| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Acceleration factors for environmental testing of integrated circuits
|
|
|
1971
|
10 |
6 |
p. 412-
1 p.
|
artikel
|
| 2 |
Active filters: new tools for separating frequencies
|
|
|
1971
|
10 |
6 |
p. 417-
1 p.
|
artikel
|
| 3 |
A hybrid thin-film radiosonde transmitter
|
|
|
1971
|
10 |
6 |
p. 419-
1 p.
|
artikel
|
| 4 |
A mechanism of evaluation in MAOS systems
|
|
|
1971
|
10 |
6 |
p. 421-
1 p.
|
artikel
|
| 5 |
A miniature FM telemetry device using thick-film circuitry
|
|
|
1971
|
10 |
6 |
p. 420-
1 p.
|
artikel
|
| 6 |
An algorithm for the reliability evaluation of redundant networks
|
|
|
1971
|
10 |
6 |
p. 415-
1 p.
|
artikel
|
| 7 |
An application of the STD process to hybrid microelectronics
|
|
|
1971
|
10 |
6 |
p. 417-
1 p.
|
artikel
|
| 8 |
An investigation into flip chip bonding
|
Johnson, K.I.
|
|
1971
|
10 |
6 |
p. 451-452
2 p.
|
artikel
|
| 9 |
Anticipatory test monitors IC suppliers process control
|
|
|
1971
|
10 |
6 |
p. 412-413
2 p.
|
artikel
|
| 10 |
Application of photoresists in semiconductor manufacturing
|
|
|
1971
|
10 |
6 |
p. 418-419
2 p.
|
artikel
|
| 11 |
A shorter truncated sequential test
|
|
|
1971
|
10 |
6 |
p. 414-
1 p.
|
artikel
|
| 12 |
A statistical prediction interval for availability
|
|
|
1971
|
10 |
6 |
p. 414-
1 p.
|
artikel
|
| 13 |
A Vamfo-Caris method for determining thicknesses of transparent films with small number of interference extrema
|
|
|
1971
|
10 |
6 |
p. 423-
1 p.
|
artikel
|
| 14 |
Bonded crossovers for thin film circuits
|
|
|
1971
|
10 |
6 |
p. 423-
1 p.
|
artikel
|
| 15 |
Calendar of International Conferences, Symposia, Lectures and Meetings of Interest
|
|
|
1971
|
10 |
6 |
p. 401-402
2 p.
|
artikel
|
| 16 |
Call for papers
|
|
|
1971
|
10 |
6 |
p. 403-406
4 p.
|
artikel
|
| 17 |
Capacitors in microwave integrated circuits
|
|
|
1971
|
10 |
6 |
p. 419-
1 p.
|
artikel
|
| 18 |
Cavity perturbation method for measurement of permittivity and conductivity of medium lossy semiconductors and dielectrics
|
|
|
1971
|
10 |
6 |
p. 421-
1 p.
|
artikel
|
| 19 |
Charge neutrality in semiconductors with implanted impurity profiles
|
|
|
1971
|
10 |
6 |
p. 424-
1 p.
|
artikel
|
| 20 |
Charge storage in MNOS transistors at electric fields near gate insulator breakdown
|
|
|
1971
|
10 |
6 |
p. 420-
1 p.
|
artikel
|
| 21 |
Comparison of variants of integrated digital circuits
|
|
|
1971
|
10 |
6 |
p. 417-
1 p.
|
artikel
|
| 22 |
Component reliability
|
Rackstraw, R.R.
|
|
1971
|
10 |
6 |
p. 425-426
2 p.
|
artikel
|
| 23 |
Computer controlled batch process manufacture of thin film resistor networks on ceramic substrates
|
|
|
1971
|
10 |
6 |
p. 424-
1 p.
|
artikel
|
| 24 |
Confidence limits
|
|
|
1971
|
10 |
6 |
p. 411-
1 p.
|
artikel
|
| 25 |
Cooling of microelectronics
|
|
|
1971
|
10 |
6 |
p. 417-
1 p.
|
artikel
|
| 26 |
Corrosion resistance of several integrated-circuit metallization systems
|
|
|
1971
|
10 |
6 |
p. 412-
1 p.
|
artikel
|
| 27 |
Deposited oxide contours in multi-layer metal circuitry
|
|
|
1971
|
10 |
6 |
p. 416-417
2 p.
|
artikel
|
| 28 |
Deposited oxide contours in multi-layer metal circuitry
|
|
|
1971
|
10 |
6 |
p. 416-
1 p.
