nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Analog characteristics of drain engineered submicron MOSFETs for mixed-signal applications
|
Chen, Hung-Sheng |
|
1995 |
38 |
11 |
p. 1857-1859 3 p. |
artikel |
2 |
Analytical model of Si SiGe field-effect transistors
|
Sadek, A |
|
1995 |
38 |
11 |
p. 1969-1971 3 p. |
artikel |
3 |
A neuron-like Multi-Quantum-Well Injection-Mode Device for electronic pulse-mode circuits
|
Song, Chungkun |
|
1995 |
38 |
11 |
p. 1953-1967 15 p. |
artikel |
4 |
An explicit physical model for the long-channel MOS transistor including small-signal parameters
|
Araújo Cunha, Ana Isabela |
|
1995 |
38 |
11 |
p. 1945-1952 8 p. |
artikel |
5 |
Annealing effect on the characteristics of MTIS solar cells
|
Vdovenkova, T.A |
|
1995 |
38 |
11 |
p. 1929-1932 4 p. |
artikel |
6 |
Calculations of the temperature and field dependent electronic mobility in β-SiC
|
Joshi, R.P |
|
1995 |
38 |
11 |
p. 1911-1916 6 p. |
artikel |
7 |
Current transport in Ti GaAs Schottky barriers prepared by ion beam sputtering
|
Di Dio, M |
|
1995 |
38 |
11 |
p. 1923-1928 6 p. |
artikel |
8 |
Electron transfer between two coupled quantum wells in a resonant tunneling diode structure
|
Mounaix, P |
|
1995 |
38 |
11 |
p. 1899-1904 6 p. |
artikel |
9 |
Experimental investigation of the double exponential model of a solar cell under illuminated conditions: Considering the instrumental uncertainties in the current, voltage and temperature values
|
Veissid, N |
|
1995 |
38 |
11 |
p. 1937-1943 7 p. |
artikel |
10 |
Flexible, thin-film, GaAs hetero-junction bipolar transistors mounted on natural diamond substrates
|
Arbet-Engels, V |
|
1995 |
38 |
11 |
p. 1972-1974 3 p. |
artikel |
11 |
High-frequency noise of bipolar devices in consideration of carrier heating and low temperature effects
|
Herzel, Frank |
|
1995 |
38 |
11 |
p. 1905-1909 5 p. |
artikel |
12 |
Impact of silicidation on the excess noise behaviour of mos transistors
|
Vandamme, E.P |
|
1995 |
38 |
11 |
p. 1893-1897 5 p. |
artikel |
13 |
Influence of carrier energy quantization on the gate-induced drain breakdown
|
Majkusiak, Bogdan |
|
1995 |
38 |
11 |
p. 1933-1936 4 p. |
artikel |
14 |
Investigation of wet etching solutions for In0.5Ga0.5P
|
Lee, J.W |
|
1995 |
38 |
11 |
p. 1871-1874 4 p. |
artikel |
15 |
Observation and modelling of RTS in InAlAs/InGaAs/InP HFETs
|
Sommer, V |
|
1995 |
38 |
11 |
p. 1917-1922 6 p. |
artikel |
16 |
Optical and chemical analysis of the Ag In0.53Ga0.47As interface formed at low temperature
|
Lee, H.J |
|
1995 |
38 |
11 |
p. 1875-1878 4 p. |
artikel |
17 |
Polysilicon gate depletion effect on IC performance
|
Chen, Kai |
|
1995 |
38 |
11 |
p. 1975-1977 3 p. |
artikel |
18 |
Study of shallow bulk traps in thin nitrided oxide films by thermal re-emission of electrons trapped at high field
|
Yang, B.L |
|
1995 |
38 |
11 |
p. 1887-1891 5 p. |
artikel |
19 |
Temperature effects on pin diode forward bias resistance
|
Caverly, Robert |
|
1995 |
38 |
11 |
p. 1879-1885 7 p. |
artikel |
20 |
Theory and application of polysilicon resistor trimming
|
Feldbaumer, D.W |
|
1995 |
38 |
11 |
p. 1861-1869 9 p. |
artikel |