nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A computer model for inter-electrode capacitance-voltage characteristics of an a-Si:H TFT
|
Choi, Jong S. |
|
1993 |
36 |
2 |
p. 223-228 6 p. |
artikel |
2 |
Analysis of microwave scattering from semiconductor wafers
|
Otaredian, T. |
|
1993 |
36 |
2 |
p. 163-172 10 p. |
artikel |
3 |
An analytical expression for sheet carrier concentration vs gate voltage for HEMT modelling
|
DasGupta, Nandita |
|
1993 |
36 |
2 |
p. 201-203 3 p. |
artikel |
4 |
Current and number fluctuations in submicron n + nn + structures
|
Varani, Luca |
|
1993 |
36 |
2 |
p. 251-261 11 p. |
artikel |
5 |
Current-voltage characteristics of Si bipolar junction transistors operating in the cut-off mode
|
Jang, Sheng-Lyang |
|
1993 |
36 |
2 |
p. 291-292 2 p. |
artikel |
6 |
Dynamic simulation of electron trapping and device lifetime of LDDnMOSFET
|
Lin, Jian-Yang |
|
1993 |
36 |
2 |
p. 297-299 3 p. |
artikel |
7 |
Effects of oxygen implantation in GaAs
|
He, L. |
|
1993 |
36 |
2 |
p. 173-178 6 p. |
artikel |
8 |
Energy distribution of interface state density in AlN/n-GaAs heterostructures formed by laser chemical vapor deposition
|
Li, Xin |
|
1993 |
36 |
2 |
p. 279-284 6 p. |
artikel |
9 |
Formulation of the Boltzmann equation in terms of scattering matrices
|
Alam, Muhammad A. |
|
1993 |
36 |
2 |
p. 263-271 9 p. |
artikel |
10 |
Generalized steady state diode equation: The state equations approach
|
Dosluoglu, T. |
|
1993 |
36 |
2 |
p. 273-277 5 p. |
artikel |
11 |
High current gain AlGaAs/GaAs heterojunction bipolar transistor grown by molecular beam epitaxy
|
Huang, Chen-Chih |
|
1993 |
36 |
2 |
p. 197-200 4 p. |
artikel |
12 |
Investigation of the uniformity of ohmic contacts to n-type GaAs formed by rapid thermal processing
|
Zhou, W.Y. |
|
1993 |
36 |
2 |
p. 295-296 2 p. |
artikel |
13 |
Low-frequency current and intensity noise in AlGaAs laser diodes
|
Jang, Sheng-Lyang |
|
1993 |
36 |
2 |
p. 189-196 8 p. |
artikel |
14 |
Low frequency oscillations in GaAs MESFETs
|
Abdala, M.A. |
|
1993 |
36 |
2 |
p. 237-245 9 p. |
artikel |
15 |
Metal/n-InP interfaces studied by photoreflectance and Raman spectroscopies
|
Shi, Z.Q. |
|
1993 |
36 |
2 |
p. 147-151 5 p. |
artikel |
16 |
Modeling the transient response of channel-substrate interface traps to gate voltage steps in GaAs FETs
|
Sengouga, N. |
|
1993 |
36 |
2 |
p. 229-236 8 p. |
artikel |
17 |
Monte Carlo analysis of band structure influence on impact ionization in InP
|
Chandramouli, V. |
|
1993 |
36 |
2 |
p. 285-290 6 p. |
artikel |
18 |
Multiple proton energy irradiation for improved GTO thyristors
|
Hallén, Anders |
|
1993 |
36 |
2 |
p. 133-141 9 p. |
artikel |
19 |
Normalized expression of the frequency response of p-i-n avalanche photodiodes
|
Riesz, Ferenc |
|
1993 |
36 |
2 |
p. 293-294 2 p. |
artikel |
20 |
On the common-emitter breakdown voltage of bipolar junction transistors
|
Jang, Sheng-Lyang |
|
1993 |
36 |
2 |
p. 213-216 4 p. |
artikel |
21 |
Removal of native oxide from silicon surfaces of a-SiN x /Si devices using high pressure hydrogen plasma
|
Dutta, Achyut Kumar |
|
1993 |
36 |
2 |
p. 247-249 3 p. |
artikel |
22 |
Separate contactless measurement of the bulk lifetime and the surface recombination velocity by the harmonic optical generation of the excess carriers
|
Otaredian, T. |
|
1993 |
36 |
2 |
p. 153-162 10 p. |
artikel |
23 |
Series expansion of the Fermi-Dirac integral F j(x) over the entire domain of real j and x
|
Goano, Michele |
|
1993 |
36 |
2 |
p. 217-221 5 p. |
artikel |
24 |
Software survey section
|
|
|
1993 |
36 |
2 |
p. I-IV nvt p. |
artikel |
25 |
Spreading resistance of a round ohmic contact
|
Gelmont, Boris |
|
1993 |
36 |
2 |
p. 143-146 4 p. |
artikel |
26 |
Strain fields due to differential dilatation at metal/semiconductor contacts and resulting piezoelectrical fields in GaAs
|
Farvacque, J.L. |
|
1993 |
36 |
2 |
p. 205-211 7 p. |
artikel |
27 |
Theoretical calculations of temperature and current profiles in multi-finger heterojunction bipolar transistors
|
Liu, William |
|
1993 |
36 |
2 |
p. 125-132 8 p. |
artikel |
28 |
“Universal” effective mobility of empirical local mobility models for n- and p-channel silicon MOSFETs
|
Wong, Hon-Sum |
|
1993 |
36 |
2 |
p. 179-188 10 p. |
artikel |
29 |
Use of finite gate widths in multipoint correlation methods for DLTS characterization of semiconductors
|
G., A.Avila |
|
1993 |
36 |
2 |
p. 119-124 6 p. |
artikel |