p.
artikel
29 A novel Lossy and dispersive interconnect model for integrated circuit simulation 1992
100-101 1-2 p. 296-
1 p.
artikel
30 A PABX model using the 6800 MPU Marclay, Bernard
1978
100-101 1-2 p. 15-33
19 p.
artikel
31 Application of DIN ISO 9000 through 9004 to the practice of nondestructive testing 1992
100-101 1-2 p. 283-
1 p.
artikel
32 A proportional hazards approach to correlate SiO2—breakdown voltage and time distributions 1992
100-101 1-2 p. 288-
1 p.
artikel
33 A review of the properties of aluminium alloy films used during silicon device fabrication 1992
100-101 1-2 p. 300-
1 p.
artikel
34 A self optimising central heating control system Leiper, Dave
1978
100-101 1-2 p. 101-109
9 p.
artikel
35 A simple expression for band gap narrowing (BGN) in heavily doped Si, Ge, GaAs and GexSi1−x strained layers 1992
100-101 1-2 p. 297-
1 p.
artikel
36 A simple model for life cycle cost vs maintainability function Govil, K.K.
1992
100-101 1-2 p. 269-270
2 p.
artikel
37 A submicron electron-beam tester for VLSI circuits beyond the 4-Mb DRAM 1992
100-101 1-2 p. 301-
1 p.
artikel
38 A system safety approach to the design of an Intermediate Capacity Transit System Rumsey, A.F
1980
100-101 1-2 p. 123-129
7 p.
artikel
39 A unified performance reliability analysis of a system with a cumulative down time constraint Nicola, Victor
1992
100-101 1-2 p. 49-65
17 p.
artikel
40 Automated analysis of phased-mission reliability 1992
100-101 1-2 p. 291-
1 p.
artikel
41 Automated apparatus for long-term testing of electrical brushes 1992
100-101 1-2 p. 285-286
2 p.
artikel
42 Automatic soldering technology accommodates computer needs 1992
100-101 1-2 p. 295-
1 p.
artikel
43 Availability of k-out-of-m:G repairable system with non-identical elements Gadani, J.P.
1979
100-101 1-2 p. 65-71
7 p.
artikel
44 A VLSI design for an efficient multiprocessor cache memory 1992
100-101 1-2 p. 296-
1 p.
artikel
45 A Weibull model to characterize lifetimes of aluminum alloy electrical wire connections 1992
100-101 1-2 p. 290-
1 p.
artikel
46 Bayes credibility estimation of an exponential parameter for random censoring and incomplete information 1992
100-101 1-2 p. 286-287
2 p.
artikel
47 Bayes estimates under asymmetric loss 1992
100-101 1-2 p. 290-
1 p.
artikel
48 Bayes predictive analysis of a fundamental software-reliability model 1992
100-101 1-2 p. 289-
1 p.
artikel
49 Behavioral prediction of materials degradation in load-bearing structures Hay, D.Robert
1979
100-101 1-2 p. 127-132
6 p.
artikel
50 Benzocyclobutene interlayer dielectrics for thin film multichip modules 1992
100-101 1-2 p. 298-299
2 p.
artikel
51 Biographies 1980
100-101 1-2 p. 163-167
5 p.
artikel
52 Biographies 1979
100-101 1-2 p. 151-160
10 p.
artikel
53 Calculation of the Binomial survivor function 1992
100-101 1-2 p. 287-
1 p.
artikel
54 Calculation of the Poisson cumulative distribution function 1992
100-101 1-2 p. 289-
1 p.
artikel
55 Calendar of international conferences, symposia, lectures and meetings of interest 1992
100-101 1-2 p. 277-280
4 p.
artikel
56 Can a noninvasive reliability prediction of electronic boards be accurate? Rawicz, Andrew H.
1992
100-101 1-2 p. 223-232
10 p.
artikel
57 Chairman's message Lewis, Neville
1980
100-101 1-2 p. iii-
1 p.
artikel
58 Characterization of the Pearson family of distributions 1992
100-101 1-2 p. 291-
1 p.
artikel
59 Chip tantalum capacitors take center stage among SMDs 1992
100-101 1-2 p. 296-
1 p.
artikel
60 Chip technology now available for aluminum electro-lytic capacitors 1992
100-101 1-2 p. 286-
1 p.
