nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A Ka-band monolithic low phase noise coplanar waveguide oscillator using InAlAs/InGaAs HBT
|
Cui, Delong |
|
2002 |
46 |
2 |
p. 249-253 5 p. |
artikel |
2 |
Analysis of the breakdown voltage in SOI and SOS technologies
|
Roig, J |
|
2002 |
46 |
2 |
p. 255-261 7 p. |
artikel |
3 |
An improved regulated cascode current mirror
|
Sarao, J. |
|
2002 |
46 |
2 |
p. 307-312 6 p. |
artikel |
4 |
An investigation of structural, optical and electrical properties of GaN thin films grown on Si(111) by reaction evaporation
|
Zhang, Haoxiang |
|
2002 |
46 |
2 |
p. 301-306 6 p. |
artikel |
5 |
A small sized lateral trench electrode IGBT for improving latch-up and breakdown characteristics
|
Kang, Ey Goo |
|
2002 |
46 |
2 |
p. 295-300 6 p. |
artikel |
6 |
Comparison of deep levels spectra and electrical properties of GaAs crystals grown by vertical Bridgeman and by liquid encapsulated Czochralski methods
|
Markov, A.V |
|
2002 |
46 |
2 |
p. 269-277 9 p. |
artikel |
7 |
Electrical characteristics of thin film cubic boron nitride
|
Noor Mohammad, S. |
|
2002 |
46 |
2 |
p. 203-222 20 p. |
artikel |
8 |
Experimental studies of frequency response of small-signal MOSFET amplifiers
|
Vernon, Emerson |
|
2002 |
46 |
2 |
p. 287-294 8 p. |
artikel |
9 |
GaN-based modulation doped FETs and UV detectors
|
Morkoç, Hadis |
|
2002 |
46 |
2 |
p. 157-202 46 p. |
artikel |
10 |
Gate coupled and zener diode triggering silicon-controlled rectifiers for electrostatic discharge protection circuits
|
Jang, Sheng-Lyang |
|
2002 |
46 |
2 |
p. 263-267 5 p. |
artikel |
11 |
Gate polarity dependence of impact ionization probabilities in metal-oxide-silicon structures under Fowler–Nordheim stress
|
Samanta, Piyas |
|
2002 |
46 |
2 |
p. 279-285 7 p. |
artikel |
12 |
Modelling of the hole-initiated impact ionization current in the framework of hydrodynamic equations
|
Lorenzini, Martino |
|
2002 |
46 |
2 |
p. 223-234 12 p. |
artikel |
13 |
The impact of post-polysilicon gate process on ultra-thin gate oxide integrity
|
Ang, Chew-Hoe |
|
2002 |
46 |
2 |
p. 243-247 5 p. |
artikel |
14 |
Ultra-thin insulator covered silicon: potential barriers and tunnel currents
|
Mizsei, János |
|
2002 |
46 |
2 |
p. 235-241 7 p. |
artikel |