nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A compact bipolar transistor model for very-high-frequency applications with special regard to narrow emitter stripes and high current densities
|
Koldehoff, A. |
|
1993 |
36 |
7 |
p. 1035-1048 14 p. |
artikel |
2 |
Analysis of I-V measurements on CrSi2Si Schottky structures in a wide temperature range
|
Barus, Miroslav |
|
1993 |
36 |
7 |
p. 969-974 6 p. |
artikel |
3 |
Conservation equations for hot carriers—II. Dynamic features
|
Gružinskis, V. |
|
1993 |
36 |
7 |
p. 1067-1075 9 p. |
artikel |
4 |
Conservation equations for hot carriers—I. Transport models
|
Gružinskis, V. |
|
1993 |
36 |
7 |
p. 1055-1066 12 p. |
artikel |
5 |
Current transport and its effect on the determination of the Schottky-barrier height in a typical system: Gold on silicon
|
Chen, T.P. |
|
1993 |
36 |
7 |
p. 949-954 6 p. |
artikel |
6 |
Effect of annealing and plasma precleaning on the electrical properties of N2O/SiH4 PECVD oxide as gate material in MOSFETs and CCDs
|
Chanana, R.K. |
|
1993 |
36 |
7 |
p. 1021-1026 6 p. |
artikel |
7 |
Electron and hole traps in heavily compensated InGaAs/GaAs heterostructures
|
Buchwald, W.R. |
|
1993 |
36 |
7 |
p. 1077-1082 6 p. |
artikel |
8 |
Experimental application of a novel technique to extract gate bias dependent source and drain parasitic resistances of GaAs MESFETs
|
Menozzi, Roberto |
|
1993 |
36 |
7 |
p. 1083-1084 2 p. |
artikel |
9 |
Fabrication methods for an AlGaAs/InGaP/AlGaAs visible laser with transverse junction stripe structure grown by liquid phase epitaxy
|
Chang, L.B. |
|
1993 |
36 |
7 |
p. 1049-1054 6 p. |
artikel |
10 |
Injection current in a planar doped base Si bipolar junction transistor
|
Jorke, H. |
|
1993 |
36 |
7 |
p. 975-979 5 p. |
artikel |
11 |
Investigation of the kink and hysteresis from 13 K to 30 K in N-channel CMOS transistors with a floating well
|
Kasley, Kathy L. |
|
1993 |
36 |
7 |
p. 945-948 4 p. |
artikel |
12 |
Low-frequency noise characteristics of lightly-doped-drain MOSFETs
|
Jang, Sheng-Lyang |
|
1993 |
36 |
7 |
p. 1007-1010 4 p. |
artikel |
13 |
Numerical analysis of small-signal characteristics of a fully depleted SOI MOSFET
|
Yang, P.C. |
|
1993 |
36 |
7 |
p. 939-944 6 p. |
artikel |
14 |
On the carrier removal phenomenon in silicon after proton irradiation
|
Gopal, R. |
|
1993 |
36 |
7 |
p. 1011-1019 9 p. |
artikel |
15 |
Photoelectrical properties of Au/GaAs(1−x)Sx/Mo structures as a function of sulfur concentration
|
Lalande, Frédéric |
|
1993 |
36 |
7 |
p. 981-984 4 p. |
artikel |
16 |
Semi-analytical model for charge control in SiGe quantum well MOS structures
|
Bhaumik, Kaushik |
|
1993 |
36 |
7 |
p. 961-968 8 p. |
artikel |
17 |
Small-signal non-quasi-static model for single and double heterojunction bipolar transistors
|
Huang, Jeffrey C.-N. |
|
1993 |
36 |
7 |
p. 1027-1034 8 p. |
artikel |
18 |
Software survey section
|
|
|
1993 |
36 |
7 |
p. I-IV nvt p. |
artikel |
19 |
Spatially transient hot electron distributions in silicon determined from the chambers path integral solution of the Boltzmann transport equation
|
Leung, C.C.C. |
|
1993 |
36 |
7 |
p. 1001-1006 6 p. |
artikel |
20 |
Study of lateral non-uniformity as a function of junction depth in ultra-shallow junctions and its effect on leakage behavior in as-deposited polycrystalline Si and amorphous Si diodes
|
Batra, Shubneesh |
|
1993 |
36 |
7 |
p. 955-960 6 p. |
artikel |
21 |
Theory of surface photovoltage in a semiconductor with deep impurities
|
Choo, S.C. |
|
1993 |
36 |
7 |
p. 989-999 11 p. |
artikel |
22 |
Use of empirically deduced composition and temperature dependent intrinsic carrier density in Si1−xGex, In1−xGaxAs and In1−xGaxAsyP1−y in calculating minimum capacitance in C-V plot of MIS structure
|
Paul, Sajal K. |
|
1993 |
36 |
7 |
p. 985-988 4 p. |
artikel |