nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A first-order theory of the static induction transistor
|
Bulucea, C. |
|
1987 |
30 |
12 |
p. 1227-1242 16 p. |
artikel |
2 |
A new boron implantation model suitable for analytical modeling of threshold voltage of MOSFETs
|
Gupta, A.Das |
|
1987 |
30 |
12 |
p. 1283-1287 5 p. |
artikel |
3 |
A new theoretical model for a p-n junction realistic diode
|
Khan, W.I. |
|
1987 |
30 |
12 |
p. 1221-1225 5 p. |
artikel |
4 |
A novel two-dimensional MOS transistor for analog applications
|
Aggarwal, Sudhir |
|
1987 |
30 |
12 |
p. 1323-1329 7 p. |
artikel |
5 |
Bulk tunneling contribution to the reverse breakdown characteristics of InSb gate controlled diodes
|
Adar, R. |
|
1987 |
30 |
12 |
p. 1289-1293 5 p. |
artikel |
6 |
Buried injector logic, a vertical IIL using deep ion implantation
|
Mouthaan, A.J. |
|
1987 |
30 |
12 |
p. 1243-1249 7 p. |
artikel |
7 |
Charge trapping in silicon-rich Si3N4 thin films
|
Buchanan, D.A. |
|
1987 |
30 |
12 |
p. 1295-1301 7 p. |
artikel |
8 |
Determination of transport parameters for InP device simulations in n + n + structures
|
Tait, Gregory B. |
|
1987 |
30 |
12 |
p. 1317-1322 6 p. |
artikel |
9 |
Drift velocity and diffusivity of hot carriers in germanium: Model calculations
|
Omar, M.Ali |
|
1987 |
30 |
12 |
p. 1351-1354 4 p. |
artikel |
10 |
Drift velocity and ionization coefficient for holes in single-valley semiconductors
|
Gautam, D.K. |
|
1987 |
30 |
12 |
p. 1271-1275 5 p. |
artikel |
11 |
Effect of heating on the structure of Au/GaAs encapsulated with SiO2
|
Zeng, X.-F. |
|
1987 |
30 |
12 |
p. 1259-1266 8 p. |
artikel |
12 |
Full Schottky high density 2-D infrared charge coupled detector array
|
KuriaĆski, Jerzy M. |
|
1987 |
30 |
12 |
p. 1341-1343 3 p. |
artikel |
13 |
Laser annealing of GaAs implanted with low doses of selenium ions
|
Akintunde, J.A. |
|
1987 |
30 |
12 |
p. 1251-1258 8 p. |
artikel |
14 |
List of contents and author index
|
|
|
1987 |
30 |
12 |
p. i-xviii nvt p. |
artikel |
15 |
MOSFET analysis through numerical solution of Poisson's equation by the method of moments
|
Arvas, E. |
|
1987 |
30 |
12 |
p. 1355-1357 3 p. |
artikel |
16 |
New integral representations of circuit models and elements for the circuit technique for semiconductor device analysis
|
Sah, C.T. |
|
1987 |
30 |
12 |
p. 1277-1281 5 p. |
artikel |
17 |
Numerical study of the effect of the doping profile on the threshold voltage of narrow-channel MOS transistor
|
Asenov, Asen M. |
|
1987 |
30 |
12 |
p. 1305-1315 11 p. |
artikel |
18 |
Ohmic contacts on selectively doped AlInAs/GaInAs heterostructures using Ni, AuGe and Au
|
Kamada, M. |
|
1987 |
30 |
12 |
p. 1345-1349 5 p. |
artikel |
19 |
Optimization of transconductance in JFETs and MESFETs
|
Solheim, Alan G. |
|
1987 |
30 |
12 |
p. 1267-1269 3 p. |
artikel |
20 |
Simple explicit expressions for the moderate inversion limits in long channel MOSFETs for analog applications
|
Bagheri, Mehran |
|
1987 |
30 |
12 |
p. 1357-1359 3 p. |
artikel |
21 |
Software survey section
|
|
|
1987 |
30 |
12 |
p. I-III nvt p. |
artikel |
22 |
Thermal radiation, thermal noise and zero-point energy
|
Kleen, W.J. |
|
1987 |
30 |
12 |
p. 1303-1304 2 p. |
artikel |
23 |
The threshold voltage of short-channel BC-MOSFET in the enhancement mode
|
Tong, K.Y. |
|
1987 |
30 |
12 |
p. 1359-1361 3 p. |
artikel |
24 |
Transient analysis for a new CMOS latchup model
|
Li, Wei |
|
1987 |
30 |
12 |
p. 1331-1339 9 p. |
artikel |