artikel
61 Clustered defects in IC fabrication: impact on process control charts 1992
100-101 1-2 p. 293-294
2 p.
artikel
62 Combining analog simulation techniques optimizes designs 1992
100-101 1-2 p. 293-
1 p.
artikel
63 Comment on: an efficient non-recursive algorithm for computing the reliability of k-out-of-n systems 1992
100-101 1-2 p. 291-
1 p.
artikel
64 Communication and transportation network reliability using routing models 1992
100-101 1-2 p. 288-
1 p.
artikel
65 Comparison of Bayesian nonparametric estimates of the reliability with rival estimates Papadopoulos, Alex S.
1992
100-101 1-2 p. 233-240
8 p.
artikel
66 Comparison of phosphorus, arsenic and boron implants into bulk silicon and SOS 1992
100-101 1-2 p. 301-
1 p.
artikel
67 Component replacement and the use of Relcode Hastings, N.A.J.
1979
100-101 1-2 p. 49-56
8 p.
artikel
68 Computer operations — An introduction Woollons, D.J.
1978
100-101 1-2 p. 153-162
10 p.
artikel
69 Cost-benefit analysis of a 2-unit priority-standby system with patience-time for repair 1992
100-101 1-2 p. 290-
1 p.
artikel
70 Cost-benefit analysis of single server n-unit imperfect switch system with delayed repair Gopalan, M.N.
1992
100-101 1-2 p. 5-9
5 p.
artikel
71 CP-140 aircraft reliability program — A “tailored” management approach Steiner, R.F.
1979
100-101 1-2 p. 133-139
7 p.
artikel
72 Data acquisition — Acquiring a little of the data Brown, Dave
1978
100-101 1-2 p. 87-91
5 p.
artikel
73 Design a digital synchronizer with a low metastable-failure rate 1992
100-101 1-2 p. 296-
1 p.
artikel
74 Design guidelines for polymer thick-film technology 1992
100-101 1-2 p. 300-
1 p.
artikel
75 Designs meet needs of high-speed, high-density systems 1992
100-101 1-2 p. 293-
1 p.
artikel
76 Detection of multiple input bridging and stuck-on faults in CMOS logic circuits using current monitoring 1992
100-101 1-2 p. 287-
1 p.
artikel
77 Development of a maintenance plan for the intermediate capacity transit system Keith, Brian
1980
100-101 1-2 p. 25-31
7 p.
artikel
78 Development of the DHC-7 aircraft maintenance program Oates, D.L
1980
100-101 1-2 p. 11-
1 p.
artikel
79 Diffusion of ion implanted phosphorus in silicon in inert ambient 1992
100-101 1-2 p. 300-
1 p.
artikel
80 Drain engineering of hot-carrier-resistant MOSFETs using concave silicon surfaces for deep submicron VLSI technology 1992
100-101 1-2 p. 298-
1 p.
artikel
81 Dynamic behaviour of SMT chip capacitors during solder reflow 1992
100-101 1-2 p. 286-
1 p.
artikel
82 Editorial Board 1992
100-101 1-2 p. IFC-
1 p.
artikel
83 Editorial Board 1979
100-101 1-2 p. IFC-
1 p.
artikel
84 Editorial Board 1978
100-101 1-2 p. IFC-
1 p.
artikel
85 Effect of system peak load forecast uncertainty on annualized reliability indices of composite generation and transmission systems Billinton, R
1980
100-101 1-2 p. 91-100
10 p.
artikel
86 Efficient modeling parameter extraction for dual Pearson approach to simulation of implanted impurity profiles in silicon 1992
100-101 1-2 p. 297-298
2 p.
artikel
87 Electrical inhomogeneity in alloyed AuGe-Ni contact formed on GaAs 1992
100-101 1-2 p. 298-
1 p.
artikel
88 Electronic system packaging: the search for manufacturing the optimum in a sea of constraints 1992
100-101 1-2 p. 292-
1 p.
artikel
89 Electro-optic sampling of high-speed devices and integrated circuits 1992
100-101 1-2 p. 286-
1 p.
artikel
90 Empirically based analysis of failures in software systems 1992
100-101 1-2 p. 288-
1 p.
artikel
91 Empirical studies of software validation Howden, William E.
1979
100-101 1-2 p. 39-47
9 p.
artikel
92 Enhancement of flip-chip fatigue life by encapsulation 1992
100-101 1-2 p. 284-
1 p.
