nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Accurate modeling of gate capacitance in deep submicron MOSFETs with high-K gate-dielectrics
|
Hakim, M.M.A. |
|
2004 |
48 |
7 |
p. 1095-1100 6 p. |
artikel |
2 |
Analysis of 2-D quantum effects in the poly-gate and their impact on the short-channel effects in double-gate MOSFETs via the density-gradient method
|
Park, Ji-Sun |
|
2004 |
48 |
7 |
p. 1163-1168 6 p. |
artikel |
3 |
Analysis of improved dc and ac performances of an InGaP/GaAs heterojunction bipolar transistor with a graded Al x Ga1−x As layer at emitter/base heterojunction
|
Cheng, Shiou-Ying |
|
2004 |
48 |
7 |
p. 1087-1094 8 p. |
artikel |
4 |
A seven-parameter nonlinear I–V characteristics model for sub-μm range GaAs MESFETs
|
Islam, M.S. |
|
2004 |
48 |
7 |
p. 1111-1117 7 p. |
artikel |
5 |
Conduction type change with annealing in thin silicon-on-insulator wafers
|
Shibata, Yoshitake |
|
2004 |
48 |
7 |
p. 1249-1252 4 p. |
artikel |
6 |
Design considerations for novel device architecture: hetero-material double-gate (HEM-DG) MOSFET with sub-100 nm gate length
|
Saxena, Manoj |
|
2004 |
48 |
7 |
p. 1169-1174 6 p. |
artikel |
7 |
Effect of technology scaling on the 1/f noise of deep submicron PMOS transistors
|
Chew, K.W. |
|
2004 |
48 |
7 |
p. 1101-1109 9 p. |
artikel |
8 |
Electrothermal simulations of high-power SOI vertical DMOS transistors with lateral drain contacts under unclamped inductive switching test
|
Pinardi, Kuntjoro |
|
2004 |
48 |
7 |
p. 1119-1126 8 p. |
artikel |
9 |
Elimination of current instability and improvement of RF power performance using Si3N4 passivation in SiC lateral epitaxy MESFETs
|
Cha, Ho-Young |
|
2004 |
48 |
7 |
p. 1233-1237 5 p. |
artikel |
10 |
Fabrication of trench-gate power MOSFETs by using a dual doped body region
|
Juang, M.H. |
|
2004 |
48 |
7 |
p. 1079-1085 7 p. |
artikel |
11 |
Further improvements in equivalent-circuit model with levelized incomplete LU factorization for mixed-level semiconductor device and circuit simulation
|
Dai, Jing-Fu |
|
2004 |
48 |
7 |
p. 1181-1188 8 p. |
artikel |
12 |
Gallium nitride: the promise of high RF power and low microwave noise performance in S and I band
|
Oxley, C.H. |
|
2004 |
48 |
7 |
p. 1197-1203 7 p. |
artikel |
13 |
Gate-induced floating-body effect in fully-depleted SOI MOSFETs with tunneling oxide and back-gate biasing
|
Cassé, M. |
|
2004 |
48 |
7 |
p. 1243-1247 5 p. |
artikel |
14 |
Germanium profile design options for SiGe LEC HBTs
|
Schroter, Michael |
|
2004 |
48 |
7 |
p. 1133-1146 14 p. |
artikel |
15 |
High reliability GaN-based light-emitting diodes with photo-enhanced wet etching
|
Chen, Lung-Chien |
|
2004 |
48 |
7 |
p. 1239-1242 4 p. |
artikel |
16 |
Impact of gate tunneling floating-body charging on drain current transients of 0.10 μm-CMOS partially depleted SOI MOSFETs
|
Rafı́, J.M. |
|
2004 |
48 |
7 |
p. 1211-1221 11 p. |
artikel |
17 |
Improved subthreshold slope method for precise extraction of gate capacitive coupling coefficients in stacked gate and source-side injection flash memory cells
|
Cho, Caleb Yu-Sheng |
|
2004 |
48 |
7 |
p. 1189-1195 7 p. |
artikel |
18 |
Modelling and characterisation of the OCVD response at an arbitrary time and injection level
|
Bellone, Salvatore |
|
2004 |
48 |
7 |
p. 1127-1131 5 p. |
artikel |
19 |
Observation of anomalous leakage increase of narrow and short BCPMOS
|
Xu, Y.Z. |
|
2004 |
48 |
7 |
p. 1175-1179 5 p. |
artikel |
20 |
Role of multiple delta doping in PHEMTs scaled to sub-100 nm dimensions
|
Kalna, K. |
|
2004 |
48 |
7 |
p. 1223-1232 10 p. |
artikel |
21 |
Schottky barrier characteristics of ternary silicide Co1−x Ni x Si2 on n-Si(100) contacts formed by solid phase reaction of multilayer
|
Zhu, Shiyang |
|
2004 |
48 |
7 |
p. 1205-1209 5 p. |
artikel |
22 |
Self-consistent simulations of mesoscopic devices operating under a finite bias
|
Forsberg, Erik |
|
2004 |
48 |
7 |
p. 1147-1154 8 p. |
artikel |
23 |
Source-gated transistors in hydrogenated amorphous silicon
|
Shannon, J.M. |
|
2004 |
48 |
7 |
p. 1155-1161 7 p. |
artikel |