nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Alteration of diffusion profiles in semiconductors due to p−n junctions
|
Anthony, P.J. |
|
1982 |
25 |
12 |
p. 1171-1177 7 p. |
artikel |
2 |
Announcement
|
|
|
1982 |
25 |
12 |
p. 1215-1216 2 p. |
artikel |
3 |
Carrier recombination in single crystal PbSe
|
Zogg, H. |
|
1982 |
25 |
12 |
p. 1147-1155 9 p. |
artikel |
4 |
Diffusivity and growth rate of silicon in solid-phase epitaxy with an aluminum medium
|
Qingheng, Hua |
|
1982 |
25 |
12 |
p. 1187-1188 2 p. |
artikel |
5 |
Direct verification of heterojunction rules
|
Nussbaum, Allen |
|
1982 |
25 |
12 |
p. 1201-1204 4 p. |
artikel |
6 |
Electroabsorption produced mixed injection and its effect on the determination of ionization coefficients
|
Bulman, G.E. |
|
1982 |
25 |
12 |
p. 1189-1200 12 p. |
artikel |
7 |
List of contents and author index
|
|
|
1982 |
25 |
12 |
p. i-xiv nvt p. |
artikel |
8 |
MOS transistors with a forward-biased source-substrate junction
|
Velchev, N.B. |
|
1982 |
25 |
12 |
p. 1157-1160 4 p. |
artikel |
9 |
On the open-circuit voltage of a Schottky-barrier MIS solar cell
|
Daw, A.N. |
|
1982 |
25 |
12 |
p. 1205-1206 2 p. |
artikel |
10 |
Power MOSFET characteristics with modified spice modeling
|
Cheng, Hwa |
|
1982 |
25 |
12 |
p. 1209-1212 4 p. |
artikel |
11 |
Reply to comment on the paper entitled “A note on βup and βdown I2L transistors”
|
Berger, Horst H. |
|
1982 |
25 |
12 |
p. 1213- 1 p. |
artikel |
12 |
The effect of Al-GaAs interaction on the technology of self-aligned gallium arsenide MESFETs
|
Singh, B.R. |
|
1982 |
25 |
12 |
p. 1206-1209 4 p. |
artikel |
13 |
Theoretical basis for field calculations on multi-dimensional reverse biased semiconductor devices
|
Adler, M.S. |
|
1982 |
25 |
12 |
p. 1179-1186 8 p. |
artikel |
14 |
Theory of open circuit photo-voltage in degenerate abrupt p-n junctions
|
Vijay Kumar, D. |
|
1982 |
25 |
12 |
p. 1161-1164 4 p. |
artikel |
15 |
Transconductance degradation in VVMOS power transistors due to thermal and field effects
|
Tarasewicz, S.W. |
|
1982 |
25 |
12 |
p. 1165-1170 6 p. |
artikel |