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                             23 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Accessing transmission-mode dispersion in super-prisms Du, Y
2003
47 8 p. 1369-1377
9 p.
artikel
2 A simple quantum model for the MOS structure in accumulation mode Vexler, M.I.
2003
47 8 p. 1283-1287
5 p.
artikel
3 A two-dimensional physically-based current model for deep-submicrometer SOI dynamic threshold-voltage MOSFET Huang, Ru
2003
47 8 p. 1275-1282
8 p.
artikel
4 Avalanche transistor operation at extreme currents: physical reasons for low residual voltages Vainshtein, Sergey N.
2003
47 8 p. 1255-1263
9 p.
artikel
5 Effect of post oxidation annealing on VCSEL performance Das, N.C.
2003
47 8 p. 1359-1362
4 p.
artikel
6 Effects of first rapid thermal annealing temperature on Co silicide formation Peng, H.J.
2003
47 8 p. 1249-1253
5 p.
artikel
7 Enhanced emission in organic light-emitting diodes using Ta2O5 buffer layers Lu, Huei-Tzong
2003
47 8 p. 1409-1412
4 p.
artikel
8 Erratum to “Preface” [Solid-State Electronics 2003;47(3):385] 2003
47 8 p. 1417-
1 p.
artikel
9 GaInP/GaAs heterojunction bipolar transistor with carbon-doped base layer grown by solid source molecular beam epitaxy using carbon tetrabromide Zhang, R.
2003
47 8 p. 1339-1343
5 p.
artikel
10 GaN/AlGaN back-illuminated multiple-quantum-well Schottky barrier ultraviolet photodetectors Teke, A
2003
47 8 p. 1401-1408
8 p.
artikel
11 High temperature thermal stability of Au/Ti/WSi x Schottky contacts on n-type 4H-SiC Kim, Jihyun
2003
47 8 p. 1345-1350
6 p.
artikel
12 Impact of virtual substrate quality on performance enhancements in strained Si/SiGe heterojunction n-channel MOSFETs Olsen, S.H.
2003
47 8 p. 1289-1295
7 p.
artikel
13 Improved reliability for gate dielectric of low-temperature polysilicon thin-film transistors by NO-plasma nitridation Or, David C.T
2003
47 8 p. 1391-1395
5 p.
artikel
14 Influence of gettering and passivation on uniformity of the electrical parameters in monolithic multicrystalline silicon solar cell Wang, He
2003
47 8 p. 1363-1367
5 p.
artikel
15 Monte Carlo analysis of the implant dose sensitivity in 0.1 μm NMOSFET Srinivasaiah, H.C
2003
47 8 p. 1379-1383
5 p.
artikel
16 New procedure for the extraction of a-Si:H TFTs model parameters in the subthreshold region Reséndiz, L.
2003
47 8 p. 1351-1358
8 p.
artikel
17 Photosensing properties of interdigitated metal–semiconductor–metal structures with undepleted region Masui, T
2003
47 8 p. 1385-1390
6 p.
artikel
18 Si film electrical characterization in SOI substrates by the HgFET technique Hovel, H.J.
2003
47 8 p. 1311-1333
23 p.
artikel
19 Simulation of nonequilibrium thermal effects in power LDMOS transistors Raman, A
2003
47 8 p. 1265-1273
9 p.
artikel
20 Steam-induced interface improvement of N2O-nitrided SiO2 grown on 6H–SiC Xu, J.P
2003
47 8 p. 1397-1400
4 p.
artikel
21 The characteristics of InGaAs/GaAs modulation-doped photodetectors with two absorption bands Hsieh, Li-Zen
2003
47 8 p. 1413-1415
3 p.
artikel
22 Two-dimensional hydrodynamic model including inertia effects in carrier momentum for power millimetre-wave semi-conductor devices Rousseau, M.
2003
47 8 p. 1297-1309
13 p.
artikel
23 Zinc-blende ZnS under pressure: predicted electronic properties Benmakhlouf, F.
2003
47 8 p. 1335-1338
4 p.
artikel
                             23 gevonden resultaten
 
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