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                             22 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A compact bipolar transistor model for very-high-frequency applications with special regard to narrow emitter stripes and high current densities Koldehoff, A.
1993
36 7 p. 1035-1048
14 p.
artikel
2 Analysis of I-V measurements on CrSi2Si Schottky structures in a wide temperature range Barus, Miroslav
1993
36 7 p. 969-974
6 p.
artikel
3 Conservation equations for hot carriers—II. Dynamic features Gružinskis, V.
1993
36 7 p. 1067-1075
9 p.
artikel
4 Conservation equations for hot carriers—I. Transport models Gružinskis, V.
1993
36 7 p. 1055-1066
12 p.
artikel
5 Current transport and its effect on the determination of the Schottky-barrier height in a typical system: Gold on silicon Chen, T.P.
1993
36 7 p. 949-954
6 p.
artikel
6 Effect of annealing and plasma precleaning on the electrical properties of N2O/SiH4 PECVD oxide as gate material in MOSFETs and CCDs Chanana, R.K.
1993
36 7 p. 1021-1026
6 p.
artikel
7 Electron and hole traps in heavily compensated InGaAs/GaAs heterostructures Buchwald, W.R.
1993
36 7 p. 1077-1082
6 p.
artikel
8 Experimental application of a novel technique to extract gate bias dependent source and drain parasitic resistances of GaAs MESFETs Menozzi, Roberto
1993
36 7 p. 1083-1084
2 p.
artikel
9 Fabrication methods for an AlGaAs/InGaP/AlGaAs visible laser with transverse junction stripe structure grown by liquid phase epitaxy Chang, L.B.
1993
36 7 p. 1049-1054
6 p.
artikel
10 Injection current in a planar doped base Si bipolar junction transistor Jorke, H.
1993
36 7 p. 975-979
5 p.
artikel
11 Investigation of the kink and hysteresis from 13 K to 30 K in N-channel CMOS transistors with a floating well Kasley, Kathy L.
1993
36 7 p. 945-948
4 p.
artikel
12 Low-frequency noise characteristics of lightly-doped-drain MOSFETs Jang, Sheng-Lyang
1993
36 7 p. 1007-1010
4 p.
artikel
13 Numerical analysis of small-signal characteristics of a fully depleted SOI MOSFET Yang, P.C.
1993
36 7 p. 939-944
6 p.
artikel
14 On the carrier removal phenomenon in silicon after proton irradiation Gopal, R.
1993
36 7 p. 1011-1019
9 p.
artikel
15 Photoelectrical properties of Au/GaAs(1−x)Sx/Mo structures as a function of sulfur concentration Lalande, Frédéric
1993
36 7 p. 981-984
4 p.
artikel
16 Semi-analytical model for charge control in SiGe quantum well MOS structures Bhaumik, Kaushik
1993
36 7 p. 961-968
8 p.
artikel
17 Small-signal non-quasi-static model for single and double heterojunction bipolar transistors Huang, Jeffrey C.-N.
1993
36 7 p. 1027-1034
8 p.
artikel
18 Software survey section 1993
36 7 p. I-IV
nvt p.
artikel
19 Spatially transient hot electron distributions in silicon determined from the chambers path integral solution of the Boltzmann transport equation Leung, C.C.C.
1993
36 7 p. 1001-1006
6 p.
artikel
20 Study of lateral non-uniformity as a function of junction depth in ultra-shallow junctions and its effect on leakage behavior in as-deposited polycrystalline Si and amorphous Si diodes Batra, Shubneesh
1993
36 7 p. 955-960
6 p.
artikel
21 Theory of surface photovoltage in a semiconductor with deep impurities Choo, S.C.
1993
36 7 p. 989-999
11 p.
artikel
22 Use of empirically deduced composition and temperature dependent intrinsic carrier density in Si1−xGex, In1−xGaxAs and In1−xGaxAsyP1−y in calculating minimum capacitance in C-V plot of MIS structure Paul, Sajal K.
1993
36 7 p. 985-988
4 p.
artikel
                             22 gevonden resultaten
 
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