nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A hydrogenated amorphous Si/SiC heterojunction phototransistor
|
Hong, J.W. |
|
1989 |
32 |
10 |
p. 883-886 4 p. |
artikel |
2 |
Amorphous-crystalline silicon heterojunction: Theoretical evaluation of the current terms
|
Rubinelli, F. |
|
1989 |
32 |
10 |
p. 813-825 13 p. |
artikel |
3 |
Announcement
|
|
|
1989 |
32 |
10 |
p. i-ii nvt p. |
artikel |
4 |
Carrier transport near the Si/SiO2 interface of a MOSFET
|
Hänsch, W. |
|
1989 |
32 |
10 |
p. 839-849 11 p. |
artikel |
5 |
Comments on “simplified modelling of delays in the emitter-base junction”
|
van den Biesen, J.J.H. |
|
1989 |
32 |
10 |
p. 922- 1 p. |
artikel |
6 |
Editorial - software survey section
|
|
|
1989 |
32 |
10 |
p. I-III nvt p. |
artikel |
7 |
Generation of interface states and oxide charges in n-MOS structures due to high electric field
|
Tolpadi, Amita |
|
1989 |
32 |
10 |
p. 919-921 3 p. |
artikel |
8 |
Generation-recombination-type 1 ƒ noise in nip diodes
|
van der Ziel, A. |
|
1989 |
32 |
10 |
p. 905-907 3 p. |
artikel |
9 |
Influence of dynamical interactions between density and mobility of carriers in the channel on 1 ƒ noise of MOS transistors below saturation—II. Implications
|
Grabowski, Franciszek |
|
1989 |
32 |
10 |
p. 915-918 4 p. |
artikel |
10 |
Influence of dynamical interactions between density and mobility of carriers in the channel on 1 ƒ noise of MOS transistors below saturation—I. Mechanisms
|
Grabowski, Franciszek |
|
1989 |
32 |
10 |
p. 909-913 5 p. |
artikel |
11 |
Investigation of injection mechanisms for InGaAs/InP double heterostructure bipolar transistors
|
Elshabini-Riad, Aicha |
|
1989 |
32 |
10 |
p. 853-860 8 p. |
artikel |
12 |
Iteration approach for solving the Boltzmann equation with the Monte Carlo method
|
Nedjalkov, M. |
|
1989 |
32 |
10 |
p. 893-896 4 p. |
artikel |
13 |
Mathematical analysis of amorphous silicon phototransistors
|
Chen, Inan |
|
1989 |
32 |
10 |
p. 887-892 6 p. |
artikel |
14 |
Numerical and analytical modelling of non ohmic MOSFET operation at liquid helium temperature
|
Hafez, I.M. |
|
1989 |
32 |
10 |
p. 861-865 5 p. |
artikel |
15 |
Performance-oriented scaling laws for mixed analog/digital MOS circuits
|
Singh, Rajinder |
|
1989 |
32 |
10 |
p. 835-838 4 p. |
artikel |
16 |
Temperature dependent effects and catastrophic burnout of the integrated series impatt structure (ISIS) diodes
|
Christou, A. |
|
1989 |
32 |
10 |
p. 897-904 8 p. |
artikel |
17 |
The development and application of a SiSiO2 interface-trap measurement system based on the staircase charge-pumping technique
|
Chung, James E. |
|
1989 |
32 |
10 |
p. 867-882 16 p. |
artikel |
18 |
The influence of grain boundaries on the performance efficiency of polycrystalline gallium arsenide solar cells
|
Mohammad, S.Noor |
|
1989 |
32 |
10 |
p. 827-834 8 p. |
artikel |
19 |
Ultrahigh voltage silicon P−N junctions with a breakdown voltage above 20 kV
|
Astrova, E.V. |
|
1989 |
32 |
10 |
p. 851-852 2 p. |
artikel |