|
artikel
|
| 29 |
Design limits when using Gold-Al bonds
|
|
|
1971
|
10 |
6 |
p. 412-
1 p.
|
artikel
|
| 30 |
Design of complex microstrip circuits by measurement and computer modelling
|
|
|
1971
|
10 |
6 |
p. 415-
1 p.
|
artikel
|
| 31 |
Design of customised microelectronics masks using off-line and on-line computer aids
|
|
|
1971
|
10 |
6 |
p. 418-
1 p.
|
artikel
|
| 32 |
Detection-Correction decoding for system reliability
|
|
|
1971
|
10 |
6 |
p. 414-
1 p.
|
artikel
|
| 33 |
Determination of optimum burn-in time: A composite criterion
|
|
|
1971
|
10 |
6 |
p. 411-
1 p.
|
artikel
|
| 34 |
Differential pressure test: A quantitative stress test method for bonded beam-leaded devices
|
|
|
1971
|
10 |
6 |
p. 412-
1 p.
|
artikel
|
| 35 |
Diffusion data Vol. 5, No. 1. (1971)
|
Rule, A.F.E.
|
|
1971
|
10 |
6 |
p. 426-
1 p.
|
artikel
|
| 36 |
Direct liquid cooling of microelectronics
|
|
|
1971
|
10 |
6 |
p. 416-
1 p.
|
artikel
|
| 37 |
Durability and stability of various insulating films against the high temperature water in an autoclave
|
|
|
1971
|
10 |
6 |
p. 421-
1 p.
|
artikel
|
| 38 |
Effect of geometry on double injection in semiconductors
|
|
|
1971
|
10 |
6 |
p. 421-
1 p.
|
artikel
|
| 39 |
Ein schnelles Verfahren zur Berechnung der Auswirkungen von Bauelementetoleranzen bei einer Klasse von Zweitorschaltungen
|
|
|
1971
|
10 |
6 |
p. 415-
1 p.
|
artikel
|
| 40 |
Electrical breakdown and selfhealing in solid tantalum capacitors
|
|
|
1971
|
10 |
6 |
p. 413-
1 p.
|
artikel
|
| 41 |
Electron beams shine on IC layouts
|
|
|
1971
|
10 |
6 |
p. 424-
1 p.
|
artikel
|
| 42 |
Field reliability of plastic encapsulated transistors and integrated circuits
|
Reich, B.
|
|
1971
|
10 |
6 |
p. 461-462
2 p.
|
artikel
|
| 43 |
Guest editorial
|
Jowett, C.E.
|
|
1971
|
10 |
6 |
p. 399-
1 p.
|
artikel
|
| 44 |
High-speed trimming of tantalum resistors
|
|
|
1971
|
10 |
6 |
p. 422-
1 p.
|
artikel
|
| 45 |
Hybrid large-scale integration
|
|
|
1971
|
10 |
6 |
p. 416-
1 p.
|
artikel
|
| 46 |
Hybrid microelectronics S-band receiver
|
|
|
1971
|
10 |
6 |
p. 420-
1 p.
|
artikel
|
| 47 |
Inference on Weibull percentiles from sudden death tests using maximum likelihood
|
|
|
1971
|
10 |
6 |
p. 412-
1 p.
|
artikel
|
| 48 |
Insertion techniques for dual in-line package integrated circuits
|
|
|
1971
|
10 |
6 |
p. 416-
1 p.
|
artikel
|
| 49 |
Isolation method shrinks bipolar cells for fast, dense memories
|
|
|
1971
|
10 |
6 |
p. 420-
1 p.
|
artikel
|
| 50 |
Japan-France Symposium
|
|
|
1971
|
10 |
6 |
p. 407-
1 p.
|
artikel
|
| 51 |
Laser resistance trimming from the measurement point of view
|
|
|
1971
|
10 |
6 |
p. 424-
1 p.
|
artikel
|
| 52 |
Letter to the editor
|
Reiche, H.
|
|
1971
|
10 |
6 |
p. 400-
1 p.
|
artikel
|
| 53 |
LOCOS: A new I.C. technology
|
|
|
1971
|
10 |
6 |
p. 471-472
2 p.
|
artikel
|
| 54 |
Markov approach to finding failure times of repairable systems
|
|
|
1971
|
10 |
6 |
p. 415-
1 p.
