nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Analysis and optimization of power MOSFETs for cryogenic operation
|
Singh, Ranbir |
|
1993 |
36 |
8 |
p. 1203-1211 9 p. |
artikel |
2 |
An analytic model for punchthrough-implanted MOSFETs in strong inversion
|
Wong, Shyh-Chyi |
|
1993 |
36 |
8 |
p. 1183-1195 13 p. |
artikel |
3 |
A new δ-doped InGaAs/GaAs pseudomorphic high electron mobility transistor utilizing a strained superlattice spacer
|
Shieh, H.M. |
|
1993 |
36 |
8 |
p. 1117-1119 3 p. |
artikel |
4 |
A physical model of the transit time in bipolar transistors
|
Weng, J. |
|
1993 |
36 |
8 |
p. 1197-1201 5 p. |
artikel |
5 |
A study of trapezoidal programming waveform for the FLOTOX EEPROM
|
Sik On Kong, |
|
1993 |
36 |
8 |
p. 1093-1100 8 p. |
artikel |
6 |
A tristate switching device with double delta-doped quantum well structure
|
Hsu, Wei-Chou |
|
1993 |
36 |
8 |
p. 1089-1092 4 p. |
artikel |
7 |
Composition grading for base transit time minimization in SiGe-base heterojunction bipolar transistors
|
Winterton, S.S. |
|
1993 |
36 |
8 |
p. 1161-1164 4 p. |
artikel |
8 |
Contribution of bulk states to the depletion layer admittance
|
Dhariwal, S.R. |
|
1993 |
36 |
8 |
p. 1165-1174 10 p. |
artikel |
9 |
Current transport mechanisms studied by I-V-T and IR photoemission measurements on a P-doped PtSi Schottky diode
|
Chin, V.W.L. |
|
1993 |
36 |
8 |
p. 1107-1116 10 p. |
artikel |
10 |
Deep-depletion-layer impact-ionization-induced gate-oxide breakdown in thin-oxide n-MOSFETs
|
Huang, M.Q. |
|
1993 |
36 |
8 |
p. 1155-1160 6 p. |
artikel |
11 |
Dielectric response of p-n junctions
|
Jonscher, Andrew K. |
|
1993 |
36 |
8 |
p. 1121-1128 8 p. |
artikel |
12 |
Dynamic properties of an AlGaAs/GaAs double heterojunction thyristor
|
Willén, B. |
|
1993 |
36 |
8 |
p. 1225-1227 3 p. |
artikel |
13 |
Effect of wafer stress on surface photovoltage diffusion length measurements
|
Hwang, I.G. |
|
1993 |
36 |
8 |
p. 1147-1153 7 p. |
artikel |
14 |
Enhanced current driving capability GaAs/graded In x Ga1−x As/GaAs high electron mobility transistor
|
Hsu, R.T. |
|
1993 |
36 |
8 |
p. 1143-1146 4 p. |
artikel |
15 |
Impact of the emitter and base diffusion capacitances on the a.c. behavior of bipolar transistors
|
Hamel, John Starr |
|
1993 |
36 |
8 |
p. 1175-1182 8 p. |
artikel |
16 |
Kink effect on the base current of heterojunction bipolar transistors
|
Liou, J.J. |
|
1993 |
36 |
8 |
p. 1222-1224 3 p. |
artikel |
17 |
Minority carrier accumulation at high-low junctions
|
in't Hout, S.R. |
|
1993 |
36 |
8 |
p. 1135-1142 8 p. |
artikel |
18 |
Modeling the avalanche multiplication current of AlGaAs/GaAs heterojunction bipolar transistors
|
Liou, J.J. |
|
1993 |
36 |
8 |
p. 1217-1221 5 p. |
artikel |
19 |
Non-destructive characterisation of SOI wafers using spectroscopic reflectrometry
|
Smeys, P. |
|
1993 |
36 |
8 |
p. 1213-1216 4 p. |
artikel |
20 |
Photoluminescence of undoped and Er-doped 1.1-μm InGaAsP layers grown by liquid-phase epitaxy
|
Chiu, Cheng-Ming |
|
1993 |
36 |
8 |
p. 1101-1106 6 p. |
artikel |
21 |
Saturation transconductance of deep-submicron-channel MOSFETs
|
Taur, Y. |
|
1993 |
36 |
8 |
p. 1085-1087 3 p. |
artikel |
22 |
Software survey section
|
|
|
1993 |
36 |
8 |
p. I-IV nvt p. |
artikel |
23 |
The influence of bandgap narrowing on the I–V characteristics of a MOSFET
|
Jakubowski, A. |
|
1993 |
36 |
8 |
p. 1129-1134 6 p. |
artikel |