| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Advanced RBSOA analysis for advanced power BJTs
|
Busatto, Giovanni
|
|
1996
|
|
7-8 |
p. 1077-1093
17 p.
|
artikel
|
| 2 |
A methodology for microcontroller signal frequency stress prediction
|
Hsieh, Sheng-Jen
|
|
2005
|
|
7-8 |
p. 1243-1251
9 p.
|
artikel
|
| 3 |
An analytical threshold voltage model of NMOSFETs with hot-carrier induced interface charge effect
|
Ho, C.S.
|
|
2005
|
|
7-8 |
p. 1144-1149
6 p.
|
artikel
|
| 4 |
An investigation of electrical and structural properties of Ni-germanosilicided Schottky diode
|
Saha, A.R.
|
|
2005
|
|
7-8 |
p. 1154-1160
7 p.
|
artikel
|
| 5 |
Announcement
|
|
|
1996
|
|
7-8 |
p. 1139-
1 p.
|
artikel
|
| 6 |
A review of hot-carrier degradation mechanisms in MOSFETs
|
Acovic, Alexander
|
|
1996
|
|
7-8 |
p. 845-869
25 p.
|
artikel
|
| 7 |
Bipolar mechanisms present in short channel SOI-MOSFET transistors
|
Janczyk, G.
|
|
2005
|
|
7-8 |
p. 1257-1263
7 p.
|
artikel
|
| 8 |
Blue shift and mirror degradation in InGaAs GaAs strained quantum well lasers
|
Serra, L.
|
|
1996
|
|
7-8 |
p. 1095-1105
11 p.
|
artikel
|
| 9 |
Breakdown of thin gate silicon dioxide films—A review
|
Nafría, M.
|
|
1996
|
|
7-8 |
p. 871-905
35 p.
|
artikel
|
| 10 |
Built-in self-test and diagnostic support for safety critical microsystems
|
Olbrich, T.
|
|
1996
|
|
7-8 |
p. 1125-1136
12 p.
|
artikel
|
| 11 |
Carrier separation analysis for clarifying carrier conduction and degradation mechanisms in high-k stack gate dielectrics
|
Mizubayashi, Wataru
|
|
2005
|
|
7-8 |
p. 1041-1050
10 p.
|
artikel
|
| 12 |
Chip-packaging interaction: a critical concern for Cu/low k packaging
|
Wang, Guotao
|
|
2005
|
|
7-8 |
p. 1079-1093
15 p.
|
artikel
|
| 13 |
Conduction mechanisms and an evidence for phonon-assisted conduction process in thin high-k Hf x Ti y Si z O films
|
Paskaleva, A.
|
|
2005
|
|
7-8 |
p. 1124-1133
10 p.
|
artikel
|
| 14 |
Considerations for evaluating hot-electron reliability of strained Si n-channel MOSFETs
|
Kelly, D.Q.
|
|
2005
|
|
7-8 |
p. 1033-1040
8 p.
|
artikel
|
| 15 |
Copper interconnect electromigration behaviors in various structures and lifetime improvement by cap/dielectric interface treatment
|
Lin, M.H.
|
|
2005
|
|
7-8 |
p. 1061-1078
18 p.
|
artikel
|
| 16 |
Determination of self-heating and thermal resistance in polycrystalline and bulk silicon resistors by DC measurements
|
Sauter, Martin
|
|
2005
|
|
7-8 |
p. 1187-1193
7 p.
|
artikel
|
| 17 |
Development of process modeling methodology for flip chip on flex interconnections with non-conductive adhesives
|
Zhang, Xiaowu
|
|
2005
|
|
7-8 |
p. 1215-1221
7 p.
|
artikel
|
| 18 |
Diagnosis in submicron integrated circuits by electric force microscopy
|
Böhm, C.
|
|
1996
|
|
7-8 |
p. 1113-1118
6 p.
|
artikel
|
| 19 |
Diagnostics of the quality of MOSFETs
|
Vandamme, E.P.
|
|
1996
|
|
7-8 |
p. 1107-1112
6 p.
|
artikel
|
| 20 |
Dynamic NBTI lifetime model for inverter-like waveform
|
Tan, Shyue Seng
|
|
2005
|
|
7-8 |
p. 1115-1118
4 p.
|
artikel
|
| 21 |
Editorial
|
Stojadinović, Ninoslav
|
|
1996
|
|
7-8 |
p. 843-844
2 p.
|
artikel
|
| 22 |
Effect of localized traps on the anomalous behavior of the transconductance in nanocrystalline TFTs
|
Estrada, M.
|
|
2005
|
|
7-8 |
p. 1161-1166
6 p.
|
artikel
|
| 23 |
Electrical and radiation tests of thin tunnel oxides
|
Paccagnella, A.
|
|
1996
|
|
7-8 |
p. 1033-1044
12 p.
|
artikel
|
| 24 |
Electrical properties of highly reliable 32Mb FRAM with advanced capacitor technology
|
Song, Y.J.
|
|
2005
|
|
7-8 |
p. 1150-1153
4 p.
|
artikel
|
| 25 |
Electromigration failure of contacts and vias in sub-micron integrated circuit metallizations
|
Oates, Anthony S.
|
|
1996
|
|
7-8 |
p. 925-953
29 p.
|
artikel
|
| 26 |
Electromigration in Al based stripes: Low frequency noise measurements and MTF tests
|
Bagnoli, P.E.
|
|
1996
|
|
7-8 |
p. 1045-1050
6 p.
|
artikel
|
| 27 |
Electrostatic discharge directly to the chip surface, caused by automatic post-wafer processing
|
Jacob, Peter
|
|
2005
|
|
7-8 |
p. 1174-1180
7 p.
