no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
1 |
Accurate thermal analysis of GaN HFETs
|
Conway, A.M. |
|
2008 |
52 |
5 |
p. 637-643 7 p. |
article |
2 |
A fully 2-dimensional, quantum mechanical calculation of short-channel and drain induced barrier lowering effects in HEMTs
|
Krokidis, G. |
|
2008 |
52 |
5 |
p. 625-631 7 p. |
article |
3 |
A 10GHz low phase-noise CMOS voltage-controlled oscillator using dual-transformer technology
|
Chiu, Hsien-Chin |
|
2008 |
52 |
5 |
p. 765-770 6 p. |
article |
4 |
A Monte Carlo study of Si/SiGe MITATT diodes for terahertz power generation
|
Bi, Xiaochuan |
|
2008 |
52 |
5 |
p. 688-694 7 p. |
article |
5 |
Analytical description of the injection ratio of self-biased bipolar transistors under the very high injection conditions of ESD events
|
Gendron, A. |
|
2008 |
52 |
5 |
p. 663-674 12 p. |
article |
6 |
Analytical extraction of small and large signal models for FinFET varactors
|
Crupi, Giovanni |
|
2008 |
52 |
5 |
p. 704-710 7 p. |
article |
7 |
Analytical modeling and numerical simulations of the thermal behavior of trench-isolated bipolar transistors on SOI substrates
|
Marano, I. |
|
2008 |
52 |
5 |
p. 730-739 10 p. |
article |
8 |
Bulk lifetime and efficiency enhancement due to gettering and hydrogenation of defects during cast multicrystalline silicon solar cell fabrication
|
Sheoran, Manav |
|
2008 |
52 |
5 |
p. 612-617 6 p. |
article |
9 |
Dynamics of AlGaN based detectors in the deep-UV
|
Mazzeo, G. |
|
2008 |
52 |
5 |
p. 795-800 6 p. |
article |
10 |
Editorial Board
|
|
|
2008 |
52 |
5 |
p. IFC- 1 p. |
article |
11 |
Effect of gate length in InAs/AlSb HEMTs biased for low power or high gain
|
Borg, Malin |
|
2008 |
52 |
5 |
p. 775-781 7 p. |
article |
12 |
Fabrication and characterizations of ZnO thin film transistors prepared by using radio frequency magnetron sputtering
|
Navamathavan, R. |
|
2008 |
52 |
5 |
p. 813-816 4 p. |
article |
13 |
Formation, etching and electrical characterization of a thermally grown gallium oxide on the Ga-face of a bulk GaN substrate
|
Zhou, Yi |
|
2008 |
52 |
5 |
p. 756-764 9 p. |
article |
14 |
Growth and optical properties of Zn:Ce:Cu:LiNbO3 single crystals
|
Ma, Decai |
|
2008 |
52 |
5 |
p. 644-648 5 p. |
article |
15 |
High gate voltage drain current leveling off and its low-frequency noise in 65nm fully-depleted strained and non-strained SOI nMOSFETs
|
Lukyanchikova, N. |
|
2008 |
52 |
5 |
p. 801-807 7 p. |
article |
16 |
High-performance white organic light-emitting device using non-doped-type structure
|
Yang, Huishan |
|
2008 |
52 |
5 |
p. 657-662 6 p. |
article |
17 |
High power density, high efficiency 1W SiGe power HBT for 2.4GHz power amplifier applications
|
Yeh, Ping-Chun |
|
2008 |
52 |
5 |
p. 745-748 4 p. |
article |
18 |
Hopping photoconductivity and the effectiveness of phonon detection in GaAs:Zn bolometers
|
Taele, B.M. |
|
2008 |
52 |
5 |
p. 782-786 5 p. |
article |
19 |
Hot-carrier effects as a function of silicon film thickness in nanometer-scale SOI pMOSFETs
|
Jang, Sung Jun |
|
2008 |
52 |
5 |
p. 824-829 6 p. |
article |
20 |
Influence of oxynitride (SiO x N y ) passivation on the microwave performance of AlGaN/GaN HEMTs
|
Desmaris, V. |
|
2008 |
52 |
5 |
p. 632-636 5 p. |
article |
21 |
Low-frequency noise properties of double channel AlGaN/GaN HEMTs
|
Jha, S.K. |
|
2008 |
52 |
5 |
p. 606-611 6 p. |
article |
22 |
Microwave performance of field-plate 0.13-μm MOS transistors with varying field-plate extension
|
Chiu, Hsien-Chin |
|
2008 |
52 |
5 |
p. 725-729 5 p. |
article |
23 |
Mobility model for compact device modeling of OTFTs made with different materials
|
Estrada, M. |
|
2008 |
52 |
5 |
p. 787-794 8 p. |
article |
24 |
Modeling non-quasi-static effects in channel thermal noise and induced-gate noise in MOS field-effect transistors
|
Deshpande, Abhay |
|
2008 |
52 |
5 |
p. 771-774 4 p. |
article |
25 |
Modeling of potentials and threshold voltage for symmetric doped double-gate MOSFETs
|
Cerdeira, A. |
|
2008 |
52 |
5 |
p. 830-837 8 p. |
article |
26 |
Physics-based 1/f noise model for MOSFETs with nitrided high-κ gate dielectrics
|
Morshed, Tanvir Hasan |
|
2008 |
52 |
5 |
p. 711-724 14 p. |
article |
27 |
Pressure induced, electronic and optical properties of zincblende InP
|
Parashari, Satyam S. |
|
2008 |
52 |
5 |
p. 749-755 7 p. |
article |
28 |
Pulse input Class-C power amplifier response of SiC MESFET using physical transistor structure in TCAD
|
Azam, Sher |
|
2008 |
52 |
5 |
p. 740-744 5 p. |
article |
29 |
Realizing high voltage SJ-LDMOS with non-uniform N-buried layer
|
Chen, Wanjun |
|
2008 |
52 |
5 |
p. 675-678 4 p. |
article |
30 |
Schottky rectifiers fabricated on bulk GaN substrate analyzed by electron-beam induced current technique
|
Lu, Hai |
|
2008 |
52 |
5 |
p. 817-823 7 p. |
article |
31 |
Solar-blind MSM-photodetectors based on Al x Ga1−x N/GaN heterostructures grown by MOCVD
|
Averine, S.V. |
|
2008 |
52 |
5 |
p. 618-624 7 p. |
article |
32 |
Subthreshold characteristics of polysilicon TFTs
|
Deng, Wanling |
|
2008 |
52 |
5 |
p. 695-703 9 p. |
article |
33 |
The effect of a smart body tie on the bottom-gate thin film transistor
|
Lin, Jyi-Tsong |
|
2008 |
52 |
5 |
p. 808-812 5 p. |
article |
34 |
The effects of radiation-induced interface traps on base current in gated bipolar test structures
|
Chen, X.J. |
|
2008 |
52 |
5 |
p. 683-687 5 p. |
article |
35 |
Transient charge pumping as an efficient technique to measure low light intensity with PD SOI MOSFET
|
Harik, L. |
|
2008 |
52 |
5 |
p. 597-605 9 p. |
article |
36 |
Ultraviolet Schottky detector based on epitaxial ZnO thin film
|
Jiang, Dayong |
|
2008 |
52 |
5 |
p. 679-682 4 p. |
article |
37 |
Variation and mismatch effects of the low-temperature poly-Si TFTs on the circuit for the X-ray active matrix sensor
|
Tai, Ya-Hsiang |
|
2008 |
52 |
5 |
p. 649-656 8 p. |
article |