artikel
93 Error log analysis: statistical modeling and heuristic trend analysis 1992
100-101 1-2 p. 287-
1 p.
artikel
94 Establishing and confirming R and M requirements for DND vehicles Harris, A.P
1980
100-101 1-2 p. 55-73
19 p.
artikel
95 Evaluating fault trees (AND and OR gates only) with repeated events 1992
100-101 1-2 p. 289-
1 p.
artikel
96 Evaluation and design of an ultra-reliable distributed architecture for fault tolerance 1992
100-101 1-2 p. 289-
1 p.
artikel
97 Evaluation of fuzzy reliability of a non-series parallel network Chowdhury, Sumandra Ghosh
1992
100-101 1-2 p. 1-4
4 p.
artikel
98 Event-tree analysis by fuzzy probability 1992
100-101 1-2 p. 291-
1 p.
artikel
99 Experimental evaluation of the fault tolerance of an atomic multicast system 1992
100-101 1-2 p. 291-
1 p.
artikel
100 Extended behavioral decomposition for estimating ultrahigh reliability 1992
100-101 1-2 p. 283-
1 p.
artikel
101 Extrapolation of high-voltage stress measurements to lowvoltage operation for thin silicon-oxide films 1992
100-101 1-2 p. 299-
1 p.
artikel
102 Fabrication of high density multichip modules 1992
100-101 1-2 p. 293-
1 p.
artikel
103 Fault-tolerant programs and their reliability 1992
100-101 1-2 p. 288-289
2 p.
artikel
104 Fault-trees for a voting circuit; synthesis and joint analysis Schneeweiss, Winfrid G.
1992
100-101 1-2 p. 35-47
13 p.
artikel
105 Fibre optics in data transmission Yarker, Colin A.
1978
100-101 1-2 p. 179-189
11 p.
artikel
106 Fitting maintenance cost vs maintainability data to a standard curve Govil, K.K.
1992
100-101 1-2 p. 267-268
2 p.
artikel
107 Flexible picosecond probing of integrated circuits with chopped electron beams 1992
100-101 1-2 p. 294-
1 p.
artikel
108 1/f noise in ceramic superconductors and granular resistors 1992
100-101 1-2 p. 299-
1 p.
artikel
109 Focused ion beam technology 1992
100-101 1-2 p. 300-
1 p.
artikel
110 Formation of voids in silicone RTV dispersion under beam-leaded silicon integrated circuits 1992
100-101 1-2 p. 284-285
2 p.
artikel
111 Fundamentals of manipulator calibration G.W.A.D.,
1992
100-101 1-2 p. 275-276
2 p.
artikel
112 Gidep assists in solving reliability/quality problems Richards, Edwin T
1980
100-101 1-2 p. 83-90
8 p.
artikel
113 Hardware and software reliability and confidence limits for computer-controlled systems Haynes, Robert D
1980
100-101 1-2 p. 109-122
14 p.
artikel
114 Hierarchical Bayesian approach to reliability estimation under competing risk Badarinathi, Ravija
1992
100-101 1-2 p. 249-258
10 p.
artikel
115 Hierarchical Bayesian reliability analysis using Erlang families of priors and hyperpriors Bhattacharya, Samir K.
1992
100-101 1-2 p. 241-247
7 p.
artikel
116 Highly integrated microcomputers Kornstein, Howard
1978
100-101 1-2 p. 3-4
2 p.
artikel
117 High-speed GaAs/AIGaAs optoelectronic devices for computer applications 1992
100-101 1-2 p. 296-
1 p.
artikel
118 High temperature millisecond annealing of arsenic implanted silicon 1992
100-101 1-2 p. 301-302
2 p.
artikel
119 High thermal conductivity aluminum nitride ceramic substrates and packages 1992
100-101 1-2 p. 294-
1 p.
artikel
120 Hi-Q chip model ceramic capacitors handle high frequencies 1992
100-101 1-2 p. 286-
1 p.
artikel
121 Hybrid ICs find market, adopt new technology 1992
100-101 1-2 p. 300-
1 p.
artikel
122 IC tester industry gears up for large-memory DRAMs 1992
100-101 1-2 p. 292-
1 p.
artikel
123 Impact ionization in silicon: a review and update 1992
100-101 1-2 p. 301-
1 p.
