nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Aging studies on transformer insulating materials (Class A) by means of infra-red spectroscopy
|
Lengyel, G |
|
1962 |
1 |
3 |
p. 227-232 6 p. |
artikel |
2 |
An evaporated film 135-cryotron memory plane
|
Kraus, C.J |
|
1962 |
1 |
3 |
p. 245-246 2 p. |
artikel |
3 |
Bibliography and chapter headings of some useful books on reliability and microminiaturization
|
|
|
1962 |
1 |
3 |
p. 271-274 4 p. |
artikel |
4 |
Low-level redundancy as a means of improving digital computer reliability
|
Cluley, J.C |
|
1962 |
1 |
3 |
p. 203-216 14 p. |
artikel |
5 |
Micrologic elements
|
Norman, R.H |
|
1962 |
1 |
3 |
p. 251-254 4 p. |
artikel |
6 |
Microminiaturization
|
Granville, J.W |
|
1962 |
1 |
3 |
p. 269- 1 p. |
artikel |
7 |
Microminiaturization and molecular electronics
|
Alberts, R.D |
|
1962 |
1 |
3 |
p. 233-234 2 p. |
artikel |
8 |
Molecular electronics and microsystems
|
Stelmak, J.P |
|
1962 |
1 |
3 |
p. 261-266 6 p. |
artikel |
9 |
Recent progress in microelectronics
|
Apstein, M |
|
1962 |
1 |
3 |
p. 239-242 4 p. |
artikel |
10 |
Reliability principles and practices
|
Dummer, G.W.A |
|
1962 |
1 |
3 |
p. 269-270 2 p. |
artikel |
11 |
Reliability through controlled environments and microminiaturization
|
Dummer, G.W.A |
|
1962 |
1 |
3 |
p. 189-201 13 p. |
artikel |
12 |
The reliability of a silicon alloy transistor
|
Honeychurch, J |
|
1962 |
1 |
3 |
p. 217-225 9 p. |
artikel |