nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A comparison of traveling-wave ultrasonic amplification in solids by resistive and resonant processes
|
Carleton, H.R. |
|
1965 |
8 |
3 |
p. 285-294 10 p. |
artikel |
2 |
An alloy process for making high current density silicon tunnel diode junctions
|
Franks, V.M. |
|
1965 |
8 |
3 |
p. 343-344 2 p. |
artikel |
3 |
Breakdown characteristics and light emissions observed on silicon alloyed pn junctions
|
Migitaka, M. |
|
1965 |
8 |
3 |
p. 295-298 4 p. |
artikel |
4 |
Determination of the intrinsic density of silicon below the temperature of intrinsic conduction from electric measurements on transistors
|
Benda, H. |
|
1965 |
8 |
3 |
p. 189-210 22 p. |
artikel |
5 |
Die galvano- und thermomagnetischen effekte des InSbNiSbEutektikums
|
Wagini, H. |
|
1965 |
8 |
3 |
p. 241-254 14 p. |
artikel |
6 |
Double diffused gallium arsenide transistors
|
Becke, H. |
|
1965 |
8 |
3 |
p. 255-265 11 p. |
artikel |
7 |
Effect of surface traps on characteristics of insulated-gate field-effect transistors
|
O'Reilly, T.J. |
|
1965 |
8 |
3 |
p. 267-274 8 p. |
artikel |
8 |
Magnetoresistance of InSbNiSb at microwave frequency
|
Sun, S.F. |
|
1965 |
8 |
3 |
p. 344-346 3 p. |
artikel |
9 |
Minority carrier injection and charge storage in epitaxial Schottky barrier diodes
|
Scharfetter, D.L. |
|
1965 |
8 |
3 |
p. 299-311 13 p. |
artikel |
10 |
Physical limitations on the frequency response of a semiconductor surface inversion layer
|
Hofstein, S.R. |
|
1965 |
8 |
3 |
p. 321-341 21 p. |
artikel |
11 |
Physics of III–V compounds
|
Dunlap, W.Crawford |
|
1965 |
8 |
3 |
p. 347-348 2 p. |
artikel |
12 |
P + IN + silicon diodes at high forward current densities
|
Howard, N.R. |
|
1965 |
8 |
3 |
p. 275-284 10 p. |
artikel |
13 |
Structural and operational characteristics of piezo-transistors and allied devices
|
Rindner, W. |
|
1965 |
8 |
3 |
p. 227-240 14 p. |
artikel |
14 |
Surface capacity of oxide coated semiconductors
|
Hall, R. |
|
1965 |
8 |
3 |
p. 211-226 16 p. |
artikel |
15 |
The effect of ambients on the charge density and carrier mobility in a silicon-silicon dioxide interface
|
Deshpande, R.Y. |
|
1965 |
8 |
3 |
p. 313-319 7 p. |
artikel |