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                             27 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 An analytical threshold voltage model for SiGe-channel PMOS devices Kuo, J.B.
1993
36 9 p. 1349-1352
4 p.
artikel
2 A power semiconductor diode with an integrated forward-current sensor Manduteanu, George V.
1993
36 9 p. 1335-1338
4 p.
artikel
3 A study of radiation effects on reoxidized nitrided oxide MOSFETs, including effects on mobility Mallik, A.
1993
36 9 p. 1359-1361
3 p.
artikel
4 Call for papers 1993
36 9 p. V-VI
nvt p.
artikel
5 Comparative analysis of microwave noise in GaAs and AlGaAs/GaAs channels Aninkevičius, V.
1993
36 9 p. 1339-1343
5 p.
artikel
6 Current fluctuations due to locally distributed charge generation in semiconductor junctions: A theoretical study Niemcharoen, S.
1993
36 9 p. 1362-1364
3 p.
artikel
7 D.C. and transient analysis of a SiGe-base heterojunction bipolar device in an ECL buffer using a modified pisces program Kuo, J.B.
1993
36 9 p. 1273-1276
4 p.
artikel
8 Demonstration of a Si/SiGe optoelectronic reset-set flip-flop based on an inversion-channel heterostructure Vetter, A.
1993
36 9 p. 1247-1250
4 p.
artikel
9 Design of AlGaAs/GaAs quantum wells for electroabsorption modulators Susa, Nobuhiko
1993
36 9 p. 1277-1287
11 p.
artikel
10 Effect of two-dimensional electron gas on the d.c. characteristics of InAlAs/InGaAs double heterojunction bipolar transistors Huang, Chao-Hsing
1993
36 9 p. 1229-1234
6 p.
artikel
11 Electrical characterisation of a heterojunction field effect transistor photodetector (HFETPD) Thompson, David
1993
36 9 p. 1295-1302
8 p.
artikel
12 Improved GaAs/In0.25Ga0.75As/GaAs pseudomorphic heterostructure by growing double δ-doping GaAs layers on both sides of the channel Shieh, H.M.
1993
36 9 p. 1235-1237
3 p.
artikel
13 Impurity profile extraction from semiconductor chips of cellular construction Bulucea, Constantin
1993
36 9 p. 1239-1246
8 p.
artikel
14 Modeling of β-SiC MESFETs using hydrodynamic equations Zhou, Jing-Rong
1993
36 9 p. 1289-1294
6 p.
artikel
15 Negative differential resistance of single barrier interband tunnelling diodes Khrenov, G.
1993
36 9 p. 1325-1333
9 p.
artikel
16 Noise in diodes, rigorously deduced from first principles De Vos, Alexis
1993
36 9 p. 1267-1271
5 p.
artikel
17 Numerical transient simulation of the programming window degradation in FLOTOX EEPROM cells Papadas, C.
1993
36 9 p. 1303-1311
9 p.
artikel
18 Plasma etching antenna effect on oxide-silicon interface reliability Shin, Hyungcheol
1993
36 9 p. 1356-1358
3 p.
artikel
19 Preparation of heterojunction solar cell Vishwakarma, S.R.
1993
36 9 p. 1345-1348
4 p.
artikel
20 Process and material properties of WSi2 formed by discharge treatment Singh, Awatar
1993
36 9 p. 1365-1367
3 p.
artikel
21 Reduced hot-carrier reliability degradation of x-ray irradiated MOSFETs in a 0.25 μm CMOS technology with ultra-thin gate oxide Acovic, A.
1993
36 9 p. 1353-1355
3 p.
artikel
22 SiGe-base heterojunction bipolar transistors: An analytical current gain and forward transit time model Lu, T.C.
1993
36 9 p. 1313-1320
8 p.
artikel
23 Silicon-implanted SiO2 for nonvolatile memory applications Hao, Ming-Yin
1993
36 9 p. 1321-1324
4 p.
artikel
24 Software survey section 1993
36 9 p. I-III
nvt p.
artikel
25 Switch-off transient analysis for heterojunction bipolar transistors in saturation Yuan, J.S.
1993
36 9 p. 1261-1266
6 p.
artikel
26 The effect of sidewall base injection on the a.c. base resistance of a bipolar transistor Sadovnikov, A.D.
1993
36 9 p. 1368-1370
3 p.
artikel
27 Threshold voltage model for narrow width MOSFETs Oh, Sung-Hun
1993
36 9 p. 1251-1260
10 p.
artikel
                             27 gevonden resultaten
 
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