artikel
124 Impact of network failures on the performance degradation of a class of cluster-based multiprocessors 1992
100-101 1-2 p. 285-
1 p.
artikel
125 Implementing fault-tolerance via modular redundancy with comparison 1992
100-101 1-2 p. 287-288
2 p.
artikel
126 In-line statistical process control and feedback for VLSI integrated circuit manufacturing 1992
100-101 1-2 p. 294-295
2 p.
artikel
127 Integrated circuits in radio transceivers Bryant, James M.
1978
100-101 1-2 p. 77-85
9 p.
artikel
128 Integrated circuits take the cams out of cameras Anderson, David
1978
100-101 1-2 p. 35-47
13 p.
artikel
129 Integrated components for fiber optic data links in industrial applications Hanson, Del
1978
100-101 1-2 p. 175-178
4 p.
artikel
130 Intermetallic formation on the fracture of Sn/Pb solder and Pd/Ag conductor interfaces 1992
100-101 1-2 p. 284-
1 p.
artikel
131 Introduction and certification of a quality assurance system 1992
100-101 1-2 p. 291-
1 p.
artikel
132 Introduction to programming Monk, J.
1978
100-101 1-2 p. 143-152
10 p.
artikel
133 Investigation of arsenic-implanted silicon by optical reflectometry 1992
100-101 1-2 p. 301-
1 p.
artikel
134 Laptop PCs propel progress in half-pitch connectors 1992
100-101 1-2 p. 285-
1 p.
artikel
135 Large-scale GaAs ICs challenge bipolar ICs in speed, power, cost 1992
100-101 1-2 p. 296-
1 p.
artikel
136 Laser trimming of thick film metal resistors on aluminum nitride substrates 1992
100-101 1-2 p. 299-
1 p.
artikel
137 LED array modules by new technology microbump bonding method 1992
100-101 1-2 p. 294-
1 p.
artikel
138 Light simulation of molecular beam epitaxy 1992
100-101 1-2 p. 301-
1 p.
artikel
139 Makers expect ASICs to reverse computer slump 1992
100-101 1-2 p. 292-
1 p.
artikel
140 Management of satellite systems reliability program Behmann, François
1979
100-101 1-2 p. 15-21
7 p.
artikel
141 Management of total reliability Puri, S.C.
1979
100-101 1-2 p. 7-10
4 p.
artikel
142 Manual backup operations: Some behavioral aspects of human reliability Abo El-Ela, Maged A.
1979
100-101 1-2 p. 141-149
9 p.
artikel
143 Mass production back-grinding/wafer-thinning technology for GaAs devices 1992
100-101 1-2 p. 295-
1 p.
artikel
144 Measurement of the standoff height between a flip-mounted IC chip and its substrate 1992
100-101 1-2 p. 293-
1 p.
artikel
145 Mechanical component reliability under environmental stress Dhillon, Balbir S
1980
100-101 1-2 p. 153-160
8 p.
artikel
146 Microprocessors for high accuracy component measurement Bond, D.F.
1978
100-101 1-2 p. 53-63
11 p.
artikel
147 Modelling of epitaxial growth rate of silicon by vapour phase epitaxy 1992
100-101 1-2 p. 298-
1 p.
artikel
148 Monte Carlo analysis of semiconductor devices: the DAMOCLES program 1992
100-101 1-2 p. 284-
1 p.
artikel
149 MOS semiconductor random access memory failure rate Arsenault, J.E.
1979
100-101 1-2 p. 81-88
8 p.
artikel
150 Multichip modules for advanced applications 1992
100-101 1-2 p. 294-
1 p.
artikel
151 Multilayer ceramic packaging alternatives 1992
100-101 1-2 p. 295-
1 p.
artikel
152 New development of thin plastic package with high terminal counts 1992
100-101 1-2 p. 295-
1 p.
artikel
153 New developments in high voltage planar thyristors for use in automobile Ethenoz, Pierre
1978
100-101 1-2 p. 193-203
11 p.
artikel
154 Nonparametric confidence bounds, using censored data on the mean residual life 1992
100-101 1-2 p. 287-
1 p.
artikel
155 Ohmic contact electromigration Scorzoni, Andrea
1992
100-101 1-2 p. 167-174
8 p.
artikel
156 On comparison of estimators in a generalized life model Dey, Dipak K.
1992
100-101 1-2 p. 207-221
15 p.
