| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A generalized formula for the a.c. admittances of nondegenerate semiconductor devices with one-dimensional geometry near equilibrium
|
Min, H.S.
|
|
1989
|
32 |
4 |
p. 295-298
4 p.
|
artikel
|
| 2 |
A general model for minority carrier transport in polysilicon emitters
|
Jalali, B.
|
|
1989
|
32 |
4 |
p. 323-327
5 p.
|
artikel
|
| 3 |
Announcement
|
|
|
1989
|
32 |
4 |
p. III-
1 p.
|
artikel
|
| 4 |
A unified electrothermal hot-carrier transport model for silicon bipolar transistor simulations
|
Szeto, Simon
|
|
1989
|
32 |
4 |
p. 307-315
9 p.
|
artikel
|
| 5 |
Constant-capacitance deep-level optical spectroscopy
|
Vilanova, J.
|
|
1989
|
32 |
4 |
p. 287-293
7 p.
|
artikel
|
| 6 |
Corrigendum
|
|
|
1989
|
32 |
4 |
p. I-
1 p.
|
artikel
|
| 7 |
Editorial - software survey section
|
|
|
1989
|
32 |
4 |
p. V-VII
nvt p.
|
artikel
|
| 8 |
Effects of field-oxide volume ratio and interface-charge density on submicron modified-locos isolations
|
Shih Wei Sun,
|
|
1989
|
32 |
4 |
p. 333-336
4 p.
|
artikel
|
| 9 |
High voltage characteristics of resurfed Schottky injection FETs
|
Sin, Johnny K.O.
|
|
1989
|
32 |
4 |
p. 317-322
6 p.
|
artikel
|
| 10 |
Matching properties of linear MOS capacitors
|
Singh, Rajinder
|
|
1989
|
32 |
4 |
p. 299-306
8 p.
|
artikel
|
| 11 |
Non-alloyed ohmic contacts on rapid thermally Zn diffused GaAs
|
Kalkur, T.S.
|
|
1989
|
32 |
4 |
p. 281-285
5 p.
|
artikel
|
| 12 |
Nonlinear stored charge vs d.c. bias-current relationship under high-level injection in pin diodes
|
Caverly, Robert H.
|
|
1989
|
32 |
4 |
p. 329-332
4 p.
|
artikel
|
| 13 |
On the capacitance of metal/thin oxide/semiconductor structures with localized oxide states
|
Nannini, A.
|
|
1989
|
32 |
4 |
p. 337-338
2 p.
|
artikel
|
| 14 |
On the Monte Carlo simulation program “RESIS” for electron exposure of resists
|
Deshmukh, P.R.
|
|
1989
|
32 |
4 |
p. 261-268
8 p.
|
artikel
|
| 15 |
The effect of layout, substrate/well biases, and triggering source location on latchup triggering currents in bulk CMOS circuits
|
Yang, Yeu-Haw
|
|
1989
|
32 |
4 |
p. 269-279
11 p.
|
artikel
|
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