|
artikel
|
| 55 |
Measurement of resistivity of silicon by the spreading resistance method
|
|
|
1971
|
10 |
6 |
p. 420-421
2 p.
|
artikel
|
| 56 |
Metallization systems for integrated circuits
|
|
|
1971
|
10 |
6 |
p. 419-
1 p.
|
artikel
|
| 57 |
Microelectronics
|
G.W.A.D.,
|
|
1971
|
10 |
6 |
p. 425-
1 p.
|
artikel
|
| 58 |
Microprogramming made easy—with a 4,096-bit bipolar ROM
|
|
|
1971
|
10 |
6 |
p. 419-
1 p.
|
artikel
|
| 59 |
Minimization of misclassification of component failures in a two-component system
|
|
|
1971
|
10 |
6 |
p. 412-
1 p.
|
artikel
|
| 60 |
MOSFETS rejuvenate old design for CATV broadband amplifiers
|
|
|
1971
|
10 |
6 |
p. 419-
1 p.
|
artikel
|
| 61 |
Network approaches to finding the reliability of repairable systems
|
|
|
1971
|
10 |
6 |
p. 413-414
2 p.
|
artikel
|
| 62 |
Ni-Cr Resistor contact reliability
|
|
|
1971
|
10 |
6 |
p. 413-
1 p.
|
artikel
|
| 63 |
Noise of hot holes in space-charge-limited germanium diodes
|
|
|
1971
|
10 |
6 |
p. 421-
1 p.
|
artikel
|
| 64 |
On determining the reliability of protective relay systems
|
|
|
1971
|
10 |
6 |
p. 414-
1 p.
|
artikel
|
| 65 |
“On the chip” multilevel interconnection
|
|
|
1971
|
10 |
6 |
p. 418-
1 p.
|
artikel
|
| 66 |
On the usefulness of the maximum entropy principle in the Bayesian estimation of reliability
|
|
|
1971
|
10 |
6 |
p. 411-412
2 p.
|
artikel
|
| 67 |
Optimal Reliability of a complex system
|
|
|
1971
|
10 |
6 |
p. 414-
1 p.
|
artikel
|
| 68 |
Papers to be published in future issues
|
|
|
1971
|
10 |
6 |
p. 427-
1 p.
|
artikel
|
| 69 |
Plasma-grown Al2O3 for COS/MOS integrated circuits
|
|
|
1971
|
10 |
6 |
p. 418-
1 p.
|
artikel
|
| 70 |
Practical consideration affecting thick-film conductor adherence of solder systems
|
|
|
1971
|
10 |
6 |
p. 422-
1 p.
|
artikel
|
| 71 |
Precision adjusted, beam-leaded, thin film resistors
|
|
|
1971
|
10 |
6 |
p. 423-
1 p.
|
artikel
|
| 72 |
Precision measurement of resistor networks
|
|
|
1971
|
10 |
6 |
p. 422-
1 p.
|
artikel
|
| 73 |
Radiation-induced perturbations in metal-insulator-semiconductor structures
|
|
|
1971
|
10 |
6 |
p. 421-
1 p.
|
artikel
|
| 74 |
Random failure
|
|
|
1971
|
10 |
6 |
p. 412-
1 p.
|
artikel
|
| 75 |
Recent United Kingdom patents in microelectronics
|
|
|
1971
|
10 |
6 |
p. 409-410
2 p.
|
artikel
|
| 76 |
Reduction of electromigration—induced failure in aluminum metallization through anodization
|
|
|
1971
|
10 |
6 |
p. 413-
1 p.
|
artikel
|
| 77 |
Reliability analysis of large nonrepairable systems
|
|
|
1971
|
10 |
6 |
p. 414-415
2 p.
|
artikel
|
| 78 |
Reliability of MgAl Semiconductor Interconnects
|
|
|
1971
|
10 |
6 |
p. 416-
1 p.
|
artikel
|
| 79 |
Reliability of switching networks for impediment of trunk lines
|
|
|
1971
|
10 |
6 |
p. 414-
1 p.
|
artikel
|
| 80 |
Reliability of thermoelectric couple networks based upon couple catastrophic failures
|
|
|
1971
|
10 |
6 |
p. 413-
1 p.
|
artikel
|
| 81 |
Renewal theoretic aspects of two-unit redundant systems
|
|
|
1971
|
10 |
6 |
p. 415-
1 p.
|
artikel
|
| 82 |
Scanning electron microscopy studies on switching lateral transistors in integrated circuits
|
|
|
1971
|
10 |
6 |
p. 424-
1 p.