artikel
157 On fault trees and other reliability evaluation methods Dhillon, Balbir S.
1979
100-101 1-2 p. 57-63
7 p.
artikel
158 On optimizing yield reliability and area overhead in large memory arrays Noore, A.
1992
100-101 1-2 p. 67-77
11 p.
artikel
159 On the analysis of accelerated life-testing experiments 1992
100-101 1-2 p. 291-
1 p.
artikel
160 On the possibility of internal gettering in commercially available silicon wafers 1992
100-101 1-2 p. 295-
1 p.
artikel
161 On the robustness of LDD and nMOS transistors subjected to measurement of drain breakdown voltage 1992
100-101 1-2 p. 286-
1 p.
artikel
162 Optically controlled current-voltage characteristics of ion-implanted MESFETs 1992
100-101 1-2 p. 301-
1 p.
artikel
163 Optimal allocation and control problems for software-testing resources 1992
100-101 1-2 p. 288-
1 p.
artikel
164 Optimal design of k-out-of-n redundant systems Pham, Hoang
1992
100-101 1-2 p. 119-126
8 p.
artikel
165 Optimal maintainability allocation using the geometric programming method Govil, K.K.
1992
100-101 1-2 p. 265-266
2 p.
artikel
166 Optimum reliability investment in the electronics industry Sultan, Torky I.
1992
100-101 1-2 p. 159-166
8 p.
artikel
167 Optimum software release policy with random life-cycle 1992
100-101 1-2 p. 289-
1 p.
artikel
168 Optimum test design strategies Kapur, Kailash C
1980
100-101 1-2 p. 75-81
7 p.
artikel
169 Origin of gas impurities in sputtering plasmas during thin film deposition 1992
100-101 1-2 p. 299-
1 p.
artikel
170 Parallel Petri net path searching on a local area network—Object oriented Pascal implementation Anneberg, L.
1992
100-101 1-2 p. 199-206
8 p.
artikel
171 Passive chip components follow high-density trends 1992
100-101 1-2 p. 293-
1 p.
artikel
172 Picosecond noninvasive optical detection of internal electrical signals in flip-chip-mounted silicon integrated circuits 1992
100-101 1-2 p. 296-
1 p.
artikel
173 Picosecond photoemission probing of integrated circuits: capabilities, limitations, and applications 1992
100-101 1-2 p. 284-
1 p.
artikel
174 Point defect generation and arsenic diffusion in silicon in inert ambient 1992
100-101 1-2 p. 297-
1 p.
artikel
175 Point defect populations in amorphous and crystalline silicon 1992
100-101 1-2 p. 298-
1 p.
artikel
176 Potential and problems of high-temperature electronics and CMOS integrated circuits (25–250°C)—an overview 1992
100-101 1-2 p. 292-
1 p.
artikel
177 Practical experimental designs applied to haloing (Measling) on Teflon circuit boards 1992
100-101 1-2 p. 284-
1 p.
artikel
178 Predicting and eliminating built-in test false alarms 1992
100-101 1-2 p. 288-
1 p.
artikel
179 Prediction of the reliability of mechanical components subjected to combined alternating and mean stresses with non-constant stress ratio Kececioglu, D
1980
100-101 1-2 p. 45-54
10 p.
artikel
180 Principles of wet chemical processing in ULSI microfabrication 1992
100-101 1-2 p. 293-
1 p.
artikel
181 Printed wiring board inner layer contamination study 1992
100-101 1-2 p. 285-
1 p.
artikel
182 Product audit: quality assurance of quality assurance 1992
100-101 1-2 p. 283-
1 p.
artikel
183 Publications, notices, calls for papers, Etc. 1992
100-101 1-2 p. 281-
1 p.
artikel
184 Quality assurance and the consumer Heslop, Louise A
1980
100-101 1-2 p. 1-9
9 p.
artikel
185 “Real world” interfacing to microprocessors Rabin, Neville
1978
100-101 1-2 p. 111-117
7 p.
artikel
186 Redundancy optimization of k-out-of-n systems with common-cause failures 1992
100-101 1-2 p. 290-
1 p.
artikel
187 Redundant-system demonstrated-reliability approximation using piece-part failure rates 1992
100-101 1-2 p. 285-
1 p.
artikel
188 Reliability analysis of a human operator under different levels of stress Chung, Who Kee
1992
100-101 1-2 p. 127-131
5 p.
