nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Achieving the ballistic-limit current in Si MOSFETs
|
Kim, Keunwoo |
|
2003 |
47 |
4 |
p. 721-726 6 p. |
artikel |
2 |
A modified Shockley–Read–Hall theory including radiative transitions
|
Beaucarne, G. |
|
2003 |
47 |
4 |
p. 685-689 5 p. |
artikel |
3 |
Analysis of the turn-off failure mechanism of silicon power diode
|
Huang, Alex Q |
|
2003 |
47 |
4 |
p. 727-739 13 p. |
artikel |
4 |
A numerical comparison between MOS control and junction control high voltage devices in SiC technology
|
Mihaila, A |
|
2003 |
47 |
4 |
p. 607-615 9 p. |
artikel |
5 |
Deep levels studies of AlGaN/GaN superlattices
|
Polyakov, A.Y. |
|
2003 |
47 |
4 |
p. 671-676 6 p. |
artikel |
6 |
Electronic wavelength tuning of multisegment InGaAsP/InP lasers with laterally coupled absorptive DFB gratings
|
Körbl, M. |
|
2003 |
47 |
4 |
p. 741-745 5 p. |
artikel |
7 |
Fabrication and electrical characteristics of polymer-based Schottky diode
|
Liang, Guirong |
|
2003 |
47 |
4 |
p. 691-694 4 p. |
artikel |
8 |
Fabrication of field emitter arrays using the mold method for FED application
|
Cho, Kyung-Jea |
|
2003 |
47 |
4 |
p. 633-637 5 p. |
artikel |
9 |
Formula for the current gain cut-off frequency considering intrinsic emitter dimensions and extrinsic parasitics in HBT
|
Shin, Hyunchol |
|
2003 |
47 |
4 |
p. 747-749 3 p. |
artikel |
10 |
High performance 12 GHz enhancement-mode pseudomorphic HEMT prepared by He plus reactive ion etching
|
Lin, C.S. |
|
2003 |
47 |
4 |
p. 695-698 4 p. |
artikel |
11 |
Impact of the band–band tunneling in silicon on electrical characteristics of Al/SiO2/p+-Si structures with the sub-3 nm oxide under positive bias
|
El Hdiy, A. |
|
2003 |
47 |
4 |
p. 617-620 4 p. |
artikel |
12 |
Inversion charge linearization in MOSFET modeling and rigorous derivation of the EKV compact model
|
Sallese, Jean-Michel |
|
2003 |
47 |
4 |
p. 677-683 7 p. |
artikel |
13 |
Investigation of thermal properties in fabricated 4H-SiC high power bipolar transistors
|
Danielsson, E. |
|
2003 |
47 |
4 |
p. 639-644 6 p. |
artikel |
14 |
Lateral polysilicon p+–p–n+ and p+–n–n+ diodes
|
Karnik, Sooraj V. |
|
2003 |
47 |
4 |
p. 653-659 7 p. |
artikel |
15 |
Measured thermal images of a gallium arsenide power MMIC with and without RF applied to the input
|
Oxley, C.H. |
|
2003 |
47 |
4 |
p. 755-758 4 p. |
artikel |
16 |
Modeling of electron gate current and post-stress drain current of p-type silicon-on-insulator MOSFETs
|
Sheu, Chorng-Jye |
|
2003 |
47 |
4 |
p. 705-711 7 p. |
artikel |
17 |
Modeling of kink effect in polysilicon thin film transistor using charge sheet approach
|
Bindra, Simrata |
|
2003 |
47 |
4 |
p. 645-651 7 p. |
artikel |
18 |
Modeling of the gate leakage current reduction in MOSFET with ultra-thin nitrided gate oxide
|
Yang, C.W. |
|
2003 |
47 |
4 |
p. 751-754 4 p. |
artikel |
19 |
Non-equilibrium modeling of tunneling gate currents in nanoscale MOSFETs
|
Huang, Chung-Kuang |
|
2003 |
47 |
4 |
p. 713-720 8 p. |
artikel |
20 |
Persistent photoconductivity in ZnCdSe MBE films grown on GaAs
|
Hernández, L. |
|
2003 |
47 |
4 |
p. 759-762 4 p. |
artikel |
21 |
Photoassisted MOVPE grown (n)ZnSe/(p+)GaAs heterojunction solar cells
|
Parent, D.W. |
|
2003 |
47 |
4 |
p. 595-599 5 p. |
artikel |
22 |
Physical modeling of off-state breakdown in power GaAs MESFETs
|
Kunihiro, Kazuaki |
|
2003 |
47 |
4 |
p. 621-631 11 p. |
artikel |
23 |
Process technique for SEU reliability improvement of deep sub-micron SRAM cell
|
Saxena, P.K. |
|
2003 |
47 |
4 |
p. 661-664 4 p. |
artikel |
24 |
Properties of Schottky contact of titanium on low doped p-type SiGeC alloy by rapid thermal annealing
|
Li, Baojun |
|
2003 |
47 |
4 |
p. 601-605 5 p. |
artikel |
25 |
Publishers Note
|
|
|
2003 |
47 |
4 |
p. 593- 1 p. |
artikel |
26 |
Reversible light coalescence phenomena of Si photo-emitters under stressing at low breakdown currents
|
Chatterjee, A. |
|
2003 |
47 |
4 |
p. 665-670 6 p. |
artikel |
27 |
The critical charge density in high voltage 4H-SiC thyristors
|
Levinshtein, Michael E. |
|
2003 |
47 |
4 |
p. 699-704 6 p. |
artikel |