nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A method for predicting breakdown voltage of power devices with cylindrical diffused junctions
|
Chai, Francis K |
|
1995 |
38 |
8 |
p. 1547-1549 3 p. |
artikel |
2 |
A model for the dependence of maximum oscillation frequency on collector to substrate capacitance in bipolar transistors
|
Armstrong, G.A |
|
1995 |
38 |
8 |
p. 1505-1510 6 p. |
artikel |
3 |
Analysis of the high injection effects in silicon bipolar transistors at low temperatures
|
Zhixiong, Xiao |
|
1995 |
38 |
8 |
p. 1455-1460 6 p. |
artikel |
4 |
An analytical expression for the current in short-base transistors
|
Denis, A.St |
|
1995 |
38 |
8 |
p. 1431-1436 6 p. |
artikel |
5 |
An analytical model of the V BE-dependence of current-splitting in CMOS-compatible lateral bipolar transistors
|
Freund, Dirk |
|
1995 |
38 |
8 |
p. 1543-1546 4 p. |
artikel |
6 |
Application of the MOS charge-sheet model to nonuniform doping along the channel
|
Victory, James |
|
1995 |
38 |
8 |
p. 1497-1503 7 p. |
artikel |
7 |
Computationally efficient version of the Pao-Sah model with variable mobility
|
Persi, M |
|
1995 |
38 |
8 |
p. 1461-1463 3 p. |
artikel |
8 |
Computation of current and transconductance of a nonuniformly doped channel MOSFET with an arbitrary doping profile
|
Wang, Chong-Lung |
|
1995 |
38 |
8 |
p. 1423-1429 7 p. |
artikel |
9 |
Conduction behaviour of low-temperature (≤600°C) polysilicon TFTs with an in situ drain doping level
|
Pichon, L |
|
1995 |
38 |
8 |
p. 1515-1521 7 p. |
artikel |
10 |
Determination of contact resistivity by a modified Cox and Strack method in case of finite metal sheet resistance
|
Ahmad, M |
|
1995 |
38 |
8 |
p. 1437-1440 4 p. |
artikel |
11 |
Determination of tunnelling parameters in ultra-thin oxide layer poly-Si/SiO2/Si structures
|
Depas, M |
|
1995 |
38 |
8 |
p. 1465-1471 7 p. |
artikel |
12 |
Deterministic MOSFET simulation using a generalized spherical harmonic expansion of the Boltzmann equation
|
Hennacy, K.A |
|
1995 |
38 |
8 |
p. 1485-1495 11 p. |
artikel |
13 |
Double-sweep LF-CV technique for generation rate determination in MOS capacitors
|
Sorge, Roland |
|
1995 |
38 |
8 |
p. 1479-1484 6 p. |
artikel |
14 |
Evidence of optical generation-recombination noise
|
Jang, Sheng-Lyang |
|
1995 |
38 |
8 |
p. 1449-1453 5 p. |
artikel |
15 |
Luminescence polarization and spin-relaxation in GaAs grown on Si and on InP
|
Bacquet, G |
|
1995 |
38 |
8 |
p. 1523-1527 5 p. |
artikel |
16 |
MESFET performance and limitations of optimized GaAs strained buffer layer grown on InP by molecular beam epitaxy
|
Lee, C.T |
|
1995 |
38 |
8 |
p. 1529-1531 3 p. |
artikel |
17 |
Numerical analysis of the extraction of barrier height and Richardson constant of Schottky contacts on AlGaAs/GaAs heterostructures
|
Menozzi, Roberto |
|
1995 |
38 |
8 |
p. 1511-1514 4 p. |
artikel |
18 |
Photovoltaic properties and high efficiency of preferentially doped polysilicon solar cells
|
Ben Arab, Adel |
|
1995 |
38 |
8 |
p. 1441-1447 7 p. |
artikel |
19 |
Silicon Auger transistor—New insight into the performance of a tunnel MIS emitter transistor
|
Grekhov, I.V |
|
1995 |
38 |
8 |
p. 1533-1542 10 p. |
artikel |
20 |
The effects of rapid thermal processing on ultra-shallow junctions for deep sub-micron MOSFETs
|
Liu, R |
|
1995 |
38 |
8 |
p. 1473-1477 5 p. |
artikel |