|
artikel
|
| 28 |
Electrostatic micromotor and its reliability
|
Zhang, Wenming
|
|
2005
|
|
7-8 |
p. 1230-1242
13 p.
|
artikel
|
| 29 |
ESD issues for advanced CMOS technologies
|
Duvvury, Charvaka
|
|
1996
|
|
7-8 |
p. 907-924
18 p.
|
artikel
|
| 30 |
Failure-analysis-based test chip design for quick yield improvement
|
Hashimoto, Chisato
|
|
1996
|
|
7-8 |
p. 1063-1075
13 p.
|
artikel
|
| 31 |
Failures induced on analog integrated circuits by conveyed electromagnetic interferences: A review
|
Masetti, G.
|
|
1996
|
|
7-8 |
p. 955-972
18 p.
|
artikel
|
| 32 |
High voltage applications and NBTI effects of DT-pMOSFETS with reverse Schottky substrate contacts
|
Lee, Yao-Jen
|
|
2005
|
|
7-8 |
p. 1119-1123
5 p.
|
artikel
|
| 33 |
Implementation, analysis and performance evaluation of the IRP replacement policy
|
Jaragh, Mansour
|
|
2005
|
|
7-8 |
p. 1264-1269
6 p.
|
artikel
|
| 34 |
Improving reliability of thick film initiators for automotive applications based on FE-analyses
|
Smetana, W.
|
|
2005
|
|
7-8 |
p. 1194-1201
8 p.
|
artikel
|
| 35 |
Lateral punch-through TVS devices for on-chip protection in low-voltage applications
|
Urresti, J.
|
|
2005
|
|
7-8 |
p. 1181-1186
6 p.
|
artikel
|
| 36 |
List of reviewers
|
|
|
1996
|
|
7-8 |
p. 1137-
1 p.
|
artikel
|
| 37 |
Modeling of NBTI saturation effect and its impact on electric field dependence of the lifetime
|
Aono, H.
|
|
2005
|
|
7-8 |
p. 1109-1114
6 p.
|
artikel
|
| 38 |
Modelling considerations and development of upper limits of stress conditions for dielectric breakdown projections
|
Vollertsen, R.-P.
|
|
1996
|
|
7-8 |
p. 1019-1031
13 p.
|
artikel
|
| 39 |
Monolithic active pixel sensor realized in SOI technology—concept and verification
|
Niemiec, H.
|
|
2005
|
|
7-8 |
p. 1202-1207
6 p.
|
artikel
|
| 40 |
New encapsulation development for fine pitch IC devices
|
Yao, Y.F.
|
|
2005
|
|
7-8 |
p. 1222-1229
8 p.
|
artikel
|
| 41 |
[No title]
|
Stojcev, Mile
|
|
2005
|
|
7-8 |
p. 1272-
1 p.
|
artikel
|
| 42 |
[No title]
|
Stojcev, Mile
|
|
2005
|
|
7-8 |
p. 1270-1271
2 p.
|
artikel
|
| 43 |
[No title]
|
Stojcev, Mile
|
|
2005
|
|
7-8 |
p. 1273-1274
2 p.
|
artikel
|
| 44 |
Optimizing the hot carrier reliability of N-LDMOS transistor arrays
|
Brisbin, Douglas
|
|
2005
|
|
7-8 |
p. 1021-1032
12 p.
|
artikel
|
| 45 |
Plastic packages survive where hermetic packages fail
|
Sinnadurai, Nihal
|
|
1996
|
|
7-8 |
p. 1001-1018
18 p.
|
artikel
|
| 46 |
Process improvement of 0.13μm Cu/Low K (Black DiamondTM) dual damascene interconnection
|
Li, H.Y.
|
|
2005
|
|
7-8 |
p. 1134-1143
10 p.
|
artikel
|
| 47 |
Pseudomorphic HEMTs reliability with scattering and noise parameters
|
Conti, P.
|
|
1996
|
|
7-8 |
p. 1119-1124
6 p.
|
artikel
|
| 48 |
Reliability of erasing operation in NOR-Flash memories
|
Chimenton, Andrea
|
|
2005
|
|
7-8 |
p. 1094-1108
15 p.
|
artikel
|
| 49 |
Reliability of InGaAs InP based separate absorption grading multiplication avalanche photodiodes
|
Montangero, P.
|
|
1996
|
|
7-8 |
p. 973-1000
28 p.
|
artikel
|
| 50 |
Reliability study of new SnZnAl lead-free solders used in CSP packages
|
Kitajima, Masayuki
|
|
2005
|
|
7-8 |
p. 1208-1214
7 p.
|
artikel
|
| 51 |
Size effects on the DC characteristics and low frequency noise of double polysilicon NPN bipolar transistors
|
Valdaperez, Nicolas
|
|
2005
|
|
7-8 |
p. 1167-1173
7 p.
|
artikel
|
| 52 |
Study on the RF Sputtered hydrogenated amorphous silicon–germanium thin films
|
Serényi, M.
|
|
2005
|
|
7-8 |
p. 1252-1256
5 p.
|
artikel
|
| 53 |
The evolution of the microscopic damage in electromigration studied by multiple electrical measurements
|
Jone, B.K.
|
|
1996
|
|
7-8 |
p. 1051-1062
12 p.
|
artikel
|
| 54 |
Threshold voltage instability characteristics of HfO2 dielectrics n-MOSFETs
|
Rhee, Se Jong
|
|
2005
|
|
7-8 |
p. 1051-1060
10 p.
|
artikel
|
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