artikel
189 Reliability analysis of two-unit warm standby system with partial failure mode and inspection time Pandey, D.K.
1992
100-101 1-2 p. 17-19
3 p.
artikel
190 Reliability and maintainability growth of a modern, high performance aircraft, the F-14A Bigel, Gary
1979
100-101 1-2 p. 31-38
8 p.
artikel
191 Reliability assessment of small signal GaAs FETs Behmann, François
1979
100-101 1-2 p. 107-115
9 p.
artikel
192 Reliability based quality (RBQ) technique for evaluating the degradation of reliability during manufacturing Neri, Lewis
1979
100-101 1-2 p. 117-126
10 p.
artikel
193 Reliability demonstration testing for software 1992
100-101 1-2 p. 290-
1 p.
artikel
194 Reliability in the dormant condition Harris, A.P
1980
100-101 1-2 p. 33-44
12 p.
artikel
195 Reliability learning model: Application to color TV Imai, J.
1979
100-101 1-2 p. 73-80
8 p.
artikel
196 Reliability of modified designs: a Bayes analysis of an accelerated test of electronic assemblies 1992
100-101 1-2 p. 287-
1 p.
artikel
197 Reliability optimization in generalized stochastic-flow networks 1992
100-101 1-2 p. 287-
1 p.
artikel
198 Reliability pays off Kindig, William G
1980
100-101 1-2 p. 101-108
8 p.
artikel
199 Remote data conversion Watson, David
1978
100-101 1-2 p. 119-125
7 p.
artikel
200 Resistor networks increasing overall mounting density 1992
100-101 1-2 p. 299-
1 p.
artikel
201 Rules and criteria for when to stop testing a piece of software Petrova, E.
1992
100-101 1-2 p. 101-117
17 p.
artikel
202 SCRUMPI 3—A microprocessor with low cost I/O Miller-Kirkpatrick, John H.
1978
100-101 1-2 p. 65-76
12 p.
artikel
203 Selecting, under type-II censoring, Weibull populations that are more reliable 1992
100-101 1-2 p. 287-
1 p.
artikel
204 Self-annealing in ion-implanted Si and GaAs 1992
100-101 1-2 p. 301-
1 p.
artikel
205 Selling reliability engineering to the company Darch, M.B.
1979
100-101 1-2 p. 1-5
5 p.
artikel
206 Silicon micromechanics: sensors and actuators on a chip 1992
100-101 1-2 p. 292-
1 p.
artikel
207 Simulated fault injection: a methodology to evaluate fault tolerant microprocessor architectures 1992
100-101 1-2 p. 290-
1 p.
artikel
208 Simulation and design of Lossy transmission lines in a thin-film multichip package 1992
100-101 1-2 p. 300-
1 p.
artikel
209 Simulation of electromigration behaviour in Al metallization of integrated circuits Scherge, M.
1992
100-101 1-2 p. 21-24
4 p.
artikel
210 Solder joint reliability of fine pitch surface mount technology assemblies 1992
100-101 1-2 p. 285-
1 p.
artikel
211 Special seminex 1978 edition semiconductors and microprocessors Dummer, G.W.A.
1978
100-101 1-2 p. 1-
1 p.
artikel
212 Stochastic modelling of a two-stage transfer-line production system with end buffer and random demand Gopalan, M.N.
1992
100-101 1-2 p. 11-15
5 p.
artikel
213 Strategies of file redundancy in information systems Turksen, I.B
1980
100-101 1-2 p. 131-144
14 p.
artikel
214 Submicron-gate-length GaAs MESFETs 1992
100-101 1-2 p. 296-
1 p.
artikel
215 Supply formats change with chip use trends 1992
100-101 1-2 p. 292-293
2 p.
artikel
216 Synchronization techniques for distributed systems: An overview Jeffrey Mee, W.
1992
100-101 1-2 p. 175-197
23 p.
artikel
217 System availability monitoring 1992
100-101 1-2 p. 288-
1 p.
artikel
218 Technical trends in optical connector development 1992
100-101 1-2 p. 296-
1 p.
artikel
219 Technology prevents reflow soldering defects linked to miniaturization 1992
100-101 1-2 p. 295-
1 p.
