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                             27 results found
no title author magazine year volume issue page(s) type
1 Arsenic ion implantation through Mo and Mo silicide layers for shallow junction formation Angelucci, R.
1992
35 7 p. 941-947
7 p.
article
2 A stochastic algorithm for high speed capacitance extraction in integrated circuits Le Coz, Y.L.
1992
35 7 p. 1005-1012
8 p.
article
3 A unified mobility model for device simulation—II. Temperature dependence of carrier mobility and lifetime Klaassen, D.B.M.
1992
35 7 p. 961-967
7 p.
article
4 A unified mobility model for device simulation—I. Model equations and concentration dependence Klaassen, D.B.M.
1992
35 7 p. 953-959
7 p.
article
5 Capacitance method for determination of LDD MOSFET geometrical parameters Vitanov, P.
1992
35 7 p. 985-991
7 p.
article
6 Contact resistance and 1 F noise of Sn/In/HgCdTe contacts Fastow, R.
1992
35 7 p. 1025-1026
2 p.
article
7 Current-voltage relation for abrupt N +-P-N + and N-i-N structures Bakker, J.G.C.
1992
35 7 p. 897-904
8 p.
article
8 Diagnosis of NMOS DRAM functional performance as affected by a picosecond dye laser Kim, Q.
1992
35 7 p. 905-912
8 p.
article
9 Editorial: Software survey section 1992
35 7 p. I-III
nvt p.
article
10 Effect of bandgap gradient in the base region of SiGe heterojunction bipolar transistors Roulston, David J.
1992
35 7 p. 1019-1020
2 p.
article
11 Experimental method for extraction of emitter injection limited gain in bipolar transistors Hamel, J.S.
1992
35 7 p. 1021-1022
2 p.
article
12 Fully self-aligned N-p-n InGaAs/InP HBTs with evaluation of their microwave characteristics Pitz, G.
1992
35 7 p. 937-939
3 p.
article
13 How to measure and interpret the conduction current in a.c. thin-film electroluminescent devices Neyts, K.A.
1992
35 7 p. 933-936
4 p.
article
14 Influence of a non-uniformly doped semiconductor region on skin effect resistance of ohmic contacts in mm-wave IMPATTs Ahmad, I.
1992
35 7 p. 883-889
7 p.
article
15 Influence of a selectively ion-implanted collector on bipolar transistor electrical characteristics Liang, Minchang
1992
35 7 p. 1017-1018
2 p.
article
16 Measurement of transport parameters in heavily-doped emitters of bipolar transistors Popp, J.
1992
35 7 p. 999-1003
5 p.
article
17 Measurements of substrate carrier lifetimes in silicon-on-insulator wafers by a contactless dual-beam optical modulation technique Yang, Ping-Chang
1992
35 7 p. 927-932
6 p.
article
18 Modeling Si/Si1−xGex heterojunction bipolar transistors Yuan, J.S.
1992
35 7 p. 921-926
6 p.
article
19 New technique for the determination of series resistance of Schottky barrier diodes Chattopadhyay, P.
1992
35 7 p. 1023-1024
2 p.
article
20 Novel effects of heating rate on the activation/recrystallization of boron-implanted Si substrates Juang, M.H.
1992
35 7 p. 969-973
5 p.
article
21 Parasitic conduction current in the passivation ledge of AlGaAs/GaAs heterojunction bipolar transistors Liu, William
1992
35 7 p. 891-895
5 p.
article
22 Photoelectric characteristics of a semiconductor diode with an abrupt junction at high photoexcitation levels Kucherenko, S.S.
1992
35 7 p. 993-997
5 p.
article
23 Properties of amorphous Bi2S3-crystalline silicon heterojunctions Singh, B.K.
1992
35 7 p. 1027-1029
3 p.
article
24 Revised theory of current transport through the Schottky structure Racko, J.
1992
35 7 p. 913-919
7 p.
article
25 Simple accurate general expression of the Fermi-Dirac integral F j (a) for arbitrary a and j > −1 Van Cong, Huynh
1992
35 7 p. 949-951
3 p.
article
26 Simple interface-layer model for the nonideal characteristics of the Schottky-barrier diode Szatkowski, J.
1992
35 7 p. 1013-1015
3 p.
article
27 Spatiotemporal chaos in Gunn diodes in presence of impact ionization Čenys, A.
1992
35 7 p. 975-984
10 p.
article
                             27 results found
 
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