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                             20 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Analog characteristics of drain engineered submicron MOSFETs for mixed-signal applications Chen, Hung-Sheng
1995
38 11 p. 1857-1859
3 p.
artikel
2 Analytical model of Si SiGe field-effect transistors Sadek, A
1995
38 11 p. 1969-1971
3 p.
artikel
3 A neuron-like Multi-Quantum-Well Injection-Mode Device for electronic pulse-mode circuits Song, Chungkun
1995
38 11 p. 1953-1967
15 p.
artikel
4 An explicit physical model for the long-channel MOS transistor including small-signal parameters Araújo Cunha, Ana Isabela
1995
38 11 p. 1945-1952
8 p.
artikel
5 Annealing effect on the characteristics of MTIS solar cells Vdovenkova, T.A
1995
38 11 p. 1929-1932
4 p.
artikel
6 Calculations of the temperature and field dependent electronic mobility in β-SiC Joshi, R.P
1995
38 11 p. 1911-1916
6 p.
artikel
7 Current transport in Ti GaAs Schottky barriers prepared by ion beam sputtering Di Dio, M
1995
38 11 p. 1923-1928
6 p.
artikel
8 Electron transfer between two coupled quantum wells in a resonant tunneling diode structure Mounaix, P
1995
38 11 p. 1899-1904
6 p.
artikel
9 Experimental investigation of the double exponential model of a solar cell under illuminated conditions: Considering the instrumental uncertainties in the current, voltage and temperature values Veissid, N
1995
38 11 p. 1937-1943
7 p.
artikel
10 Flexible, thin-film, GaAs hetero-junction bipolar transistors mounted on natural diamond substrates Arbet-Engels, V
1995
38 11 p. 1972-1974
3 p.
artikel
11 High-frequency noise of bipolar devices in consideration of carrier heating and low temperature effects Herzel, Frank
1995
38 11 p. 1905-1909
5 p.
artikel
12 Impact of silicidation on the excess noise behaviour of mos transistors Vandamme, E.P
1995
38 11 p. 1893-1897
5 p.
artikel
13 Influence of carrier energy quantization on the gate-induced drain breakdown Majkusiak, Bogdan
1995
38 11 p. 1933-1936
4 p.
artikel
14 Investigation of wet etching solutions for In0.5Ga0.5P Lee, J.W
1995
38 11 p. 1871-1874
4 p.
artikel
15 Observation and modelling of RTS in InAlAs/InGaAs/InP HFETs Sommer, V
1995
38 11 p. 1917-1922
6 p.
artikel
16 Optical and chemical analysis of the Ag In0.53Ga0.47As interface formed at low temperature Lee, H.J
1995
38 11 p. 1875-1878
4 p.
artikel
17 Polysilicon gate depletion effect on IC performance Chen, Kai
1995
38 11 p. 1975-1977
3 p.
artikel
18 Study of shallow bulk traps in thin nitrided oxide films by thermal re-emission of electrons trapped at high field Yang, B.L
1995
38 11 p. 1887-1891
5 p.
artikel
19 Temperature effects on pin diode forward bias resistance Caverly, Robert
1995
38 11 p. 1879-1885
7 p.
artikel
20 Theory and application of polysilicon resistor trimming Feldbaumer, D.W
1995
38 11 p. 1861-1869
9 p.
artikel
                             20 gevonden resultaten
 
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