nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A deterministic particle method for the kinetic model of semiconductors: The homogeneous field model
|
Degond, P. |
|
1991 |
34 |
12 |
p. 1335-1345 11 p. |
artikel |
2 |
A high-power short-pulse laser diode for waveguide second harmonic generation
|
Kume, Masahiro |
|
1991 |
34 |
12 |
p. 1329-1333 5 p. |
artikel |
3 |
A modified conductance technique for the determination of series resistance of MIS tunnel diodes
|
Chattopadhyay, P. |
|
1991 |
34 |
12 |
p. 1455-1456 2 p. |
artikel |
4 |
Analysis of I–V measurements on PtSi-Si Schottky structures in a wide temperature range
|
Donoval, D. |
|
1991 |
34 |
12 |
p. 1365-1373 9 p. |
artikel |
5 |
Analysis of the trapping characteristics of silicon dioxide after Fowler-Nordheim degradation
|
Papadas, C. |
|
1991 |
34 |
12 |
p. 1375-1379 5 p. |
artikel |
6 |
Analytical modelling of ultra-thin film depletion-mode SOI MOSFETs
|
Balestra, F. |
|
1991 |
34 |
12 |
p. 1361-1364 4 p. |
artikel |
7 |
A new resonant-tunneling bipolar transistor with triple-well emitter structure
|
Liu, Wen-Chao |
|
1991 |
34 |
12 |
p. 1457-1459 3 p. |
artikel |
8 |
Application of quantum mechanical wave impedance in the solution of Schrodinger's equation in quantum wells
|
Fazlul Kabir, S.M. |
|
1991 |
34 |
12 |
p. 1466-1468 3 p. |
artikel |
9 |
A self-consistent analytic threshold voltage model for thin SOI n-channel MOSFETs
|
Choi, Jin-Ho |
|
1991 |
34 |
12 |
p. 1421-1425 5 p. |
artikel |
10 |
Breakdown voltage of diffused epitaxial junctions
|
Bulucea, Constantin |
|
1991 |
34 |
12 |
p. 1313-1318 6 p. |
artikel |
11 |
Closed-form analytical solutions for avalanche breakdown quantities in high-voltage diffused junctions
|
Liang, Su-Jun |
|
1991 |
34 |
12 |
p. 1433-1437 5 p. |
artikel |
12 |
Comments on “An improved model of ‘generation width’ for pulsed MOS C-t transient analysis”
|
Calzolari, P.U. |
|
1991 |
34 |
12 |
p. 1473- 1 p. |
artikel |
13 |
Device-circuit mixed simulation of VDMOS charge transients
|
M.A. Ravanelli, Enrico |
|
1991 |
34 |
12 |
p. 1353-1360 8 p. |
artikel |
14 |
Editorial: Software survey section
|
|
|
1991 |
34 |
12 |
p. I-III nvt p. |
artikel |
15 |
Effect of oxide resistance on the characterization of interface trap density in MOS structures
|
Lin, Jing-Jenn |
|
1991 |
34 |
12 |
p. 1449-1454 6 p. |
artikel |
16 |
Effects of using minority hole mobility in n + emitter on bipolar device modeling
|
Yuan, J.S. |
|
1991 |
34 |
12 |
p. 1460-1462 3 p. |
artikel |
17 |
Emitter injection and collector current ideality in abrupt heterojunction AlInAs/GaInAs HBTs
|
Ferro, R.J. |
|
1991 |
34 |
12 |
p. 1319-1324 6 p. |
artikel |
18 |
Experimental study and modeling of band-to-band tunneling leakage current in thin-oxide MOSFETs
|
Nedev, I. |
|
1991 |
34 |
12 |
p. 1401-1408 8 p. |
artikel |
19 |
1/f noise in amorphous silicon and hydrogenated amorphous silicon thin films
|
Baciocchi, M. |
|
1991 |
34 |
12 |
p. 1439-1447 9 p. |
artikel |
20 |
GaAs MESFETs with channel-doping variations
|
Abid, Z. |
|
1991 |
34 |
12 |
p. 1427-1432 6 p. |
artikel |
21 |
GaAs surface plasma treatments for Schottky contacts
|
Paccagnella, A. |
|
1991 |
34 |
12 |
p. 1409-1414 6 p. |
artikel |
22 |
High-performance P-n-p heterojunction bipolar transistor design
|
Yuan, J.S. |
|
1991 |
34 |
12 |
p. 1347-1352 6 p. |
artikel |
23 |
Hot-carrier-induced photovoltage in silicon bipolar junction transistors
|
Jang, Sheng-Lyang |
|
1991 |
34 |
12 |
p. 1387-1392 6 p. |
artikel |
24 |
List of contents and author index
|
|
|
1991 |
34 |
12 |
p. i-xix nvt p. |
artikel |
25 |
Low-temperature degradation studies of AlGaAs/GaAs modulation-doped field effect transistors
|
Kang, Soon-won |
|
1991 |
34 |
12 |
p. 1415-1419 5 p. |
artikel |
26 |
On the recombination in the quasi-neutral base of polysilicon emitter transistors with interfacial oxides
|
Wijburg, Rutger C. |
|
1991 |
34 |
12 |
p. 1469-1471 3 p. |
artikel |
27 |
Parallel parasitic conductance in narrow-width MOSFETs
|
Zuo, Z.P. |
|
1991 |
34 |
12 |
p. 1381-1386 6 p. |
artikel |
28 |
Reply to “Comments on ‘An improved model of “generation width” for pulsed MOS C-t transient analysis‘”
|
Zhang, Xiumiao |
|
1991 |
34 |
12 |
p. 1474- 1 p. |
artikel |
29 |
Study of electrical properties of SiO2 grown over plasma-cleaned silicon surfaces
|
Chanana, R.K. |
|
1991 |
34 |
12 |
p. 1463-1465 3 p. |
artikel |
30 |
The cut-off frequency of base-graded and junction-graded Al x Ga1−x As DHBTs
|
Ang, Oon-Sim |
|
1991 |
34 |
12 |
p. 1325-1328 4 p. |
artikel |
31 |
Two-dimensional analysis of high injection effects in AlGaAs/GaAs HBTs with semi-insulating external collectors
|
Horio, Kazushige |
|
1991 |
34 |
12 |
p. 1393-1400 8 p. |
artikel |