artikel
220 Temperature cycling effects between Sn/Pb solder and thick film Pd/Ag conductor metallization 1992
100-101 1-2 p. 299-
1 p.
artikel
221 Test generation for VLSI chips with embedded memories 1992
100-101 1-2 p. 294-
1 p.
artikel
222 Testing printed board assemblies in SMD technology 1992
100-101 1-2 p. 284-
1 p.
artikel
223 Testing whether one distribution is more IFR than another Wei, Xianhua
1992
100-101 1-2 p. 271-273
3 p.
artikel
224 Test planning as a basis for process control 1992
100-101 1-2 p. 290-
1 p.
artikel
225 The accession of the monolithic analogue to digital converter Jenkins, Andrew
1978
100-101 1-2 p. 93-99
7 p.
artikel
226 The anisotropic model for simulation of a multilayer structure dry etching 1992
100-101 1-2 p. 293-
1 p.
artikel
227 The 1978 Canadian SRE Reliability Symposium Committee 1979
100-101 1-2 p. v-
1 p.
artikel
228 The case for full convection reflow 1992
100-101 1-2 p. 294-
1 p.
artikel
229 The combined effects of strain and heavy doping on the indirect band gap of Si and GexSi1−x alloys 1992
100-101 1-2 p. 297-
1 p.
artikel
230 The computer in the street Curry, Chris
1978
100-101 1-2 p. 9-13
5 p.
artikel
231 The design of microcomputer systems Cooke, P.
1978
100-101 1-2 p. 127-131
5 p.
artikel
232 The development of ultra-high-frequency VLSI device test systems 1992
100-101 1-2 p. 293-
1 p.
artikel
233 The effectiveness of adding standby redundancy at system and component levels 1992
100-101 1-2 p. 288-
1 p.
artikel
234 The effect of statically and dynamically replicated components on system reliability 1992
100-101 1-2 p. 291-292
2 p.
artikel
235 The effects of localized hot-carrier-induced charge in VLSI switching circuits 1992
100-101 1-2 p. 297-
1 p.
artikel
236 The effects of variables sampling on component reliability 1992
100-101 1-2 p. 290-
1 p.
artikel
237 The human element in reliable systems Cross, P
1980
100-101 1-2 p. 145-
1 p.
artikel
238 The logistics of life cycle cost Peronnet, John R.
1979
100-101 1-2 p. 23-30
8 p.
artikel
239 The mean time-to-failure of some special series-parallel arrays 1992
100-101 1-2 p. 292-
1 p.
artikel
240 The modeling of multi-layer structures and the impact of emitter-base coupling on the determination of base recombination parameters 1992
100-101 1-2 p. 298-
1 p.
artikel
241 The need for feedback of field RAM data Gillis, A.R.
1979
100-101 1-2 p. 89-95
7 p.
artikel
242 Thermal breakdown in GaAs MES diodes 1992
100-101 1-2 p. 286-
1 p.
artikel
243 Thermal fatigue life of Pb-Sn alloy interconnections 1992
100-101 1-2 p. 285-
1 p.
artikel
244 The single-board computer approach to business machine control Bennison, Roger
1978
100-101 1-2 p. 49-52
4 p.
artikel
245 The 1980 SRE Canadian Reliability Symposium Committee 1980
100-101 1-2 p. iv-
1 p.
artikel
246 The status of magnetic bubble memories Parratt, Dave
1978
100-101 1-2 p. 191-192
2 p.
artikel
247 The zero-truncated negative binomial distribution as a failure model from the Bayesian approach Kyriakoussis, A.
1992
100-101 1-2 p. 259-264
6 p.
artikel
248 Thick film resistors for AIN ceramics 1992
100-101 1-2 p. 300-
1 p.
artikel
249 Ultra high reliable spacecraft computer system design considerations Rayapati, Venkatapathi Naidu
1992
100-101 1-2 p. 133-142
10 p.
artikel
250 Ultra-thin dielectrics for semiconductor applications—growth and characteristics 1992
100-101 1-2 p. 298-
1 p.
artikel
251 Vacuum mechatronics and self-contained manufacturing for microelectronics processing 1992
100-101 1-2 p. 294-
1 p.
artikel
252 Volume contents 1980
100-101 1-2 p. I-
1 p.
artikel
253 VXI packaging and power issues heat up 1992
100-101 1-2 p. 294-
1 p.
artikel
                             253 gevonden resultaten
 
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