|
artikel
|
| 83 |
Schottky barriers on p-type silicon
|
|
|
1971
|
10 |
6 |
p. 421-
1 p.
|
artikel
|
| 84 |
Some bounds for the reliability of a system with specified failure rate characteristics
|
|
|
1971
|
10 |
6 |
p. 413-
1 p.
|
artikel
|
| 85 |
Some observations on the controlled oxidation of silicon
|
Joyce, B.A.
|
|
1971
|
10 |
6 |
p. 473-
1 p.
|
artikel
|
| 86 |
Squeegee pressure and thick-film resistor fabrication
|
|
|
1971
|
10 |
6 |
p. 423-
1 p.
|
artikel
|
| 87 |
Survey of semiconductor joining techniques
|
|
|
1971
|
10 |
6 |
p. 418-
1 p.
|
artikel
|
| 88 |
Techniques for optimum spares allocation: A tutorial review
|
|
|
1971
|
10 |
6 |
p. 414-
1 p.
|
artikel
|
| 89 |
Temperature coefficient of tantalum nitride film resistor
|
|
|
1971
|
10 |
6 |
p. 422-
1 p.
|
artikel
|
| 90 |
Testing for adhesion of hybrid films
|
|
|
1971
|
10 |
6 |
p. 423-
1 p.
|
artikel
|
| 91 |
Testing integrated circuits with a laser beam
|
|
|
1971
|
10 |
6 |
p. 424-
1 p.
|
artikel
|
| 92 |
Test of McWhorter's model of low-frequency noise in Si MOSTs
|
Berz, F.
|
|
1971
|
10 |
6 |
p. 429-433
5 p.
|
artikel
|
| 93 |
The effects of in-process heating on K1200 monolithic multilayer capacitors
|
|
|
1971
|
10 |
6 |
p. 419-
1 p.
|
artikel
|
| 94 |
The influence of stacking faults on leakage currents of FET devices
|
Schwuttke, G.H.
|
|
1971
|
10 |
6 |
p. 467-470
4 p.
|
artikel
|
| 95 |
The influence of the reaction kinetics of O2 and source flow rates on the uniformity of boron and arsenic diffusions
|
|
|
1971
|
10 |
6 |
p. 422-
1 p.
|
artikel
|
| 96 |
The measurement of linear circuits with a computer-operated system
|
|
|
1971
|
10 |
6 |
p. 419-420
2 p.
|
artikel
|
| 97 |
Thermal behavior and aging of tantalum nitride thin film resistors under pulsed operation
|
|
|
1971
|
10 |
6 |
p. 422-423
2 p.
|
artikel
|
| 98 |
Thermal emission and capture of electrons at sulfur centers in silicon
|
|
|
1971
|
10 |
6 |
p. 420-
1 p.
|
artikel
|
| 99 |
The TBA631-IF/FM limiter-amplifier; FM detector; Low frequency power amplifier
|
Bertotti, F.
|
|
1971
|
10 |
6 |
p. 435-449
15 p.
|
artikel
|
| 100 |
The Teaching of integrated circuits: Analysis, design and fabrication
|
|
|
1971
|
10 |
6 |
p. 415-416
2 p.
|
artikel
|
| 101 |
The use of passive chip components in hybrid integrated circuits
|
|
|
1971
|
10 |
6 |
p. 419-
1 p.
|
artikel
|
| 102 |
Thick film substrates for beam lead and flip chip attachments
|
|
|
1971
|
10 |
6 |
p. 422-
1 p.
|
artikel
|
| 103 |
Thin film circuit resistor adjustment and conductor verification employing a programmable facility
|
|
|
1971
|
10 |
6 |
p. 423-
1 p.
|
artikel
|
| 104 |
Thin film laser machining
|
|
|
1971
|
10 |
6 |
p. 424-
1 p.
|
artikel
|
| 105 |
Turn around time for custom LSI reduced using reprocessed multilayers
|
|
|
1971
|
10 |
6 |
p. 418-
1 p.
|
artikel
|
| 106 |
Unique Bi-fold microcircuit packaging design
|
|
|
1971
|
10 |
6 |
p. 417-
1 p.
|
artikel
|
| 107 |
Warranty periods based on three ordered sample observations from Weibull population
|
|
|
1971
|
10 |
6 |
p. 415-
1 p.
|
artikel
|
Tijdschrift beschrijving