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                             18 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A comparative study of the Kirk effect in GaAs and Si bipolar junction transistors Lee, Joonwoo
1994
37 8 p. 1485-1490
6 p.
artikel
2 A fully analytical partitioned-charge-based model for linearly-graded SiGe-base heterojunction bipolar transistors Kuo, J.B.
1994
37 8 p. 1561-1566
6 p.
artikel
3 A low temperature ion-beam assisted deposition method for realizing SiGe/Si heterostructures Mohajerzadeh, S.
1994
37 8 p. 1467-1469
3 p.
artikel
4 Analytical modeling of polycrystalline silicon emitter bipolar transistors under high-level injection Chyan, Yih-Feng
1994
37 8 p. 1521-1529
9 p.
artikel
5 Analytical two-dimensional modeling for potential distribution and threshold voltage of the short-channel fully depleted SOI (silicon-on-insulator) MOSFET Aggarwal, Vaneeta
1994
37 8 p. 1537-1542
6 p.
artikel
6 An analytical model of current-voltage characteristics and d.c. small-signal parameters for Si/Si1−x Ge x FETs Liu, Kuo-Wei
1994
37 8 p. 1570-1572
3 p.
artikel
7 1/ƒ and g-r noise in AlGaAs epitaxial layers Pascal, F.
1994
37 8 p. 1503-1508
6 p.
artikel
8 Announcement 1994
37 8 p. iii-
1 p.
artikel
9 A unified theory of direct and indirect interband tunneling under a nonuniform electric field Tanaka, Sumio
1994
37 8 p. 1543-1552
10 p.
artikel
10 Barrier height enhancement of Pt/n-InP Schottky diodes by P2S5/(NH4)2S solution treatment of the InP surface Huang, T.S.
1994
37 8 p. 1461-1466
6 p.
artikel
11 Design of IGBTs for latch-up free operation Zeng, J.
1994
37 8 p. 1471-1475
5 p.
artikel
12 High frequency noise and diffusion coefficient of hot electrons in bulk Al0.25 Ga0.75 As de Murcia, M.
1994
37 8 p. 1477-1483
7 p.
artikel
13 High-level injection influence on the high frequency performance of polycrystalline silicon emitter bipolar transistors Chyan, Yih-Feng
1994
37 8 p. 1531-1536
6 p.
artikel
14 Improvement of reverse leakage current characteristics of GaSb and Al0.3Ga0.7Sb/GaSb diodes grown by MBE Kodama, Mitsuru
1994
37 8 p. 1567-1569
3 p.
artikel
15 New technique for the characterization of Si/SiGe layers using heterostructure MOS capacitors Voinigescu, S.P.
1994
37 8 p. 1491-1501
11 p.
artikel
16 Numerical simulation of the temperature dependence of the sidegating effect in GaAs MESFETs Chang, Shwu-Jing
1994
37 8 p. 1557-1559
3 p.
artikel
17 On the relaxation of field induced oxide charge in metal-oxide-semiconductor capacitors Meinertzhagen, A.
1994
37 8 p. 1553-1556
4 p.
artikel
18 Scattering matrix formulation of electron transport in compound semiconductor devices Alam, Muhammad A.
1994
37 8 p. 1509-1520
12 p.
artikel
                             18 gevonden resultaten
 
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