Digitale Bibliotheek
Sluiten Bladeren door artikelen uit een tijdschrift
     Tijdschrift beschrijving
       Alle jaargangen van het bijbehorende tijdschrift
         Alle afleveringen van het bijbehorende jaargang
                                       Alle artikelen van de bijbehorende aflevering
 
                             23 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Advanced SOI MOSFETs with buried alumina and ground plane: self-heating and short-channel effects Oshima, K.
2004
48 6 p. 907-917
11 p.
artikel
2 Analysis of heavy-ion induced charge collection mechanisms in SOI circuits Schwank, J.R
2004
48 6 p. 1027-1044
18 p.
artikel
3 A process/physics-based compact model for nonclassical CMOS device and circuit design Fossum, J.G.
2004
48 6 p. 919-926
8 p.
artikel
4 Blue sky in SOI: new opportunities for quantum and hot-electron devices Luryi, S.
2004
48 6 p. 877-885
9 p.
artikel
5 Composite ULP diode fabrication, modelling and applications in multi-V th FD SOI CMOS technology Levacq, David
2004
48 6 p. 1017-1025
9 p.
artikel
6 Device design and manufacturing issues for 10 nm-scale MOSFETs: a computational study Hasan, Sayed
2004
48 6 p. 867-875
9 p.
artikel
7 Double gate silicon on insulator transistors. A Monte Carlo study Gámiz, F.
2004
48 6 p. 937-945
9 p.
artikel
8 Emerging silicon-on-nothing (SON) devices technology Monfray, S.
2004
48 6 p. 887-895
9 p.
artikel
9 Fully depleted SOI process and device technology for digital and RF applications Ichikawa, F.
2004
48 6 p. 999-1006
8 p.
artikel
10 Laterally asymmetric channel engineering in fully depleted double gate SOI MOSFETs for high performance analog applications Kranti, Abhinav
2004
48 6 p. 947-959
13 p.
artikel
11 Low field electron mobility in ultra-thin SOI MOSFETs: experimental characterization and theoretical investigation Esseni, David
2004
48 6 p. 927-936
10 p.
artikel
12 Low frequency noise and hot-carrier reliability in advanced SOI MOSFETs Dieudonné, François
2004
48 6 p. 985-997
13 p.
artikel
13 Modeling the floating-body effects of fully depleted, partially depleted, and body-grounded SOI MOSFETs Chan, Mansun
2004
48 6 p. 969-978
10 p.
artikel
14 Multiple-gate SOI MOSFETs Colinge, Jean-Pierre
2004
48 6 p. 897-905
9 p.
artikel
15 Nanoscale SOI MOSFETs: a comparison of two options Walls, Thomas J.
2004
48 6 p. 857-865
9 p.
artikel
16 New SOI lateral power devices with trench oxide Park, J.M.
2004
48 6 p. 1007-1015
9 p.
artikel
17 [No title] Cristoloveanu, Sorin
2004
48 6 p. 855-
1 p.
artikel
18 Qualification of 300 mm SOI CMOS substrate material: readiness for development and manufacturing Hovel, H.
2004
48 6 p. 1065-1072
8 p.
artikel
19 Reduction in threshold voltage fluctuation in fully-depleted SOI MOSFETs with back gate control Numata, Toshinori
2004
48 6 p. 979-984
6 p.
artikel
20 Requirements for ultra-thin-film devices and new materials for the CMOS roadmap Fenouillet-Beranger, C.
2004
48 6 p. 961-967
7 p.
artikel
21 Smart-Cut® technology: from 300 mm ultrathin SOI production to advanced engineered substrates Maleville, Christophe
2004
48 6 p. 1055-1063
9 p.
artikel
22 Total ionizing dose damage in deep submicron partially depleted SOI MOSFETs induced by proton irradiation Simoen, E.
2004
48 6 p. 1045-1054
10 p.
artikel
23 Two-dimensional simulation of pattern-dependent oxidation of silicon nanostructures on silicon-on-insulator substrates Uematsu, M.
2004
48 6 p. 1073-1078
6 p.
artikel
                             23 gevonden resultaten
 
 Koninklijke Bibliotheek - Nationale Bibliotheek van Nederland