nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A new computer-aided simulation model for polycrystalline silicon film resistors
|
Ching-Yuan Wu, |
|
1983 |
26 |
7 |
p. 675-684 10 p. |
artikel |
2 |
A solar cell with enhanced photocurrent
|
Källbäck, Bengt |
|
1983 |
26 |
7 |
p. 653-656 4 p. |
artikel |
3 |
Carrier recombination at dislocations in epitaxial gallium phosphide layers
|
Dimitriadis, C.A. |
|
1983 |
26 |
7 |
p. 633-637 5 p. |
artikel |
4 |
Constant voltage scaling of FETs for high frequency and high power applications
|
Chi, J.Y. |
|
1983 |
26 |
7 |
p. 667-670 4 p. |
artikel |
5 |
Effects of velocity overshoot on performance of GaAs devices, with design information
|
Buot, F.A. |
|
1983 |
26 |
7 |
p. 617-632 16 p. |
artikel |
6 |
Electrical measurements on ion-implanted LPCVD polycrystalline silicon films
|
Huang, Ruey-Shing |
|
1983 |
26 |
7 |
p. 657-665 9 p. |
artikel |
7 |
Electron bombardment effect on the reverse I–V characteristics and tensosensibility of p +-nGaAs diodes
|
Brudnyi, V.N. |
|
1983 |
26 |
7 |
p. 699-703 5 p. |
artikel |
8 |
Evidence of optical generation of minority carriers from saturated MOS transistors
|
Childs, P.A. |
|
1983 |
26 |
7 |
p. 685-688 4 p. |
artikel |
9 |
1/f noise as a reliability estimation for solar cells
|
Vandamme, L.K.J. |
|
1983 |
26 |
7 |
p. 671-674 4 p. |
artikel |
10 |
Fourier-transformation analysis of deep level transient signals in semiconductors
|
Okuyama, Masanori |
|
1983 |
26 |
7 |
p. 689-694 6 p. |
artikel |
11 |
Generalized theory of conduction in schottky barriers
|
Simmons, J.G. |
|
1983 |
26 |
7 |
p. 705-709 5 p. |
artikel |
12 |
Induced-gate thermal noise in high electron mobility transistors
|
Wu, E.N. |
|
1983 |
26 |
7 |
p. 639-642 4 p. |
artikel |
13 |
Modified theory of MISS, MIST and OMIST devices
|
Zólomy, I. |
|
1983 |
26 |
7 |
p. 643-651 9 p. |
artikel |
14 |
Rapid measurement of lifetime using a ramped mos capacitor transient
|
Tiwari, P. |
|
1983 |
26 |
7 |
p. 695-698 4 p. |
artikel |