| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A diffusion model for carrier transport in a polycrystalline film
|
Ling, C.H.
|
|
1984
|
27 |
7 |
p. 633-638
6 p.
|
artikel
|
| 2 |
An analytical model for the narrow-width effect in ion-implanted MOSFETs
|
Lai, P.T.
|
|
1984
|
27 |
7 |
p. 639-649
11 p.
|
artikel
|
| 3 |
An analytic and accurate model for the threshold voltage of short channel MOSFETs in VLSI
|
Wu, Ching-Yuan
|
|
1984
|
27 |
7 |
p. 651-658
8 p.
|
artikel
|
| 4 |
Annealing of damage in Se+-implanted indium phosphide
|
Woodhouse, J.D.
|
|
1984
|
27 |
7 |
p. 677-686
10 p.
|
artikel
|
| 5 |
A simple method for separation of the internal and external (peripheral) currents of bipolar transistors
|
Rein, H.-M.
|
|
1984
|
27 |
7 |
p. 625-631
7 p.
|
artikel
|
| 6 |
2-D particle modelling of the InP MISFET
|
Mouis, M.
|
|
1984
|
27 |
7 |
p. 659-665
7 p.
|
artikel
|
| 7 |
1 f , g-r and burst noise induced by emitter-edge dislocations in bipolar transistors
|
Mihaila, M.
|
|
1984
|
27 |
7 |
p. 675-676
2 p.
|
artikel
|
| 8 |
ICASSP 85 Call for papers 1985 IEEE international conference on acoustics, speech & signal processing
|
|
|
1984
|
27 |
7 |
p. 699-
1 p.
|
artikel
|
| 9 |
Impurity distributions and p−n junctions in semiconductors
|
Fekete, Denes
|
|
1984
|
27 |
7 |
p. 607-615
9 p.
|
artikel
|
| 10 |
Influence of high density band tailing surface states on the MOSFET characteristics
|
Pásztor, Gy.
|
|
1984
|
27 |
7 |
p. 689-694
6 p.
|
artikel
|
| 11 |
Mobility of holes in p-type silicon determined by the self-consistent method
|
Tjapkin, D.A.
|
|
1984
|
27 |
7 |
p. 667-673
7 p.
|
artikel
|
| 12 |
Schottky barrier height of sputtered TiN contacts on silicon
|
Finetti, M.
|
|
1984
|
27 |
7 |
p. 617-623
7 p.
|
artikel
|
| 13 |
Software survey section
|
|
|
1984
|
27 |
7 |
p. I-III
nvt p.
|
artikel
|
| 14 |
Surface potential modulation at alumina-GaAs interfaces prepared by plasma oxidation
|
Lee, W.S.
|
|
1984
|
27 |
7 |
p. 695-698
4 p.
|
artikel
|
| 15 |
The quasi-equilibrium response of MOS structures: Quasi-static factor
|
Okeke, M.
|
|
1984
|
27 |
7 |
p. 601-606
6 p.
|
artikel
|
| 16 |
Thermal noise in inversion layers
|
Hayat, S.A.
|
|
1984
|
27 |
7 |
p. 687-688
2 p.
|
artikel
|
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