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                             23 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Analysis and optimization of power MOSFETs for cryogenic operation Singh, Ranbir
1993
36 8 p. 1203-1211
9 p.
artikel
2 An analytic model for punchthrough-implanted MOSFETs in strong inversion Wong, Shyh-Chyi
1993
36 8 p. 1183-1195
13 p.
artikel
3 A new δ-doped InGaAs/GaAs pseudomorphic high electron mobility transistor utilizing a strained superlattice spacer Shieh, H.M.
1993
36 8 p. 1117-1119
3 p.
artikel
4 A physical model of the transit time in bipolar transistors Weng, J.
1993
36 8 p. 1197-1201
5 p.
artikel
5 A study of trapezoidal programming waveform for the FLOTOX EEPROM Sik On Kong,
1993
36 8 p. 1093-1100
8 p.
artikel
6 A tristate switching device with double delta-doped quantum well structure Hsu, Wei-Chou
1993
36 8 p. 1089-1092
4 p.
artikel
7 Composition grading for base transit time minimization in SiGe-base heterojunction bipolar transistors Winterton, S.S.
1993
36 8 p. 1161-1164
4 p.
artikel
8 Contribution of bulk states to the depletion layer admittance Dhariwal, S.R.
1993
36 8 p. 1165-1174
10 p.
artikel
9 Current transport mechanisms studied by I-V-T and IR photoemission measurements on a P-doped PtSi Schottky diode Chin, V.W.L.
1993
36 8 p. 1107-1116
10 p.
artikel
10 Deep-depletion-layer impact-ionization-induced gate-oxide breakdown in thin-oxide n-MOSFETs Huang, M.Q.
1993
36 8 p. 1155-1160
6 p.
artikel
11 Dielectric response of p-n junctions Jonscher, Andrew K.
1993
36 8 p. 1121-1128
8 p.
artikel
12 Dynamic properties of an AlGaAs/GaAs double heterojunction thyristor Willén, B.
1993
36 8 p. 1225-1227
3 p.
artikel
13 Effect of wafer stress on surface photovoltage diffusion length measurements Hwang, I.G.
1993
36 8 p. 1147-1153
7 p.
artikel
14 Enhanced current driving capability GaAs/graded In x Ga1−x As/GaAs high electron mobility transistor Hsu, R.T.
1993
36 8 p. 1143-1146
4 p.
artikel
15 Impact of the emitter and base diffusion capacitances on the a.c. behavior of bipolar transistors Hamel, John Starr
1993
36 8 p. 1175-1182
8 p.
artikel
16 Kink effect on the base current of heterojunction bipolar transistors Liou, J.J.
1993
36 8 p. 1222-1224
3 p.
artikel
17 Minority carrier accumulation at high-low junctions in't Hout, S.R.
1993
36 8 p. 1135-1142
8 p.
artikel
18 Modeling the avalanche multiplication current of AlGaAs/GaAs heterojunction bipolar transistors Liou, J.J.
1993
36 8 p. 1217-1221
5 p.
artikel
19 Non-destructive characterisation of SOI wafers using spectroscopic reflectrometry Smeys, P.
1993
36 8 p. 1213-1216
4 p.
artikel
20 Photoluminescence of undoped and Er-doped 1.1-μm InGaAsP layers grown by liquid-phase epitaxy Chiu, Cheng-Ming
1993
36 8 p. 1101-1106
6 p.
artikel
21 Saturation transconductance of deep-submicron-channel MOSFETs Taur, Y.
1993
36 8 p. 1085-1087
3 p.
artikel
22 Software survey section 1993
36 8 p. I-IV
nvt p.
artikel
23 The influence of bandgap narrowing on the I–V characteristics of a MOSFET Jakubowski, A.
1993
36 8 p. 1129-1134
6 p.
artikel
                             23 gevonden resultaten
 
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